Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)
We will introduce examples of surface analysis and measurements using various devices such as XPS, AES, and GD-OES, including measurements of Ni plating thickness, concentration, and surface contamination levels.
In this case study collection, we will introduce examples related to "surface analysis." We cover the objectives, methods, and results of "cleaning evaluation of plating substrates (GD-OES measurement)," as well as the features and analysis cases of "surface contamination analysis using XPS," and the characteristics and analysis cases of "analysis of iron rust (Raman spectroscopy)," among many others. Additionally, we present analysis results, condition analysis, composition measurements, and more. We encourage you to read it. [Contents] ■ Cleaning evaluation of plating substrates (GD-OES measurement) ■ Surface contamination analysis using XPS ■ Condition analysis of copper oxide (XPS/AES analysis) ■ Analysis of iron rust (Raman spectroscopy) ■ Composition investigation of discolored stainless steel *For more details, please refer to the PDF document or feel free to contact us.
- Company：セイコーフューチャークリエーション
- Price：Other
