![Accelerating research and development, [new] surface analysis service launched!](https://image.mono.ipros.com/public/product/image/480/2001535453/IPROS2944828896955495055.jpg?w=280&h=280)
Accelerating research and development, [new] surface analysis service launched!
Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!
We have launched a new service using XPS/HAXPES starting in June! For increasingly complex materials and fine structure samples, we can evaluate the composition and chemical bonding states from the surface to the interior of the material (up to ~30nm) at the same location and in a non-destructive manner. - Depending on the elements of interest and the analysis area and depth, we can select the appropriate X-ray source (Al Kα/Mg Kα/Ga Kα/Cr Kα) to achieve evaluation under suitable measurement conditions. - Non-exposure measurements to the atmosphere, Ar monomer/GCIB sputter etching, and heating pretreatment can be combined. - It is possible to evaluate the electronic states of semiconductor samples using UPS/LEIPS (ionization potential/electron affinity/band gap).
- Company：一般財団法人材料科学技術振興財団 MST
- Price：Other
![[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface](https://image.mono.ipros.com/public/product/image/387108/IPROS11365948078834941828.jpg?w=280&h=280)
