We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Surface Analysis Equipment.
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Surface Analysis Equipment Product List and Ranking from 9 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. 東邦化研 Saitama//Electronic Components and Semiconductors
  3. 北野精機 Tokyo//Manufacturing and processing contract
  4. 4 アイテス Shiga//Electronic Components and Semiconductors
  5. 4 エイブイシー Ibaraki//Testing, Analysis and Measurement
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. [Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS 一般財団法人材料科学技術振興財団　MST
  2. Accelerating research and development, [new] surface analysis service launched! 一般財団法人材料科学技術振興財団　MST
  3. [Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films 一般財団法人材料科学技術振興財団　MST
  4. 4 [Data] List of Analysis Machines 東邦化研
  5. 4 [Analysis Case] Evaluation of Solid Polymer Electrolyte Membrane for Fuel Cells 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

31～42 item / All 42 items

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[Analysis Case] Component Identification of Foreign Substances Considering Thermal History

[Analysis Case] Component Identification of Foreign Substances Considering Thermal History

Proposal for the use of standard samples with aligned thermal history.

Polymeric materials such as polypropylene (PP) react with oxygen and moisture in the atmosphere when heated, causing changes in their molecular structure. Therefore, when foreign substances or contaminants may be present in polymeric materials, it is necessary to use standard materials processed in the same environment as the measurement sample for comparison data. To investigate how the PP standard material changes due to heat treatment (200°C for 30 minutes), FT-IR and TOF-SIMS measurements were conducted.

  • Contract Analysis

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[Analysis Case] Qualitative Analysis of Organic EL Layer

[Analysis Case] Qualitative Analysis of Organic EL Layer

Suppression of component alteration through measurement surface finishing under atmosphere control.

We conducted qualitative analysis of the components by measuring the surface under controlled conditions, minimizing alterations due to processing, on a commercially available digital audio player equipped with an organic EL display.

  • Contract Analysis

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[Analysis Case] Investigation of the Causes of Wettability Changes Due to Plasma Treatment

[Analysis Case] Investigation of the Causes of Wettability Changes Due to Plasma Treatment

Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.

On the surface of cell culture dishes, treatments are performed to convert hydrophobic plastic surfaces to hydrophilic ones in order to enhance cell adhesion. In this study, the surfaces of dishes that underwent hydrophilic treatment were evaluated using XPS and TOF-SIMS, revealing an increase in OH and CHO groups. By conducting quantitative evaluations with XPS and qualitative evaluations with TOF-SIMS, it is possible to capture how the surface has changed.

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  • Contract Analysis

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[Analysis Case] Evaluation of the Cleaning Effect of Organic Ingredients

[Analysis Case] Evaluation of the Cleaning Effect of Organic Ingredients

You can measure the 300mm wafer as it is.

TOF-SIMS has the characteristics of simultaneously evaluating organic and inorganic materials, being capable of analyzing small areas with high sensitivity at the very surface, and allowing evaluation while still in the form of 300mm wafers, making it effective for residue investigations during cleaning processes. We will introduce an analysis case of the removal effect of organic contamination on Si surfaces. TOF-SIMS analysis was conducted on samples where amine-based organic materials were confirmed to be in extremely small quantities by XPS. Even in small areas, it is possible to measure components in such extremely small amounts.

  • Contract Analysis

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[Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS

[Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS

Investigation of the causes of coating peeling and poor adhesion through TOF-SIMS analysis.

To investigate the delamination issue that occurred on the nickel plating over bronze, TOF-SIMS analysis was conducted. By forcibly delaminating the affected area and performing qualitative analysis with TOF-SIMS, siloxanes and potassium compounds (such as potassium chloride and potassium sulfate) were detected from the delamination surface. These components are believed to be the cause of the delamination.

  • Contract Analysis

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All applicants will receive a gift! Basics of surface analysis and examples of contract analysis.

All applicants will receive a gift! Basics of surface analysis and examples of contract analysis.

<XPS・TOF-SIMS> A comprehensive explanation of what surface analysis is, the types of surface analysis, and other fundamental aspects. Additionally, representative examples using surface analysis are included.

We will introduce a compilation of basic explanations and analysis examples that will be helpful for your consideration of surface analysis. Please keep it on hand and make use of it for your consideration of analysis services. ★Free gift for all who wish to receive it★ Please check "Request for catalog" in the [Contact Us] section to apply. *You can view the digest version from [PDF Download].

  • Contract Analysis
  • Other contract services

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Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

We will introduce examples of surface analysis and measurements using various devices such as XPS, AES, and GD-OES, including measurements of Ni plating thickness, concentration, and surface contamination levels.

In this case study collection, we will introduce examples related to "surface analysis." We cover the objectives, methods, and results of "cleaning evaluation of plating substrates (GD-OES measurement)," as well as the features and analysis cases of "surface contamination analysis using XPS," and the characteristics and analysis cases of "analysis of iron rust (Raman spectroscopy)," among many others. Additionally, we present analysis results, condition analysis, composition measurements, and more. We encourage you to read it. [Contents] ■ Cleaning evaluation of plating substrates (GD-OES measurement) ■ Surface contamination analysis using XPS ■ Condition analysis of copper oxide (XPS/AES analysis) ■ Analysis of iron rust (Raman spectroscopy) ■ Composition investigation of discolored stainless steel *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contract Analysis
  • Surface treatment contract service

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Technical Document "Overview of Surface Analysis"

Technical Document "Overview of Surface Analysis"

Technical documentation explaining representative surface analysis methods such as EPMA and AES.

The technical document "Overview of Surface Analysis" contains information on various "surface analysis methods" that have become increasingly important in recent years for product development and addressing defects, focusing on understanding the structure and composition of surfaces and interfaces. This document provides a concise explanation of the fundamental surface analysis techniques, including representative methods such as EPMA, AES, XPS, SIMS, and TOF-SIMS. [Contents] ■ Types and characteristics of surface analysis - EPMA - AES - XPS, etc. For more details, please refer to the catalog or feel free to contact us.

  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Technical Data - Analysis of LIB - Mn Valence Analysis by ESCA

Technical Data - Analysis of LIB - Mn Valence Analysis by ESCA

We will introduce examples of analyzing the Mn valence using commercially available lithium manganese oxide.

This is a technical document introducing the analysis of Mn valence using -LIB analysis - ESCA. It presents a case study analyzing the Mn valence using commercially available lithium manganese oxide, clearly illustrated with charts and graphs. [Contents] ■ Overview ■ Introduction of analysis case studies *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

Evaluation of the distribution of organic components and active substances on the surface, qualitative analysis.

The segregation of components and the formation of films on the surface of the positive electrode of lithium-ion secondary batteries are factors that influence the electric capacity. We will introduce a case study on Li(NiCoMn)O2 (NCM), which is used as a positive electrode, where micro-region mapping was conducted using AES, and qualitative analysis of organic components (binder) and active material surface films was performed using XPS and TOF-SIMS. These methods allow for analysis with a series of treatments conducted under an Ar atmosphere, which helps to suppress the alteration of the sample.

  • Contract measurement
  • Contract Analysis

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[Analysis Case] Wide-area Quantitative Mapping using XPS

[Analysis Case] Wide-area Quantitative Mapping using XPS

It is possible to evaluate the composition distribution in an area of up to 70×70mm.

This is an example of wide-area quantitative mapping using XPS. We evaluated organic residue on silicon wafers using the following procedure. To graph the amount (atomic concentration) rather than peak intensity, it is less affected by sample roughness and allows for data acquisition over a wide area. It is suitable for investigating organic and inorganic contamination, discoloration, surface treatments, etc., as it enables an overview assessment of the compositional distribution on the sample surface.

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  • Contract Analysis
  • Contract measurement

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Accelerating research and development, [new] surface analysis service launched!

Accelerating research and development, [new] surface analysis service launched!

Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!

We have launched a new service using XPS/HAXPES starting in June! For increasingly complex materials and fine structure samples, we can evaluate the composition and chemical bonding states from the surface to the interior of the material (up to ~30nm) at the same location and in a non-destructive manner. - Depending on the elements of interest and the analysis area and depth, we can select the appropriate X-ray source (Al Kα/Mg Kα/Ga Kα/Cr Kα) to achieve evaluation under suitable measurement conditions. - Non-exposure measurements to the atmosphere, Ar monomer/GCIB sputter etching, and heating pretreatment can be combined. - It is possible to evaluate the electronic states of semiconductor samples using UPS/LEIPS (ionization potential/electron affinity/band gap).

  • Secondary Cells/Batteries

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