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Surface Analysis Equipment Product List and Ranking from 10 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. セイコーフューチャークリエーション Chiba//Testing, Analysis and Measurement
  3. 東邦化研 Saitama//Electronic Components and Semiconductors
  4. 4 ユニケミー Aichi//Testing, Analysis and Measurement
  5. 4 東レリサーチセンター Tokyo//Service Industry
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. [Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS 一般財団法人材料科学技術振興財団　MST
  2. [Analysis Case] Quantification of Hydroxyl Groups by Chemical Modification XPS 一般財団法人材料科学技術振興財団　MST
  3. [Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS 一般財団法人材料科学技術振興財団　MST
  4. 4 [Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS 一般財団法人材料科学技術振興財団　MST
  5. 5 [Data] List of Analysis Machines 東邦化研

Surface Analysis Equipment Product List

31～43 item / All 43 items

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[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film

[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film

Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.

XPS allows for the evaluation of bonding states of oxidized components (components bonded with oxygen) and metallic components (components bonded with metals). Additionally, by using argon ion sputtering, it is also possible to evaluate bonding states in the depth direction. * Regarding the passive film on the surface of stainless steel (with a thickness of several tens of nm to several hundred nm), the results of the above measurements showed that (1) there are many Fe oxidized components on the surface side, (2) Cr oxidized components exist below the Fe oxide layer, and (3) Ni oxidized components are almost nonexistent. * Since it includes changes in bonding states due to sputtering, the evaluation is primarily based on relative comparisons.

  • Contract Analysis

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[Analysis Case] Component Identification of Foreign Substances Considering Thermal History

[Analysis Case] Component Identification of Foreign Substances Considering Thermal History

Proposal for the use of standard samples with aligned thermal history.

Polymeric materials such as polypropylene (PP) react with oxygen and moisture in the atmosphere when heated, causing changes in their molecular structure. Therefore, when foreign substances or contaminants may be present in polymeric materials, it is necessary to use standard materials processed in the same environment as the measurement sample for comparison data. To investigate how the PP standard material changes due to heat treatment (200°C for 30 minutes), FT-IR and TOF-SIMS measurements were conducted.

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[Analysis Case] Qualitative Analysis of Organic EL Layer

[Analysis Case] Qualitative Analysis of Organic EL Layer

Suppression of component alteration through measurement surface finishing under atmosphere control.

We conducted qualitative analysis of the components by measuring the surface under controlled conditions, minimizing alterations due to processing, on a commercially available digital audio player equipped with an organic EL display.

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[Analysis Case] Investigation of the Causes of Wettability Changes Due to Plasma Treatment

[Analysis Case] Investigation of the Causes of Wettability Changes Due to Plasma Treatment

Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.

On the surface of cell culture dishes, treatments are performed to convert hydrophobic plastic surfaces to hydrophilic ones in order to enhance cell adhesion. In this study, the surfaces of dishes that underwent hydrophilic treatment were evaluated using XPS and TOF-SIMS, revealing an increase in OH and CHO groups. By conducting quantitative evaluations with XPS and qualitative evaluations with TOF-SIMS, it is possible to capture how the surface has changed.

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  • Contract Analysis

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[Analysis Case] Evaluation of Impurities in Metal Wires

[Analysis Case] Evaluation of Impurities in Metal Wires

Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.

SIMS analysis can be applied to various shapes of samples beyond wafers and substrates. In this case study, we will introduce an example of evaluating the distribution of impurities in a wire. The results of evaluating the impurity distribution in the depth direction from the side of the wire (Figure 2) indicate that the impurity profiles of H, O, F, S, and Cl vary in intensity with depth, suggesting that they are localized within the wire. The elemental mapping of the wire cross-section (Figure 3) confirmed the localization of impurities within the wire.

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[Analysis Case] Investigation of Contamination Causes on Silicon Wafers

[Analysis Case] Investigation of Contamination Causes on Silicon Wafers

Evaluation of contamination originating from gloves

In semiconductor device manufacturing, it is necessary to investigate what causes thin deposits that lead to defects in order to examine contamination processes. An analysis was conducted using TOF-SIMS on the deposits for which carbon was detected by EDX and quantified by XPS. When compared to the gloves used for standard samples in each process, similar trends were observed with gloves A and B. Furthermore, verification was performed by adhering the standard sample gloves to silicon wafers. As a result, it was found that they were similar to glove A. Adhering standard samples to silicon wafers for verification is an effective method.

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[Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS

[Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS

Investigation of the causes of coating peeling and poor adhesion through TOF-SIMS analysis.

To investigate the delamination issue that occurred on the nickel plating over bronze, TOF-SIMS analysis was conducted. By forcibly delaminating the affected area and performing qualitative analysis with TOF-SIMS, siloxanes and potassium compounds (such as potassium chloride and potassium sulfate) were detected from the delamination surface. These components are believed to be the cause of the delamination.

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[Analysis Case] Composition Evaluation of Nozzle Surface and Inner Wall

[Analysis Case] Composition Evaluation of Nozzle Surface and Inner Wall

It is possible to evaluate the compositional distribution of the convex and concave samples.

TOF-SIMS is an effective method for evaluating distribution, as it can simultaneously analyze elemental composition and molecular information of organic and inorganic substances, as well as perform imaging analysis. This document presents a case study analyzing the inner wall of a nozzle. The distribution of the nozzle surface and inner wall was confirmed, and the presence or absence of peaks at various locations was verified. Measurement method: TOF-SIMS Product field: Manufacturing equipment, parts, daily goods Analysis purpose: Composition distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] Evaluation of Material Structure of Organic EL (OLED)

[Analysis Case] Evaluation of Material Structure of Organic EL (OLED)

It is possible to identify components for each layer, pixel by pixel.

To improve the reliability of organic EL, which is expected to expand in demand in the future, detailed structural analysis, state analysis, and identification of degradation causes will become increasingly important. We will introduce examples of evaluating layer structures and materials using TOF-SIMS and LC/MS. With TOF-SIMS, we were able to evaluate the layer structure and the component information of each layer. We conducted analyses of the components revealed by TOF-SIMS using LC/MS and a fluorescence detector, allowing us to assess the emission wavelength and understand the structure of the components. Thus, the combination of TOF-SIMS and LC/MS enables detailed evaluations.

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[Analysis Case] Evaluation of Component Distribution in Skin Cross-Section

[Analysis Case] Evaluation of Component Distribution in Skin Cross-Section

It is possible to visualize molecular information of organic and inorganic substances.

We created skin tissue samples and evaluated the distribution of biogenic components in freeze-dried samples using TOF-SIMS. Since TOF-SIMS identifies components based on the mass of molecular ions, it does not require labels such as fluorescent substances, allowing for the evaluation of distribution without the influence of labeled materials. The mapping results confirmed that arginine, a natural moisturizing factor (NMF), and cholesterol, which retains moisture as an intercellular lipid, are localized in the stratum corneum. This method is also effective for assessing the permeation state during drug application.

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  • Contract measurement

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Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

We will introduce examples of surface analysis and measurements using various devices such as XPS, AES, and GD-OES, including measurements of Ni plating thickness, concentration, and surface contamination levels.

In this case study collection, we will introduce examples related to "surface analysis." We cover the objectives, methods, and results of "cleaning evaluation of plating substrates (GD-OES measurement)," as well as the features and analysis cases of "surface contamination analysis using XPS," and the characteristics and analysis cases of "analysis of iron rust (Raman spectroscopy)," among many others. Additionally, we present analysis results, condition analysis, composition measurements, and more. We encourage you to read it. [Contents] ■ Cleaning evaluation of plating substrates (GD-OES measurement) ■ Surface contamination analysis using XPS ■ Condition analysis of copper oxide (XPS/AES analysis) ■ Analysis of iron rust (Raman spectroscopy) ■ Composition investigation of discolored stainless steel *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
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  • Surface treatment contract service

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Technical Document "Overview of Surface Analysis"

Technical Document "Overview of Surface Analysis"

Technical documentation explaining representative surface analysis methods such as EPMA and AES.

The technical document "Overview of Surface Analysis" contains information on various "surface analysis methods" that have become increasingly important in recent years for product development and addressing defects, focusing on understanding the structure and composition of surfaces and interfaces. This document provides a concise explanation of the fundamental surface analysis techniques, including representative methods such as EPMA, AES, XPS, SIMS, and TOF-SIMS. [Contents] ■ Types and characteristics of surface analysis - EPMA - AES - XPS, etc. For more details, please refer to the catalog or feel free to contact us.

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Technical Data - Analysis of LIB - Mn Valence Analysis by ESCA

Technical Data - Analysis of LIB - Mn Valence Analysis by ESCA

We will introduce examples of analyzing the Mn valence using commercially available lithium manganese oxide.

This is a technical document introducing the analysis of Mn valence using -LIB analysis - ESCA. It presents a case study analyzing the Mn valence using commercially available lithium manganese oxide, clearly illustrated with charts and graphs. [Contents] ■ Overview ■ Introduction of analysis case studies *For more details, please refer to the PDF document or feel free to contact us.

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