We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Surface Analysis Equipment.
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Surface Analysis Equipment Product List and Ranking from 9 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. 東邦化研 Saitama//Electronic Components and Semiconductors
  3. 北野精機 Tokyo//Manufacturing and processing contract
  4. 4 アイテス Shiga//Electronic Components and Semiconductors
  5. 4 エイブイシー Ibaraki//Testing, Analysis and Measurement
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. [Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS 一般財団法人材料科学技術振興財団　MST
  2. Accelerating research and development, [new] surface analysis service launched! 一般財団法人材料科学技術振興財団　MST
  3. [Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films 一般財団法人材料科学技術振興財団　MST
  4. 4 [Data] List of Analysis Machines 東邦化研
  5. 4 [Analysis Case] Evaluation of Solid Polymer Electrolyte Membrane for Fuel Cells 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

16～30 item / All 42 items

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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

Depth direction analysis will be conducted to a depth of several micrometers.

XPS is a surface-sensitive technique widely used for evaluating sample surfaces, but when combined with ion etching, it allows for depth analysis. In addition to the compositional distribution in the depth direction, XPS also enables the assessment of bonding states, making it suitable for investigating the causes of discoloration on the surfaces of device components. This document presents a case study evaluated by XPS regarding the discoloration of the blades of a turbo molecular pump.

  • Contract Analysis
  • Contract manufacturing

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Analysis case: Evaluation of the oxide film on the surface of solder balls.

Analysis case: Evaluation of the oxide film on the surface of solder balls.

Evaluation case of spherical shape samples

In AES analysis, the SEM observation function is included, allowing for the measurement of specific areas on the sample surface. Additionally, since measurements can be taken in sub-micrometer micro-regions, it is possible to target specific areas for measurement not only on flat samples like substrates but also on samples with spherical or curved shapes, which are less affected by curvature. Below is an example of evaluating the oxide film thickness on solder ball surfaces with different surface shapes.

  • Contract Analysis
  • Solder

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Technical Data: Evaluation of Element Distribution and Chemical State of SEI Film on Secondary Battery Anode

Technical Data: Evaluation of Element Distribution and Chemical State of SEI Film on Secondary Battery Anode

Composite approach to the cross-sectional structure and surface shape of the negative electrode, as well as elemental mapping images of the active material cross-section!

One of the causes of capacity degradation at the negative electrode of lithium-ion secondary batteries is the formation of a film called SEI (Solid Electrolyte Interphase), which is created by interfacial reactions between the active material and the electrolyte, resulting in various lithium salt compounds complexing on the surface of the active material. To improve battery performance, control over the composition, thickness, and chemical bonding state of the SEI film is required. This document presents examples of evaluations of the SEI film formed on the surface of carbon-based negative electrode active materials for automotive batteries using SEM, TEM, TEM-EELS, TOF-SIMS, and XPS. *For more details, please refer to the PDF document or feel free to contact us.*

  • Secondary Cells/Batteries
  • Contract measurement

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[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

Separation of components in the Cu spectrum, quantification, and calculation of film thickness.

From the analysis of the Cu2p3/2 spectrum and Cu Auger spectrum, it is possible to evaluate the bonding state, quantitative assessment, and film thickness of the Cu surface. Major application examples include the evaluation of CMP processing and cleaning of Cu wiring, as well as the investigation of rust and discoloration of Cu electrodes. We will summarize the surface states of Cu treated with various processes and the thickness of the oxide film. (Measurements can be conducted immediately after treatment in a clean room environment.)

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  • Contract measurement

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[Analysis Case] Evaluation of Discoloration Causes in Ceramics

[Analysis Case] Evaluation of Discoloration Causes in Ceramics

TOF-SIMS enables imaging of the discoloration causes of inorganic materials.

Ceramics are inorganic compound materials widely used in everyday goods and electronic components. For evaluating the discoloration of ceramics caused by impurities and adherents, TOF-SIMS analysis, which allows for imaging analysis of trace components regardless of organic or inorganic substances at the focus area, is effective. This document presents a case study where the discoloration of aluminum oxide ceramics was analyzed using TOF-SIMS, demonstrating the cause of discoloration through ion images and line profiles. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Composition distribution evaluation For more details, please download the document or contact us.

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  • Contract Analysis

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[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

It is possible to visualize the distribution of cleaning components and evaluate the distribution in the depth direction.

Ceramics are inorganic compound materials widely used in everyday items and electronic components. Their surface condition significantly affects the properties and performance of materials such as everyday items and electronic components. Therefore, it is important to properly evaluate the surface condition when assessing the functionality of ceramics. This document introduces a case study evaluating the cleaning components that contribute to the wettability of ceramic surfaces made of zirconium oxide, using TOF-SIMS to assess surface distribution and depth distribution. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Qualitative and distribution evaluation For more details, please download the document or contact us.

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  • Contract Analysis
  • Contract measurement

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Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

We have carefully selected case studies using XPS, AES, and AFM for discoloration investigation and surface modification evaluation. Please take a look and download the materials.

In this case study collection, we will introduce examples related to "surface analysis." We feature numerous characteristics and analysis cases, including "investigation of discoloration on material surfaces using XPS," "evaluation of surface modification of PET using XPS," "analysis of hydrophobic films using XPS," and "evaluation of heating effects on plated parts." Additionally, we present analysis results, discoloration investigations, surface modification evaluations, and analyses of hydrophobic films. We encourage you to read through it. [Contents] ■ Investigation of discoloration on material surfaces using XPS ■ Evaluation of surface modification of PET using XPS ■ Analysis of hydrophobic films using XPS ■ Evaluation of heating effects on plated parts (AFM, AES) *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Other metal materials
  • Other polymer materials

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Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In many cases, the analysis targets in surface analysis are limited to those that can be maintained in a vacuum. On the other hand, by applying the potential of high-speed ions, it is possible to bring the analysis probe out to atmospheric pressure. At TRC, we examined Rutherford backscattering spectroscopy (RBS) at atmospheric pressure and succeeded in its realization. This paper reports on depth analysis of solid/liquid interfaces using atmospheric pressure RBS, evaluation of depth distribution of quantum dots in HeLa cells, and depth analysis of hydrogen in wet samples using atmospheric pressure RBS/HFS (hydrogen forward scattering analysis). **Table of Contents** 1. Introduction 2. Solid/Liquid Interface Analysis 3. Application to Biological Samples 4. Development of Measurement System at TRC: Atmospheric Pressure RBS/HFS Analysis 5. Conclusion

  • Contract Analysis
  • Contract measurement
  • Technical and Reference Books

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Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

A surface structure analysis device equipped with an EB evaporator suitable for the fabrication of metal thin films!

The "Ultra High Vacuum Surface Structure Analysis Device" is a surface analysis instrument capable of performing LEED diffraction patterns, Auger analysis, and temperature-programmed desorption analysis for semiconductors and model catalysts. The analyzer is equipped with a LEED/AES mass spectrometer and features an EB evaporator suitable for metal thin film fabrication. Please feel free to contact us if you have any inquiries. 【Specifications】 ■ Surface analysis system: LEED/AES ■ Evaporation source: Ultra high vacuum evaporator "AEV series" ■ Gas source: Hydrogen cracking gun "AEV series" ■ Sample heating: Direct electric heating type (TC contact type sample holder) ■ Sample manipulator: 5-axis operation with X, Y, Z, θ, and in-plane rotation axis, etc. *For more details, please contact us.

  • Analytical Equipment and Devices

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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

Measures and avoidance of issues are possible! We will introduce examples verified through elemental and bonding state analysis.

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis via surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results by XPS (ESCA) ■ Bonding State Analysis Results by XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results by XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS

[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS

Properly sampling and measuring surface contamination even on large parts that cannot be cut.

It was found that there are water-repellent stains on the surface of the aluminum material. The stained area was adhered to tape (transferred), and analysis was conducted using TOFSIMS. Fragments identical to those from the stained area on the aluminum surface were detected from the "tape surface where the stained area was transferred," suggesting that the substance causing the stain has been transferred to the tape. This method of transferring and collecting the causative substance onto tape is effective for parts that cannot be cut.

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[Analysis Case] Evaluation of Adhesive Tape Residue

[Analysis Case] Evaluation of Adhesive Tape Residue

We will identify the surface adsorbate components using TOF-SIMS.

Residue from adhesive tape can cause poor adhesion and peeling during the manufacturing process. When residue is suspected to be the cause of defects, TOF-SIMS, which can analyze the composition and distribution of surface contaminants, is effective. We will present a case where the surface of a silicon wafer was adhered with adhesive tape and measured with TOF-SIMS after peeling it off.

  • Contract Analysis

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[Analysis Case] Analysis of Catalysts for Fuel Cells

[Analysis Case] Analysis of Catalysts for Fuel Cells

Chemical state analysis using XPS and morphological observation using TEM.

The electrodes of fuel cells have a structure in which Pt particles, serving as the catalyst, are supported on a carbon carrier. For the evaluation of Pt, XPS analysis is effective for state analysis, while TEM observation is useful for morphological observation. These methods can also be used to assess the degradation of Pt catalysts, such as oxidation (poisoning) and aggregation (decrease in specific surface area). By reconstructing images taken from different angles, a three-dimensional image of the Pt particles is obtained.

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[Analysis Case] Evaluation of Solid Polymer Electrolyte Membrane for Fuel Cells

[Analysis Case] Evaluation of Solid Polymer Electrolyte Membrane for Fuel Cells

Molecular structure evaluation by TOF-SIMS and chemical state evaluation by XPS.

Solid polymer fuel cells (PEFC) are attracting attention for their high output at room temperature, making them suitable for automotive applications, home cogeneration, and mobile use. This time, we will introduce examples of molecular structure evaluation using TOF-SIMS, bonding state analysis using XPS, and quantitative evaluation of solid polymer electrolyte membranes. Additionally, MST allows for comprehensive evaluation of battery materials using various analytical methods under controlled atmospheric conditions.

  • Contract Analysis

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[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film

[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film

Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.

XPS allows for the evaluation of bonding states of oxidized components (components bonded with oxygen) and metallic components (components bonded with metals). Additionally, by using argon ion sputtering, it is also possible to evaluate bonding states in the depth direction. * Regarding the passive film on the surface of stainless steel (with a thickness of several tens of nm to several hundred nm), the results of the above measurements showed that (1) there are many Fe oxidized components on the surface side, (2) Cr oxidized components exist below the Fe oxide layer, and (3) Ni oxidized components are almost nonexistent. * Since it includes changes in bonding states due to sputtering, the evaluation is primarily based on relative comparisons.

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