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The Japan Electronics Corporation IB-19520CCP Cooling Cross-Section Polisher sample preparation device can reduce thermal damage from ion beams by cooling the sample with liquid nitrogen during processing. It has a long cooling retention time and is designed to minimize liquid nitrogen consumption. 〇 Features - Allows for rapid cooling, room temperature recovery, and removal of the sample while keeping liquid nitrogen inside. - Equipped with a transport mechanism to perform processing to observation in a non-atmospheric exposure environment. - Automatic processing program. - Multi-purpose stage. *For more details, please download the PDF or feel free to contact us.

Japan Electronics Co., Ltd. IB-19530CP Cross-Section Polisher Sample Preparation Device has adopted a multi-purpose stage to meet the diversifying market needs, achieving multifunctionality by exchanging various functional holders. By selecting functional holders according to the application, it can expand its capabilities not only for cross-section milling but also for planar milling, ion beam sputter coating, and more. 〇Features - Automatic processing program - Multi-purpose stage *For more details, please download the PDF or feel free to contact us.