アズサイエンス List of Products and Services

The Japan Electronics Corporation IB-19520CCP Cooling Cross-Section Polisher sample preparation device can reduce thermal damage from ion beams by cooling the sample with liquid nitrogen during processing. It has a long cooling retention time and is designed to minimize liquid nitrogen consumption. 〇 Features - Allows for rapid cooling, room temperature recovery, and removal of the sample while keeping liquid nitrogen inside. - Equipped with a transport mechanism to perform processing to observation in a non-atmospheric exposure environment. - Automatic processing program. - Multi-purpose stage. *For more details, please download the PDF or feel free to contact us.

The Japan Electronics Corporation JIB-4700F composite beam processing observation device meets the high resolution and precision needs for evaluation techniques such as morphological observation, elemental analysis, and crystallographic analysis. Combined with the "in-lens Schottky electron gun," it enables high-resolution observation and high-speed analysis. 〇 Features - High-resolution SEM observation - High-speed analysis - High-speed processing - Enhanced detection system - Three-dimensional observation and analysis *For more details, please download the PDF or feel free to contact us.