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  2. Testing, Analysis and Measurement
  3. サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K.
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Testing, Analysis and Measurement
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サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K.

EstablishmentJune 27, 1989
capital45650Ten thousand
number of employees530
addressTokyo/Minato-ku/2-8, Shibaura 4-chome
phone0120-753-670
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last updated:Jan 27, 2026
サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K.logo
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サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K. Product Lineup

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Antibody-affinity proteomics based on Proximity Extension Assay (PEA) Antibody-affinity proteomics based on Proximity Extension Assay (PEA)
フィルター製品 フィルター製品
Liquid chromatography Liquid chromatography
FTIR - Infrared Microscope FTIR - Infrared Microscope
Raman spectrometer Raman spectrometer
Near Infrared Spectroscopy Device (NIR) Near Infrared Spectroscopy Device (NIR)
Ultraviolet-visible spectrophotometer (UV-Vis) and micro-spectrophotometer. Ultraviolet-visible spectrophotometer (UV-Vis) and micro-spectrophotometer.
X-ray diffraction device (XRD) X-ray diffraction device (XRD)
X-ray fluorescence (XRF) analysis device X-ray fluorescence (XRF) analysis device
Handheld X-ray fluorescence (XRF) analyzer Handheld X-ray fluorescence (XRF) analyzer
Solid Emission Analysis Device (OES) Solid Emission Analysis Device (OES)
Gas analyzer Gas analyzer
Rheometer and viscometer Rheometer and viscometer
Extruder (dual-axis extrusion mixing machine) Extruder (dual-axis extrusion mixing machine)
オンライン元素分析装置 オンライン元素分析装置
Online thickness gauge Online thickness gauge
Centrifuge / Centrifugal Concentrator Centrifuge / Centrifugal Concentrator
Pipette/Tip Pipette/Tip
Column consumables Column consumables
X-ray photoelectron spectroscopy (XPS) device X-ray photoelectron spectroscopy (XPS) device
Safety cabinet Safety cabinet
Sample freeze storage related products / 2D code tube Sample freeze storage related products / 2D code tube
Ion chromatography Ion chromatography
SEM/TEM detectors (EDS, WDS, etc.) and X-ray analyzers SEM/TEM detectors (EDS, WDS, etc.) and X-ray analyzers
General-purpose equipment for laboratories General-purpose equipment for laboratories
Plastic bottle / assay plate Plastic bottle / assay plate
Gas chromatography Gas chromatography
Lab pH and ion meter, water quality meter Lab pH and ion meter, water quality meter
Plastic labware / General-purpose laboratory supplies Plastic labware / General-purpose laboratory supplies
Trace element analysis device Trace element analysis device
Online water quality measurement equipment for processes Online water quality measurement equipment for processes
Clinical consumables Clinical consumables
Single-use devices and consumables Single-use devices and consumables
Quality control equipment and reagents Quality control equipment and reagents
Purification chromatography resin and column Purification chromatography resin and column
Cell culture medium Cell culture medium
Cell culture-related products Cell culture-related products
Protein analysis-related products Protein analysis-related products
Cell analysis-related products Cell analysis-related products
Molecular biology-related products Molecular biology-related products
Sample preparation related products Sample preparation related products
SEM/TEM

SEM/TEM detectors (EDS, WDS, etc.) and X-ray analyzers

We will introduce X-ray analysis analyzers and X-ray detectors (EDS/WDS) for electron microscopes.

Quasor II EBSD System

Introducing an electron backscatter diffraction analysis device that easily allows for simultaneous collection of EBSD data and EDS/WDS spectral images!

The "Quasor II EBSD System" is an electron backscatter diffraction analysis device that allows for the simultaneous collection of EBSD data and EDS/WDS spectral images with ease. It characterizes the crystal structures that influence the physical properties of a wide range of materials observed through scanning electron microscopy (SEM) and microanalysis. You can obtain both structural and chemical information of the sample in a single measurement. 【Features】 ■ Collection speed of up to 600 frames per second with 99% of pixels indexed ■ Obtain both structural and chemical information of the sample in a single measurement ■ Background removal through subtraction or division ■ Image cropping ■ Flat fielding using FFT or parabolic methods *For more details about the product, please contact us directly.

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WDS MagnaRay Spectrometer

By combining the data with the results from EDS, we achieve a truly integrated EDS/WDS system!

The "WDS MagnaRay Spectrometer" enables elemental analysis in electron microscopes, automatic intelligent alignment, and parameter settings with high speed and reliability. High-resolution trace analysis can be performed as easily as with an EDS system. The built-in expert system automatically handles alignment, analysis settings, and data collection. 【Features】 ■ High resolution ■ Sensitivity to trace elements ■ Continuous spectrometer covering the entire spectral range ■ Guaranteed sensitivity specifications *For more details about the product, please contact us directly.

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UltraDry EDS Detector

The input rate is 1,000,000 counts per second! A detector that provides faster and more accurate interpretation of X-rays.

The "UltraDry EDS Detector" provides faster and more accurate X-ray interpretation in industries such as metals and mining, advanced materials, and semiconductors. When used in conjunction with Thermo Scientific Pathfinder X-ray microanalysis software, it demonstrates exceptional resolution with a very high yield. It maintains an extremely high data collection speed without the need for external cooling or cooling with liquid nitrogen. 【Features】 ■ Incredible operating space that achieves excellent performance ■ Miniaturized integrated FET to effectively eliminate electronic noise ■ One of the largest collection solid angles among detectors available on the market, thanks to the crystalline active area ■ Sensitivity to light elements down to Be (beryllium) ■ No auxiliary cooling such as cooling water or fans, or liquid nitrogen required *For more product details, please contact us directly.

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X-ray microanalysis software "Pathfinder"

Improving electron microscope analysis! It excels in discovering the properties of unknown materials and foreign substances.

"Pathfinder" is a new tool designed to achieve efficient and comprehensive electron microscope analysis. It allows for the detection of trace elements in extremely complex matrices by scanning spectral imaging data at the pixel level. Our proprietary 29 types of imaging filters enhance the clarity and comprehensibility of SEM/EDS and SEM/WDS data images. 【Features】 ■ Achieves efficient and comprehensive electron microscope analysis ■ Prevents prolonged and subjective analysis ■ Reliable analysis can be completed in less than one minute ■ Excellent for discovering the properties of unknown materials and foreign substances ■ Capable of detecting trace elements in extremely complex matrices *For more details about the product, please contact us directly.

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