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Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a focus of attention as a material for power devices that can be expected to be high-efficiency and low-cost. Controlling impurity concentration and crystallinity, which influence the characteristics of the devices, is crucial for their development. This document presents the results of observations of the damage layer and changes in surface roughness caused by disturbances in the crystal structure due to ion implantation, under various annealing conditions. Measurement methods: TEM, AFM Product fields: Oxide semiconductors, power devices Analysis objectives: Shape evaluation, structural evaluation For more details, please download the document or contact us.
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Lignin is an aromatic polymer component that accounts for about 30% of wood biomass, and attention is being drawn to its potential as an alternative to petrochemical raw materials and its use in engineering plastics. This document presents a comprehensive evaluation of lignin, starting from extraction from wood to chemical structure analysis. Measurement methods: NMR, LC/MS, GC/MS Product fields: Environment, Biotechnology, Polymer Materials Analysis purposes: Composition evaluation, identification, chemical bonding state evaluation, structural evaluation For more details, please download the document or contact us.
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Polyamines are a general term for aliphatic hydrocarbons that contain two or more amino groups. They are important components that exist within biological cells and are essential for normal metabolism, but it is known that their levels decrease with aging. On the other hand, by consuming polyamines, it is possible to replenish the reduced levels, which is why foods rich in polyamines are expected to have anti-aging effects. This document presents a case study of the quantification of three representative polyamines (putrescine, spermidine, and spermine) contained in soybean products using HPLC. Measurement method: HPLC Product field: Food Analysis purpose: Composition evaluation and identification For more details, please download the document or contact us.
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X-ray CT allows for non-destructive observation of internal structures and dimensional measurements of products. This document presents a case study of a cylindrical lithium-ion battery (φ14mm×H50mm). X-rays were sufficiently transmitted from the outer casing to the interior electrodes, and initially, a wide-area observation was conducted to confirm the three-dimensional structure of the entire battery. Subsequently, by performing magnified observations on specific areas, we identified voids within the positive electrode, foreign substances between the positive and negative electrodes, and disturbances in the electrode layers. Additionally, measurements of the inter-electrode distance were conducted from the obtained cross-sectional images. Measurement method: X-ray CT Product field: Secondary batteries Analysis purpose: Shape evaluation, failure analysis, defect analysis, product investigation For more details, please download the document or contact us.
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In the structural analysis of organic compounds using NMR, two-dimensional NMR is generally used in addition to one-dimensional NMR (1H-NMR and 13C-NMR) to confirm the correlations between peaks in one-dimensional NMR, allowing for the assignment of peaks and determination of the compound's structure. However, in compounds such as sugars that contain many similar structures, peaks can overlap even in two-dimensional NMR, making analysis difficult. In such cases, three-dimensional NMR is effective. This document presents examples of applying three-dimensional NMR using oligosaccharides as model compounds.
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There are individual differences in drug metabolism activity, and these differences are believed to be due to genetic polymorphisms. In the field of pharmacogenomics (PGx), there is an expectation for the application of personalized medicine that takes into account the effects of drugs, side effects, and drug interactions by investigating genetic polymorphisms. This document introduces the analysis of genetic polymorphisms related to drug metabolism using a designed analysis tool based on mass array methods. Genetic polymorphisms will be determined from the analysis results of SNPs (Single Nucleotide Polymorphisms) and CNVs (Copy Number Variations) for 20 drug metabolism-related genes.
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FeFETs (ferroelectric transistors) using HfxZr1-xO2 (HZO) are expected to be candidates for next-generation transistors due to their high-speed operation and low power consumption, but they have the drawback of low polarization. To improve the characteristics of FeFETs, enhancing the ferroelectricity of HZO is effective, and methods have been proposed to apply stress to the HZO layer to increase the crystalline phases that exhibit ferroelectricity. This case evaluated the stress generated in each layer during cooling in a laminated structure composed of materials with different coefficients of linear expansion, such as TiN, W, Pt, and HZO, using the finite element method. Measurement Method: Computational Science, AI, Data Analysis Product Fields: LSI, Memory, Electronic Components, Manufacturing Equipment, Parts Analysis Objectives: Shape Evaluation, Structural Evaluation, Stress, Strain Evaluation For more details, please download the materials or contact us.
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5-ALA (5-Aminolevulinic Acid) is a type of natural amino acid found in the bodies of plants and animals. It is known for activating mitochondria and is said to have effects such as fatigue recovery and mood enhancement when taken orally. This document presents a case study where the content of 5-ALA in black vinegar, amazake, sake, and wine, which are generally considered to have high levels, was quantified using LC-MS/MS. For black vinegar and amazake, analyses were conducted on two different products, and the quantification results were compared. Measurement method: LC/MS Product field: Food Analysis purpose: Composition evaluation and identification For more details, please download the document or contact us.
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It is known that dipole interactions occur between spatially close atomic nuclei in molecules and crystals. The strength of this interaction is inversely proportional to the sixth power of the interatomic distance, allowing the measurement of interatomic distances using the SEDOR method (Spin Echo Double Resonance) with solid-state NMR.
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Non-contact three-dimensional measurement device
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Perovskite solar cells have excellent conversion efficiency in a film form and can be manufactured at low cost, leading to active research and development towards practical application. TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is effective for component analysis of the HTM layer (hole transport layer), evaluation of main components, dopants, and the depth distribution of impurities. This document presents a case study of depth analysis from the HTM layer to the perovskite layer. Measurement method: TOF-SIMS Product field: Solar cells Analysis purpose: Identification, distribution evaluation For more details, please download the document or contact us.
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Perovskite solar cells are composed of various types of organic materials depending on their purpose and role. This document presents an example of qualitative analysis of organic materials using LC/MS. By utilizing high-resolution MS spectra and MS/MS spectra, we were able to identify hole transport materials and additives in the hole transport layer. It is also possible to quantify the identified materials by comparing between samples or using standard samples. Measurement method: LC/MS Product field: Solar cells Analysis purpose: Composition evaluation and identification For more details, please download the document or contact us.
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- The dielectric strength of the test sample is evaluated by applying high voltage to the test sample and measuring the voltage at which insulation breakdown occurs. - Testing in various temperature and humidity environments (such as 85°C/85%RH, 150°C, 175°C, etc.) is also possible. - It is also possible to measure the time until insulation breakdown occurs. By measuring the time to insulation breakdown at multiple voltages, a lifespan (V-t) curve can be drawn. - Testing in oil is also supported.
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- This is a durability test in which a bias is applied in a direction that makes it difficult for current to flow between the collector-emitter and drain-source of power devices under high temperature or high temperature and humidity conditions. - During the test, the leakage current is monitored over time, allowing observation of behavior until insulation breakdown occurs. - It is compatible with various standards such as AQG324 and JEITA ED-4701.
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- The transient thermal resistance value (Rthjc) of power devices, heat dissipation substrates, etc., will be measured based on JESD51-14. - If it is a power device, testing can be conducted with the actual device as is. When testing heat dissipation substrates, it is necessary to mount various semiconductor chips as heat sources. - We also support the prototyping of test devices, and evaluation can be conducted even with individual components provided.
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- It is possible to evaluate the durability against thermal and electrical stress by periodically applying a large current to the power device (On/Off state). - Equipped with a transient thermal resistance measurement mechanism (T3Ster), it measures the thermal resistance values of the entire power device and each component, allowing for quantitative assessment of degradation over cycles. - We also support the prototyping of test devices, so evaluation is possible even with the provision of individual components.
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? Surface analysis of solid materials is possible ? Light elements such as Li, which are difficult to evaluate with EDX, can be assessed ? By using Ga ions as primary ions, evaluation can be performed with high surface resolution (on the order of tens of nm) ? The detection limit is as low as a few ppm (depending on the element), making it suitable for trace impurity element analysis compared to EDX ? Measurements can be conducted without atmospheric exposure by using a dedicated holder ? Since it is mounted on a SEM device, morphological observation and elemental analysis can be performed within the same chamber
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By changing the conditions of ultraviolet irradiation from carbon arc discharge, as well as the temperature, humidity, and water spray inside the chamber, it is possible to conduct accelerated testing of degradation that occurs due to outdoor use of products, parts, and materials, which takes a long time in nature.
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By analyzing characteristic X-rays using a wavelength dispersive X-ray spectrometer (WDX), measurements with higher sensitivity than those obtained with an energy dispersive X-ray spectrometer (EDX) can be achieved. Additionally, using soft X-ray emission spectroscopy (SXES) allows for the acquisition of information regarding local chemical bonding states.
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NMR is a technique used to estimate the structure of compounds by observing the phenomenon (resonance phenomenon) in which atomic nuclei absorb specific electromagnetic waves corresponding to their respective chemical environments when exposed to electromagnetic waves in a magnetic field. The main constituent elements of organic compounds, such as hydrogen and carbon, allow for structural analysis and quantitative analysis of organic compounds through the measurement of 1H and 13C NMR spectra, based on their chemical shifts and integral intensities. Additionally, by analyzing the splitting patterns of the spectra, it is also possible to estimate the spatial relationships between the atomic nuclei. In inorganic compounds, insights regarding their structures can be obtained by measuring nuclei other than 1H and 13C, known as multinuclear nuclei (for example, 19F, 29Si, 31P, etc.). NMR includes solution NMR, used for samples soluble in solvents, and solid-state NMR, used for samples that are insoluble or poorly soluble in solvents.
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The characteristic of methods such as ESI and FD, which are other soft ionization techniques, is that they can ionize polymers with molecular weights of tens of thousands, which are difficult to ionize using other methods. In MALDI-MS analysis, which combines MALDI with time-of-flight (TOF) mass spectrometry, mass spectra of polymer materials can be measured, allowing for qualitative analysis. By utilizing a mass spectrometer that switches between the high mass resolution spiral mode and the wide mass range linear mode, a broad range of materials can be evaluated. Furthermore, it is also possible to perform MS/MS analysis by colliding the sample molecular ions separated and detected in spiral mode with inert gas to induce fragmentation, allowing for the mass spectrum of the generated fragment ions to be measured. This enables the molecular structure analysis of polymer materials.
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It is possible to evaluate organic materials such as organic EL and proteins, as well as solutions, substrates, thin films, and powders of luminescent materials. It is possible to evaluate not only the fluorescence spectrum but also at which wavelength the most emission occurs (excitation spectrum). By using low-temperature measurements (77K) and the built-in shutter, it is possible to separately acquire fluorescence and phosphorescence.
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It is also referred to as HX-PES or HXPES. Due to high-energy X-ray excitation, it allows for bulk state evaluation up to approximately 50 nm deep, which is several to about 10 times deeper than conventional XPS, as well as damage-free evaluation of bonding states at interfaces. This device is a laboratory instrument equipped with a GaKα source (9.25 keV), which enables a reduction in the time lag from sample preparation to measurement. - Bulk-sensitive state evaluation (approximately up to 50 nm) - Non-destructive evaluation of buried interface bonding states - Evaluation using deep inner shell orbitals (avoiding overlapping Auger peaks in XPS, analysis using the non-split 1s orbital) It also includes options for measurements combined with sputtering using GCIB (Gas Cluster Ion Beam), angle-resolved measurements, Al source (1.49 keV), neutralization guns, and measurements under non-exposure to the atmosphere. - Damage-free sputter cleaning using GCIB (depth profiling is generally not possible) - Depth-direction comparison of bonding states using Al source and angle-resolved measurements - Evaluation under non-exposure to the atmosphere
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- Visualization of attraction and repulsion due to the electric dipole effect of piezoelectric samples is possible. - Quantitative evaluation of the sample's expansion and contraction due to piezoelectric response is a reference value. - AFM images can also be obtained simultaneously.
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It is also possible to apply voltage to the sample, measure the temperature profile in the chamber, and conduct sampling evaluations during the specified cycle.
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- We accommodate tests not only in accordance with standards but also tests tailored to your requests, even if they fall outside the standards. - We have a variety of fixtures for gripping and securing. Additionally, we can also handle the creation of custom fixtures.
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We evaluate the effects of vibrations and durability on electronic components, electronic devices, and other products during use or transportation.
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We evaluate the impact of shocks that electronic components, electronic devices, and other products experience during use or when dropped, as well as their durability.
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1. Temperature and Humidity Cycle Test By repeatedly applying temperature differences between high and low temperatures, the resistance to temperature changes and humidity is evaluated in a short time. 2. Condensation Test Humidity is controlled during high-temperature exposure to evaluate the effects of condensation that occurs due to repeated high-temperature and high-humidity environments.
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We evaluate and determine the sealing performance of sealed conditions for hollow structure components and the like.
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It is compatible with both leaded and lead-free solder.
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Bake, perform moisture absorption pre-treatment to reproduce storage conditions, and after reflow, check for the occurrence of delamination or cracks.
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- Temperature gradient control of up to 15°C/min based on sample temperature is possible. - Complies with standard tests JESD22-A104E and IEC60749-25. - Accurate standard testing of sample temperature lamp plate at 15°C/min or below (-40 to 125°C) is possible.
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By applying shock or vibration to the sample and detecting the sound generated when tiny foreign objects within the hollow structure collide with the walls, it is possible to prevent issues such as shorts before they occur.
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- MM (Machine Model) test: A test that simulates damage caused by the discharge of static electricity accumulated in metals and other materials. - HBM (Human Body Model) test: A test that simulates damage caused by the discharge of static electricity accumulated in the human body. - CDM (Charged Device Model) test: A test that simulates damage caused by the discharge of static electricity occurring when a charged conductor comes into contact with terminals of different potentials. - Latch-up test*: Evaluates the resistance to the phenomenon of latch-up, where excessive current continues to flow in devices with a parasitic thyristor structure. *Corresponds to pulse current injection method and power supply overvoltage method.
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Rubber products contain various additives such as vulcanization accelerators, antioxidants, plasticizers, and lubricants. This document presents case studies of the analysis of additives found in commercially available rubber products. After immersing the rubber in an organic solvent, the resulting solution was analyzed using LC/MS/MS, revealing the presence of several additive components, including N-(1,3-dimethylbutyl)-N'-phenyl-1,4-phenylenediamine, which is commonly used as an antioxidant. By conducting LC/MS/MS analysis, comprehensive qualitative analysis is possible.
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This method allows for simultaneous measurement of the sample's surface roughness and mechanical property distribution, as well as infrared absorption images (functional group distribution) at selected absorption bands, by conducting measurements in conjunction with the AFM system. AFM-IR has the following features: - It enables evaluation with very high spatial resolution (on the nanoscale), allowing for spectral and imaging measurements in small areas. - Similar analyses can be performed by using the FT-IR library.
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O-PTIR has the following features: - It allows for spectral and image measurements in small areas due to its spatial resolution (maximum spatial resolution: less than 1μm). - No need for thin sectioning (effective for samples that are difficult to thin section, such as foreign materials). - Measurements can generally be performed non-destructively. - Similar analyses can be performed using the FT-IR library.
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Fitting is performed using various computational models on the force curve, which is an AFM measurement technique, to obtain elastic and viscoelastic data. ? Data can be measured in micro-regions that are consistent with DMA testing machines and nanoindenters. ? Applicable to materials with various hardness ranging from 10 kPa to 100 GPa. ? Fitting is possible using elastic models (DMT, Hertz, JKR) and viscoelastic models. ? Elastic modulus and viscoelastic modulus mapping can be performed using the above models. ? Frequency dependence (0.1 to 20 kHz) can be evaluated at each analysis point. ? Measurements can be conducted with temperature changes (room temperature to 250°C).
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TG-DTA-MS continuously evaluates not only TG and DTA but also the volatile components (MS). - TG allows for the detection of weight changes on the order of percentage. - DTA provides insights into reactions such as pyrolysis, melting, sublimation, oxidation, combustion, and phase transitions. - MS enables the structural estimation of volatile components and decomposition products.
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In secondary ion mass spectrometry (SIMS), due to phenomena such as surface roughness, the knock-on effect where atoms present on the surface are pushed inward by ion irradiation, and crater bottom roughness, it may not be possible to obtain sharp elemental distributions. To address this issue, the SSDP method (Back-Side SIMS) involves performing SIMS analysis from the substrate side (the back side) after thinning the sample. This technique allows for a more accurate evaluation of elemental distribution without being affected by the sample shape or measurement conditions.
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The IP method utilizes the sputtering phenomenon, where sample atoms are ejected from the sample surface when an ion beam with aligned energy and direction is irradiated onto the sample. It is also referred to as the CP method (Cross-section Polish). The ion species used is typically a noble gas (Ar in MST) that does not pose concerns for chemical reactions with the sample. In the AES analysis of the processed surface, the components of the shielding plate (Ni, P) were below the detection limit. ■Features - Wide-area cross-section processing is possible (approximately 500μm to 1mm) - No impact from mechanical polishing damage - Minimal surface contamination - Non-exposure to the atmosphere, cooling processing is possible
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There are mainly three types of dyes, which are used according to the observation target. - Osmium tetroxide (OsO4) It selectively reacts with the unsaturated polymer material's ?CH=CH- (double bond). - Ruthenium tetroxide (RuO4) It cross-links with the amorphous parts of saturated polymer materials such as polyolefins. - Phosphotungstic acid (H3[P(W3O10)4]·xH2O, abbreviated as PTA) It reacts with polyamides and other materials containing the -CONH functional group.
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- Possible to identify high resistance abnormal areas - The current flowing through the wiring is weak (pA) - Measurement is possible even with a surface protective film present - Measurement is possible even with multilayered wiring - Measurement is possible under conditions almost identical to SEM observation
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? High-speed sample processing is possible with pico-second pulse lasers. ? Light-transmitting samples such as glass can also be processed.
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