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  6. Total support service for cross-sectional grinding, processing, observation, and analysis.

Total support service for cross-sectional grinding, processing, observation, and analysis.

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last updated:Jun 26, 2025

アイテス
アイテス
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  • Official site

We undertake contract processing and manufacturing of cross-sections of various parts and materials.

At Aites, we undertake contract processing of cross-sections of various components and materials, including electronic components, mounted circuit boards, semiconductors, compound semiconductors, power devices, films, resin molded products, solar panels, and LCD glass. We also conduct observation and analysis of the produced cross-sections, providing contract analysis for defect analysis and quality evaluation. 【Service List】 ■Mechanical polishing ■CP processing ■Microtome ■FIB processing ■Analysis of semiconductor diffusion layers, etc. *For more details, please refer to the PDF document or feel free to contact us.

    Analytical Equipment and DevicesAnalysis Services
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Total support service for cross-sectional grinding, processing, observation, and analysis.

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  • Related Link - https://www.ites.co.jp
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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catalog(73)

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Total support service for cross-section grinding, processing, observation, and analysis.

Total support service for cross-section grinding, processing, observation, and analysis.

OTHER
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Example of analysis using EBSD (whisker)

Example of analysis using EBSD (whisker)

OTHER
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[Data] Structural Analysis of MEMS Components

[Data] Structural Analysis of MEMS Components

TECHNICAL
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Observation of diamond clarity

Observation of diamond clarity

TECHNICAL
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Oblique CT observation of the laminated substrate

Oblique CT observation of the laminated substrate

TECHNICAL
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Measurement of solder crack rate by cross-sectional observation.

Measurement of solder crack rate by cross-sectional observation.

TECHNICAL
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Example of EPMA analysis using the guide network map method.

Example of EPMA analysis using the guide network map method.

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The microtome's blade (knife) is its lifeline.

The microtome's blade (knife) is its lifeline.

TECHNICAL
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[Information] Differentiating Between Optical Microscopes and SEM

[Information] Differentiating Between Optical Microscopes and SEM

TECHNICAL
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Surface observation of IC chips implemented on LCD panels.

Surface observation of IC chips implemented on LCD panels.

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Analysis case of faulty switch contacts

Analysis case of faulty switch contacts

TECHNICAL
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Optical film light transmission characteristics

Optical film light transmission characteristics

OTHER
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Observation of CMOS image sensor cross-section by mechanical polishing.

Observation of CMOS image sensor cross-section by mechanical polishing.

TECHNICAL
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Analysis of electronic components and materials using TEM.

Analysis of electronic components and materials using TEM.

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Material evaluation using a ultra-micro hardness tester.

Material evaluation using a ultra-micro hardness tester.

OTHER
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Observation of the coating film

Observation of the coating film

TECHNICAL
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Energy Dispersive X-ray Spectroscopy (EDS)

Energy Dispersive X-ray Spectroscopy (EDS)

TECHNICAL
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[Analysis case by EDS] Bonding interface of Cu pad

[Analysis case by EDS] Bonding interface of Cu pad

TECHNICAL
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Cross-sectional observation of substrate-mounted components.

Cross-sectional observation of substrate-mounted components.

TECHNICAL
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Cross-sectional observation of substrate-mounted components (1) to (6)

Cross-sectional observation of substrate-mounted components (1) to (6)

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CP processing device Arblade5000_ Wide Area Cross-section Milling

CP processing device Arblade5000_ Wide Area Cross-section Milling

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Example of analysis of compounds at the interface between SAC solder and Ni pads.

Example of analysis of compounds at the interface between SAC solder and Ni pads.

TECHNICAL
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[Case Study] X-ray Fluoroscopy and CT Examination Equipment

[Case Study] X-ray Fluoroscopy and CT Examination Equipment

TECHNICAL
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Section preparation using a microtome

Section preparation using a microtome

TECHNICAL
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Differences in appearance due to SEM observation conditions.

Differences in appearance due to SEM observation conditions.

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3D construction through mechanical grinding

3D construction through mechanical grinding

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Introduction to Section Processing and Observation Methods

Introduction to Section Processing and Observation Methods

TECHNICAL
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MLCC crack X-ray observation

MLCC crack X-ray observation

TECHNICAL
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Cross-section polishing (CP) method for cross-sectional observation service.

Cross-section polishing (CP) method for cross-sectional observation service.

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EPMA analysis

EPMA analysis

TECHNICAL
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Regarding the curing temperature of epoxy resin during sample encapsulation.

Regarding the curing temperature of epoxy resin during sample encapsulation.

TECHNICAL
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Authenticity investigation (comparative observation)

Authenticity investigation (comparative observation)

TECHNICAL
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Examples of semiconductor observation through mechanical polishing.

Examples of semiconductor observation through mechanical polishing.

OTHER
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X-ray fluoroscopy and CT scanner 'Cheetah EVO'

X-ray fluoroscopy and CT scanner 'Cheetah EVO'

PRODUCT
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X-ray fluoroscopy and CT examination device: Case study of BGA solder crack analysis

X-ray fluoroscopy and CT examination device: Case study of BGA solder crack analysis

TECHNICAL
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[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.

[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.

TECHNICAL
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Observation of metallic tissue through chemical treatment.

Observation of metallic tissue through chemical treatment.

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The nature of analysis techniques, including defect analysis of joints, adhesion, and assembly parts.

The nature of analysis techniques, including defect analysis of joints, adhesion, and assembly parts.

TECHNICAL
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Whisker evaluation

Whisker evaluation

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[Information] Whisker Observation - Tips for Observing Flat Whiskers

[Information] Whisker Observation - Tips for Observing Flat Whiskers

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[Data] EPMA Analysis Example 2

[Data] EPMA Analysis Example 2

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Analysis of the assembly joints of the implemented components

Analysis of the assembly joints of the implemented components

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Surface mount electronic component cross-sectional observation service

Surface mount electronic component cross-sectional observation service

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[Data] Cross-sectional observation of neodymium magnets using a desktop SEM (Scanning Electron Microscope)

[Data] Cross-sectional observation of neodymium magnets using a desktop SEM (Scanning Electron Microscope)

TECHNICAL
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Observation of aluminum welding joints

Observation of aluminum welding joints

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Cross-sectional observation of large samples (expansion valve)

Cross-sectional observation of large samples (expansion valve)

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Changes due to differences in acceleration voltage during EDX analysis.

Changes due to differences in acceleration voltage during EDX analysis.

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Basic Analytical Methods for Similar Yet Distinct Objects

Basic Analytical Methods for Similar Yet Distinct Objects

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Ultrasonic Microscope 'SAM'

Ultrasonic Microscope 'SAM'

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[Data] Cross-sectional observation of solar cell modules

[Data] Cross-sectional observation of solar cell modules

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Seven spectral crystals in EPMA analysis

Seven spectral crystals in EPMA analysis

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[Data] Example of EPMA Analysis

[Data] Example of EPMA Analysis

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Evaluation of BGA/CSP solder

Evaluation of BGA/CSP solder

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Cross-sectional polishing service for implementation parts and electronic components.

Cross-sectional polishing service for implementation parts and electronic components.

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Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

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X-ray observation of electrolytic capacitors

X-ray observation of electrolytic capacitors

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Cross beam FIB cross-sectional observation

Cross beam FIB cross-sectional observation

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Crystal analysis by EBSD: Intermetallic compounds in solder joints

Crystal analysis by EBSD: Intermetallic compounds in solder joints

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[Dataset] LCD Panel Analysis Dataset

[Dataset] LCD Panel Analysis Dataset

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Crystal analysis by EBSD BGA

Crystal analysis by EBSD BGA

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[Information] Regarding the bonding interface of Cu wire bonding.

[Information] Regarding the bonding interface of Cu wire bonding.

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Cross-sectional observation by SEM: Connector plating

Cross-sectional observation by SEM: Connector plating

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FE-SEM observation (Crystal grain observation of Al wire bonding section)

FE-SEM observation (Crystal grain observation of Al wire bonding section)

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Appearance observation and measurement services

Appearance observation and measurement services

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Observation of tracking camera cross-section by mechanical polishing.

Observation of tracking camera cross-section by mechanical polishing.

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About the curing temperature of epoxy resin free of hazardous substances.

About the curing temperature of epoxy resin free of hazardous substances.

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Cryogenic ion milling cross-section processing example (rubber products)

Cryogenic ion milling cross-section processing example (rubber products)

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Effects of heat generated during cross-sectional ion milling (CP) processing.

Effects of heat generated during cross-sectional ion milling (CP) processing.

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Example of failure analysis of chip resistors

Example of failure analysis of chip resistors

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Confirmation of chiplet package structure by mechanical polishing.

Confirmation of chiplet package structure by mechanical polishing.

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Ultrasonic microscope observation of printed circuit boards

Ultrasonic microscope observation of printed circuit boards

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Observation of wire bonding shapes

Observation of wire bonding shapes

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[Analysis Case] Non-lighting Analysis in LED Lighting

[Analysis Case] Non-lighting Analysis in LED Lighting

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News about this product(14)

Confirmation of chiplet package structure by mechanical polishing.

  • Product news

Regarding the chip mounted on the main circuit board of the VR goggles manufactured by Company A, upon visual observation, it was inferred that it has a chiplet structure with multiple chips integrated. To examine the structure in more detail, we created a cross-section using X-ray CT observation and mechanical polishing, and we will introduce the structural confirmation results. *For more details, please download the PDF or feel free to contact us.*

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Cryogenic ion milling cross-section processing example (rubber products)

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We will introduce a case where cross-sections were created and observed by method regarding the adhesive parts of the tires of pull-back cars. When conducting SEM observations of the created cross-sections, fillers present inside the rubber were confirmed. It was found that the dispersion state of the fillers and the condition of the adhesive interface were not clear with fracture by liquid nitrogen or mechanical polishing. In contrast, the cross-sections created by cryo ion milling allow for clear observation of the dispersion state of the fillers contained within the rubber and the condition of the adhesive interface with the plastic substrate.

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About the curing temperature of epoxy resin free from hazardous substances.

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We conducted measurements to reconfirm the temperature of heat generation during curing, following the change to a non-toxic epoxy resin. When using a large amount of resin, we apply heat generation prevention treatment for resin embedding. Without this treatment, the temperature can rise up to 138°C during curing. However, by applying the heat generation prevention treatment even with a large amount of resin, we were able to keep the heat generation during curing within 30°C.

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Observation of tracking camera cross-section by mechanical grinding.

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I would like to introduce "Cross-sectional observation of tracking camera using mechanical polishing." Regarding the structure of the tracking camera components, when viewed from above, the lens can be identified. Although it cannot be clearly seen in the X-ray image, the lens is incorporated into the convex part. Additionally, the cross-sectional structure is similar to that of an RGB sensor, featuring a back-illuminated CMOS structure. However, since color information is not necessary for the tracking camera, there is no color filter layer. A jagged uneven shape was observed on the surface of the photodiode.

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Companynews list (109)

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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