Accurately apply particles for inspection device evaluation.
A sheet socket that enables stable inspection in semiconductor back-end process inspection! What is "PCR" that allows for high-speed and high-density measurements? Technical materials on operating principles and more will be provided!
A super high-resolution camera capable of wide-angle and ultra-high-definition imaging, suitable for various MV applications.
We deliver products that make life simpler and more comfortable.
FPD-Link III & GMSL & GVIF2 Interface Board (Serial, Parallel, MIPI Conversion)
Automatic insertion of all probe pins. Exchange of any specified pins is also possible.
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo units available for loan.
Satisfying customer needs with a lid that can control heat in various structures.
Applicable to all test environments from evaluation tests to mass production tests!
An essential tool for measuring wafer temperature distribution.
It is used in a wide range of industries such as machinery, semiconductor and LCD manufacturing equipment, industrial robots, medical and welfare, transportation equipment, construction, and aerospace!
Justem Co., Ltd., manufacturer and seller of measuring machines, processing machines, dedicated machines, and automation equipment.
Practical application of ultrasonic ultrasonic technology mounted on a spin sheet device!
It can be used for a wide range of applications, from analog semiconductors such as power supply-related ICs, operational amplifiers, and motor drivers to analog-digital mixed ICs.
We offer high-precision air sliders with a wide variety of options to accommodate various specifications!
A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.
Ideal for measuring MEMS devices! Also compatible with measurements in temperature environments.
You can choose from the 'RST Aligner' that achieves a tracking capability of 0.1μm and the space-saving, thin, and compact 'YRA Series' according to your application needs.
Test solution that does not damage solder balls or measurement substrates with soft contact!
It is suitable for visual inspection of wafers, lenses, and glass substrate surfaces.
A technical partner for our customers that supports "performance improvement" and "stable operation" of the manufacturing line.
Measurement of hydrogen peroxide trimethylamine and standard cations for semiconductor manufacturing using ion chromatography.
We handle everything from development and design to processing, welding, assembly, and inspection consistently.
Maximum size up to 1,200mm × 3,600mm can be produced. Can be made in either glass or resin.
We will explain the series of processes involved in ion implantation, which is crucial for determining the characteristics of semiconductors, using illustrations.
CCTECH's custom-made module inspection device. Based on appearance inspection, it can be fully customized to meet customer needs.
Test, 6-sided appearance inspection, laser marking, taping integrated machine.
Stainless steel 316, high temperature and high pressure compatible T-type and inline filter 'H-600 series'. This filter allows for element replacement.
Enhancing noise tolerance for industrial applications! Achieving operation as an alternative to floppy disk drives.
It has a high permeability and excellent noise suppression effect.
Supporting high image quality of displays through coating tests of semiconductor wafers.
Detecting foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!
Pellet and powder foreign matter inspection device *Compatible with clean rooms and can be installed in factories, capable of detecting 9µm!
Inspection is possible only on the surface of the double-sided implementation substrate! Also compatible with 3D tomography inspection. *Detailed explanatory materials will be provided.
SPD EEPROM programmer capable of reading, saving, and writing SPD from DIMM/SODIMM on a Windows PC.
Up to 3 earthquake monitoring devices can be connected.
Achieving high-precision inspection! Fully compatible with appearance inspection of chip components from fine chips to special sizes.
Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.
This is an MBE device compatible with compact sizes (1 inch to 2 inches).
The nano-resolution piezo positioning stage is used in various fields around the world, so you can use it with confidence.
Multi-standard compatible "RFID Comprehensive Testing Machine" using proprietary "LabVIEW" measurement technology.
Replace with elastomer seals! Introducing our metal seals.
We provide design and manufacturing services for automatic assembly machines and labor-saving machinery in various fields, including automotive parts, electronic components, semiconductors, and construction and civil engineering.
SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.
High current/high voltage probing is possible! Achieving contact on both sides of the wafer.
We will introduce products related to semiconductors and cleanroom equipment.
Automating visual inspection of wafer defects.
A high-purity gas pressure transmitter has been released from Value Impact's in-house brand "PressVac."
Process analyzer / Online analyzer for continuous monitoring of hydrogen peroxide concentration in the CMT process!
Analytical methods essential for the processes and quality control in semiconductor manufacturing.
Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.
Reliable solder ball repair is performed using high-speed image processing and a uniquely developed repair unit.
This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.
This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.
This is a device for drying 300mm wafers that have been cleaned after double-sided polishing.
This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.
This machine is a device for measuring the thickness of φ4, 5, 6, and 8-inch wafers.
High-precision detection of defects in semiconductor wafers. Contributes to improved production efficiency.
By using heat reflection and laser technology, LIT narrows down the heat generation points beneath the metal layer, which were difficult to detect, to as small as 2μm, breaking through the limits of heat generation analysis.
A device for arranging broken wafers in order of lot number.
TFE electron gun, high-voltage power supply device "FE503XP" for electron beam lithography!
Temperature control unit with free combination of handlers.
We apply torque to the test specimen and conduct various durability and performance tests.
It is possible to provide the entire system! We create testing fixtures capable of controlling many ICs.
CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.
From the pursuit of steel materials, we measure with high-precision inspection equipment such as temperature control of heat treatment furnaces, hardness tests, microstructure inspections, and dimensional inspections, delivering only products that have passed our planning!
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?
Can be used for various applications! Such as patterning of organic devices and cutting of metal wiring for ICs, etc.
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
It is a device that measures the dynamic characteristics of semiconductors according to specified test conditions.
Tester for AC characteristic testing in semiconductor backend processes! Capable of conducting avalanche tolerance tests on products.
Micro cutting of chemically strengthened glass using ultrashort pulse lasers.
Products compatible with 8 types of voltage! Reference voltage generator with buffer.
Supporting precise control of robotics in semiconductor wafer coating tests.
Applying semiconductor technology to evaluate the environmental resistance of agricultural materials.
The filter membrane is made of PTFE and has a two-layer structure.
Labor-saving and rationalization machinery (excerpt 01)
Labor-saving and rationalization machinery (excerpt 03)
Strong in harsh environments. Flexible response from tank to duct with PP processing.
Perfect for voltage measurement! The probe's stray capacitance is minimal + the impedance is infinite!
Automated X-ray inspection device for inspecting solder bumps on wafers.
It is a UV irradiation device that can utilize DUV light up to 248nm and allows for wavelength selection and switching.
We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.
Chip, Melf, lead-type resistor sorting machine
