A sheet socket that enables stable inspection in semiconductor back-end process inspection! What is "PCR" that allows high-speed and high-density measurements? Technical materials on operating principles and more will be provided!
We deliver products that make life simpler and more comfortable.
A soundproof shield room that combines electromagnetic shielding performance and sound insulation performance, creating an excellent inspection environment!
It is a UV irradiation device that can utilize DUV light up to 248nm and allows for wavelength selection and switching.
Significant cost reduction for AI appearance inspection systems!! A starter set that can be introduced more easily, more simply, and in a short period of time.
Contributes to the efficiency and quality improvement of semiconductor manufacturing processes. Since there are no specialized parts, maintenance is easy, allowing for quick recovery. It achieves low costs.
The measurement medium temperature ranges from -10°C to a maximum of 300°C.
It is suitable for visual inspection of wafers, lenses, and glass substrate surfaces.
Easily create cross-sectional observation samples for SEM! Marking is possible with a positional accuracy of ±2.5μm.
Achieving probing compatible with multiple simultaneous measurements! Correcting misalignment after dicing.
For the semiconductor industry! Process analyzer / Online analyzer for monitoring tetramethylammonium hydroxide (TMAH) in developer solutions!
The cooperative test system will accommodate inspections of all types of circuit boards.
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo units available for loan.
CCTECH's custom-made module inspection device. Based on appearance inspection, it can be fully customized to meet customer needs.
High-precision 3D surface measurement to meet the demands of complex surface measurements.
Stainless steel 316 high-temperature and high-pressure ball valve (ball valve) "H6800 series". Pressure resistance is compatible up to a maximum of 41 MPa.
Measurement of wounds and foreign objects is also possible! It is suitable for internal observation of silicon chips!
Detecting foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!
It is possible to inspect appearance defects occurring in the wafer process and dicing process quickly and with high precision.
Improve work efficiency with mapping software! XY automatic stage for microscopes.
We propose improvements to tester capabilities in line with production quantities.
We provide advanced specialized technology as an integrated R&D foundry.
Measurement of hydrogen peroxide trimethylamine and standard cations for semiconductor manufacturing using ion chromatography.
Super engineering plastics / machining / extensive experience in various industries such as semiconductor equipment, medical device parts, and food machinery parts!
CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.
A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.
The CTA8280 is an IC tester specialized for analog products. It is characterized by high accuracy in voltage and current measurements.
Cost-reduction model of Prestige II developed specifically for 8-inch wafers. It is capable of simultaneously inspecting defects and irregularities on the wafer.
Industry-first: Achieving dynamic characteristic testing of high current in wafer testing.
Resistance rate / Sheet resistance measuring instrument [CRESBOX]
Automatic insertion of all probe pins. Exchange of any specified pins is also possible.
A compact design device programmer compatible with a vast array of programmable devices.
It is an infrared microscope specialized in the observation and measurement of the oxidation region of VCSELs.
This is an image inspection machine using a 2D CCD camera that performs high-speed six-sided inspection of chip components.
Perfect for voltage measurement! The probe's stray capacitance is minimal + the impedance is infinite!
A light source device used for performance testing (inspection) of semiconductors.
It is possible to propose a customized FFU that fits the size of the enclosure.
Prevents slight misalignment of devices, improving operability even when using high-magnification microscopes.
We will explain the series of processes involved in ion implantation, which is crucial for determining the characteristics of semiconductors, using illustrations.
This is a manual prober that eliminates "misalignment" and "blurring" caused by zoom, enabling high-precision and stable probing even for fine circuits.
This is an MBE device compatible with compact sizes (1 inch to 2 inches).
Achieving high magnification, high resolution, and high density resolution! Compact X-ray TV inspection device.
About twice the hardness of cast iron! Ideal for high-precision measurements, with short delivery times and low-cost precision granite plates.
A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.
Aiming for a new standard in semiconductor peripheral equipment inspection! We will shorten the takt time through wide-field imaging.
Adopting a low-dust structure, ideal for clean environments! Achieving high speed, high rigidity, and long-term maintenance-free operation!
The nano-resolution piezo positioning stage is used in various fields around the world, so you can use it with confidence.
High-precision measurement of the positional deviation of patterns on the wafer surface/backside.
Flagship model: A handler that thoroughly pursues excellent stability and significant reductions in working time.
High-precision alignment (within 1μm of the target) is now possible in all directions of X-Y-Z-θx-θy-θz.
We will solve our customers' problems by leveraging our know-how in KG gearboxes!! ◆Special environment specifications ◆High-speed rotation specifications ◆Space-saving design
A collection of case studies on the implementation of process analyzers / online analyzers actually introduced around the world!
Quantification of anions in high-concentration sodium hydroxide solution for semiconductor manufacturing using ion chromatography.
Automating the concentration process involving neutralization and matrix removal in ion chromatography to measure impurities in high-purity ammonium hydroxide used in semiconductor manufacturing.
Process analyzer / Online analyzer for continuous monitoring of hydrogen peroxide concentration in the CMT process!
LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.
We handle everything from development and design to processing, welding, assembly, and inspection consistently.
A new pixel-shifting SWIR camera capable of high-resolution (5M, 12M, 21M) imaging in the SWIR band and applicable for various inspection purposes has arrived!
A super high-resolution camera capable of wide-angle and ultra-high-definition imaging, suitable for various MV applications.
We have accepted the order for the production of a probe holder used for foundation measurement devices, with a minimum estimate of half a day.
LD is supplied in a tray storage state, and automatic pickup and measurement are performed continuously!
Press the start button to automatically measure all items continuously! Introduction to the laser diode inspection device.
We specialize in processing sizes from 500 to 1200 mm and can guarantee precision in the 1000s range. Please feel free to consult with us first.
It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.
It is a device for inverting and transferring silicon wafers.
It is a semi-automatic device for visual inspection of 8-inch silicon wafers.
STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.
By using heat reflection and laser technology, LIT narrows down the heat generation points beneath the metal layer, which were difficult to detect, to as small as 2μm, breaking through the limits of heat generation analysis.
We have successfully achieved long-life operation of the device. The high durability of the degassing device is essential for avoiding issues with the liquid delivery pump and for flow rate reproducibility and stability.
It is a high-precision high-voltage power supply device for TFE electron guns!
It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute foreign substances and scratches, as well as their quantitative evaluation.
We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis regarding the malfunctioning part!
We will analyze trace amounts of organic contaminants adhered to the material using TD-GC/MS.
HL-720 Tube-Mounted IC 3D Appearance Inspection Device
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
It is also possible to impart water-repellent properties to the tapered surface on the outer circumference to improve ESI efficiency!
Custom design and production available according to customer requests!
Test, 6-sided appearance inspection, laser marking, taping integrated machine.
This is a high-precision SC-cut OCXO in a 7×5mm size. It is a high stability, fixed frequency type with ±20ppb (-40 to +85℃). It is a standard stock item.
Remove the insulation layer of the IC! A system with a small footprint and high cost-effectiveness.
Introduction to Theoretical Analysis of Wire Probe Wear
We offer high-precision air sliders with a wide variety of options to accommodate various specifications!
Using two inspection cameras for semiconductor wafer inspection equipment, the tact time has been reduced by half. 3D bump inspection is also possible.
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
Inspection of semiconductor defects, unevenness, and stains is handled by a single machine using the same inspection process.
If you're looking for low-cost, high-performance semiconductor IC testers, choose CCTECH. We're revealing the reasons why we can provide extensive support!
Consistent production system from grinding to assembly! We also accommodate small lots.
