The optimal imaging inspection device for TGV inspection has been completed!
Automatic insertion of all probe pins. Exchange of any specified pins is also possible.
We deliver products that make life simpler and more comfortable.
Cutting-edge testing systems supporting the AI era! Solutions that achieve semiconductor testing with technology and quality.
High-precision alignment (within 1μm of the target) is now possible in all directions of X-Y-Z-θx-θy-θz.
A soundproof shield room that combines electromagnetic shielding performance and sound insulation performance, creating an excellent inspection environment!
Contributes to the efficiency and quality improvement of semiconductor manufacturing processes. Since there are no specialized parts, maintenance is easy, allowing for quick recovery. It achieves low costs.
If you're looking for low-cost, high-performance semiconductor IC testers, choose CCTECH. We're revealing the reasons why we can provide extensive support!
It is suitable for visual inspection of wafers, lenses, and glass substrate surfaces.
Introducing an experimental polarization device for polarizing piezoelectric elements!
Using a UV-LED with a wavelength of 365nm, at room temperature irradiation, with low running costs!
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo units available for loan.
Satisfying customer needs with a lid that can control heat in various structures.
SPD EEPROM programmer capable of reading, saving, and writing SPD from DIMM/SODIMM on a Windows PC.
Achieving ultra-thin, high rigidity, and high precision.
We respond to product development, manufacturing, inspection, and shipping in all fields with short lead times.
LD is supplied in a tray storage state, and automatic pickup and measurement are performed continuously!
Press the start button to automatically measure all items continuously! Introduction to the laser diode inspection device.
500℃ temperature cycle thin film stress measurement device FLX-2320-S
It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute foreign substances and scratches, as well as their quantitative evaluation.
Helicoils, which are often incorporated into design specifications. By embedding them into the base material, they enhance thread strength and enable repeated use!
Test, 6-sided appearance inspection, laser marking, taping integrated machine.
Applicable to all test environments from evaluation tests to mass production tests!
Strong in harsh environments. Flexible response from tank to duct with PP processing.
266nm CW (continuous wave) laser 10mW - 550mW @ 266nm Compact head Air-cooled, low noise
Automatic measurement of the static characteristics of discrete semiconductors! Tester for power devices/modules compatible with up to 50kV and 1200A.
Full panel size support! A high-capacity, high-speed, and high-precision inspection solution compatible with a maximum point count of 24Kch.
A kit that allows you to easily learn about the properties of permalloy and its magnetic shielding performance.
Back grinding is possible with various types of semiconductors! You can observe the elements and the condition of defects.
Our stainless steel drawn products are used in medical-related and industrial equipment-related applications!
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
A must-see for those considering a review of production equipment! Solve your problems with processing long materials!
"The most important points considered when introducing a long-length processing machine!" Introducing an interview after the installation of the long-length processing machine.
~Easily choose specifications on the web~ Semi-order porous chuck
Stainless steel 316 high-temperature and high-pressure ball valve (ball valve) "H6800 series". Pressure resistance is compatible up to a maximum of 41 MPa.
Ideal for small-batch, multi-variety production! Equipment with excellent operability that does not require operator skills.
Conventional high-speed measurement capability about 10 times faster! It is possible to capture the shape of the edge in just a few seconds!
Heat resistance up to 175°C! A rich lineup covering large currents and wide rated power!
Detecting foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!
Detects foreign particles in devices. Capable of testing over 2000 parts per hour.
A light source device used for performance testing (inspection) of semiconductors.
The semiconductor curve tracer is a state-of-the-art device capable of handling a maximum peak of 3000V and a maximum peak current of 1000A.
Automated X-ray inspection device for inspecting solder bumps on wafers.
OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.
Consolidating decades of technology developed with contact probes for semiconductor testing!
This is an MBE device compatible with compact sizes (1 inch to 2 inches).
The number of output channels and other output signals can also be customized according to your requests!
It is used in a wide range of industries such as machinery, semiconductor and LCD manufacturing equipment, industrial robots, medical and welfare, transportation equipment, construction, and aerospace!
Adopting electrically neutral atomic beams! Surface analysis equipment that solves charging issues.
A group of masters in semiconductor polishing processing.
Machining / Firiru Co., Ltd.
Significant cost reduction for AI appearance inspection systems! Easy detection of pattern anomalies.
Small semiconductor electrical measurement inspection marking appearance inspection taping device. High-speed processing composite equipment.
Defects in expansion can also be measured! SemiScope enables spectral line analysis.
This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).
This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.
It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.
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We undertake precision processing of a wide variety of resins.
Zirconia (ZrO2) has high bending strength and compressive strength at room temperature, and its fracture toughness is extremely high.
High-precision inspection equipment compatible with transparent materials.
Automating visual inspection of wafer defects.
Establishing a consistent production system for design, processing, assembly, and inspection, not only for difficult-to-cut materials processing and metal machining.
Our company has introduced the latest processing equipment and is committed to precision parts processing with thorough quality control, striving to enhance customer trust and satisfaction.
We provide our customers with a consistent production of technologies such as difficult-to-machine materials processing, soldering, welding, and assembly.
The layered metal mesh filter offers more options for mesh opening size and thickness (number of layers). Additionally, adding a radius to the corners makes it easier for materials to enter.
Measurement of hydrogen peroxide trimethylamine and standard cations for semiconductor manufacturing using ion chromatography.
Analytical methods essential for the processes and quality control in semiconductor manufacturing.
Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.
Full-color appearance inspection device "AURCA Series"
We provide high-quality circuit processing and wiring processing services using FIB. We achieve a high processing yield!
Maximum size up to 1,200mm × 3,600mm can be produced. Can be made in either glass or resin.
Reliable solder ball repair is performed using high-speed image processing and a uniquely developed repair unit.
A super high-resolution camera capable of wide-angle and ultra-high-definition imaging, suitable for various MV applications.
High-precision detection of defects in semiconductor wafers. Contributes to improved production efficiency.
We have accepted the order for the production of a probe holder used for foundation measurement devices, with a minimum estimate of half a day.
Half-day estimate at the shortest / A must-see for those who are thinking, 'I want to ask...'
Leave silicon carbide and silicon nitride to JFC.
Particle size, quantity, and pattern. A coating device that does not compromise.
Accurately apply particles for inspection device evaluation.
A device for arranging broken wafers in order of lot number.
A device that transfers 25 wafers to a carrier or boat at once.
Industry-specific catalog of a Taiwanese comprehensive electronic measuring instrument manufacturer with a 25% share of the global market!
High-performance SoC/Analog test system enables excellent multimedia audio/video chip testing.
Temperature control unit with free combination of handlers.
High-speed device automatic writing machine with multi-nozzle.
FPD-Link III & GMSL & GVIF2 Interface Board (Serial, Parallel, MIPI Conversion)
Main roller groove shape inspection machine for wire cutting machines. The inspection device is mounted on the roller, allowing for measurement of the groove shape profile monitor and shape images.