Semiconductor inspection/test equipment Weekly Product Rankings

A device that transfers 25 wafers to a carrier or boat at once.

• Semiconductor inspection/test equipment

A device for arranging broken wafers in order of lot number.

• Semiconductor inspection/test equipment

We deliver products that make life simpler and more comfortable.

• Semiconductor inspection/test equipment

High-speed line inspection at SWIR 2K×1, 110kHz

• Monochrome camera
• Semiconductor inspection/test equipment

Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo units available for loan.

• Visual Inspection Equipment
• Semiconductor inspection/test equipment
• Defect Inspection Equipment

High voltage connector

• Semiconductor inspection/test equipment
• Other Connectors
• Other Auto Parts

A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.

• Inspection fixture
• Semiconductor inspection/test equipment

Leave silicon carbide and silicon nitride to JFC.

• Fine Ceramics
• Other machine elements
• Semiconductor inspection/test equipment

Custom design and production available according to customer requests!

• Semiconductor inspection/test equipment
• Other inspection equipment and devices

CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.

• Semiconductor inspection/test equipment
• Other machine elements

Test, 6-sided appearance inspection, laser marking, taping integrated machine.

• Semiconductor inspection/test equipment

Stainless steel 316, high temperature and high pressure compatible T-type and inline filter 'H-600 series'. This filter allows for element replacement.

• filter
• Piping Materials
• Semiconductor inspection/test equipment

Perfect for voltage measurement! The probe's stray capacitance is minimal + the impedance is infinite!

• Semiconductor inspection/test equipment

Frequency stability of 10⁻¹¹. Over 1,000 units delivered to major manufacturers as light sources for precision interferometric measurements for smartphone and automotive lenses, as well as semiconductor wafers.

• Optical Measuring Instruments
• Semiconductor inspection/test equipment

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

• Semiconductor inspection/test equipment

A high-purity gas pressure transmitter has been released from Value Impact's in-house brand "PressVac."

• Semiconductor inspection/test equipment

It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for simple cleaning (brush + water) of φ300 mm silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We have successfully achieved long-life operation of the device. The high durability of the degassing device is essential for avoiding issues with the liquid delivery pump and for flow rate reproducibility and stability.

• Deaeration device
• Analytical Equipment and Devices
• Semiconductor inspection/test equipment

Industry-first: Achieving dynamic characteristic testing of high current in wafer testing.

• Semiconductor inspection/test equipment

Resistance rate / Sheet resistance measuring instrument [WS-3000]

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

PN Tester [PN-1S]

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Automatic insertion of all probe pins. Exchange of any specified pins is also possible.

• Tester
• Semiconductor inspection/test equipment

Stainless steel 316 high-temperature and high-pressure ball valve (ball valve) "H6800 series". Pressure resistance is compatible up to a maximum of 41 MPa.

• valve
• Piping Materials
• Semiconductor inspection/test equipment

It is possible to inspect appearance defects occurring in the wafer process and dicing process quickly and with high precision.

• Semiconductor inspection/test equipment
• Visual Inspection Equipment

The company "Leap" from Taiwan, known for its ROM writer IC programmers, is a manufacturer of IC programmers certified by major semiconductor manufacturers around the world.

• Semiconductor inspection/test equipment

Mercury Prober CV/IV Measurement System

• Semiconductor inspection/test equipment

Achieving high magnification, high resolution, and high density resolution! Compact X-ray TV inspection device.

• Semiconductor inspection/test equipment

Transport ultra-thin wafers with a thickness of 20μm by bending, warping, and without damage in a non-contact manner.

• Other semiconductor manufacturing equipment
• Wafer
• Semiconductor inspection/test equipment

Ultra-thin stage featuring a groundbreaking modular structure (patented)

• Semiconductor inspection/test equipment
• Other machine elements
• Actuator

It is used in a wide range of industries such as machinery, semiconductor and LCD manufacturing equipment, industrial robots, medical and welfare, transportation equipment, construction, and aerospace!

• Other machine elements
• Milling machine
• Semiconductor inspection/test equipment

Femtosecond fiber laser for two-photon lithography and semiconductor inspection.

• Semiconductor inspection/test equipment

We provide high-quality services and products, prioritizing customer satisfaction above all.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

Full support from FPC design, prototyping, and mass production to board power-on testing, appearance inspection systems, and FA automation! TAIYO FPC SOLUTIONS!

• Semiconductor inspection/test equipment
• Printed Circuit Board
• Circuit board design and manufacturing

For the semiconductor industry! Process analyzer / Online analyzer for monitoring tetramethylammonium hydroxide (TMAH) in developer solutions!

• Analytical Equipment and Devices
• Wafer
• Semiconductor inspection/test equipment

ONE DAY RESCUE. We will shape it on that day. Express service. Short delivery time.

• Prototype Services
• Other machine elements
• Semiconductor inspection/test equipment

Introducing a 21-megapixel CoaXPress-over-Fiber (CoF) camera that supports image transmission at up to 425 fps!

• Semiconductor inspection/test equipment

We have accepted the order for the production of a probe holder used for foundation measurement devices, with a minimum estimate of half a day.

• Semiconductor inspection/test equipment

It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.

• Semiconductor inspection/test equipment

Measurement of Si wafer thickness, front and back surface P/N determination.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that extracts silicon wafers from a dedicated cassette using edge handling and measures the thickness of a set pattern.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Large-diameter silicon wafer measuring instrument

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

The very popular TME series

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

This is a device that removes silicon wafers from a dedicated cassette and measures the thickness at the set points.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement device for silicon wafers with a diameter of φ200mm and φ300mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of Si, SiC, and other wafers with a diameter of φ100mm to φ150mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of various types of wafers below φ4"

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the edge of a wafer and measures its diameter through image processing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Classified by resistivity and thickness categories.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device for inverting and transferring silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

It is a device that loads wafers one by one.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for storing φ300 mm wafers, which have completed processing, one by one into a Teflon cassette for submersion.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Loading and unloading of φ150 mm and φ125 mm silicon wafers.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for drying 300mm wafers that have been cleaned after double-sided polishing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

A device capable of performing three types of operations.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for surface inspection of wafers after polishing.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that detects the wafer edge using green LED light and measures the diameter by comparing it with a calibration wafer (reference wafer).

• Semiconductor inspection/test equipment

This machine is a device for measuring the thickness of φ4, 5, 6, and 8-inch wafers.

• Semiconductor inspection/test equipment

A kit that allows you to easily learn about the properties of permalloy and its magnetic shielding performance.

• Electron beam lithography equipment
• Semiconductor inspection/test equipment
• Other inspection equipment and devices

This is a microchip made from high-purity materials with excellent chemical resistance, heat resistance, and ultraviolet transmittance.

• Semiconductor inspection/test equipment
• Glass

It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute foreign substances and scratches, as well as their quantitative evaluation.

• Semiconductor inspection/test equipment
• Other Sanitation Inspections
• Other appearance and image inspection equipment

We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis regarding the malfunctioning part!

• Analysis Services
• Contract Analysis
• Semiconductor inspection/test equipment

Back grinding is possible with various types of semiconductors! You can observe the elements and the condition of defects.

• Analysis Services
• Semiconductor inspection/test equipment

300mm wafer case

• Semiconductor inspection/test equipment
• Other clean room equipment and facilities
• Wafer processing/polishing equipment

Metal coaxial test socket compatible with high-speed testing up to 112Gbps.

• Semiconductor inspection/test equipment
• Other inspection equipment and devices

We have a proven track record in static electricity measures and charge prevention, from atmospheric environments to vacuum environments.

• Other semiconductors
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.

• Analytical Equipment and Devices
• Other machine elements
• Semiconductor inspection/test equipment

High-performance semi-automatic prober capable of measuring microcurrents at the fA level.

• Other physicochemical equipment
• Semiconductor inspection/test equipment

Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?

• Semiconductor inspection/test equipment

Up to 20mm! Measurement is possible with a wide measurement gap!

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Parker A-LOK Instrumentation Tube Fitting

• Semiconductor inspection/test equipment

It is possible to measure up to 32 wafers of power semiconductors.

• Semiconductor inspection/test equipment

Resistance rate / Sheet resistance measuring instrument [NC-80MAP]

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Resistance rate / Sheet resistance measuring instrument [CRESBOX]

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments

Next-generation memory compatible mass production 16-channel ultra-high-speed gang programmer.

• Semiconductor inspection/test equipment

A compact design device programmer compatible with a vast array of programmable devices.

• Semiconductor inspection/test equipment

Complete all-in-one solution from ROM writing to laser stamping and appearance inspection!

• Semiconductor inspection/test equipment

Device for removing organic substances attached to wafers.

• Semiconductor inspection/test equipment
• Wafer processing/polishing equipment

Enhancing noise tolerance for industrial applications! Achieving operation as an alternative to floppy disk drives.

• Semiconductor inspection/test equipment

Conventional high-speed measurement capability about 10 times faster! It is possible to capture the shape of the edge in just a few seconds!

• Semiconductor inspection/test equipment
• Wafer processing/polishing equipment
• Image analysis software

We can provide a wide range of proposals tailored to your needs.

• Semiconductor inspection/test equipment
• Capacitor
• power supply