A sheet socket that enables stable inspection in semiconductor back-end process inspection! What is "PCR" that allows for high-speed and high-density measurements? Technical materials on operating principles and more will be provided!
We deliver products that make life simpler and more comfortable.
SPD EEPROM programmer capable of reading, saving, and writing SPD from DIMM/SODIMM on a Windows PC.
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo units available for loan.
A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.
Leave electrical characteristic testing, laser trimming, reliability testing, and more to us!
We provide support from reliability testing to failure analysis reports!
A clear explanation of case studies related to semiconductor testing, divided into four sections: background, issues, implementation, and results!
Automatic insertion of all probe pins. Exchange of any specified pins is also possible.
It is used in a wide range of industries such as machinery, semiconductor and LCD manufacturing equipment, industrial robots, medical and welfare, transportation equipment, construction, and aerospace!
Introduction to the reliability tests conducted by Rishin Tech, including lifespan tests and strength tests.
We propose improvements to tester capabilities in line with production quantities.
A soundproof shield room that combines electromagnetic shielding performance and sound insulation performance, creating an excellent inspection environment!
Ideal for testing resin and plastic raw materials! Our uniquely developed inspection mechanism detects foreign substances and discoloration in pellets and powders! *Detection of 9μm is possible.
Achieving high magnification, high resolution, and high density resolution! Compact X-ray TV inspection device.
Adopting a low-dust structure, ideal for clean environments! Achieving high speed, high rigidity, and long-term maintenance-free operation!
High-precision alignment (within 1μm of the target) is now possible in all directions of X-Y-Z-θx-θy-θz.
It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute foreign substances and scratches, as well as their quantitative evaluation.
Custom design and production available according to customer requests!
Linear guide - high performance, high load circular contact type ball guide system.
Perfect for voltage measurement! The probe's stray capacitance is minimal + the impedance is infinite!
Helicoils, which are often incorporated into design specifications. By embedding them into the base material, they enhance thread strength and allow for repeated use!
We propose a layout design aimed at improving mass production efficiency and trimming accuracy.
Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.
We handle everything from development and design to processing, welding, assembly, and inspection consistently.
Frequency stability of 10⁻¹¹. Over 1,000 units delivered to major manufacturers as light sources for precision interferometric measurements for smartphone and automotive lenses, as well as semiconductor wafers.
Reliable solder ball repair is performed using high-speed image processing and a uniquely developed repair unit.
Thickness measurement of Si, SiC, and other wafers with a diameter of φ100mm to φ150mm.
By using heat reflection and laser technology, LIT narrows down the heat generation points beneath the metal layer, which were difficult to detect, to as small as 2μm, breaking through the limits of heat generation analysis.
To achieve low cost and high precision, we are switching from Japanese manufacturers' testers to overseas manufacturers' testers.
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
Satisfying customer needs with a lid that can control heat in various structures.
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Resistance rate / Sheet resistance measuring instrument [NC-10]
It is a manufacturer of IC programmers certified by major semiconductor manufacturers worldwide, produced by "Leap Corporation" in Taiwan.
Enhancing noise tolerance for industrial applications! Achieving operation as an alternative to floppy disk drives.
Conventional high-speed measurement capability about 10 times faster! It is possible to capture the shape of the edge in just a few seconds!
Strong in harsh environments. Flexible response from tank to duct with PP processing.
A light source device used for performance testing (inspection) of semiconductors.
Effective for analyzing defects and crystal defects! Equipped with interfaces for a wide range of cryostats.
Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.
Leave everything from the design and manufacturing of vacuum devices to maintenance work to us!
We can easily accommodate a tight budget. RF amplifier IC tester.
Achieving ultra-thin, high rigidity, and high precision.
Introducing an experimental polarization device for polarizing piezoelectric elements!
Automatic measurement of the static characteristics of discrete semiconductors! Tester for power devices/modules compatible with up to 50kV and 1200A.
You can choose from the 'RST Aligner' that achieves a tracking capability of 0.1μm and the space-saving, thin, and compact 'YRA Series' according to your application needs.
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We undertake precision processing of a wide variety of resins.
A collection of case studies on the implementation of process analyzers / online analyzers actually introduced around the world!
Process analyzer / Online analyzer for continuous monitoring of hydrogen peroxide concentration in the CMT process!
LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.
A new pixel-shifting SWIR camera capable of high-resolution (5M, 12M, 21M) imaging in the SWIR band and applicable for various inspection purposes has arrived!
Press the start button to automatically measure all items continuously! Introduction to the laser diode inspection device.
This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.
Maximum size up to 1,200mm × 3,600mm can be produced. Can be made in either glass or resin.
Contributes to the efficiency and quality improvement of semiconductor manufacturing processes. Since there are no specialized parts, maintenance is easy, allowing for quick recovery. It achieves low costs.
The cooperative test system will accommodate inspections of all types of circuit boards.
TFE electron gun, high-voltage power supply device "FE503XP" for electron beam lithography!
This is the high-voltage power supply unit 'IB303XS' for FIB ion guns, which also helps shorten the development period!
Back grinding is possible with various types of semiconductors! You can observe the elements and the condition of defects.
It can be used for a wide range of applications, from analog semiconductors such as power supply-related ICs, operational amplifiers, and motor drivers to analog-digital mixed ICs.
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
Semiconductors, dies, package sorters. This is a device that performs visual inspection after extracting from tubes, trays, and taping/reels, and then repackages them.
CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.
We provide total solutions for implementation through implementation-related equipment and systems, starting with Panasonic, to solve our customers' implementation challenges!
This product is specifically developed for a Peltier temperature controller that can be easily set up.
Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?
Test, 6-sided appearance inspection, laser marking, taping integrated machine.
This is a high-precision SC-cut OCXO in a 7×5mm size. It is a high stability, fixed frequency type with ±20ppb (-40 to +85℃). It is a standard stock item.
Can be used for various applications! Such as patterning of organic devices and cutting of metal wiring for ICs, etc.
We provide a one-stop service from semiconductor test development to the launch of semiconductor testing and semiconductor testing outsourcing.
Applicable to all test environments from evaluation tests to mass production tests!
Applicable to all test environments from evaluation tests to mass production tests!
Laser shape processing: Cutting of brittle ceramic materials.
Tester for AC characteristic testing in semiconductor backend processes! Capable of conducting avalanche tolerance tests on products.
Up to 20mm! Measurement is possible with a wide measurement gap!
Parker A-LOK Instrumentation Tube Fitting
It is possible to measure up to 32 wafers of power semiconductors.
A compact design device programmer compatible with a vast array of programmable devices.
Stainless steel 316, high temperature and high pressure compatible T-type and inline filter 'H-600 series'. This filter allows for element replacement.
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Resistance rate / Sheet resistance measuring instrument [NC-80MAP]
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Resistance rate / Sheet resistance measuring instrument [CRESBOX]
It generates clean and dry air by removing moisture and carbon dioxide (CO2) from compressed air.
A semiconductor optical amplifier capable of broadband optical amplification in the 1.5μm long wavelength band.
Measurement of wounds and foreign objects is also possible! It is suitable for internal observation of silicon chips!
It is an infrared microscope specialized in the observation and measurement of the oxidation region of VCSELs.
Coating tests that support the miniaturization and high functionality of semiconductor devices.
This is an image inspection machine using a 2D CCD camera that performs high-speed six-sided inspection of chip components.
High-precision inspection of output line misalignment, pitch between cells, and cell chips and cracks.
Detect foreign substances and discoloration in pellets and powders with our independently developed inspection mechanism!