It is suitable for visual inspection of wafers, lenses, and glass substrate surfaces.
We deliver products that make life simpler and more comfortable.
Visualize surface foreign substances, dirt, and scratches! It is well-received as a daily management tool for yield management, quality control, cleaning management, and hygiene management. *Demo units available for loan.
SPD EEPROM programmer capable of reading, saving, and writing SPD from DIMM/SODIMM on a Windows PC.
A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.
Full panel size support! A high-capacity, high-speed, and high-precision inspection solution compatible with a maximum point count of 24Kch.
Support for a total of 48K points in both vertical and horizontal directions! A high-speed inspection solution for multi-panel arrangements of large full-panel PCBs (500×620mm).
A soundproof shield room that combines electromagnetic shielding performance and sound insulation performance, creating an excellent inspection environment!
It is used in a wide range of industries such as machinery, semiconductor and LCD manufacturing equipment, industrial robots, medical and welfare, transportation equipment, construction, and aerospace!
Full panel size support! A high-capacity, high-speed, and high-precision inspection solution compatible with a maximum point count of 24Kch.
Supports a maximum of 112Kp up and down! Achieving multi-pin and high-precision inspection of large HDI boards.
Expansion of measurement conditions and built-in 64 LCR meters enable faster and more accurate inspections!
Consolidating information on partnerships of semiconductor companies, such as business integrations and corporate acquisitions! Introducing information services.
A device for arranging broken wafers in order of lot number.
Back grinding is possible with various types of semiconductors! You can observe the elements and the condition of defects.
Satisfying customer needs with a lid that can control heat in various structures.
Connecting from planning to beyond with "innovation." Your solution partner for testing and quality.
Automatic insertion of all probe pins. Exchange of any specified pins is also possible.
It is an infrared microscope specialized in the observation and measurement of the oxidation region of VCSELs.
The measurement medium temperature ranges from -10°C to a maximum of 300°C.
Strong in harsh environments. Flexible response from tank to duct with PP processing.
Crystal orientation and polarity are clear in 15 minutes! Stable surface analysis is possible without the influence of charging!
High-precision measurement of the positional deviation of patterns on the wafer surface/backside.
Flagship model: A handler that thoroughly pursues excellent stability and significant reductions in working time.
Supports high-density, multi-pin inspection. Achieves high-precision continuity and insulation testing for large HDI substrates and interposers.
Overall positioning accuracy ±2.5µm! A high-precision inspection device ideal for inspecting large, multi-pin semiconductor package substrates.
Reliable solder ball repair is performed using high-speed image processing and a uniquely developed repair unit.
Particle size, quantity, and pattern. A coating device that does not compromise.
Multiple different measurement item conditions can be set, allowing for continuous testing.
If you're looking for low-cost, high-performance semiconductor IC testers, choose CCTECH. We're revealing the reasons why we can provide extensive support!
It is possible to propose a customized FFU that fits the size of the enclosure.
Stainless steel 316 high-temperature and high-pressure ball valve (ball valve) "H6800 series". Pressure resistance is compatible up to a maximum of 41 MPa.
The choke coils from Shōshin Electric are effective as common mode noise filters for noise reduction in switching power supplies and inverter equipment.
Ideal for testing resin and plastic raw materials! Our uniquely developed inspection mechanism detects foreign substances and discoloration in pellets and powders! *Detection of 9μm is possible.
Up to 3 earthquake monitoring devices can be connected.
InGaAs (SWIR) camera compatible microscope
Achieving high magnification, high resolution, and high density resolution! Compact X-ray TV inspection device.
Adopting a low-dust structure, ideal for clean environments! Achieving high speed, high rigidity, and long-term maintenance-free operation!
Five-axis machining for semiconductor manufacturing equipment parts [Leave cost reduction to Philir Co., Ltd.]
You can choose from the 'RST Aligner' that achieves a tracking capability of 0.1μm and the space-saving, thin, and compact 'YRA Series' according to your application needs.
Significant cost reduction for AI appearance inspection systems!! A starter set that can be introduced more easily, more simply, and in a short period of time.
Significant cost reduction for AI appearance inspection systems! Start distortion inspection immediately.
Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.
Classified by resistivity and thickness categories.
We will provide high-value-added analysis services by integrating AI with cutting-edge analytical technologies.
Automating visual inspection of wafer defects.
A high-purity gas pressure transmitter has been released from Value Impact's in-house brand "PressVac."
Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.
Overall alignment accuracy ±2.5μm! Inspection equipment for large individual pieces/quarter panels.
LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.
The optimal imaging inspection device for TGV inspection has been completed!
The layered metal mesh filter offers more options for mesh opening size and thickness (number of layers). Additionally, adding a radius to the corners makes it easier for materials to enter.
We accommodate various needs such as analog circuit design, high-speed circuit design, and differential wiring.
The cooperative test system will accommodate inspections of all types of circuit boards.
By conducting a complete visual inspection of the chips before implementation, we can reduce losses in subsequent processes and improve yield! Ideal for acceptance inspection and screening in module assembly!
Reliable solder ball repairs are performed by a repair unit that has accumulated unique image processing and proven results.
LD is supplied in a tray storage state, and automatic pickup and measurement are performed continuously!
Shortest half-day estimate / A5052 (aluminum material) / NC lathe processing with a vacuum chuck tip + anodizing treatment.
Super engineering plastics / machining / extensive experience in various industries such as semiconductor equipment, medical device parts, and food machinery parts!
A super high-resolution camera capable of wide-angle and ultra-high-definition imaging, suitable for various MV applications.
High-precision detection of defects in semiconductor wafers. Contributes to improved production efficiency.
Contributes to the efficiency and quality improvement of semiconductor manufacturing processes. Since there are no specialized parts, maintenance is easy, allowing for quick recovery. It achieves low costs.
It excels in high sensitivity detection, quantification, and portability, making it suitable for quality inspection and research and development settings. It contributes to the detection of minute foreign substances and scratches, as well as their quantitative evaluation.
Practical application of ultrasonic ultrasonic technology mounted on a spin sheet device!
High-speed device automatic writing machine with multi-nozzle.
HL-720 Tube-Mounted IC 3D Appearance Inspection Device
Helicoils, which are often incorporated into design specifications. By embedding them into the base material, they enhance thread strength and allow for repeated use!
Custom design and production available according to customer requests!
Test, 6-sided appearance inspection, laser marking, taping integrated machine.
Achieve fast deep learning for object detection, image classification, and feature extraction!
CCTECH's custom-made module inspection device. Based on appearance inspection, it can be fully customized to meet customer needs.
The CTA8280 is an IC tester specialized for analog products. It is characterized by high accuracy in voltage and current measurements.
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
Our company manufactures transport and inspection equipment using robots and drive systems for the purpose of reducing labor.
You can choose between N2 pressurization and pump pressurization!
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Resistance rate / Sheet resistance measuring instrument [NC-10]
Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]
Film thickness measurement device capable of measuring film thickness on wafer glass substrates and mirror substrates.
It is possible to measure up to 32 wafers of power semiconductors.
Industry-first: Achieving dynamic characteristic testing of high current in wafer testing.
Easily create cross-sectional observation samples for SEM! Marking is possible with a positional accuracy of ±2.5μm.
A kit has been developed to modify the current FOUP load port for N2 purge functionality within 8 hours. There have been 3,000 units delivered.