The sale of the appearance inspection device "AURCA series," which supports RDL defect inspection, bump defect inspection, and TSV defect inspection, has begun!
Achieving a size and low price that large companies cannot offer. With a compact design that is easy to introduce into laboratories, customization to specifications that match wafers and special substrates is also flexible.
Analytical methods essential for the processes and quality control in semiconductor manufacturing.
Simultaneous measurement of inorganic and organic components in minute specific areas.
Examples of applications used in a wide range of areas such as graph creation, matrix calculations, and numerical solutions of simultaneous differential equations.
If you have challenges with streamlining wet processes or saving space, this is a must-see. We are currently offering materials that introduce an overview of process integration technology.
A wide range of products including ingots and 4-inch, 6-inch, and 8-inch wafers! Leave the procurement of high-quality, low-cost SiC wafers to us.
Fine glass cutting processing, glass cutting processing
In addition to high-purity SiC for semiconductor device components, overseas SiC wafers, and refractory SiC, we also offer contract services for laser processing that is compatible with SiC components!


















































































































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