A wide range of products including ingots and 4-inch, 6-inch, and 8-inch wafers! Leave the procurement of high-quality, low-cost SiC wafers to us.
The AI-equipped appearance inspection device "AURCA Series" for semiconductor wafers and panels has arrived! It can also inspect semiconductor package substrates and printed circuit boards!
Simultaneous measurement of inorganic and organic components in minute specific areas.
In addition to high-purity SiC for semiconductor device components, overseas SiC wafers, and refractory SiC, we also offer contract services for laser processing that is compatible with SiC components!
The sale of the appearance inspection device "AURCA series," which supports RDL defect inspection, bump defect inspection, and TSV defect inspection, has begun!
It can grasp and transfer fragile films and ultra-thin sheets non-contact.
Prototype support, small quantity support, 4 to 12 inch support, optional film thickness (10nm to 20μm), substrate arrangement possible, support for supplied substrates, short delivery time.
Quantification of anions in high-concentration sodium hydroxide solution for semiconductor manufacturing using ion chromatography.
Automating quality control of the chloride ion concentration in the acidic copper plating bath used for Cu deposition on semiconductor wafers using a potentiometric automatic titration system.
Simultaneous analysis of ammonium hydroxide, hydrogen peroxide, and hydrochloric acid in the wafer cleaning tank monitored by inline near-infrared analyzer!
Process analyzer / Online analyzer for continuous monitoring of hydrogen peroxide concentration in the CMT process!
For the semiconductor industry! Process analyzer / Online analyzer for monitoring tetramethylammonium hydroxide (TMAH) in developer solutions!
Evaluation of Organic Coatings on Metals Using Electrochemical Measurement Devices Based on ISO 17463 - Paints and Varnishes
Analytical methods essential for the processes and quality control in semiconductor manufacturing.





























































































































