List of Measurement and Analysis products
- classification:Measurement and Analysis
5761~5805 item / All 55282 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Ideal for micro-machining! Achieves deburring of holes and double-sided machining in one pass, which was difficult with conventional tools!
- Other machine tools
We will be exhibiting at Mecatronics Tech Japan 2021 from October 20 (Wednesday) to October 23 (Saturday)!
Our company will exhibit at "Mechatrotech Japan 2021," which will be held at Portmesse Nagoya from Wednesday, October 20 to Saturday, October 23, 2021. We will introduce our tools, including the 'Bar Off Tool' capable of chamfering and deburring from a diameter of 0.8 mm, and the 'FEM' tool breakage detection device that reliably detects breakage. We look forward to your visit. (Booth number: 2B12)
Tracking evaluation of phase transitions and crystallinity changes during the heating process.
- Contract Analysis
Information about valence bands and intra-gap levels can be obtained by element.
- Contract Analysis
"Technical Information: Analysis of Dental Implants Using TOF-SIMS" and two other items have been released.
We have published the following three analysis case studies on the MST website: - Analysis of dental implants using TOF-SIMS - Evaluation of GaN using soft X-ray emission spectroscopy For more details, please visit the MST website. http://www.mst.or.jp/
Measurement targeting microdomains is possible.
- Contract Analysis
Technical information "Raman 3D mapping of organic multilayer films" and three other items have been released.
We have published the following three analysis case studies on the MST website: - Raman 3D mapping of organic multilayer films - Evaluation of metal and organic contamination on wafer surfaces - Foreign substance analysis on metal components using Raman For more details, please visit the MST website. http://www.mst.or.jp/
Depth direction analysis will be conducted to a depth of several micrometers.
- Contract Analysis
- Contract manufacturing
We will evaluate the internal structure of the device in a comprehensive manner.
- Contract Analysis
- Other electronic parts
Evaluation of GFRP is possible according to the purpose.
- Contract Analysis
- Contract measurement
It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).
- Contract Analysis
The molecular weight distribution of hyaluronic acid can be evaluated by electrophoresis.
- Contract measurement
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
- Contract measurement
- Transistor
- Memory
Lipid mapping of mouse brain using MALDI-MS.
- Contract measurement
- Animal cells
- Imaging and image analysis equipment
It is effective for checking the impact of packaging materials on samples and the residues before and after changes to equipment.
- Contract measurement
- Paper and pulp
Simultaneous measurement of inorganic and organic components in minute specific areas.
- Contract measurement
- Wafer
- Memory
Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).
- Contract Analysis
- Contract measurement
- Contract Inspection
Reduce the impact of foreign object surrounding information with appropriate sampling.
- Contract Analysis
Lattice image analysis using the FFTM method
- Contract Analysis
Capable of observing large-area surface shapes.
- Contract Analysis
X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.
- Contract Analysis
Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.
- Contract Analysis
Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.
- Contract Analysis
Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.
- Contract Analysis
Waveform analysis and evaluation of the depth distribution of bonding states by Ar sputtering.
- Contract Analysis
We have compiled frequently asked questions regarding your order in an FAQ format.
- Contract Analysis
Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.
- Contract Analysis
A lineup of AlGaN standard samples with various Al compositions.
- Contract Analysis
Visualization of pharmaceutical components using TOF-SIMS.
- Contract Analysis
Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.
- Contract Analysis
Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.
- Contract Analysis
Quantitative analysis of main components and trace components is possible.
- Contract Analysis
Verification of the luminous characteristics of the chip and phosphor in white LEDs.
- Contract Analysis
Evaluation of the composition and distribution of impurities in polymer materials using XRF.
- Contract Analysis
Measurement examples of cleaning residues using TOF-SIMS.
- Contract Analysis
It is possible to evaluate the depth distribution of B, Al, N, P, and As in SiC with high sensitivity.
- Contract Analysis
Imaging SIMS enables the evaluation of localized elements.
- Contract Analysis
Imaging SIMS allows for the evaluation of localized elements.
- Contract Analysis
It is possible to identify the components of each layer of PET bottles using TOF-SIMS.
- Contract Analysis
Cool the sample and evaluate the shape of the separator more accurately.
- Contract Analysis
- Contract measurement
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
- Contract Analysis
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
- Contract Analysis
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
- Contract Analysis
Estimation of film thickness using the average free path of photoelectrons.
- Contract Analysis
Evaluation of localized elements is possible with imaging SIMS.
- Contract Analysis
Evaluation of activation rate is possible through composite analysis.
- Contract Analysis
The coordinate linkage function with the foreign object inspection device allows for the evaluation of specific foreign objects.
- Contract Analysis
Evaluate film thickness, density, and bonding state.
- Contract Analysis
Capable of evaluating the composition of the main elemental components of GaN-based LEDs in the depth direction.
- Contract Analysis