List of Other measuring instruments products
- classification：Other measuring instruments
9616～9630 item / All 16650 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
Millimeter-wave low-loss dielectric film measurement! Efficient and reliable measurements are possible.
- Other measurement, recording and measuring instruments
Are you having trouble with poor lighting? We will solve it with technology that ensures reliable illumination!
- Other machine elements
- Other measurement, recording and measuring instruments
Introducing the LSV Laser Surface Speed Meter for non-contact, high-precision measurement of transport speed and length!
- Other measurement, recording and measuring instruments
Use an appropriate light source wavelength for doped wafers to accommodate challenging doped wafer thickness measurements.
- Other measurement, recording and measuring instruments
- Sensors
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor
Rich experience in flatness measurement in high-temperature environments, foreign matter inspection during manufacturing processes, edge shape inspection of button batteries, and measurement of separa...
- Other measurement, recording and measuring instruments
No XY stage needed! Thickness and distance (displacement) measurement possible using the principle of spectral interference! Also suitable for wafer inspection applications.
- Other inspection equipment and devices
- Other measurement, recording and measuring instruments
- Scanner
No need to worry about the effects of vibration! Achieves easy operability without relying on the environment! Also suitable for wafer inspection applications.
- Color camera
- Other inspection equipment and devices
- Other measurement, recording and measuring instruments
Recommended inexpensive type focused on cost. Sensors for thickness measurement and distance measurement. Also suitable for wafer inspection applications.
- Other inspection equipment and devices
- Other measurement, recording and measuring instruments
- Sensors
Achieves high-resolution shape measurement. A wide variety of sensor probes are available. Inline measurement of flatness and thickness is also possible. Suitable for wafer inspection applications.
- Other measurement, recording and measuring instruments
Operates for 2 to 3 years on three AA batteries! The range between the transmitter and receiver is up to 70 meters with a mesh network.
- Other security and surveillance systems
- Other measurement, recording and measuring instruments
Introducing the CHRocodile 2IT DW1000 with analog I output!
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
Thickness measurement of various materials, capable of handling both during and after processing across a wide measurement range with a single device! Also suitable for wafer inspection applications.
- Other measurement, recording and measuring instruments
- Sensors
Portable probe-integrated film thickness gauge
- Coating thickness gauge
We will exhibit at the 28th R&R Architectural Regeneration Exhibition 2024 from June 12 to 14, 2024.
Sankou Electronic Research Institute will be exhibiting at the "28th R&R Architectural Regeneration Exhibition 2024" to be held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday), 2024. Our company is a manufacturer of coating thickness gauges, pinhole detectors, gloss meters, and inspection measurement equipment. If you have any requests or inquiries regarding inspection or measurement devices, please feel free to let us know. We will be showcasing non-destructive measurement devices such as eddy current thickness gauges and ultrasonic thickness gauges for waterproofing layers (such as urethane, resin linings, and waterproof sheets). Additionally, we will also exhibit other construction-related inspection equipment, including pinhole detectors, moisture meters, and rebar detectors. We look forward to your visit.