List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
451～495 item / All 679 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
This is a small chip inductor of the air-core winding type for high-frequency machines.
- Semiconductor inspection/test equipment
- transformer
- power supply
[New Product from Sagami Electric] Power inductor "HER8080C" for automotive equipment, achieving compact size and low profile.
Features • Power inductor for automotive equipment with a compact and low-profile design • Improved current characteristics by using different magnetic materials for drum core and ring core • *Current characteristics improved by approximately 20% compared to existing same size • HER8080C achieves the same characteristics as a 10mm square coil • AEC-Q200 compliant • Operating temperature range: -40℃ to +150℃ (including self-heating) Applications • Automotive-related equipment (car audio, car navigation, ECU, LED headlights, etc.) • Others (various power supplies, industrial equipment, medical and beauty devices, energy equipment, etc.)
We provide our services to over 800 leading home appliance and industrial equipment manufacturers in Japan, the United States, and various European countries, receiving high praise.
- Semiconductor inspection/test equipment
- Capacitor
- power supply
[Taiyo Yuden New Product] Commercialization of high-voltage multilayer ceramic capacitors with a rated voltage of 2000V.
Taiyo Yuden has commercialized a high-voltage multilayer ceramic capacitor, the "XMK432 B7472KY" (4.5x3.2x2.0mm, X7R), with a rated voltage of 2000V. This product is used for lightning surge protection (Note 1) in base station communication devices and wireless LAN access point input/output sections, as well as for noise suppression applications in DC-DC converters for industrial equipment. For lightning surge protection, a high-voltage multilayer ceramic capacitor that can withstand high surge voltages caused by lightning strikes is required. Therefore, Taiyo Yuden optimized the materials and internal structure of the multilayer ceramic capacitor to achieve the rated voltage of 2000V with the "XMK432 B7472KY." ■Terminology Explanation (Note 1) Lightning Surge - A momentary high voltage caused by lightning strikes. Many electronic devices have connections to the outside, such as antennas and cables, and if appropriate lightning surge protection measures are not taken, high voltages can be transmitted through these connections into the device, potentially leading to damage.
Automatic measurement of the static characteristics of discrete semiconductors! Tester for power devices/modules compatible with up to 50kV and 1200A.
- Other semiconductors
- Semiconductor inspection/test equipment
We deliver products that make life simpler and more comfortable.
- Semiconductor inspection/test equipment
This machine is a device for measuring the thickness of φ4, 5, 6, and 8-inch wafers.
- Semiconductor inspection/test equipment
This is a device that detects the wafer edge using green LED light and measures the diameter by comparing it with a calibration wafer (reference wafer).
- Semiconductor inspection/test equipment
It is a manufacturer of IC programmers certified by major semiconductor manufacturers worldwide, produced by "Leap Corporation" in Taiwan.
- Semiconductor inspection/test equipment
Electromagnetic scanner type (patented) allows for damage-free and non-destructive measurements at a low cost. It has functions equivalent to expensive AFM.
- Semiconductor inspection/test equipment
It is a high-voltage power supply for TFE electron guns!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
TFE electron gun, high-voltage power supply device "FE503XP" for electron beam lithography!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
This is the high-voltage power supply unit 'IB303XS' for FIB ion guns, which also helps shorten the development period!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
This is the "IB303XP," a high-voltage power supply for FIB ion guns that also helps shorten the development period!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
This is the drive power supply 'XE303XP' exclusively for soft X-ray tubes using a thermal FE emitter!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
It is a high-precision high-voltage power supply device for TFE electron guns!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
It is the high-voltage power supply unit "FE103XP" for CD-SEM and review SEM!
- Semiconductor inspection/test equipment
- Electron beam lithography equipment
- Other processing machines
Up to 3 earthquake monitoring devices can be connected.
- Other machine tools
- Semiconductor inspection/test equipment
- Metal bearings
Achieving high-precision inspection! Fully compatible with appearance inspection of chip components from fine chips to special sizes.
- Semiconductor inspection/test equipment
- Inspection robot
Achieving a flatness accuracy of 0.001mm or less (for φ12 inches).
- Semiconductor inspection/test equipment
- Wafer processing/polishing equipment
- Processing Jig
The second installment of the TDC introduction video has been completed!
The introduction video part 2 of TDC has been completed. This time, it features an introduction to management by our president, Akabane. It's a short movie of about one minute, so please take a look. You can watch the video from the "Related Information" section below. Title: TDC Management Now, we are exhibiting at "Nanotech 2018," which is being held at Tokyo Big Sight starting today. We are showcasing not only mirror samples of various materials but also finely crafted precision parts and inner diameter mirror products created through lap polishing. Additionally, we have mirror plates of size 400 and large rolls of about one meter, so please take this opportunity to check them out. Since today is Valentine's Day, we will be providing coffee and chocolate for three days. Feel free to stop by. <Exhibitors> 2/14 (Wed): President, Fujino, Arisa 2/15 (Thu): President, Fujino, Maeda 2/16 (Fri): President, Fujino, Arisa, Maeda ★ Technical meetings are also possible ★ All of our staff are looking forward to your visit.
It is a positioning support unit that allows for precise positioning of workpieces and other items at each stage of the manufacturing process quickly and simply.
- Conveyor
- Semiconductor inspection/test equipment
- Wafer processing/polishing equipment
SiC semiconductor evaluation device using photoluminescence (PL) imaging method
- Semiconductor inspection/test equipment
This device measures the thickness of wafers fixed to ceramic plates without contact, using optical probes/sensors.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This machine is a device for measuring the thickness of φ8” silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This machine is a device that performs macro and micro inspections of φ8-inch wafers in the semiconductor manufacturing process.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
We provide high-quality layout design! High-performance package-specific automatic wiring tool.
- Semiconductor inspection/test equipment
It is a device for drying wafers that have been stripped and cleaned.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a semi-automatic device for visual inspection of 8-inch silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a fixture for visual inspection of the front and back surfaces of the quartz mask.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for visual inspection and thickness measurement of 8-inch silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that performs macro inspection of wafers and micro inspection using a microscope.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for surface inspection of wafers after polishing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for visually inspecting the edges of φ300 mm silicon wafers (chip and chipping inspection).
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Pass/Fail Judgment Device
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
A device capable of performing three types of operations.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for drying 300mm wafers that have been cleaned after double-sided polishing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for simple cleaning (brush + water) of φ300 mm silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Loading and unloading of φ150 mm and φ125 mm silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device for storing φ300 mm wafers, which have completed processing, one by one into a Teflon cassette for submersion.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that loads wafers one by one.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device used for handling to perform P/N determination and visual inspection of silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device for inverting and transferring silicon wafers.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
Classified by resistivity and thickness categories.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the wafer edge using laser light and measures the diameter by comparing it with a calibration wafer (reference wafer).
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that detects the edge of a wafer and measures its diameter through image processing.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
This is a device that measures the thickness of sapphire wafers and sorts them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
It is a device that measures the thickness of silicon wafers and rearranges them according to their thickness.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment