List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

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  • Other safety and hygiene products

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For the semiconductor industry! Process analyzer / Online analyzer for monitoring tetramethylammonium hydroxide (TMAH) in developer solutions!

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  • Analytical Equipment and Devices
  • Wafer
  • Semiconductor inspection/test equipment

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We provide high-quality circuit processing and wiring processing services using FIB. We achieve a high processing yield!

  • Semiconductor inspection/test equipment
  • Semiconductors and ICs
  • Microcomputer

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Supply disruptions from semiconductor manufacturers, the electrification of the automotive industry, and the spread of 5G communication. Are you keeping up with the urgent need for alternative product evaluations, authenticity assessments, and failure analysis?

The spread of 5G communication, the electrification of the automotive industry, the intensification of US-China trade friction represented by certain semiconductor manufacturers leading to supply stoppages, and the rapid increase in digital products due to the impact of the COVID-19 pandemic are various social phenomena that are increasing the demand for semiconductors. Along with these developments, the acceleration of semiconductor supply risks is progressing. In addition to the adoption of new products, evaluation of existing and distributed products is also necessary... However, the personnel involved in new adoption and product evaluation are limited. Do you have any of these concerns? - Lack of know-how to evaluate semiconductor components - Want to evaluate alternative products but lack personnel and equipment - Want to use stock items and market products but have concerns about reliability - Unable to determine whether the delivered semiconductor products are counterfeit or genuine At Eurofins FQL, we leverage our years of experience in component evaluation and failure analysis to provide not only semiconductor evaluations but also failure analysis services. Additionally, we offer evaluations of distributed products to assist in determining the authenticity of counterfeit, imitation, or long-term stored items. Please feel free to contact us.

Automating the concentration process involving neutralization and matrix removal in ion chromatography to measure impurities in high-purity ammonium hydroxide used in semiconductor manufacturing.

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  • Analytical Equipment and Devices
  • Ion Chromatography
  • Semiconductor inspection/test equipment

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Measurement of hydrogen peroxide trimethylamine and standard cations for semiconductor manufacturing using ion chromatography.

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  • Ion Chromatography
  • Semiconductor inspection/test equipment
  • Analytical Equipment and Devices

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Inspection is possible only on the surface of the double-sided implementation substrate! Also compatible with 3D tomography inspection. *Detailed explanatory materials will be provided.

  • Semiconductor inspection/test equipment
  • X-ray inspection equipment

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Automatically inspect crystal defect voids inside silicon wafers!

  • Semiconductor inspection/test equipment
  • X-ray inspection equipment

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X-ray observation device for analysis with a high resolution of 0.25 μm focal spot size.

  • Semiconductor inspection/test equipment
  • X-ray inspection equipment

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Automated X-ray inspection device for inspecting solder bumps on wafers.

  • Semiconductor inspection/test equipment
  • X-ray inspection equipment

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High-precision inspection equipment compatible with transparent materials.

  • Semiconductor inspection/test equipment

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[Exhibition Information] We will be exhibiting at 'SEMICON JAPAN 2025'.

We will be exhibiting Kubota's semiconductor inspection equipment at SEMICON JAPAN, an international exhibition of manufacturing technologies, equipment, and materials in the semiconductor industry. All of our staff sincerely look forward to your visit. 【Exhibition Information】 Date: December 17 (Wed) - 19 (Fri), 2025, 10:00 - 17:00 Venue: Tokyo Big Sight Booth Location: W1963 *Advance registration is required for attendance. Please check the SEMICON JAPAN website for registration details.

Automating visual inspection of wafer defects.

  • Semiconductor inspection/test equipment

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[Exhibition Information] We will be exhibiting at 'SEMICON JAPAN 2025'.

We will be exhibiting Kubota's semiconductor inspection equipment at SEMICON JAPAN, an international exhibition of manufacturing technologies, equipment, and materials in the semiconductor industry. All of our staff sincerely look forward to your visit. 【Exhibition Information】 Date: December 17 (Wed) - 19 (Fri), 2025, 10:00 - 17:00 Venue: Tokyo Big Sight Booth Location: W1963 *Advance registration is required for attendance. Please check the SEMICON JAPAN website for registration details.

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

  • Semiconductor inspection/test equipment

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semicon600x600_jp.jpg

[Exhibition Information] We will be exhibiting at 'SEMICON JAPAN 2025'.

We will be exhibiting Kubota's semiconductor inspection equipment at SEMICON JAPAN, an international exhibition of manufacturing technologies, equipment, and materials in the semiconductor industry. All of our staff sincerely look forward to your visit. 【Exhibition Information】 Date: December 17 (Wed) - 19 (Fri), 2025, 10:00 - 17:00 Venue: Tokyo Big Sight Booth Location: W1963 *Advance registration is required for attendance. Please check the SEMICON JAPAN website for registration details.

SUS304 t1.0 thin plate used (with welding)

  • Semiconductor inspection/test equipment

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~Easily choose specifications on the web~ Semi-order porous chuck

  • Semiconductor inspection/test equipment

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Introducing a 21-megapixel CoaXPress-over-Fiber (CoF) camera that supports image transmission at up to 100 Gbps!

  • Semiconductor inspection/test equipment

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A new pixel-shifting SWIR camera capable of high-resolution (5M, 12M, 21M) imaging in the SWIR band and applicable for various inspection purposes has arrived!

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  • Semiconductor inspection/test equipment
  • Monochrome camera
  • Color camera

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Introducing a 21-megapixel CoaXPress-over-Fiber (CoF) camera that supports image transmission at up to 425 fps!

  • Semiconductor inspection/test equipment

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Compact, lightweight, and low-cost! The CXP interface enables high frame rates and long-distance transmission.

  • Semiconductor inspection/test equipment

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【NEW!】CIS Product Comprehensive Catalog【March 2020】

A variety of cameras are packed with features such as compact size, high speed, high image quality, high resolution, the adoption of new interfaces, and the inclusion of a CIS original image processing engine! [Contents of this issue] ■ CoaXpress cameras ■ CameraLink cameras ■ Pixel-shift cameras ■ Board cameras (GigE/USB3.0) ■ Accessories ■ Semi-custom lenses ■ Cameras equipped with our proprietary technology "Clairvu" ■ Case studies on image processing system development In addition to the models that have been well-received so far, we are excited to introduce new products: "50M high-resolution CXP camera," "25M high-speed CXP camera," "RGB+Depth information acquisition capable USB3.0 I/F ToF camera development kit," "4K high-speed Clairvu-equipped camera," and "4K camera with 18x zoom lens and Clairvu." There is a wide range of cameras suitable for various industrial applications such as traffic monitoring, broadcasting, medical, heavy steel plants, logistics, robot vision, and various inspections. Please take a look at the enhanced lineup of CIS cameras! *For more detailed information or to request an English version of the catalog, please contact our sales department.

Ideal for FA applications such as substrate and appearance inspection. A camera series that is compact, high-resolution, low-cost, capable of high frame rates, long-distance transmission, and multi-ch...

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  • Semiconductor inspection/test equipment

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2020.3月カタログ.JPG

【NEW!】CIS Product Comprehensive Catalog【March 2020】

A variety of cameras are packed with features such as compact size, high speed, high image quality, high resolution, the adoption of new interfaces, and the inclusion of a CIS original image processing engine! [Contents of this issue] ■ CoaXpress cameras ■ CameraLink cameras ■ Pixel-shift cameras ■ Board cameras (GigE/USB3.0) ■ Accessories ■ Semi-custom lenses ■ Cameras equipped with our proprietary technology "Clairvu" ■ Case studies on image processing system development In addition to the models that have been well-received so far, we are excited to introduce new products: "50M high-resolution CXP camera," "25M high-speed CXP camera," "RGB+Depth information acquisition capable USB3.0 I/F ToF camera development kit," "4K high-speed Clairvu-equipped camera," and "4K camera with 18x zoom lens and Clairvu." There is a wide range of cameras suitable for various industrial applications such as traffic monitoring, broadcasting, medical, heavy steel plants, logistics, robot vision, and various inspections. Please take a look at the enhanced lineup of CIS cameras! *For more detailed information or to request an English version of the catalog, please contact our sales department.

USB3.2 10Gbps 5 Megapixel SWIR Model

  • Monochrome camera
  • Semiconductor inspection/test equipment

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We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!

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  • Other microscopes
  • Resist Device
  • Semiconductor inspection/test equipment

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We will handle everything from the evaluation of the diffusion layer to physical analysis/chemical analysis regarding the malfunctioning part!

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  • Analysis Services
  • Contract Analysis
  • Semiconductor inspection/test equipment

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Announcement of the introduction of Talos F200E

Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with features such as drift-corrected frame integration (DCFI), which accumulates multiple frames while correcting for drift.

Back grinding is possible with various types of semiconductors! You can observe the elements and the condition of defects.

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  • Analysis Services
  • Semiconductor inspection/test equipment

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We leverage our expertise in hydraulic, pneumatic, and electrical technologies to propose and provide solutions that align with our customers' needs.

  • Assembly Machine
  • Semiconductor inspection/test equipment
  • Transport and handling robots

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We leverage our expertise in hydraulics, pneumatics, and electrical technology to propose and provide solutions that align with our customers' needs.

  • Assembly Machine
  • Semiconductor inspection/test equipment
  • Transport and handling robots

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We leverage our expertise in hydraulics, pneumatics, and electrical technology to propose and provide solutions that align with our customers' needs.

  • Assembly Machine
  • Semiconductor inspection/test equipment
  • Transport and handling robots

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Our company leverages expertise in hydraulics, pneumatics, and electrical technology to propose and provide solutions that align with our customers' needs.

  • Assembly Machine
  • Semiconductor inspection/test equipment
  • Transport and handling robots

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We leverage our expertise in hydraulic, pneumatic, and electrical technology to propose and provide solutions that align with our customers' needs.

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  • Assembly Machine
  • Semiconductor inspection/test equipment
  • Transport and handling robots

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Strong in harsh environments. Flexible response from tank to duct with PP processing.

  • Semiconductor inspection/test equipment

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Compatible with PET, PC, and FM standards, ensuring complete cleanroom and fire prevention measures.

  • Other machine tools
  • Other process controls
  • Semiconductor inspection/test equipment

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We flexibly respond to everything from software and hardware design to implementation and product assembly. "Yoho's adaptability" to the challenges of various manufacturers.

  • EMS
  • Other semiconductor manufacturing equipment
  • Semiconductor inspection/test equipment

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Capable of accommodating large circuit board assembly in 850×500mm size.

Supports large PCB assembly with a size of 850×500mm. [Precision] Chip size: 03015 Lead pitch: 0.3mm Adjacent pitch: 0.1mm [Supported Chips] BGA, CSP, QFN, SOP, QFP, LED, etc. [Supported Sizes] Minimum size: 50mm×50mm Maximum size: 500mm×850mm Board thickness: 0.5mm to 3.0mm

Contributes to the efficiency and quality improvement of semiconductor manufacturing processes. Since there are no specialized parts, maintenance is easy, allowing for quick recovery. It achieves low ...

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  • Semiconductor inspection/test equipment

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High-precision 3D surface measurement to meet the demands of complex surface measurements.

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  • Other measurement, recording and measuring instruments
  • Wafer
  • Semiconductor inspection/test equipment

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Notice of Participation in SEMICON JAPAN 2024

Our company will exhibit at "SEMICON JAPAN 2024," which will be held at Tokyo Big Sight starting December 11, 2024 (Booth number: 2705). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of the ever-evolving semiconductor manufacturing process and the improvement of semiconductor performance. We cordially invite you to visit our booth and take a look at our offerings. Exhibited products: - Non-contact thickness measurement gauge (interferometry technology) - Contact/non-contact (confocal technology) hybrid applications - Optical 3D surface roughness and shape measuring instruments - High-end 3D surface measurement for probe card inspection - Visual blade inspection system for dicing processes

High voltage connector

  • Semiconductor inspection/test equipment
  • Other Connectors
  • Other Auto Parts

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FPD-Link III & GMSL & GVIF2 Interface Board (Serial, Parallel, MIPI Conversion)

  • Other image-related equipment
  • Semiconductor inspection/test equipment

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It is a device that removes impurities attached to high-purity gas cylinders used in semiconductor manufacturing processes.

  • Semiconductor inspection/test equipment

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An industrial computer capable of implementing up to 7 expansion boards, with components freely configurable in a maximum 19-inch rack mount 4U type chassis.

  • Industrial PCs
  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices

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Supports dual-slot GPU boards compatible with PCIe 5.0. Introducing the new entry-level HPC "MR4300" series for machine vision and AI.

Contec has developed an industrial computer for HPC that can accommodate up to seven expansion boards compatible with the 13th generation Intel(R) Core(TM) processor (Raptor Lake) and the Q670E PCH chipset, and has started accepting orders for the new product, Solution-ePC(R) series "MR4300," from May 20, 2025. The new product is an HPC-oriented industrial computer that can be equipped with a high-performance 24-core, 32-thread 13th generation Intel(R) Core(TM) processor (Raptor Lake) CPU in a 19-inch rack mount 4U type chassis, ensuring long-term supply. The PCI Express 5.0 (x16) x1 slot is directly connected to the CPU, allowing for the use of the latest dual-slot GPU boards at maximum performance. It can also be switched to PCI Express 5.0 (x8) x2 slots via jumper settings, enabling the operation of two GPU boards with eight lanes of performance. Additionally, it is equipped with PCI Express 4.0 (x4) x2, PCI Express 3.0 (x4) x1, and PCI x2 slots, making it suitable for replacing development assets.

A device that transfers 25 wafers to a carrier or boat at once.

  • Semiconductor inspection/test equipment

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A device for arranging broken wafers in order of lot number.

  • Semiconductor inspection/test equipment

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High cleaning performance! The internal structure is very simple with no fluid retention areas! No metal leaching!

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  • Semiconductor inspection/test equipment

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Case study of Daiko Corporation. Achieving operational efficiency through the utilization of company-wide shared data!

  • Semiconductor inspection/test equipment

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Semiconductor device _ housing

  • Semiconductor inspection/test equipment

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Various high-precision pressure sensors necessary for flow control in semiconductor manufacturing equipment. Customization of modules is also possible.

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  • Semiconductor inspection/test equipment
  • Etching Equipment
  • Sputtering Equipment

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Would you like to introduce the pressure controller PACE for measurement testing/line inspection of semiconductor manufacturing equipment and MEMS pressure sensors?

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  • Semiconductor inspection/test equipment
  • Etching Equipment
  • Sputtering Equipment

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It is possible to provide the entire system! We create testing fixtures capable of controlling many ICs.

  • Semiconductor inspection/test equipment

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We will analyze trace amounts of organic contaminants adhered to the material using TD-GC/MS.

  • Contract measurement
  • Semiconductor inspection/test equipment

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