List of Contract Inspection products
- classification：Contract Inspection
151～165 item / All 1822 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
XRR：X-ray Reflectivity
- Contract Analysis
- Contract measurement
- Contract Inspection
![[FIB] Focused Ion Beam Processing](https://image.mono.ipros.com/public/product/image/b01/387108030/IPROS7900017760392336423.jpg?w=280&h=280){kind=small}
FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas...
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation
The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
- Contract Analysis
- Contract measurement
- Contract Inspection
Obtain information about the molecular structure and crystal structure of the sample.
- Contract Analysis
- Contract measurement
- Contract Inspection
[MST Homepage] Analysis Case "Evaluation of Bone Condition Before and After HF Treatment" has been published.
We have published analysis cases on the MST homepage. ◆Title Evaluation of Bone Condition Before and After HF Treatment ~Evaluation of Condition Before and After Chemical Treatment Using Raman Analysis~ ◆Measurement Method / Processing Method Raman / Chemical Treatment ◆Product Field Pharmaceuticals / Biotechnology ◆Analysis Purpose Evaluation of Chemical Bonding State ◆Overview HF (hydrofluoric acid) is widely used in processes such as wet etching of SiO2 and plays a very important role in semiconductor manufacturing. However, it is also a very dangerous chemical that can penetrate the skin and damage bones, requiring careful handling. The erosion of bones caused by HF occurs due to the reaction between Ca, which exists in bones as apatite, and HF, resulting in the formation of CaF2. This case introduces an evaluation of the changes in this reaction using Raman analysis. ★★For detailed data, please see the link★★
![[EBSD] Electron Backscatter Diffrac...](https://image.mono.ipros.com/public/product/image/bef/387108007/IPROS4688397342881936146.jpg?w=280&h=280){kind=small}
It is possible to easily obtain crystal information over a wide area.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[EBIC] Electron Beam Induced Curren...](https://image.mono.ipros.com/public/product/image/03a/387108025/IPROS8986659968992890200.jpg?w=280&h=280){kind=small}
A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EELS] Electron Energy Loss Spe...](https://image.mono.ipros.com/public/product/image/d11/387108027/IPROS1835117444880261851.jpg?w=280&h=280){kind=small}
By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.
- Contract Analysis
- Contract measurement
- Contract Inspection
Ion chromatography is a method for detecting ionic components in liquid samples.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[GDMS] Glow Discharge Mass Spectrom...](https://image.mono.ipros.com/public/product/image/569/2000240719/IPROS13633680634984708159.jpeg?w=280&h=280){kind=small}
Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.
- Contract Analysis
- Contract measurement
- Contract Inspection
![[TEM-EDX] Energy Dispersive X-ray S...](https://image.mono.ipros.com/public/product/image/eea/2000240814/IPROS3960834512466909797.jpg?w=280&h=280){kind=small}
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional...
- Contract Analysis
- Contract measurement
- Contract Inspection
![[ED] Electron Diffraction Method](https://image.mono.ipros.com/public/product/image/aa2/2000240821/IPROS81867168414493685965.jpeg?w=280&h=280){kind=small}
ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.
- Contract Analysis
- Contract measurement
- Contract Inspection
UV-Vis is a method that measures the intensity of light transmitted through a sample by irradiating the sample with light divided by wavelength, allowing for the determination of the sample's absorban...
- Contract Analysis
- Contract measurement
- Contract Inspection
Absolute PL quantum yield measurement is a method for determining the photoluminescence efficiency of materials.
- Contract Analysis
- Contract measurement
- Contract Inspection
High magnification observation (up to about 300,000 times) is possible.
- Contract Analysis
- Contract measurement
- Contract Inspection
Notice of publication of a written article in the May 2012 issue of Applied Physics.
In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.
![[LC/MS] Liquid Chromatography Mass ...](https://image.mono.ipros.com/public/product/image/5c5/387108008/IPROS3879984652898883434.jpg?w=280&h=280){kind=small}
It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.
- Contract Analysis
- Contract measurement
- Contract Inspection