Measurement and Analysisの製品一覧

Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

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Identification of organic components by pyrolysis GC/MS.

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Observation of orthogonal cross-sections at locations with characteristics identified in EBIC measurements of arbitrary cross-sections.

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Evaluation of the distribution state of organic materials using low-energy STEM observation and EELS measurement.

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Observation of filling degree and voids using Slice and View.

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Dismantling and sampling can be performed in a non-exposed atmospheric environment, allowing for measurements that minimize degradation and alteration.

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Imaging SIMS allows for the visualization of concentration distributions of trace elements in micro-regions.

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Identification of failure locations using an emission microscope with a high voltage power supply.

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Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.

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We will conduct analysis of various materials, including the disassembly of LEDs, phosphors, and LED chips.

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Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

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You can understand the positional relationship between the gate layer, source layer, and body layer.

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Molecular structure evaluation by TOF-SIMS and chemical state evaluation by XPS.

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Micron-order imaging measurement using TOF-SIMS.

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We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.

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Electron beam induced current method and crystal orientation analysis using SEM.

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Crystal orientation analysis using SEM.

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Using low acceleration voltage STEM, slight density differences in organic films can be observed.

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We will conduct an evaluation that combines various methods to solve the problem.

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Low-acceleration STEM observation allows for contrast even in low-density membranes.

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Wide-area observation of micro-specific locations is possible through cross-section preparation using ion polishing.

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TEM-EELS enables elemental identification and chemical state analysis in micro-regions.

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Case studies of XRD and XRR analysis of oxide semiconductors.

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It is possible to non-destructively identify the location of defects in solar cell cells.

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Trace analysis of metallic elements and atmospheric component elements.

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Evaluation of carrier diffusion layer uniformity in samples with surface roughness.

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Identification of contamination sources on the cleavage surface using TOF-SIMS.

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Identification of contamination sources on the outermost surface using TOF-SIMS.

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Evaluation of the state before and after drug solution treatment using Raman analysis.

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Identification of powders by FT-IR analysis and XRF analysis.

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It is possible to evaluate the state of the electrodes before and after charging, as well as the presence and distribution of Li.

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Samples after thermal degradation can be evaluated using LC/MS/MS, TOF-SIMS, TEM+EDX, etc.

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Evaluation of composition, bonding state, structure, and density is possible.

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Simultaneous analysis of six types of ginsenosides (Rb1, Rc, Rd, Re, Rg1, Rg3)

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Proposal for evaluation of breakdown voltage of GaN-based devices and surface heat distribution assessment.

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Non-destructive analysis of leakage points in Si-based power diodes.

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Evaluation of distribution uniformity and identification/estimation of organic matter through surface analysis of microdomains.

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Qualitative and relative comparison of SiH and states on the Si surface due to differences in processing.

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Atomic-level observation is possible with the Cs collector-equipped STEM.

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It is possible to quantitatively evaluate impurity elements.

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Visualization of components in the cross-section of tablets after harsh testing and in new products.

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Comparison of ingredients between new products and those after harsh testing; estimation of the structure of unknown components.

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Evaluation of foreign substances in resin is possible using TOF-SIMS through cross-section processing of the sample.

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Detailed structural analysis of polyester is possible.

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Structural analysis of polyimide resin is possible using thermal decomposition GC/MS method.

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It is possible to measure the hydrogen concentration in solutions such as hydrogen water.

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