List of probe products
- classification：probe
316～360 item / All 443 items
This is a single-channel optical fiber cannula essential for in vivo optogenetics. There are two types with diameters of 1.25mm and 2.5mm.
- incubator
- Optical microscope
- probe
Supports high-temperature environments up to 150℃. Direct probing of the current waveform of the IC leads mounted on the substrate.
- oscilloscope
- Ammeter
- probe
A power device for high current testing that achieves a stable connection by using multiple pin settings!
- probe
Compact and versatile measurements without restrictions on installation location or purpose! An easy-to-operate comparative measurement device!
- probe
- Other measurement, recording and measuring instruments
Introducing probes suitable for connectors and interfaces with a 1.27mm pitch!
- probe
Rails that guarantee the delivery of clean power are beginning to spread.
- Other measurement, recording and measuring instruments
- oscilloscope
- probe
Perform low-noise measurements and provide an offset function that zooms in on the DC voltage.
- Other measurement, recording and measuring instruments
- oscilloscope
- probe
From entry-level to high-end! Choose probes and software that suit your purpose, enabling measurements that meet your needs! [Free materials available!]
- oscilloscope
- probe
Equipped with high quality, we can leverage advanced expertise in development and manufacturing!
- oscilloscope
- probe
We offer a wide range of probes and probe-related products.
- probe
Designed in-house! Processed in-house! Leave it to us for custom-made IC sockets!
- probe
- socket
- Contract manufacturing
【Layered Probe Brochure Giveaway】Compatible with high current and high temperature. Achieving stable contact resistance values!
- probe
We offer various specialized types tailored to different applications. High precision, touch probes with no differential.
- Other machine elements
- probe
A new wireless communication method resistant to noise. A touch probe that can be used continuously for 180 hours on a single battery.
- Other machine elements
- probe
Affordable pricing for measurements up to DC～40GHz!
- probe
Affordable pricing for measurements up to DC～26GHz!
- probe
Affordable pricing for measurements up to DC～50GHz!
- probe
Affordable pricing for measurements up to DC～67GHz!
- probe
Affordable pricing for measurements up to DC～110GHz!
- probe
Affordable pricing for RF high power measurements from DC to 26GHz!
- probe
Compared to conventional products, the chip is approximately 33% smaller, allowing for contact with a very small chip width of about 20μm.
- probe
Affordable differential measurements from DC to 26GHz!
- probe
The stacked probe can accommodate a minimum pitch of 0.05 mm. It also demonstrates performance as a probe for power semiconductors that apply large currents. [Catalog with case studies available]
- probe
A stacked probe capable of handling a minimum pitch of 0.05 mm. It can also accommodate small semiconductors that cannot be inspected with regular probes. The movement is explained in a video!
- probe
With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!
- probe
We are introducing a comparison of contact resistance values between our products and overseas products from other companies.
- probe
Reduce the burden on semiconductors and mitigate the risks of full inspection! Enable compatibility with various pitches.
- probe
Introducing a high current probe compatible with a 2.54mm pitch and rated for a current of 12A.
- Processing Jig
- probe
We offer a wide range of options to meet various demands from low temperatures to high temperatures.
- Semiconductor inspection/test equipment
- probe
- Other physicochemical equipment
We offer a wide range of options to meet various demands from low temperatures to high temperatures.
- Semiconductor inspection/test equipment
- probe
- Other physicochemical equipment
- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit
- Semiconductor inspection/test equipment
- Other physicochemical equipment
- probe
Providing precision probes, precision parts, and precision models (such as desktopZERO).
- probe
IB series with integrated probe socket! IF series with ultra-thin probe flexible tungsten model!
- Contract manufacturing
- probe
A unique structure of a sensitive probe that supports high-precision measurement!
- Contract manufacturing
- probe