List of 新横浜 products

Crystal Defect Measurement Device (Light Scattering Tomography)

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Infrared Spectroscopic Ellipsometry

• Optical Measuring Instruments
• Analytical Equipment and Devices
• Other environmental analysis equipment

Thin-film solar cell panel measurement device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Lifetime measurement device for single crystal silicon blocks

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Inline wafer measurement module

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

A tabletop automatic printing test machine capable of gravure printing, flexo printing, bar coating, and full coating/lamination through head replacement.

• Printing Machinery

FastGate Inline CV/IV Measurement Device

• Other inspection equipment and devices

Roll-to-roll spectral ellipsometer

• Semiconductor inspection/test equipment
• Distance measuring device
• Spectroscopic Analysis Equipment

Test coater suitable for research and development of functional paper, functional films, and printed electronics.

• Printing Machinery

Contribution to society through high-quality systems and software.

• Other network tools

Achieving high-resolution measurement with a three-wavelength method. Easy operation allows for non-contact, non-destructive, and high-speed measurement. Testing is available in the demo room, and onl...

• Other measurement, recording and measuring instruments

We will conduct non-contact and non-destructive inspections of dose amount monitoring after implantation and junction depth measurements before and after annealing treatment.

• Other inspection equipment and devices

It is a high-output, vehicle-mounted DC/DC converter.

• Fuel Cells

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

• Other inspection equipment and devices
• Semiconductor inspection/test equipment