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Measuring Instrument - メーカー・企業1168社の業務用製品ランキング | イプロスものづくり

更新日： 集計期間:Apr 15, 2026～May 12, 2026
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Measuring Instrumentのメーカー・企業ランキング

更新日： 集計期間:Apr 15, 2026～May 12, 2026
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  3. FOSS JAPAN Co., Ltd. Tokyo//Testing, Analysis and Measurement
  4. 4 日本電色工業 Tokyo//Testing, Analysis and Measurement
  5. 5 シロ産業 Osaka//Industrial Electrical Equipment
企業ランキングへ

Measuring Instrumentの製品ランキング

更新日： 集計期間:Apr 15, 2026～May 12, 2026
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  1. VR-6000 Series One-Shot 3D Shape Measuring Machine
  2. Comprehensive Catalog of Color, Reflection/Transmittance, Gloss, Haze, Turbidity, and Chromaticity Measurement Instruments 日本電色工業
  3. Grain Near-Infrared Component Measurement Device "InfraTech NOVA" FOSS JAPAN Co., Ltd.
  4. 4 [OPIE'26 Exhibition] Lens Measurement: Optical 3D Surface Roughness Measurement Device
  5. 5 Fully Automatic Image Dimension Measuring Instrument 'IM-X1000 Series'

Measuring Instrumentの製品一覧

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ZOLLER New Generation Tool Measuring Instrument 【*Introduction Benefits Document Provided】

ZOLLER New Generation Tool Measuring Instrument 【*Introduction Benefits Document Provided】

Measured with an accuracy of 1 micron and guaranteed for 10 years! Reducing the defect rate and costs of machining!

ZOLLER's new generation tool measuring device offers a significant advantage with its measurement precision of 1 micron, and this accuracy is guaranteed for 5 years and even 10 years. High-precision measurements enable cost reduction, efficiency improvement, and lower defect rates! For example, in a case where one-shot machining was made possible through boring processing, a cost reduction of 1.2 million yen per year has been achieved. *As it is a precision measuring instrument, annual inspections (calibrations) are necessary, and if you are receiving this paid service, the guarantee extends to 10 years. *We are currently offering a point document explaining the benefits of introducing high-precision tool measuring devices! For more details, please download from the form below. 【Features】 ◆ One-shot machining is possible with boring processing! ◆ Height adjustment of milling cutters is highly precise! ◆ Rapid measurement of multiple locations, such as stepped tools! ◆ Measurement accuracy and repeatability are in the micron range! *Thanks to fully automated measurements, anyone can obtain the same measurement results. For more details, please contact us or download the catalog to view.

  • Electrical Instruments/Electrometers
  • Production Management System
  • Measuring Instrument

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Simple measurement of band gap using XPS.

Simple measurement of band gap using XPS.

It is possible to measure simply using XPS! Please inquire about semiconductors other than oxide-based ones.

At AITES, we conduct "simple measurement of band gaps using XPS." It is possible to simply measure the band gaps of materials or thin films with relatively wide band gaps among semiconductors and insulators using XPS. When measuring the band gap of β-Ga2O3 using the O1s peak, the band gap of this β-Ga2O3 was measured to be approximately 4.9 eV, based on the difference between the peak position of O1s and the energy loss edge due to the band gap. 【Features】 ■ Can be easily measured using XPS ■ Simple measurement of thin films with wide band gaps, such as SiON, is also possible ■ Supports semiconductors other than oxide-based materials *For more details, please refer to the PDF document or feel free to contact us.

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  • Contract measurement
  • Measuring Instrument

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Measurement of solder crack rate by cross-sectional observation.

Measurement of solder crack rate by cross-sectional observation.

Calculating the crack rate of ball joints and implementing it according to customer specifications!

After the solder durability test on the circuit board, if cracks occur in the solder joints, the crack rate will be calculated to confirm whether the cracks are within the allowable standards. The evaluation standards after the solder durability test can be individually defined based on the product environmental specifications, so most customers have their own standards. The measurement methods vary according to the shape of the components, but when you make a request, we will carry out the tests according to your specifications. 【Service Contents】 ■ Solder joints of BGA - Calculation of crack rate for ball joints ■ Solder joints of chip resistors - Calculation of crack rate for both ends of square and rectangular terminals ■ Solder joints of coil components - Calculation of crack rate for ribbon leads and QFP leads *For more details, please refer to the PDF document or feel free to contact us.

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  • Contract measurement
  • Measuring Instrument

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Cross-sectional hardness of aluminum welds (spot welding)

Cross-sectional hardness of aluminum welds (spot welding)

Cross-sectional observation and hardness measurement of the weld joint were conducted! It was found that the void in the center is a blowhole.

We conducted hardness measurements on aluminum spot welds after performing cross-sectional observations and investigated the trends based on Vickers hardness, Young's modulus, and elasticity ratio. From X-ray radiographic observations, voids were confirmed inside the weld. Cross-sectional observations revealed that the central void was a blowhole. Additionally, the hardness measurement results indicated that the area near the blowhole was hard but had low stiffness and was prone to deformation, while areas slightly away from the blowhole exhibited higher stiffness and were somewhat brittle. [Summary] ■ Observation case of aluminum spot welds: optical microscope images, X-ray images - Voids confirmed inside the weld from X-ray radiographic observations ■ Hardness measurements of aluminum spot weld cross-sections - Measurements conducted centered around the blowhole - Investigation of trends based on Vickers hardness, Young's modulus, and elasticity ratio *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • others
  • Measuring Instrument

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Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

Measure the change state with a 3D shape measuring device! Visually confirm the indented shape and amount due to pressure.

We would like to introduce the "Substrate Deformation Observation" using a 3D shape measurement machine. By applying pressure to a PCB substrate, referencing the bending tests of plastics and PCB substrates, we measure the changes using a 3D shape measurement machine (VR-6200). Since the measurement results can be confirmed with a color palette and line profile, it is possible to visually verify the shape and amount of deformation caused by the applied pressure. 【Features】 ■ Measurement results can be confirmed with a color palette and line profile ■ It is possible to visually verify the shape and amount of deformation caused by the applied pressure *For more details, please download the PDF or feel free to contact us.

  • Analysis Services
  • Analytical Equipment and Devices
  • Measuring Instrument

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Observation of thermal deformation using a 3D shape measurement device (VR-6200)

Observation of thermal deformation using a 3D shape measurement device (VR-6200)

By combining the VR-6200 with the heater stage, it becomes possible to visualize changes during heating.

It is a measuring device that can non-contact measure surface shapes such as concavities, undulations, and surface roughness. We will introduce "Heating Deformation Observation" using a 3D shape measuring machine. First, we acquire a 3D texture image at room temperature, and then we acquire a 3D texture image in a heated state. By overlaying the texture images before and after heating and checking the differential texture image and cross-sectional profile, it can be seen that the substrate in the heated state has higher ends and a lower center compared to the room temperature state. 【Features】 ■ It is possible to visualize and confirm shape changes during heating. ■ Depending on your preferences, it is possible to create profiles for temperature rise speed, waiting time, and temperature settings. *For more details, please download the PDF or feel free to contact us.

  • Contract Inspection
  • Measuring Instrument

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Dynamic viscoelasticity measurement of CFRP

Dynamic viscoelasticity measurement of CFRP

We present the results of DMA measurements conducted on CFRP made of plain-woven carbon fiber with an epoxy resin matrix!

We would like to introduce the dynamic viscoelastic measurement of CFRP conducted by our company using the bending mode. When performing dynamic viscoelastic measurements using DMA, CFRP is generally highly elastic, and it is considered that measurements using the bending mode are suitable due to its applications. The deformation modes of DMA can measure in any mode as long as the size requirements are met, but it is ideal to select appropriate conditions based on the material's shape, elastic modulus, and the purpose of the measurement. If you have a subject for which you would like to measure dynamic viscoelasticity, please feel free to consult us. 【Measurement Modes】 ■ Tensile ■ Compression ■ Bending (two-point/one-point/three-point) ■ Shear *For more details, please download the PDF or feel free to contact us.

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  • Contract measurement
  • Other measurement and measuring equipment
  • Measuring Instrument

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Multi-channel solar cell measurement device PVL-100

Multi-channel solar cell measurement device PVL-100

It is a characteristic evaluation device that can measure multiple-channel solar cell cells continuously in bulk.

The PVL-100 irradiates organic and DSSC solar cell cells with a light source and performs IV characteristic measurements. It also has charge extraction and AC impedance measurement functions, allowing for continuous measurement of multiple cells (up to 100 cells). It extracts parameters in an easy-to-use environment and provides a measurement environment adapted to user-sized solar cells. 【Features】 ○ Performs IV characteristic measurements ○ Equipped with charge extraction and AC impedance measurement functions ○ Conducts continuous measurements of multiple cells (up to 100 cells) ○ Extracts parameters in an easy-to-use environment ○ Provides a measurement environment adapted to user-sized solar cells For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Measurement device for the micron and nano range 'HELICHECK NANO'

Measurement device for the micron and nano range 'HELICHECK NANO'

Eliminate dependence on operators! Guaranteed productivity, quality, and accuracy through certified precision.

The "HELICHECK NANO" is a solution suitable for comprehensive fully automated measurement of complex shapes. With fine optical sensing technology, it can reliably detect and evaluate extremely fine shapes with a diameter of 0.1 mm or more. It supports diameters up to 16 mm, and through automated tool processing, it enables "quality control" within the process, including tolerance correction. 【Features】 ■ Robust granite base ■ Guarantees certified accuracy with measurement frequency and methods in accordance with VDI/VDE 2617 standards ■ E1 value (default): (1.2 + L/300) µm ■ ISO 50 spindle * You can download the English version of the catalog. * For more details, please refer to the related links or feel free to contact us.

  • Optical Measuring Instruments
  • Measuring Instrument

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Water quality tester / simple hardness tester / residual chlorine colorimetric tester / pH colorimetric tester

Water quality tester / simple hardness tester / residual chlorine colorimetric tester / pH colorimetric tester

Introducing easy-to-use water quality testing and analysis equipment that can be used anytime, anywhere, by anyone!

At Advantech Toyo, we handle a wide range of equipment related to water quality testing and environmental testing. For more details, please download the PDF or feel free to contact us. 【Products listed in PDF】 ■ Water quality testing instruments ■ Simple hardness testers ■ Residual chlorine colorimetric testers ■ pH colorimetric testers ■ Other water quality testing reagents, color comparison charts, etc.

  • Environmental Test Equipment
  • Measuring Instrument

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EMC Tester SESD 271 <Option>

EMC Tester SESD 271 <Option>

The applicable standard is IEC/EN 61000-4-2! It comes with SESD 272 grounding cable.

We would like to introduce the 'SESD 271' from Schloeder GmbH, which we handle. The type is a vertical coupling plane (with SESD 272 earth cable), and it complies with the IEC/EN 61000-4-2 standard. Please refer to the downloadable materials for more details. 【Specifications】 ■ Type: Vertical coupling plane (with SESD 272 earth cable) ■ Compliance standard: IEC/EN 61000-4-2 * You can download the English version of the catalog. * For more information, please feel free to contact us.

  • Other electronic parts
  • Measuring Instrument

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EMC Measurement Device SESD 302x <Option>

EMC Measurement Device SESD 302x <Option>

The type is a discharge test chip. The applicable standard is IEC/EN 61000-4-2.

We would like to introduce the 'SESD 302x' from Schloeder GmbH, which we handle. The type is a discharge test chip. The applicable standard is IEC/EN 61000-4-2. Please refer to the downloadable materials for more details. 【Specifications】 ■Type: Discharge Test Chip ■Applicable Standard: IEC/EN 61000-4-2 *You can download the English version of the catalog. *For more information, please feel free to contact us.

  • Other electronic parts
  • Measuring Instrument

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EMC Tester SESD 30 S120 <Option>

EMC Tester SESD 30 S120 <Option>

Remote control software! Comes with a fiber optic cable.

We would like to introduce the "SESD 30 S120" that we handle. It comes with remote control software (with fiber optic cable) and is an EMC-related product from Schloeder GmbH (optional). Please refer to the downloadable materials for more details. 【Specifications】 ■ Type: Remote control software (with fiber optic cable) * You can download the English version of the catalog. * For more information, please feel free to contact us.

  • Software (middle, driver, security, etc.)
  • Measuring Instrument

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EMC Tester SESD 8800-4, _S <Option>

EMC Tester SESD 8800-4, _S <Option>

The attenuator is 20dB (max 16kV) / 30dB (max 30kV)! ESD verification set.

We would like to introduce the "SESD 8800-4, 8800-4_S" that we handle. The type is an ESD verification set (for ESD pulse verification 2Ω (4GHz)), and it complies with the standards IEC/EN 61000-4-2 and ISO 10605. The attenuator is 20dB (max 16kV) / 30dB (max 30kV). Please refer to the downloadable materials for more details. 【Specifications】 ■ Type: ESD verification set (for ESD pulse verification 2Ω (4GHz)) ■ Standards: IEC/EN 61000-4-2, ISO 10605 ■ Attenuator: 20dB (max 16kV) / 30dB (max 30kV) * You can download the English version of the catalog. * For more information, please feel free to contact us.

  • Other inspection equipment and devices
  • Measuring Instrument

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Motorcycle Sound Level Meter 'MV-90'

Motorcycle Sound Level Meter 'MV-90'

Directly capture the sound of the ball with an accelerometer! Accurate measurements can be made without being affected by surrounding noise.

The "MV-90" is a device that allows for accurate measurements by directly capturing rumbling sounds with a high-sensitivity, acceleration-type detector placed on the bearing, unaffected by surrounding noise. It displays the rumbling sound on a meter while simultaneously playing the sound through a wideband speaker. It includes a frequency filter, allowing selection of full range, high range, or low range. 【Features】 ■ Directly captures rumbling sounds with an acceleration detector ■ Unaffected by surrounding noise ■ Built-in comparator enables automatic distinction between good and defective *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Vibration Inspection
  • Measuring Instrument

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Ceramic-made 3D Ceramaster [Capable of measuring 3D coordinates all at once]

Ceramic-made 3D Ceramaster [Capable of measuring 3D coordinates all at once]

XYZ three-dimensional coordinates can be measured all at once! Achieving high-precision measurements with perpendicularity and straightness within 5μm!

The ceramic three-dimensional Sera Master utilizes the characteristics of ceramics such as "excellent rigidity with minimal warping," "hardness and excellent wear resistance," "minimal dimensional changes due to temperature," "excellent corrosion resistance and strong against chemicals," and "lightweight," and is a master that has been ultra-precisely processed to μm levels for straightness, perpendicularity, and parallelism. XYZ three-dimensional coordinate axis measurements can be performed with a single setup. It is ideal for measuring the movement and precision (straightness and perpendicularity) of machine tools, machining centers, and three-dimensional measuring machines. 【Features】 - High rigidity results in minimal deflection due to its own weight (Young's modulus 390Ga). - Dense quality and low thermal expansion lead to small temperature changes. - Lighter compared to conventional stone materials. *For more details, please contact us or download the catalog for review.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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[Data] Satake Frozen Air Conditioning Equipment Performance Measurement Device

[Data] Satake Frozen Air Conditioning Equipment Performance Measurement Device

Introducing an essential device for measuring performance and capabilities to verify the results of research and development!

This document includes calorimeters, testing devices, environmental test chambers, and measurement instruments. We introduce the "balanced type calorimeter," which allows for accurate capacity measurement by minimizing heat leakage from the test chamber, and the "cyclic calorimeter," which has significant energy-saving effects. Additionally, we also feature the "compressor calorimeter," which measures the refrigeration capacity of various standalone compressors such as room air conditioners, car air conditioners, and refrigerators. 【Featured Products】 ■ Balanced Type Calorimeter ■ Cyclic Calorimeter ■ Compressor Calorimeter ■ Car Air Conditioner Bench Testing Device ■ Prefabricated Environmental Test Chamber ■ Fan Performance Measurement Device *For more details, please download the PDF or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Measuring Instrument

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Portable Gap and Step Measuring Device 'GAPGUN'

Portable Gap and Step Measuring Device 'GAPGUN'

An alternative to calipers, step gauges, and radius gauges! This system eliminates variability caused by individuals and enables quality control.

Wouldn't you like to improve dimension measurements for assembly inspections and such to be easier and faster? "Inspection labor inevitably takes time." "There are variations in inspection results depending on the person." "Input errors occur when creating reports." "There are times when there are too many inspection items, making it unclear whether the work was done." The 'GAPGUN' is a portable gap and step measurement device that uses lasers to measure the two-dimensional cross-section of inspection points non-contact. It combines measurement speed, ease of use, portability, and robustness, allowing for high-precision measurements of steps, gaps, arcs, edge chipping, through holes, sealing sections, angles, and more. Additionally, it navigates the user according to a pre-set inspection plan for measurement locations, and the measurement results are transferred to a PC to generate inspection result reports. 【Features】 ■ Non-contact gap, step, and R measurement tool ■ Fast non-contact measurement ■ A wide range of measurement functions accommodating various shapes ■ Consistent measurement accuracy ■ User-friendly navigation system ☆ Click the link below if you would like to see the list of functions!

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  • Other inspection equipment and devices
  • Measuring Instrument

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Portable Gap and Step Measuring Device 'GAPGUN PRO2'

Portable Gap and Step Measuring Device 'GAPGUN PRO2'

An alternative to calipers, step gauges, and radius gauges! This system eliminates variability caused by individuals and enables quality control.

Wouldn't you like to improve dimension measurements for assembly inspections and more, making them easier and faster? "Inspection labor inevitably takes time." "Variability in inspection results occurs depending on the person." "Input errors happen when creating reports." "There are times when there are too many inspection items, making it unclear whether the work was done." The 'GAPGUN' is a portable gap and step measurement tool that uses lasers to measure the 2D cross-section of inspection points non-contact. It combines measurement speed, ease of use, portability, and robustness, allowing for high-precision measurements of steps, gaps, arcs, edge chipping, burrs, seals, angles, and more. Additionally, it navigates the user according to a pre-set inspection plan for the measurement points, and the measurement results are transferred to a PC to generate inspection result reports. 【Features】 ■ Non-contact gap, step, and R measurement tool ■ Fast non-contact measurement ■ A wide range of measurement functions accommodating various shapes ■ Consistent measurement accuracy ■ User-friendly navigation system ☆ Click the link below if you would like to see the list of functions!

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  • Other inspection equipment and devices
  • Measuring Instrument

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Measuring device "OCT System"

Measuring device "OCT System"

Non-contact, non-destructive, non-invasive!

The OCT system is a real-time non-destructive optical coherence tomography device that utilizes the interference of backscattered near-infrared light, allowing for the visualization of internal structures in biological tissues and samples without the need for them to be transparent in the visible range, and without taking or destroying the samples, unlike electron microscopes or stereo microscopes. The OCT system is a cutting-edge tomographic device that follows X-ray CT, MRI, ultrasound, and confocal microscopy, enabling non-contact, non-destructive, non-invasive, and high-speed measurements. Additionally, 3D imaging is also possible. 【Features】 ■ Non-contact, non-destructive, non-invasive ■ High speed ■ High functionality ■ Wide range ■ 2D and 3D cross-sectional measurement *For more details, please refer to the catalog or feel free to contact us.

  • Other measurement and measuring equipment
  • Measuring Instrument

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Optical Coherence Tomography (High-Speed Type) 'IVS-2000-HS'

Optical Coherence Tomography (High-Speed Type) 'IVS-2000-HS'

Even in a scattered medium, light can penetrate easily, making it suitable for measuring objects with strong scattering!

The "IVS-2000-HS" is an SS-OCT system capable of high-speed measurements in the center wavelength range of 1310nm. With high-speed (100kHz) measurements, it can reduce measurement time in inline inspections and other applications. It achieves a high axial resolution of less than 18um (in air), allowing for highly accurate tomographic measurements. 【Features】 ■ Center wavelength: 1310nm ■ A-line rate: 100kHz ■ High axial resolution: less than 18um (in air) *For more details, please download the PDF or feel free to contact us.

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Optical Coherence Tomography Device 'IVS-2000-LC'

Optical Coherence Tomography Device 'IVS-2000-LC'

It is possible to perform 3D measurements of objects with varying heights all at once!

The "IVS-2000-LC" is an SS-OCT system with a deep imaging range centered at a wavelength of 1310nm. This wavelength range allows light to penetrate easily even in scattering materials, making it suitable for measuring highly scattering objects. With a deep imaging range (over 18mm in air), it is possible to perform three-dimensional measurements of objects with varying heights all at once. 【Features】 ■ Center wavelength: 1310nm ■ A-line rate: 50kHz ■ High axial resolution: less than 18um (in air) *For more details, please download the PDF or feel free to contact us.

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Optical Coherence Tomography (High Resolution Type) 'IVS-2000-HR'

Optical Coherence Tomography (High Resolution Type) 'IVS-2000-HR'

Even in a scattered medium, light can penetrate easily, making it suitable for measuring strongly scattering objects!

The "IVS-2000-HR" is an SS-OCT system with a high resolution centered at a wavelength of 1310nm. It has the highest resolution in the IVS series (less than 5um in vivo), enabling measurements with even higher resolution and clarity. The high axial resolution is less than 9um (in air), and the A-line rate is 20kHz. 【Features】 ■ Center wavelength: 1310nm ■ A-line rate: 20kHz ■ High axial resolution: less than 9um (in air) *For more details, please download the PDF or feel free to contact us.

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Wafer Thickness Distribution Measurement Device "TMS-2000"

Wafer Thickness Distribution Measurement Device "TMS-2000"

Non-contact measurement of flatness with a repeatability of 1nm is possible!

The TMS-2000 is a super high-precision wafer thickness distribution measurement device with innovative hardware design and high resistance to environmental changes. It enables inline inspection of various wafer materials such as silicon (up to P+++), SiC, sapphire, glass, LiNb3, and SOI, allowing for a wide range of applications that take advantage of high throughput and compact size. It adopts a spiral scan method that balances high speed and high-density measurement. The compact design allows for space-saving placement. 【Features】 - Stable thickness measurement based on high resistance to environmental temperature changes and vibrations - Sub-nanometer repeat measurement accuracy - High flexibility in scanning methods to measure thickness distribution on the wafer surface - Measurement possible even when attached to jigs with light irradiation from one side - Differential analysis possible with multiple different wafers - Measurement of evaluation parameters compliant with SEMI standards *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

Organic EL displays are advancing in practical applications by leveraging advantages such as high brightness, high-resolution color, and thinness due to their self-emissive principle. Organic EL devices are manufactured by stacking organic films, but analyzing the organic films in their stacked state has been challenging. This time, by using the XRR method, it has become possible to measure the film thickness and density of the organic films while maintaining the stacked state. Analysis of the thickness and density of stacked films is possible regardless of whether they are crystalline or amorphous.

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Photoluminescence method

Photoluminescence method

PL：PhotoLuminescence

The photoluminescence method is a technique that involves irradiating a substance with light and observing the light emitted when excited electrons return to their ground state. Various information can be obtained from the resulting emission spectrum. - Samples with a bandgap of about 3.5 eV can be excited. - The mapping function allows for the acquisition of extensive information. - Measurements can be conducted down to approximately 10 K. - Generally, it is a non-destructive measurement that does not require special pretreatment.

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[SRA] Spread Resistance Measurement Method

[SRA] Spread Resistance Measurement Method

SRA：Spreading Resistance Analysis

SRA is a method that involves diagonally polishing the measurement sample, making contact with two probes on the polished surface, and measuring the spreading resistance. It is also referred to as SRP (Spreading Resistance Profiling). - It is possible to determine the conductivity type (p-type/n-type). - It allows for the evaluation of carrier concentration distribution in the depth direction. - It can analyze a wide range of carrier concentrations from approximately 1E12 to 2E20 /cm3. - It is capable of measuring patterned samples larger than approximately 20μm × 100μm. - By combining SRA with SIMS for evaluation, it is possible to assess the activation rate.

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[Analysis Case] Impurity Evaluation of Crystalline Si Solar Cells

[Analysis Case] Impurity Evaluation of Crystalline Si Solar Cells

Trace analysis of metallic elements and atmospheric component elements.

We propose a method for evaluating the control of impurity levels required in each process from substrate growth to cell formation of crystalline silicon solar cells, using high-sensitivity analysis for element concentration measurement. Metal elements can be measured at concentrations below ppb, and atmospheric component elements containing hydrogen can be measured at concentrations below ppm. Measurement methods: SIMS, ICP-MS, etching, disassembly Product field: Solar cells Analysis purpose: Trace concentration evaluation, product investigation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Material Distribution of Lithium-Ion Secondary Battery Cathode Materials

[Analysis Case] Evaluation of Material Distribution of Lithium-Ion Secondary Battery Cathode Materials

Mapping the conductivity of cathode materials using SSRM.

Regarding the positive electrode of lithium-ion secondary batteries, it is possible to visualize the distribution of crystal grains insulated from the surroundings and the active materials whose conductivity has decreased due to degradation by mapping their shape and conductivity. In this case study, we present the results of estimating the material distribution through SSRM measurements conducted on a cross-section of the positive electrode of a lithium-ion secondary battery prepared by mechanical polishing, along with statistical processing. Measurement method: SSRM Product field: Secondary batteries Analysis purpose: Composition distribution evaluation, shape evaluation, degradation investigation For more details, please download the materials or contact us.

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