Horizontal magnetic pole probe 41RFR
Equipping the turntable with an electromagnet.
This is an announcement from Yuzan Corporation regarding the "Horizontal Magnetic Pole Prober 41RFR."
- Company：雄山 東京支店
- Price：Other
Prober Product List and Ranking from 19 Manufacturers, Suppliers and Companies
Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.
Prober Manufacturer, Suppliers and Company Rankings
Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.
- 雄山 東京支店 Tokyo//others
- ベクターセミコン Tokyo//Electronic Components and Semiconductors
- 日本マイクロニクス Tokyo//Electronic Components and Semiconductors
- 4 MPI Corporation Taiwan//Electronic Components and Semiconductors
- 5 アポロウエーブ 本社 Osaka//Testing, Analysis and Measurement
Prober Product ranking
Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.
- Temperature-controlled stage probe 'MTP-100' イーエッチシー
- Prober VX-3000SV ベクターセミコン
- Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober. ウイング
- 4 Prova 東栄科学産業 名取工場 磁気応用部
- 5 Prover "Full Auto System" ベクターセミコン
Prober Product List
46～58 item / All 58 items
Displayed results
Probe for glove boxes, GB series
Ideal for measurements in calm conditions!
This is a notice from Yuzan Corporation regarding the "Prober for Glove Boxes."
- Company：雄山 東京支店
- Price：Other
Sheet resistance meter / four-probe tester
It is a sheet resistance measurement system using the four-probe method.
The compactly formed four-point probe system quickly and accurately measures the resistivity and sheet resistance of diverse electronic materials in the research and development, inspection processes, and manufacturing lines of semiconductor/liquid crystal substrates, solar cell cells, and conductive thin films using the four-probe method.
- Company：雄山 東京支店
- Price：Other
Manual Prober
Manual Prober
This is a manual prober optimized for reliability testing and device characteristic evaluation, compatible with 8-inch wafers. We also offer manual probers compatible with 6-inch and 12-inch wafers.
- Company：イーエスジェー・プローブテクノロジー・ジャパン
- Price：Other
Prober VX-3000SV
We can easily accommodate any requests from users.
This is the first 12-inch wafer-compatible semi-automatic prober developed by a domestic manufacturer.
- Company：ベクターセミコン
- Price：Other
8-inch wafer semi-auto system
An innovative model that can be implemented at low cost! Compatible with a variety of applications.
The product is a semi-automatic prober that meets various measurement needs. The "TS2000-SE" is designed for high performance, ultra-low noise, and high precision while reducing testing costs. It delivers top-class performance in all areas, including microcurrent measurement, highly reliable DC/IV measurement, 1/f measurement, RF measurement, and power device measurement. 【Features】 ＜TS2000-SE＞ ■ Supports wafers up to 8 inches ■ Excellent design for EMI and RFI countermeasures and light shielding ■ Automatically performs wafer loading and unloading ■ Capable of temperature control from -60℃ to 300℃ *For more details, please refer to the PDF materials or feel free to contact us.
- Company：ベクターセミコン
- Price：Other
Power device evaluation prober
A high-power measurement system that excels in cost performance and takes safety into consideration.
We handle "Power Device Evaluation Probers." The "TS150-HP/TS200-HP" is a manual prober specifically designed for power device measurements, including 10kV withstand voltage testing and 250A (pulse) current measurement. It can be equipped with a thermal chuck system capable of withstanding up to 10kV and operating at 300°C. In addition, we also offer the cost-effective "TS2000-DP" and the safety-equipped "TS2000-HP." 【Features】 ■ Manual prober specialized for power device measurements ■ Compatible with chip sizes up to a maximum of 6-inch wafer sizes (TS150-HP) ■ Compatible with chip sizes up to a maximum of 8-inch wafer sizes (TS200-HP) ■ Capable of creating a measurement environment that considers safety *For more details, please refer to the PDF document or feel free to contact us.
- Company：ベクターセミコン
- Price：Other
Wafer Fully Automatic High-Speed LED Chip Prober NPB-600A
We have successfully adopted a unique measurement method that significantly improves production efficiency.
The NPB-600A is a device that inspects the optical and electrical characteristics, as well as the appearance images, of diced LED chips (elements). It performs all measurements and appearance inspections automatically, including wafer replacement. By adopting a unique measurement method, it has successfully significantly improved production efficiency, achieving a cycle time of Max 0.07 seconds per unit. For more details, please contact us or refer to the catalog.
- Company：ワイエイシイガーター
- Price：Other
Simple room temperature prober (with temperature gradient function and micro-infrared camera included)
- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit
A custom system equipped with a unit that can apply heat to part of a sample to generate a temperature gradient, as well as a microscopic infrared camera unit for observation, designed for a simple room temperature prober.
- Company：システムブレイン 東京営業所
- Price：Other
![High Vacuum Heating Micro Prober 'HMP-100' [Supports up to 500℃]](https://image.mono.ipros.com/public/product/image/426/2000674836/IPROS81745679583306348919.png?w=280&h=280)
High Vacuum Heating Micro Prober 'HMP-100' [Supports up to 500℃]
High vacuum specification heating micro-prober! The heating temperature can reach up to 500°C, and it supports sample heating with a 10mm shape!
The "HMP-100" is a high vacuum heating micro-prober that can be used at <10^-4 Pa due to its exhaust system. It supports heating temperatures up to 500°C and is compatible with 10mm shaped samples. By adopting a TRIAX connector, it enables electrical measurements below 1 pA. 【Features】 ■ High vacuum specification Usable at <10^-4 Pa due to the exhaust system ■ Heating temperature Supports up to 500°C Compatible with heating 10mm shaped samples ■ Low current measurement Enables electrical measurements below 1 pA by adopting a TRIAX connector *For more details, please refer to the PDF document or feel free to contact us.
- Company：ハイブリッジ 東京営業所
- Price：Other
TS3500-SE-300mm Full Auto Option Prober
IV/CV, pulsed IV, 1/f noise, fully automated option for RF measurement, compatible with WaferWallet, 300mm auto prober.
300mm auto-prober for various on-wafer applications such as device modeling, RF and millimeter-wave measurements, WLR, and failure analysis. Models available with WaferWallet option that can be upgraded to a full auto-prober. Agent in Japan: Vector Semiconductor Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707
- Company：MPI Corporation
- Price：Other
Semi-auto prober (for 8-inch microcurrent measurement)
High-performance semi-automatic prober capable of measuring microcurrents at the fA level.
■Microcurrent Measurement - Enabled by a structure utilizing guard potential technology, capable of measuring microcurrents at the fA level. - Achieves low noise and high precision measurements. ■Easy Operation - External automatic control and manual operation via joystick (6 movement modes) are possible. * Both semi-automatic and manual operations are easy, contributing to improved measurement efficiency. ■Standard Compatibility with Major Measurement Instrument Manufacturers' Systems and Software - Keysight Technologies (B1500A Semiconductor Device Parameter Analyzer, EasyEXPERT) - Keithley Instruments (Systems and instruments equipped with ACS (measurement software)) * Custom support for other measurement instrument control and software is available. ■Diverse Options and Customization Support - Supports evaluation of temperature-dependent characteristics using a hot chuck (from +40°C to +200°C). - Allows for the installation of microcurrent probe cards using probe card adapters. - Customization is available according to the intended use.
- Company：アズサイエンス 松本本社
- Price：Other
Manual Prober "LP-1"
Compact and lightweight! Manual prober that can use a standard stand for optical microscopes.
The "LP-1" is a 1-inch type manual prober that allows for quick alignment. Depending on the options, it can also be equipped with a stereo microscope, triaxial chuck, and hot chuck. Please feel free to contact us if you have any requests. 【Features】 ■ 1-inch size wafer probing ■ Quick alignment capability ■ Adjustable overdriving amount of needle pressure ■ Compact size and weight for easy movement of the device * For more details, please download the PDF or feel free to contact us.
- Company：ルフト
- Price：Other
