We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Prober.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Prober Product List and Ranking from 19 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

Prober Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. 雄山 東京支店 Tokyo//others
  2. ベクターセミコン Tokyo//Electronic Components and Semiconductors
  3. MPI Corporation Taiwan//Electronic Components and Semiconductors
  4. 4 日本マイクロニクス Tokyo//Electronic Components and Semiconductors
  5. 5 アポロウエーブ　 本社 Osaka//Testing, Analysis and Measurement
Go to Company Ranking

Prober Product ranking

Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.

  1. TS3000-SE-300mm Auto Prober MPI Corporation
  2. Chip size ~ 8-inch wafer compatible manual prober ベクターセミコン
  3. Semi-Automatic Prober AP200/AP300 アポロウエーブ　 本社
  4. Temperature-controlled stage probe 'MTP-100' イーエッチシー
  5. 4 Semi-Automatic Prober for Microcurrent Measurement 'AP-80A' 日本マイクロニクス

Prober Product List

1～30 item / All 58 items

Displayed results
Evaluation and Analysis Manual Prober '705C/MP-10C'

Evaluation and Analysis Manual Prober '705C/MP-10C'

Wide support for various evaluation and analysis applications! It can also be used for temperature characteristic evaluation and high voltage device evaluation.

The "705C/MP-10C" is a manual prober that can be easily operated with one hand, thanks to its air bearing stage. It is equipped with a safety lock mechanism using a three-stage switch lever. This prevents damage to the device or probe due to operational mistakes during contact. Additionally, it allows for quick stage alignment, improving measurement efficiency. 【Features】 ■ Easy one-handed operation due to the air bearing stage ■ Equipped with a safety lock mechanism using a three-stage switch lever ■ Prevents damage to the device or probe due to operational mistakes during contact ■ Supports measures against surface discharge of power devices ■ Allows for quick stage alignment, improving measurement efficiency *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Manual Prober for Microcurrent Measurement '708fT'

Manual Prober for Microcurrent Measurement '708fT'

You can evaluate temperature-dependent characteristics using a hot chuck! Measurement efficiency will improve.

The "708fT" is a manual prober for measuring microcurrents at the fA level, featuring a triple structure of guard and shield, designed for 8-inch microcurrent measurements. With a thorough guard structure, it achieves low noise and high precision measurements. The use of an air bearing stage allows for easy one-handed operation. Additionally, it is equipped with a safety lock mechanism using a three-stage switch lever, preventing damage to the device and probe due to operational errors during contact. 【Features】 ■ Capable of measuring microcurrents at the fA level due to the triple structure of guard and shield ■ Achieves low noise and high precision measurements with a thorough guard structure ■ Easy operation ■ Safety design ■ Customizable *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Special Type Electric Manual Prober MP-200B

Special Type Electric Manual Prober MP-200B

Special Type Electric Manual Prober MP-200B

Equipped with a zoom microscope! A probe focused on work efficiency with a standard 15-inch LCD color monitor. 【Features】 ○ Long working distance improves work efficiency ○ Uses a zoom lens for easy observation without positional deviation ○ Equipped with an electric Z stage To retract the microscope and positioner up to 140 mm Making workpiece attachment and detachment easy ○ Fine positioning structure considering reproducibility ○ Allows for two-handed operation ● For other functions and details, please download the catalog.

  • Image Processing Equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober.

Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober.

12-inch compatible semi-auto prober SA-W300S

Granite base adopted! Semi-auto prober capable of high-precision positioning 【Features】 ○ By using a granite stone plate for the base and equipping a linear shaft motor for the drive motor, it is possible to achieve a backlash of '0'. ○ High-precision positioning is possible, corresponding to the accuracy/resolution of the linear scale. ○ Equipped with a manual loader, making the loading and unloading of wafers easy. ● For other functions and details, please download the catalog.

  • Image Processing Equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Semi-Automatic Prober AP200/AP300

Semi-Automatic Prober AP200/AP300

Semi-automatic prober compatible with microcurrent measurement and high-power measurement! It supports wafer sizes up to 8 and 12 inches, respectively.

-60℃ to +350℃ temperature characteristic evaluation, microcurrent measurement Compatible with power device measurements over 20kV and 200A ◎ A compact shield mechanism that can replace dry air prevents condensation even at negative temperatures. ◎ The compact shielding effect enables stable microcurrent measurements. ◎ The control software is user-friendly and excels in operability for operators. ◎ It can be equipped with automatic wafer alignment and automatic individual chip alignment utilizing image recognition. ◎ The control software is designed with icons arranged in process order to prevent operators from getting lost during operation, enhancing usability. ◎ It has a wafer alignment function that allows for angle adjustment and fine-tuning of XY positions using a model. ◎ After registering the die origin position, it features automatic detection of characteristic patterns through image processing, registering them as reference models. ◎ It is also possible to automatically align registered individual chips placed in a registered tray using image recognition. (Optional) ◎ It can be equipped with auto XYZ to accommodate wafer expansion, etc. (Optional)

  • Other inspection equipment and devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Semi-Automatic Prober 'AP-150/AP-200'

Semi-Automatic Prober 'AP-150/AP-200'

Temperature characteristic evaluation from -60℃ to +350℃, suitable for microcurrent measurement! No condensation even at negative temperatures.

The "AP-150/AP-200" is a semi-automatic prober that supports wafer sizes of up to 6 and 8 inches, respectively. Thanks to the effect of the compact shield, stable microcurrent measurements are possible. The compact shield mechanism allows for the replacement of dry air, preventing condensation even at low temperatures. Additionally, it can be equipped with features such as automatic wafer alignment and automatic individual chip alignment utilizing image recognition. 【Features】 ■ Supports power device measurements of over 20kV and 200A ■ Compatible with wafer sizes of up to 6 and 8 inches, respectively ■ Stable microcurrent measurements are possible due to the effect of the compact shield ■ Control software that is easy for operators to understand and excels in usability ■ Can be equipped with automatic wafer alignment and automatic individual chip alignment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Probing with precision in the order of a few microns using 'OYM-430'

Probing with precision in the order of a few microns using 'OYM-430'

This is a manual prober that eliminates "misalignment" and "blurring" caused by zoom, enabling high-precision and stable probing even for fine circuits.

This is a high-grade model equipped with a high-magnification metal microscope. 【Features】 ◆ A heavy-duty base and a positioning stage with excellent load-bearing capacity. ◆ High-precision and stable probing for fine circuits on the order of a few microns and sub-microns. ◆ The microscope mount features X-Y movement and quick lift for easy setup and positioning. *For more details, please refer to the catalog or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Simple Shield Box Prober "TB Series"

Simple Shield Box Prober "TB Series"

Standard equipment with all necessary components for probing! A probing system with excellent cost performance.

The "TB Series" is a model of probe that excels in cost performance and is suitable for various measurement purposes while saving space. Inside the compact shield box, standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table. Since the necessary components for the probe are included in advance, the initial setup cost is lower compared to building a new probing environment. 【Features】 ■ Standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table ■ Lower initial setup costs compared to building a new probing environment ■ A cost-effective probing system that can be widely used ■ Compact size allows for use in various applications and limited installation space ■ A wide range of optional items available, including hot chucks and probes with various tip diameters and materials *For more details, please refer to the PDF document or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Prober OYM-2000 Series

Prober OYM-2000 Series

A semi-automatic prober with excellent cost performance.

This is an announcement from Yuzan Corporation regarding the "OYM-2000 Series."

  • Circuit Board Inspection Equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Vacuum prober, high-temperature vacuum prober

Vacuum prober, high-temperature vacuum prober

Inspection in a high-temperature vacuum environment!

This is a notice from Yuzan Corporation regarding the "High-Temperature Vacuum Prober."

  • Other environmental analysis equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Vacuum prober, ultra-low temperature prober

Vacuum prober, ultra-low temperature prober

Measurement at ultra-low temperatures

This is an announcement from Yuzan Corporation regarding the "Ultra-Low Temperature Prober."

  • Other environmental analysis equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Small A3 Prober OYM-A3SP

Small A3 Prober OYM-A3SP

It is a compact manual prober that can be easily measured at a low initial cost. It consists of a positioner, microscope, and sample stage.

This is an announcement from Yuzan Corporation regarding the "Compact A3 Prober." It is a simple A3-sized manual prober that accommodates chip-level to Φ50mm wafers. By closing the sliding case, it creates a simple shielded structure. Since the microscope and work position remain constant, the field of view does not change when opening and closing the case. It is ideal for evaluating the electrical characteristics of semiconductors.

  • Circuit Board Inspection Equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
TDDB measurement probe

TDDB measurement probe

TDDB measurement probe

This is a dedicated prober for TDDB measurement. By using a dedicated ceramic card, it enables full contact measurement of 8-inch wafers, significantly contributing to the reduction of measurement time.

  • Semiconductor inspection/test equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
12-inch manual prober

12-inch manual prober

12-inch manual prober

This is a manual prober compatible with 12-inch wafers. By changing the chuck, it can support LCD substrates up to 320×320. A hot chuck can be installed as an option.

  • Semiconductor inspection/test equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Manual Prober for Implementation Boards "Model 6200"

Manual Prober for Implementation Boards "Model 6200"

Prevents slight misalignment of devices, improving operability even when using high-magnification microscopes.

The "Model6200" is a manual prober designed for direct probing of devices on printed circuit boards. By using a push button to retract the probe base plate and microscope in the Z-axis upward direction, it prevents slight misalignment of the device and improves operability even when using a high-magnification microscope. As a result, it is capable of chucking large prototype wiring boards with many components and connections. 【Standard Configuration Example】 ○ Manual Prober: Model6200 ○ Microscope: FS-70Z ○ Vibration Isolation Table: TAPC-56 ○ Micromanipulator: XYZ-500 ○ X-Y Scanner: 5010B For more details, please contact us or download the catalog.

  • Semiconductor inspection/test equipment
  • Circuit Board Inspection Equipment
  • probe
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Temperature-controlled stage probe 'MTP-100'

Temperature-controlled stage probe 'MTP-100'

Rapid cooling with forced air cooling by a cooling fan! Uses a heat-resistant probe with a temperature resistance of 300°C for 30 minutes.

The "MTP-100" is a two-probe tester with a temperature control stage. It allows for electrical measurements while changing the temperature of the sample. The top of the safety cover is equipped with a heat-resistant glass window, enabling observation of the sample with a microscope or similar equipment. 【Features】 ■ Equipped with a temperature control stage ■ Allows for electrical measurements while changing the temperature of the sample ■ The top of the safety cover has a heat-resistant glass window ■ Enables sample observation with a microscope or similar equipment *For more details, please refer to the PDF document or feel free to contact us.

  • 1.jpg
  • 2.jpg
  • Testing Equipment and Devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Semi-Automatic Prober for Power Device Evaluation AX-2500

Semi-Automatic Prober for Power Device Evaluation AX-2500

A new semi-automatic prober focused on the electrical characteristic evaluation of vertical/horizontal structured power devices.

This is a high-precision semi-automatic prober capable of handling wafer sizes up to 8 inches. Its low-noise specifications allow it to accommodate various applications. It supports automatic measurement.

  • Analytical Equipment and Devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Chip size ~ 8-inch wafer compatible manual prober

Chip size ~ 8-inch wafer compatible manual prober

This is a Vector standard model that supports chip sizes up to 8-inch wafers.

This is the Vector standard model that supports chip sizes up to 8-inch wafers. It enables the construction of various measurement solutions, including high and low temperature DC measurements, high-frequency measurements, and high-speed IV/pulse IV measurements.

  • Analytical Equipment and Devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
4-inch wafer compatible manual prober MX-400

4-inch wafer compatible manual prober MX-400

Supports wafers up to 4 inches.

Supports wafers up to 4 inches Equipped with a high-temperature chuck Can also accommodate power device evaluation

  • Analytical Equipment and Devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Semi-Automatic Prober "12-Inch Wafer Semi-Automatic System"

Semi-Automatic Prober "12-Inch Wafer Semi-Automatic System"

Supports up to 12-inch wafers! Low cost and can be installed in a very small area.

The product is a high-performance semi-automatic prober compatible with up to 12-inch wafers. The "TS3000-SE" is an innovative model that can be introduced at a low cost while supporting various measurements, including 1/f measurements, which were difficult with semi-automatic machines, as well as microcurrent measurements. It can be installed in a very small area, including the chiller unit. 【Features】 ■ "TS3000" - Simultaneous setup of probe card and positioner is possible - Suitable for failure analysis, reliability testing, RF measurements, load pull measurements, etc. - Supports measurements in low-temperature environments while maintaining a wide opening ■ "TS3000-SiPH" - Designed for the characterization of silicon photonics devices - High-precision fiber alignment system with high flexibility - Safe operation is possible *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Prover "Full Auto System"

Prover "Full Auto System"

Equipped with high measurement accuracy and automation features! A prober capable of precise calibration.

Our company offers the "Full Auto System." The "TS2500-RF" is a new full-auto probe system designed for on-wafer RF measurements. It supports wafer sizes up to 200mm and can perform low noise, low leakage measurements within a temperature range from room temperature to a maximum of 300°C. Additionally, we also offer the "TS3500/TS3500-SE" which is compatible with 12-inch wafers. 【Features】 ＜TS2500-RF＞ ■ Capable of mounting probes up to 67GHz with 4 ports ■ Supports various measurements such as DC-IV, DC-CV, and Pulsed-IV ■ Can handle wafers as small as 50um *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Dual-Sided Contact Prober 'PCP-102WS'

Dual-Sided Contact Prober 'PCP-102WS'

High current/high voltage probing is possible! Achieving contact on both sides of the wafer.

The "PCP-102WS" is a high-precision prober designed for contact on both sides of a wafer (double-sided). By adopting our unique XY position correction function and profiling function, effective position correction against wafer warpage is possible. By performing Kelvin connections on the drain side of the wafer's backside and aligning the drain sense position with the source sense position on the wafer's front side, accurate RDS (on) measurements can be achieved. 【Features】 ■ Probing of high current/high voltage is possible due to the wafer clamp method using ceramic blades. ■ Probing at multiple points within a single chip is possible. ■ A high-rigidity housing made of iron base and welded frame is adopted to achieve low vibration. ■ Low cost, high throughput. ■ Compact footprint and energy-saving design. *For more details, please refer to the PDF materials or feel free to contact us.

  • probe
  • Semiconductor inspection/test equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Prova

Prova

From compact low-cost models for research and development to fully automatic models for production!

Our probes have enhanced their functionality considering the measurement purposes of devices as pioneers of non-magnetic probes designed for magnetic mounting. We offer a lineup of models suitable for various measurement devices and techniques, such as magnetic memory, magnetic sensors, and magnetic storage. The fully automated models achieve high functionality with features like automatic angle and alignment of the probe, auto alignment, C-to-C, automatic profiling, and automatic position correction for large-diameter wafers. Additionally, we manufacture testers in-house, providing a consistent measurement test system. 【Features】 ■ The basic structure is completely non-magnetic. ■ Wafer evaluation for electronic compasses is thoroughly non-magnetized and equipped with three-axis coils. ■ Temperature measurement is possible from -40°C to +200°C while maintaining non-magnetization. ■ Utilizes low residual magnetic field technology for in-plane magnetic field, vertical magnetic field, and omnidirectional magnetic field application. *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Constant temperature vacuum prober

Constant temperature vacuum prober

Equipped with a compact TMP exhaust set! It is a probing system that can be expanded to a maximum of 4 probes.

This product is a "Constant Temperature Vacuum Prober" that uses aluminum material for the base to reduce weight and features vacuum suction on both the top and bottom. The temperature control system has two cycle control systems. The stage section has temperature control functionality, allowing measurements to be taken in environments with vacuum, gas atmosphere, and variable temperature. 【Features】 ■ Expandable to a maximum of 4 probes ■ The stage section has temperature control functionality, allowing measurements in environments with vacuum, gas atmosphere, and variable temperature ■ Vacuum suction on both the top and bottom ■ The base is made of aluminum material to reduce weight ■ Temperature control has two cycle control systems *For more details, please refer to the external link page or feel free to contact us.

  • Vacuum Equipment
  • Other machine elements
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
TS150-150mm Manual Prober

TS150-150mm Manual Prober

Highly versatile 150mm (6-inch) manual prober.

We support a wide range of applications including device evaluation, modeling, WLR, failure analysis, IC design, and MEMS.

  • Testing Equipment and Devices
  • Other inspection equipment and devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
TS2000-HP High Power Auto Prober

TS2000-HP High Power Auto Prober

High precision, high reliability 200mm auto-prober for high power measurement.

A device developed for high voltage and high current (10kV/600A) applications.

  • Testing Equipment and Devices
  • Other inspection equipment and devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
TS2000-SE-200mm Auto Prober

TS2000-SE-200mm Auto Prober

High precision, high reliability IV, CV, pulsed IV, 1/f, 200mm auto-prober for RF measurements.

200mm auto-prober compatible with various on-wafer applications such as device modeling, RF and millimeter-wave measurements, WLR, and failure analysis. Agent in Japan: Vector Semiconductor Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • Testing Equipment and Devices
  • Other inspection equipment and devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
TS3000-SE-300mm Auto Prober

TS3000-SE-300mm Auto Prober

High precision, high reliability IV, CV, pulsed IV, 1/f, 300mm auto-prober for RF measurements.

300mm auto-prober compatible with various on-wafer applications such as device modeling, RF and millimeter-wave measurements, WLR, and failure analysis. Agent in Japan: Vector Semiconductor Co., Ltd. 2-43-2 Nishi-Nippori, Arakawa-ku, Tokyo TEL 03-5604-1701 FAX 03-5604-1707

  • Testing Equipment and Devices
  • Other inspection equipment and devices
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Semiconductor Prober CP12

Semiconductor Prober CP12

A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.

This is a space-saving type of prober that has been downsized from the conventional size. It significantly improves throughput and utilizes optical technology for wafer alignment. Additionally, by efficiently accessing prober functions and testing functions through test applications, it greatly reduces the software development period.

  • Semiconductor inspection/test equipment
  • Tester
  • Other semiconductor manufacturing equipment
  • Prober

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
COPYRIGHT © 2001-2026 IPROS CORPORATION ALL RIGHTS RESERVED.