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Prober Product List and Ranking from 19 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Prober Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. 雄山 東京支店 Tokyo//others
  2. ベクターセミコン Tokyo//Electronic Components and Semiconductors
  3. 日本マイクロニクス Tokyo//Electronic Components and Semiconductors
  4. 4 MPI Corporation Taiwan//Electronic Components and Semiconductors
  5. 5 アポロウエーブ　 本社 Osaka//Testing, Analysis and Measurement
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Prober Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Temperature-controlled stage probe 'MTP-100' イーエッチシー
  2. Prober VX-3000SV ベクターセミコン
  3. Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober. ウイング
  4. 4 Prova 東栄科学産業 名取工場　磁気応用部
  5. 5 Prover "Full Auto System" ベクターセミコン

Prober Product List

1～15 item / All 58 items

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Evaluation and Analysis Manual Prober '705C/MP-10C'

Evaluation and Analysis Manual Prober '705C/MP-10C'

Wide support for various evaluation and analysis applications! It can also be used for temperature characteristic evaluation and high voltage device evaluation.

The "705C/MP-10C" is a manual prober that can be easily operated with one hand, thanks to its air bearing stage. It is equipped with a safety lock mechanism using a three-stage switch lever. This prevents damage to the device or probe due to operational mistakes during contact. Additionally, it allows for quick stage alignment, improving measurement efficiency. 【Features】 ■ Easy one-handed operation due to the air bearing stage ■ Equipped with a safety lock mechanism using a three-stage switch lever ■ Prevents damage to the device or probe due to operational mistakes during contact ■ Supports measures against surface discharge of power devices ■ Allows for quick stage alignment, improving measurement efficiency *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment

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Manual Prober for Microcurrent Measurement '708fT'

Manual Prober for Microcurrent Measurement '708fT'

You can evaluate temperature-dependent characteristics using a hot chuck! Measurement efficiency will improve.

The "708fT" is a manual prober for measuring microcurrents at the fA level, featuring a triple structure of guard and shield, designed for 8-inch microcurrent measurements. With a thorough guard structure, it achieves low noise and high precision measurements. The use of an air bearing stage allows for easy one-handed operation. Additionally, it is equipped with a safety lock mechanism using a three-stage switch lever, preventing damage to the device and probe due to operational errors during contact. 【Features】 ■ Capable of measuring microcurrents at the fA level due to the triple structure of guard and shield ■ Achieves low noise and high precision measurements with a thorough guard structure ■ Easy operation ■ Safety design ■ Customizable *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment

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Special Type Electric Manual Prober MP-200B

Special Type Electric Manual Prober MP-200B

Special Type Electric Manual Prober MP-200B

Equipped with a zoom microscope! A probe focused on work efficiency with a standard 15-inch LCD color monitor. 【Features】 ○ Long working distance improves work efficiency ○ Uses a zoom lens for easy observation without positional deviation ○ Equipped with an electric Z stage To retract the microscope and positioner up to 140 mm Making workpiece attachment and detachment easy ○ Fine positioning structure considering reproducibility ○ Allows for two-handed operation ● For other functions and details, please download the catalog.

  • Image Processing Equipment

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Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober.

Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober.

12-inch compatible semi-auto prober SA-W300S

Granite base adopted! Semi-auto prober capable of high-precision positioning 【Features】 ○ By using a granite stone plate for the base and equipping a linear shaft motor for the drive motor, it is possible to achieve a backlash of '0'. ○ High-precision positioning is possible, corresponding to the accuracy/resolution of the linear scale. ○ Equipped with a manual loader, making the loading and unloading of wafers easy. ● For other functions and details, please download the catalog.

  • Image Processing Equipment

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Semi-Automatic Prober AP200/AP300

Semi-Automatic Prober AP200/AP300

Semi-automatic prober compatible with microcurrent measurement and high-power measurement! It supports wafer sizes up to 8 and 12 inches, respectively.

-60℃ to +350℃ temperature characteristic evaluation, microcurrent measurement Compatible with power device measurements over 20kV and 200A ◎ A compact shield mechanism that can replace dry air prevents condensation even at negative temperatures. ◎ The compact shielding effect enables stable microcurrent measurements. ◎ The control software is user-friendly and excels in operability for operators. ◎ It can be equipped with automatic wafer alignment and automatic individual chip alignment utilizing image recognition. ◎ The control software is designed with icons arranged in process order to prevent operators from getting lost during operation, enhancing usability. ◎ It has a wafer alignment function that allows for angle adjustment and fine-tuning of XY positions using a model. ◎ After registering the die origin position, it features automatic detection of characteristic patterns through image processing, registering them as reference models. ◎ It is also possible to automatically align registered individual chips placed in a registered tray using image recognition. (Optional) ◎ It can be equipped with auto XYZ to accommodate wafer expansion, etc. (Optional)

  • Other inspection equipment and devices

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Semi-Automatic Prober 'AP-150/AP-200'

Semi-Automatic Prober 'AP-150/AP-200'

Temperature characteristic evaluation from -60℃ to +350℃, suitable for microcurrent measurement! No condensation even at negative temperatures.

The "AP-150/AP-200" is a semi-automatic prober that supports wafer sizes of up to 6 and 8 inches, respectively. Thanks to the effect of the compact shield, stable microcurrent measurements are possible. The compact shield mechanism allows for the replacement of dry air, preventing condensation even at low temperatures. Additionally, it can be equipped with features such as automatic wafer alignment and automatic individual chip alignment utilizing image recognition. 【Features】 ■ Supports power device measurements of over 20kV and 200A ■ Compatible with wafer sizes of up to 6 and 8 inches, respectively ■ Stable microcurrent measurements are possible due to the effect of the compact shield ■ Control software that is easy for operators to understand and excels in usability ■ Can be equipped with automatic wafer alignment and automatic individual chip alignment *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Probing with precision in the order of a few microns using 'OYM-430'

Probing with precision in the order of a few microns using 'OYM-430'

This is a manual prober that eliminates "misalignment" and "blurring" caused by zoom, enabling high-precision and stable probing even for fine circuits.

This is a high-grade model equipped with a high-magnification metal microscope. 【Features】 ◆ A heavy-duty base and a positioning stage with excellent load-bearing capacity. ◆ High-precision and stable probing for fine circuits on the order of a few microns and sub-microns. ◆ The microscope mount features X-Y movement and quick lift for easy setup and positioning. *For more details, please refer to the catalog or feel free to contact us.

  • Semiconductor inspection/test equipment

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Simple Shield Box Prober "TB Series"

Simple Shield Box Prober "TB Series"

Standard equipment with all necessary components for probing! A probing system with excellent cost performance.

The "TB Series" is a model of probe that excels in cost performance and is suitable for various measurement purposes while saving space. Inside the compact shield box, standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table. Since the necessary components for the probe are included in advance, the initial setup cost is lower compared to building a new probing environment. 【Features】 ■ Standard equipment includes a sample stage, micro positioner, probe needle, signal cables, microscope, and vibration isolation table ■ Lower initial setup costs compared to building a new probing environment ■ A cost-effective probing system that can be widely used ■ Compact size allows for use in various applications and limited installation space ■ A wide range of optional items available, including hot chucks and probes with various tip diameters and materials *For more details, please refer to the PDF document or feel free to contact us.

  • Semiconductor inspection/test equipment

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Vacuum prober, high-temperature vacuum prober

Vacuum prober, high-temperature vacuum prober

Inspection in a high-temperature vacuum environment!

This is a notice from Yuzan Corporation regarding the "High-Temperature Vacuum Prober."

  • Other environmental analysis equipment

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Vacuum prober, ultra-low temperature prober

Vacuum prober, ultra-low temperature prober

Measurement at ultra-low temperatures

This is an announcement from Yuzan Corporation regarding the "Ultra-Low Temperature Prober."

  • Other environmental analysis equipment

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Small A3 Prober OYM-A3SP

Small A3 Prober OYM-A3SP

It is a compact manual prober that can be easily measured at a low initial cost. It consists of a positioner, microscope, and sample stage.

This is an announcement from Yuzan Corporation regarding the "Compact A3 Prober." It is a simple A3-sized manual prober that accommodates chip-level to Φ50mm wafers. By closing the sliding case, it creates a simple shielded structure. Since the microscope and work position remain constant, the field of view does not change when opening and closing the case. It is ideal for evaluating the electrical characteristics of semiconductors.

  • Circuit Board Inspection Equipment

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TDDB measurement probe

TDDB measurement probe

TDDB measurement probe

This is a dedicated prober for TDDB measurement. By using a dedicated ceramic card, it enables full contact measurement of 8-inch wafers, significantly contributing to the reduction of measurement time.

  • Semiconductor inspection/test equipment

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12-inch manual prober

12-inch manual prober

12-inch manual prober

This is a manual prober compatible with 12-inch wafers. By changing the chuck, it can support LCD substrates up to 320×320. A hot chuck can be installed as an option.

  • Semiconductor inspection/test equipment

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