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Prober Product List and Ranking from 19 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Prober Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. 雄山 東京支店 Tokyo//others
  2. ベクターセミコン Tokyo//Electronic Components and Semiconductors
  3. 日本マイクロニクス Tokyo//Electronic Components and Semiconductors
  4. 4 MPI Corporation Taiwan//Electronic Components and Semiconductors
  5. 5 アポロウエーブ　 本社 Osaka//Testing, Analysis and Measurement
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Prober Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Temperature-controlled stage probe 'MTP-100' イーエッチシー
  2. Prober VX-3000SV ベクターセミコン
  3. Semiconductor inspection equipment, 12-inch compatible, semi-automatic prober. ウイング
  4. 4 Prova 東栄科学産業 名取工場　磁気応用部
  5. 5 Prover "Full Auto System" ベクターセミコン

Prober Product List

31～45 item / All 58 items

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Evaluation and Analysis Manual Prober '705A-WG7'

Evaluation and Analysis Manual Prober '705A-WG7'

Wide contact area! Stage alignment can be achieved in a short time, improving measurement efficiency.

The "705A-WG7" is a manual prober for evaluation and analysis that can handle 12-inch wafers and FPD substrate defect analysis or TEG evaluation, thanks to its large stage. The adoption of a slide table ensures a wide probing area. Additionally, the air bearing stage allows for easy one-handed operation. Furthermore, it can be customized according to usage purposes, including the installation of various microscopes and laser cutter systems. 【Features】 ■ Compatible with large substrates ■ Supports defect analysis of 12-inch wafers and FPD substrates, as well as TEG evaluation ■ Ensures a wide probing area through the use of a slide table ■ Easy one-handed operation due to the air bearing stage ■ Equipped with a safety lock mechanism using a three-stage switching lever *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment

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Semi-Automatic Prober for Microcurrent Measurement 'AP-80A'

Semi-Automatic Prober for Microcurrent Measurement 'AP-80A'

Customization support! Both semi-automatic and manual operations are easy, contributing to improved measurement efficiency.

The "AP-80A" is a semi-automatic prober designed for measuring microcurrents, achieving low noise and high precision through a thorough guard structure. Thanks to its design utilizing guard potential technology, it enables measurement of microcurrents at the fA level. It supports external automatic control and manual operation via a joystick (with six movement modes). Additionally, it can accommodate power devices and can be customized according to usage purposes. 【Features】 ■ Achieves low noise and high precision measurement ■ Simple operation ■ Enables measurement of microcurrents at the fA level through a structure utilizing guard potential technology ■ Supports external automatic control and manual operation via a joystick (with six movement modes) ■ Standard compatibility with systems and software from major measurement instrument manufacturers *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment

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8-inch compatible manual prober MP-200A

8-inch compatible manual prober MP-200A

8-inch compatible manual prober MP-200A

Manual prober compatible with 8-inch wafers equipped with an X-Y stage 【Features】 ○ Equipped with an X-Y stage 　Simple remote control such as fast forward and jog feed is possible from the operation panel ○ Quickly moves to measurement points, offering excellent operability ○ A prober designed with user needs in mind, prioritizing low cost, high precision, and short delivery times ● For other functions and details, please download the catalog.

  • Image Processing Equipment

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Manual Prober "α Series"

Manual Prober "α Series"

A manual prober focused on comfortable operability! The optical system can be selected from three types!

The "α series" is a manual prober that meets a wide range of evaluation and analysis needs with comfortable operability. You can choose from multiple types of stages and optical systems. The wafer loading and unloading can be easily performed in an open-front configuration. The Z drive features a three-stage action operated by a lever. Alignment is performed approximately 300μm away from the wafer, allowing the stage to move without losing focus from the microscope. 【Features】 ■ Selectable stages/optical systems ■ Three-stage switching for Z ■ Easy stage movement ■ Reliable alignment *For more details, please refer to the catalog. Feel free to contact us with any inquiries.

  • Other physicochemical equipment

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Vacuum Prober MJ-8/MJ-10

Vacuum Prober MJ-8/MJ-10

Temperature characteristic evaluation at extreme low to ultra-high temperatures, measurements in vacuum and gas environments.

◎It is very compact, making it easy to measure on a desk. ◎It can be moved with an external operation-type positioner (probe) even in a vacuum. ◎It has excellent shielding effects, blocking light and noise. ◎The MJ-8 is slim, designed with Hall effect measurements in mind.

  • Other inspection equipment and devices

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Tabletop Compact Prober 'MBP-55'

Tabletop Compact Prober 'MBP-55'

Compact size, lightweight, and easy to carry! Please use it for micro-capacity CV measurements, high-frequency measurements, etc.

The "MBP-55" is a compact prober suitable for chip-level IV/CV measurements. It accommodates sample sizes up to 50mm square and is an integrated unit equipped with a shield box. Additionally, it supports microcurrent IV, micro-capacitance CV measurements, and high-frequency measurements. Its compact size and lightweight design make it easy to transport. 【Features】 ■ Ideal for chip-level IV/CV measurements ■ Supports sample sizes up to 50mm square ■ Integrated unit equipped with a shield box *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Optical semiconductor prober

Optical semiconductor prober

Optical semiconductor prober

This is a device for probing and measuring/testing surface-emitting lasers (VCSEL) and photodiodes (PD/APD) in wafer form. ■ VCSEL - I-L-V measurement - V-I measurement - Wavelength measurement - High-frequency characteristics ■ PD/APD - V-I measurement (dark current, photocurrent) - High-frequency characteristics ■ Features - Peak search function for optical axis alignment - Back contact compatible with flip chips - Measurement items and content can be customized in the software to meet customer specifications.

  • Semiconductor inspection/test equipment

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XYZ 3-axis Nano Manipulator/Prober

XYZ 3-axis Nano Manipulator/Prober

Optimal for nano/micro manipulation and probing under SEM, FIB, and optical microscope observation.

The UP-100U is a manipulator/prober capable of operating on the nanometer level in the XYZ three axes and rotational axis. By combining it with commercially available SEM/FIB/optical microscopes, it can be used for various applications such as manipulation/probing at the micro/nanometer scale.

  • Microscope
  • Analytical Equipment and Devices

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Manual Prober

Manual Prober

OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.

The OYM-401 is a basic model with a simple operation panel that prioritizes ease of use. 【Features】 ◆ A model set up with a stereo microscope suitable for probing IC pads. ◆ Equipped with a standard 8-inch stroke X-Y stage. ◆ Optional installation of various equipment such as probe card holders and hot chucks is available. *For more details, please request the materials.

  • Semiconductor inspection/test equipment

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Simple Shield Box Prober TB Series

Simple Shield Box Prober TB Series

The initial installation cost is low! Just close the lid to create a shield, allowing for the measurement of microcurrents. It is a manual prober that can be equipped with a positioner and microscope.

This is an announcement from Yuzan Corporation regarding the "Simple Shield Box Prober."

  • Circuit Board Inspection Equipment

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Shielding Prober SP Series

Shielding Prober SP Series

This is a manual prober that can build a shielding environment on its own. It is equipped with a compact positioner, creating a space-saving and highly shielded measurement environment.

This is an announcement from Yuzan Corporation regarding the "Shielding Prober."

  • Circuit Board Inspection Equipment

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Vacuum prober, low-temperature prober

Vacuum prober, low-temperature prober

Measurement without condensation at low temperatures.

This is a notice from Yuzan Corporation regarding the "Low-Temperature Prober."

  • Other environmental analysis equipment

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