We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for microscope.
ipros is IPROS GMS IPROS One of the largest technical database sites in Japan that collects information on.

microscope Product List and Ranking from 31 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Jul 16, 2025~Aug 12, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Jul 16, 2025~Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. ピーテック Osaka//Medical Devices
  3. null/null
  4. 4 null/null
  5. 5 レイマー Osaka//Optical Instruments

microscope Product ranking

Last Updated: Aggregation Period:Jul 16, 2025~Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. Digital Phase Contrast Microscope "P-Scope V" ピーテック
  4. 4 Microscope "P-Scope PRO" ピーテック
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

256~270 item / All 355 items

Displayed results

Infrared microscope "TAZ10-IR"

Zoom ratio 12 (0.83x to 10x)! We offer three types of objective lenses.

The "TAZ10-IR" is an infrared microscope equipped with an infrared-compatible lens for the AZ10 zoom microscope. It is suitable for observing and aligning samples that cannot be seen with visible light, such as the interiors of samples covered with composite materials, the insides of silicon substrates, and wire bonding adhesive surfaces. 【Features】 ■ Available with objective lenses of 15x, 30x, and 50x ■ Choose between manual (TAZ10-IRT) and electric (TAZ10-IRE) types ■ Wavelength range: 650nm to 1200nm (infrared and some visible) = near-infrared microscope *For more details, please download the PDF or contact us.

  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

25 million pixel ultra-wide field microscope

f = 200mm infinite distance design compatible with coaxial illumination! Super wide field microscope.

We handle the "25 million pixel ultra-wide field microscope" with an image circle of 33mm. It is possible to incorporate laser autofocus and an electric revolver. Additionally, it features an f=200mm infinity design and is compatible with coaxial illumination. 【Features】 ■ Dedicated objective lenses of 2.5X and 5X can be attached. When using 5X, the field of view (FOV) is 4.6mm x 4.6mm. ■ Camera Link I/F *For more details, please download the PDF or contact us.

  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Industrial Microscope OLS5100 EVIDENT (OLYMPUS)

A sophisticated tool for quick measurement and analysis.

Evolving into a tool that provides total support from experiment preparation to report creation - From experiment preparation to analysis and report creation, all in one device - Industry-leading measurement performance accessible to anyone - High-precision measurements without the need for setup

  • Optical microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Inverted Metal Microscope BX53M

With abundant support features, we achieve the appropriate settings.

With its rich support features, even beginners can easily set up the microscope correctly. Additionally, the newly developed guidance function allows users to easily return to the same observation conditions as before. With the BX53M, users can fully utilize the microscope's functions without needing specialized training, reducing variability among different operators. ◆ Just turn the dial: Simple switching of observation methods Complex operations required during microscope use are minimized to the extreme. The dial on the front of the illumination tube allows users to change observation methods, enabling quick switching between commonly used methods such as bright field, dark field, and differential interference, making various analyses easy to perform. Furthermore, even in simple polarized observations, rotating the analyzer expands the range of observations. ◆ Obtain appropriate images with guidance: Indexed diaphragm The diaphragm position, which has been difficult to set correctly in the past, can now be accurately specified just by matching it to the display. By properly setting the aperture diaphragm and field diaphragm, high-contrast images that fully utilize optical performance can be obtained.

  • Optical microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Measuring Microscope STM7 (EVIDENT)

A measuring microscope that fits your purpose.

Whether the measurement sample is small or large. Whether the measurement content is simple or complex. Whether the user is a beginner or experienced. A measuring microscope that fits your measurements. That is the STM7 series.

  • Optical microscope

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Time-lapse fluorescence microscope 'LS 820/850' in incubator

Incubator-compatible; time-lapse three-color fluorescence microscope.

The "Lumascope 820/850" from Etaluma is a compact time-lapse fluorescence microscope designed for use in limited spaces such as incubators, safety cabinets, and environmental control workstations. With an LED light source, Semrock filters, advanced optical design, and a CMOS sensor, it achieves nearly diffraction-limited resolution. Additionally, by simply connecting to a dedicated computer via USB, it allows for easy saving of still images, time-lapse sequences, and videos, enabling low-cost, high-quality imaging in three-color fluorescence (blue, green, red). 【Features】 - Reduces costs and simplifies operation and maintenance through advanced LED optical design. - Achieves quick setup and ease of use with power supply and control via USB connection to a PC. - Provides excellent resolution even under general lighting conditions with an advanced optical system. - Enhances observation of unstained samples with a phase contrast unit. - Offers high image quality through compatibility with objectives from Evident, among other features. *For more details, please download the PDF or feel free to contact us.

  • Other microscopes and optical inspection equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Atomic Force Microscope (AFM) "Park NX10"

Atomic force microscope providing reliable data with the highest level of nanoscale resolution.

The "Park NX10" is an atomic force microscope (AFM) that can be easily operated at all stages, from sample setup to imaging, measurement, and analysis. With this product, users can focus more on innovative research based on better data and more time. 【Features】 ■ Accurate XY scanning without bowing due to crosstalk removal ■ Accurate AFM topography using a low-noise Z detector ■ Top-class chip lifespan, resolution, and sample protection with true non-contact (TM) mode ■ Nano-order surface analysis of various materials such as semiconductors, polymers, battery materials, and carbon-based materials (see image gallery) *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Atomic Force Microscope (AFM) "Park NX20"

Fault analysis and nano-shape measurement tools for research and development in large samples.

The "Park NX20" is a large sample atomic force microscope (AFM) that artistically combines power, versatility, and ease of operation. This product is equipped with unique features to clarify the underlying causes of device failures and develop more creative solutions. Additionally, true non-contact (TM) mode scanning allows chips to be maintained sharper and longer, preventing unnecessary time and cost expenditures. [Solutions using large sample AFM in research and FA labs] ■ Surface roughness measurement for media and substrates ■ Defect inspection imaging and analysis ■ High-resolution electrical property measurement mode ■ Sidewall measurement in 3D structural analysis ■ Accurate AFM shape imaging with a low-noise Z detector *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Atomic Force Microscope (AFM) "Park NX-Hivac"

Vacuum environment scanning suitable for fault analysis applications.

The "Park NX-Hivac" is a high vacuum atomic force microscope (AFM) designed for failure analysis and materials that are susceptible to environmental influences. It enables precise failure analysis of highly doped semiconductors. Additionally, by utilizing our already recognized technology, it has achieved low noise measurements with high resolution, high reproducibility, and operability. 【High Vacuum Measurement for Failure Analysis】 - Advanced StepScan automatic mechanism and laser alignment mechanism for high-speed scanning - Multi-sample chuck - Park's unique easy chip exchange function - Large vacuum chamber (300mm×420mm×320mm) - Direct optical microscope that enables ultra-long distance observation - Enhanced sensitivity high vacuum SSRM mode *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration