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microscope Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. フローベル Kanagawa//Optical Instruments
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  5. 5 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
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microscope Product ranking

Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. Bilateral Microscope System "TOMOS Series" フローベル
  4. 4 All-in-one fluorescence microscope 'BZ-X800'
  5. 5 All-in-one fluorescence microscope BZ-X series

microscope Product List

271～285 item / All 656 items

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In various fields such as the semiconductor industry, polymer material development and research, and quality control!

In various fields such as the semiconductor industry, polymer material development and research, and quality control!

Introduction of recommended electron microscopes, photoelectron spectrometers, and internal oblique compound microscopes by Azusa Science.

We would like to introduce three recommended products from Azusa Science. ◆ JEOL Ltd. JEM-1400Flash Electron Microscope This transmission electron microscope features a high-sensitivity sCMOS camera, an ultra-wide field montage system, and an enhanced linking function between optical microscope images and electron microscope images. It is utilized across a wide range of fields, including biology, nanotechnology, polymers, and advanced materials. ◆ JEOL Ltd. JPS-9030 X-ray Photoelectron Spectroscopy (XPS) System Equipped with a Kaufman-type etching ion source and twin anodes as standard, this versatile XPS system also offers extensive expandability with high-temperature heating systems and gas cluster ion sources. It is widely used from universities to factories as a highly versatile analytical method in material research and development, as well as in quality control. ◆ Nikon Solutions Co., Ltd. Internal Oblique Stereo Microscope SMZ445/460 This stereo zoom microscope series from Nikon boasts excellent optical performance similar to that of their cutting-edge models. It is suitable for inspecting and observing resin molded products and metal processed parts. It meets the needs for component inspection and quality control.

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JSM-IT210 Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

It is a new generation SEM that is compact and capable of unmanned operation.

The JSM-IT210 scanning electron microscope from JEOL Ltd. is the most compact scanning electron microscope among JEOL's benchtop models. The newly developed stage features all five axes driven by motors, allowing for safer and faster operation. ○ Features - "Sample Exchange Navigation" for easy observation after inserting the sample - "Zeromag" for magnifying optical images into SEM images - "Live Analysis" for continuous elemental analysis during observation - "Simple SEM" for a variety of automatic measurements - Functions that strongly support automatic measurements - Faster analysis - Standard equipped with a 60 mm² large-diameter EDS *For more details, please refer to the PDF or feel free to contact us.

  • Electron microscope

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JSM-IT710HR Scanning Electron Microscope

JSM-IT710HR Scanning Electron Microscope

Because I can see it, I want to pursue it.

JEOL Ltd. JSM-IT710HR Scanning Electron Microscope In addition to its resolution and analytical performance at the nanometer scale, throughput during data acquisition is also important. The newly developed JSM-IT710HR is a fourth-generation model in JEOL's HR series, themed "Anyone can easily capture high-resolution images with SEM." It features enhanced operability with expanded automatic functions and improved observation performance with a new detector system. ○ Features - SEM images are visible in conjunction with optical images - High-resolution electron gun for better visibility - Automatic measurement function: Simple SEM/EDS - Real-time 3D image construction: Live 3D - New low vacuum secondary electron detector LHSED - Stability of the Schottky FE electron gun enhanced to over four times compared to previous models *For more details, please refer to the PDF or feel free to contact us.

  • Electron microscope

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Research Inverted Microscope ECLIPSE Ji

Research Inverted Microscope ECLIPSE Ji

A benchtop microscope that assists with routine work in drug discovery research.

Nikon Solutions Co., Ltd. ECLIPSE Ji is Nikon's first research-use digital inverted microscope. By eliminating the eyepiece, it achieves a new design that combines ease of learning and usability while maintaining Nikon's proud optical quality and wide field of view (FOV). It enables imaging in an optimal environment for your research purposes. It streamlines the imaging workflow and assists in data acquisition. 〇 Features - Benchtop inverted microscope that does not require a darkroom - Versatile bioassays - AI-supported observation/analysis - Nikon's proud optical quality *For more details, please refer to the catalog or feel free to contact us.

  • Other microscopes

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Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields!

Research on polymer materials, foreign substance analysis and quality control in pharmaceuticals, electronics, and chemical fields!

Analysis of chemical bonding states, research in fields from biology to nanotechnology, polymers, cutting-edge materials, and the electrical, electronic, automotive, mechanical, chemical, and pharmaceutical industries.

We would like to introduce three products from Japan Electronic Corporation that can be utilized in various fields. If you are interested, please feel free to contact us. 〇 JPS-9030 Photoelectron Spectrometer (XPS) This is a general-purpose XPS that realizes "anyone can use it easily and immediately." It comes standard with a Kaufman-type etching ion source and twin anodes, and despite being a general-purpose XPS, it also has a wide range of expandability, including a high-temperature heating system and gas cluster ion source. 〇 JEM-1400Flash Electron Microscope This transmission electron microscope is equipped with a high-sensitivity sCMOS camera and incorporates powerful new features such as an ultra-wide field montage system and optical microscope image linking functionality. 〇 JCM-7000 NeoScope Desktop Scanning Electron Microscope This desktop scanning electron microscope aims to allow anyone to observe and analyze. It features a low vacuum mode that requires no pre-treatment and a stage navigation system for easy field searching. It includes functions such as Zeromag, which allows direct transition from optical images to SEM images, Live Analysis for elemental analysis while observing, and Live 3D for three-dimensional observation during SEM observation.

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  • Other physicochemical equipment

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Optical wave field three-dimensional microscope

Optical wave field three-dimensional microscope

Performance that surpasses conventional microscopes: Visualization and quantification of damage and foreign objects in transparent bodies.

This microscope allows for the evaluation of transparent foreign substances and defects on the nanometer order, obtaining height information in a single shot, and measuring in a non-contact, non-destructive, and non-invasive manner. Furthermore, it does not require focusing and can quickly scan any surface to determine measurement positions. Features: - Capable of evaluating transparent foreign substances and defects on the nanometer order - Visualizes the surfaces and bonding interfaces of transparent materials that cannot be confirmed by the naked eye - Instantaneously obtains depth information in a single shot - Enables high-speed measurement without the need for focusing - Allows for non-destructive, non-contact, and non-invasive measurements

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  • Optical microscope

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Non-contact step height measurement microscope "TAH Series"

Non-contact step height measurement microscope "TAH Series"

Since it is an optical non-contact method, measurements can be taken without the influence of deformation or dents on the workpiece!

The "TAH Series" is a microscope that allows for non-contact measurement of height, depth, and steps by aligning the "Focus Navi Mark" equipped in the microscope optical system with the Z-axis movement. By incorporating the Focus Navi Mark, reproducibility is significantly improved without relying on the operator. There are two types available: a trinocular type and a straight tube type, allowing for selection based on application. (The camera is of C-mount type) 【Features】 ■ Two types of objective lenses are available: infinite system f=180 type and f=200 type ■ Compact size ■ Can be mounted as a measurement scope on the device ■ Measurement stages, TV camera devices, and measurement software can be combined according to purpose *For more details, please download the PDF or contact us.

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Handheld Fluorescence Microscope 'S-3380'

Handheld Fluorescence Microscope 'S-3380'

Compact design that can be held with one hand! It is a smartphone-compatible fluorescence microscope.

The S-3380 is a handheld fluorescence microscope designed for easy acquisition of fluorescence images in the field using your smartphone. It allows for simple fluorescence observation of actively stained mycorrhizal fungi. It uses a battery-powered high-brightness LED, eliminating the need for an AC power source. Additionally, it can reliably capture images even in locations with unstable power supply. 【Features】 ■ Battery-operated for use anywhere (uses 3 AA batteries) ■ Excitation wavelength, fluorescence wavelength, and objective lens are interchangeable *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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Schottky field emission scanning electron microscope 'JSM-7900F'

Schottky field emission scanning electron microscope 'JSM-7900F'

It excels in operability and consistently delivers high performance without relying on the operator's skills!

We offer the next-generation electronic optical control system "Neo Engine," which integrates lens control systems and automatic function technology, in our Schottky field emission scanning electron microscope 'JSM-7900F.' Even when changing the electronic optical conditions, there is almost no deviation in the optical axis, significantly improving operability and observation accuracy, allowing anyone to easily harness the device's inherent performance. 【Features】 ■ Enhanced automatic functions - Focus can be adjusted in a few seconds ■ Improved magnification accuracy - High-precision length measurement is also possible ■ Enhanced usability of the energy filter - Even with significant changes to the settings, there is almost no deviation in the field of view or focus *For more details, please contact us.

  • Electron microscope
  • Scanning Electron Microscope

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Industrial Microscope USPM-RU-W (EVIDENT)

Industrial Microscope USPM-RU-W (EVIDENT)

Achieving spectral measurements across a wide wavelength range from visible light at 380nm to near-infrared at 1050nm.

The Olympus near-infrared micro-spectroscopy measurement device USPM-RU-W performs a wide range of spectral measurements from the visible light region to the near-infrared region with speed and high precision. It easily measures small areas and the reflectance of curved surfaces, making it ideal for optical elements and microelectronic components.

  • Optical microscope

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Semiconductor/FPD Inspection Microscope MX63/MX63L

Semiconductor/FPD Inspection Microscope MX63/MX63L

Making inspections of semiconductors and FPDs more comfortable and efficient.

The MX63/MX63L is a large microscope capable of inspecting samples such as wafers and LCD panels up to 300mm in size, as well as electronic substrates. By combining various modules that cater to different applications, we can provide a beneficial system for our customers. Furthermore, when combined with the PRECiV image analysis software, we offer a seamless workflow from observation to report generation.

  • Other inspection equipment and devices

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Stereo Microscope SZ61 EVIDENT (OLYMPUS)

Stereo Microscope SZ61 EVIDENT (OLYMPUS)

Combining compact design with high optical performance.

The SZ61 is a compact stereo microscope equipped with the necessary features for routine work inspections. It provides clear images and a wide zoom range. With its unique optical system that achieves high flatness and deep focal depth, along with ESD performance to protect electronic component samples, it meets a wide range of inspection needs.

  • Optical microscope

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Atomic Force Microscope "Park NX-Wafer"

Atomic Force Microscope "Park NX-Wafer"

Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!

The "Park NX-Wafer" is an atomic force microscope that performs defect imaging and analysis fully automatically, improving productivity in defect inspection by 1,000% through AFM measurement techniques. It is a low-noise atomic force profiler for accurate and high-throughput CMP profile measurements. It measures sub-Å surface roughness with extreme accuracy, minimizing variation between chips. 【Features】 ■ Fully automated AFM solution for defect imaging and analysis ■ Up to 1,000% increase in productivity for defect review ■ Achieves accurate and high-throughput CMP measurements with a low-noise atomic force profiler ■ Extremely accurate sub-Å surface roughness measurement, minimizing variation between chip-to-chip ■ Atomic force profiler *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • Electron microscope

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IR microscope system

IR microscope system

Non-destructive testing with infrared light

The IR microscope system SK19001-300 is a non-destructive inspection system that uses near-infrared light that passes through silicon wafers, allowing for visual confirmation of defects inside the wafer and the condition of the bonding surfaces on a PC screen.

  • Optical microscope

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