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microscope Product List and Ranking from 178 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Mar 18, 2026～Apr 14, 2026
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Mar 18, 2026～Apr 14, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  5. 5 レイマー Osaka//Optical Instruments
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microscope Product ranking

Last Updated： Aggregation Period:Mar 18, 2026～Apr 14, 2026
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser 'VK-X4000 series'
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. White interference microscope equipped with laser microscope 'VK-X3000'
  4. 4 All-in-one fluorescence microscope 'BZ-X800'
  5. 5 All-in-one fluorescence microscope BZ-X series

microscope Product List

571～600 item / All 673 items

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ECLIPSE Ci upright microscope for inspection

ECLIPSE Ci upright microscope for inspection

We will respond to requests such as 'I want to observe in a more comfortable position,' 'I want to operate with one touch,' and 'I want to minimize adjustment work.'

Nikon Solutions Co., Ltd. presents the ECLIPSE Ci series upright microscope for inspection, designed to meet various "wish list" requests from users who utilize microscopes for daily inspections and research. It can be equipped with accessories that support various observation methods such as phase contrast, simple polarization, and fluorescence. The model equipped with bright and environmentally friendly LED lighting* eliminates the need for frequent lamp replacements. 〇 Features - Comfortable operability - Easy image capture - Supports various observation methods *For more details, please download the PDF or feel free to contact us.

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Research upright microscope with up-and-down stage ECLIPSE FN1

Research upright microscope with up-and-down stage ECLIPSE FN1

Proposing optimal spatial and optical performance for the observation and analysis of neural activity in vivo and in vitro.

Nikon Solutions Co., Ltd. has designed the ECLIPSE FN1 research upright microscope from scratch, focusing on optical performance, operability, and expandability. It provides satisfactory solutions for the demands of electrophysiology and high-level live cell observation, ensuring clarity in observing details of thick samples, ease of manipulation, and thorough noise reduction. 〇 Features - Newly developed low magnification and high NA objective lenses!! One lens covers a wide range from high to low magnification, making it ideal for patch clamping and live cell imaging. - A new series of objective lenses suitable for IR-DIC observation has been developed. - Objective lens design prioritizes accessibility for electrodes. - Objective lens switching operation is safe and reliable. *For more details, please download the PDF or feel free to contact us.

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Polarizing Microscope ECLIPSE LV100N POL

Polarizing Microscope ECLIPSE LV100N POL

A polarizing microscope that combines the highest level of optical quality, operability, and stability.

Nikon Solutions Co., Ltd. Polarizing Microscope ECLIPSE LV100N POL features a high-brightness halogen light source that achieves brightness equivalent to over 100W, despite having a 50W light source. At high magnifications of 50X or more, the brightness is approximately 20% to 40% higher than that of a 100W light source. 〇 Features - Uniform light transmission illumination system - High-precision rotating stage - Five-hole revolving nosepiece for centering - Intermediate tube for polarization *For more details, please download the PDF or feel free to contact us.

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Polarizing/Differential Interference Contrast Microscope ECLIPSE LV100ND POL/DS

Polarizing/Differential Interference Contrast Microscope ECLIPSE LV100ND POL/DS

A microscope for dispersed dyeing enables qualitative analysis and identification of asbestos.

Nikon Solutions Co., Ltd. Polarized/Differential Microscope ECLIPSE LV100ND POL/DS is a high-performance polarized microscope equipped with accessories that enable dispersion staining observation at a magnification of 400 times. It can measure the properties of asbestos, such as refractive index, birefringence, retardation, extinction angle, pleochroism, and signs of elongation, assisting in the identification of asbestos. 〇Features - Highlights - Birefringence - Extinction angle *For more details, please download the PDF or feel free to contact us.

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Polarizing Microscope ECLIPSE Ci POL

Polarizing Microscope ECLIPSE Ci POL

It is a compact polarizing microscope that balances optical performance and ease of use.

Nikon Solutions Co., Ltd. Polarizing Microscope ECLIPSE Ci POL is a personal type polarizing microscope that can be widely used without occupying desk space. It is equipped with the CFI60 optical system, which simultaneously achieves high numerical aperture (NA) and long working distance, combining advanced optical performance with user-friendly operability. 〇 Features - Five-position revolving nosepiece - Polarizing intermediate tube - Transmission and reflection illumination types - Excellent basic performance as well as cost performance - Easily observe samples with significant height *For more details, please download the PDF or feel free to contact us.

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System Entity Microscope SMZ1270/1270i

System Entity Microscope SMZ1270/1270i

The standard of evolving optical microscopes.

Nikon Solutions Co., Ltd.'s SMZ1270/1270i system stereo microscope features a class-leading 12.7x zoom (magnification range 0.63x-8x). Its state-of-the-art optical system delivers bright and sharp images across the entire field of view. 〇Features - Class-leading zoom ratio - Excellent chromatic aberration correction - High-performance objective lenses - Easy switching of objective lenses and vertical observation - OCC lighting ideal for transparent samples *For more details, please refer to the PDF or feel free to contact us.

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System Entity Microscope SMZ800N

System Entity Microscope SMZ800N

A highly versatile cost-performance model with improved basic performance and operability.

Nikon Solutions Co., Ltd.'s SMZ800N system body microscope features a zoom capability (magnification range 1X-8X) that achieves a total magnification of 5X-480X. The high magnification zoom allows for detailed observation of fine structures with high clarity. By improving the color aberration correction of the zoom body optical system, sharp images can be obtained across the entire field of view. 〇Features - Excellent basic performance - Comfortable posture for observation - High expandability with a variety of accessories *Please download the PDF or feel free to contact us.

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For research in organic chemistry and materials science, as well as observations at atomic resolution!

For research in organic chemistry and materials science, as well as observations at atomic resolution!

Introduction to recommended electron microscopes, polarizing microscopes, and mass spectrometers by Azusa Science.

Here are three recommended products: ◆ JEOL Ltd. JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Equipped with a cold field emission gun (Cold-FEG) and a new spherical aberration corrector (ASCOR) capable of correcting higher-order aberrations as standard, it enables atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. This makes it easier to observe materials containing light elements with clear contrast. ◆ Nikon Solutions Co., Ltd. Polarized/Dispersion Microscope ECLIPSE LV100ND POL/DS This microscope can measure the properties of asbestos, such as refractive index, birefringence, retardation, extinction angle, pleochroism, and elongation, aiding in the identification of asbestos. It allows for dispersion staining observation at a magnification of 400 times. ◆ JEOL Ltd. JMS-T100LP AccuTOF LC-Express Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer This high-throughput mass spectrometer aims for high productivity with features such as multi-ionization, robustness, and easy maintenance. It is capable of analyzing a wide range of samples from low polarity to high polarity.

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  • JMS-T100LP.png
  • ECLIPSE LV100ND POL-DS.png
  • Analytical Equipment and Devices
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Infrared microscope "TAZ10-IR"

Infrared microscope "TAZ10-IR"

Zoom ratio 12 (0.83x to 10x)! We offer three types of objective lenses.

The "TAZ10-IR" is an infrared microscope equipped with an infrared-compatible lens for the AZ10 zoom microscope. It is suitable for observing and aligning samples that cannot be seen with visible light, such as the interiors of samples covered with composite materials, the insides of silicon substrates, and wire bonding adhesive surfaces. 【Features】 ■ Available with objective lenses of 15x, 30x, and 50x ■ Choose between manual (TAZ10-IRT) and electric (TAZ10-IRE) types ■ Wavelength range: 650nm to 1200nm (infrared and some visible) = near-infrared microscope *For more details, please download the PDF or contact us.

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25 million pixel ultra-wide field microscope

25 million pixel ultra-wide field microscope

f = 200mm infinite distance design compatible with coaxial illumination! Super wide field microscope.

We handle the "25 million pixel ultra-wide field microscope" with an image circle of 33mm. It is possible to incorporate laser autofocus and an electric revolver. Additionally, it features an f=200mm infinity design and is compatible with coaxial illumination. 【Features】 ■ Dedicated objective lenses of 2.5X and 5X can be attached. When using 5X, the field of view (FOV) is 4.6mm x 4.6mm. ■ Camera Link I/F *For more details, please download the PDF or contact us.

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Industrial Microscope OLS5100 EVIDENT (OLYMPUS)

Industrial Microscope OLS5100 EVIDENT (OLYMPUS)

A sophisticated tool for quick measurement and analysis.

Evolving into a tool that provides total support from experiment preparation to report creation - From experiment preparation to analysis and report creation, all in one device - Industry-leading measurement performance accessible to anyone - High-precision measurements without the need for setup

  • Optical microscope
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Inverted Metal Microscope BX53M

Inverted Metal Microscope BX53M

With abundant support features, we achieve the appropriate settings.

With its rich support features, even beginners can easily set up the microscope correctly. Additionally, the newly developed guidance function allows users to easily return to the same observation conditions as before. With the BX53M, users can fully utilize the microscope's functions without needing specialized training, reducing variability among different operators. ◆ Just turn the dial: Simple switching of observation methods Complex operations required during microscope use are minimized to the extreme. The dial on the front of the illumination tube allows users to change observation methods, enabling quick switching between commonly used methods such as bright field, dark field, and differential interference, making various analyses easy to perform. Furthermore, even in simple polarized observations, rotating the analyzer expands the range of observations. ◆ Obtain appropriate images with guidance: Indexed diaphragm The diaphragm position, which has been difficult to set correctly in the past, can now be accurately specified just by matching it to the display. By properly setting the aperture diaphragm and field diaphragm, high-contrast images that fully utilize optical performance can be obtained.

  • Optical microscope
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Measuring Microscope STM7 (EVIDENT)

Measuring Microscope STM7 (EVIDENT)

A measuring microscope that fits your purpose.

Whether the measurement sample is small or large. Whether the measurement content is simple or complex. Whether the user is a beginner or experienced. A measuring microscope that fits your measurements. That is the STM7 series.

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Time-lapse fluorescence microscope 'LS 820/850' in incubator

Time-lapse fluorescence microscope 'LS 820/850' in incubator

Incubator-compatible; time-lapse three-color fluorescence microscope.

The "Lumascope 820/850" from Etaluma is a compact time-lapse fluorescence microscope designed for use in limited spaces such as incubators, safety cabinets, and environmental control workstations. With an LED light source, Semrock filters, advanced optical design, and a CMOS sensor, it achieves nearly diffraction-limited resolution. Additionally, by simply connecting to a dedicated computer via USB, it allows for easy saving of still images, time-lapse sequences, and videos, enabling low-cost, high-quality imaging in three-color fluorescence (blue, green, red). 【Features】 - Reduces costs and simplifies operation and maintenance through advanced LED optical design. - Achieves quick setup and ease of use with power supply and control via USB connection to a PC. - Provides excellent resolution even under general lighting conditions with an advanced optical system. - Enhances observation of unstained samples with a phase contrast unit. - Offers high image quality through compatibility with objectives from Evident, among other features. *For more details, please download the PDF or feel free to contact us.

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Multiphoton microscopy

Multiphoton microscopy

What is a suitable light source for multiphoton microscopy? A detailed explanation from the principles to the basic components.

Multiphoton microscopy is a type of laser scanning microscope. It performs multiphoton excitation using pulsed lasers in the infrared region and observes the fluorescence intensity from the sample. It is a system that can perform three-dimensional imaging by scanning either the sample or the laser. In this article, we will explain the principles and applications of multiphoton microscopy, as well as the key light sources that make up its configuration. [Contents] ■ Principles and features of multiphoton microscopy ■ Basic configuration of multiphoton microscopy ■ Applications of multiphoton microscopy in life sciences and medical research *For more details, please download the PDF or feel free to contact us.

  • Optical microscope
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[Measurement Example] Evaluating the Thickness of Metal Thin Films with Heat [TM]

[Measurement Example] Evaluating the Thickness of Metal Thin Films with Heat [TM]

By measuring thermal properties, the thickness of the thin film can be evaluated!

By using the Bethel Corporation's thermal microscope TM3, the "thickness of thin films" can be evaluated.

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Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 (Held on 10/15)

Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 (Held on 10/15)

Free participation! Report on the determination of absolute stereochemistry using MicroED.

We will hold a webinar titled "Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 - Determining Absolute Stereochemistry Using MicroED." This time, referred to as "Part 2," we will introduce the determination of "absolute stereochemistry" while fully considering the effects of multiple scattering of electrons. This method is an excellent technique that demonstrates remarkable power in determining absolute stereochemistry in molecules composed solely of light elements. As a case study, this webinar will report on the determination of absolute stereochemistry using MicroED for complex natural products and synthetic pharmaceutical raw materials. [Event Overview] ■ Date and Time: October 15, 2024 (Tuesday) 14:00 - 14:45 ■ Participation: Free ■ Venue: Webinar held via Microsoft Teams *For more details, please refer to the related links or feel free to contact us.

  • Structural analysis contract
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Atomic Force Microscope (AFM) "Park NX10"

Atomic Force Microscope (AFM) "Park NX10"

Atomic force microscope providing reliable data with the highest level of nanoscale resolution.

The "Park NX10" is an atomic force microscope (AFM) that can be easily operated at all stages, from sample setup to imaging, measurement, and analysis. With this product, users can focus more on innovative research based on better data and more time. 【Features】 ■ Accurate XY scanning without bowing due to crosstalk removal ■ Accurate AFM topography using a low-noise Z detector ■ Top-class chip lifespan, resolution, and sample protection with true non-contact (TM) mode ■ Nano-order surface analysis of various materials such as semiconductors, polymers, battery materials, and carbon-based materials (see image gallery) *For more details, please refer to the PDF document or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX20"

Atomic Force Microscope (AFM) "Park NX20"

Fault analysis and nano-shape measurement tools for research and development in large samples.

The "Park NX20" is a large sample atomic force microscope (AFM) that artistically combines power, versatility, and ease of operation. This product is equipped with unique features to clarify the underlying causes of device failures and develop more creative solutions. Additionally, true non-contact (TM) mode scanning allows chips to be maintained sharper and longer, preventing unnecessary time and cost expenditures. [Solutions using large sample AFM in research and FA labs] ■ Surface roughness measurement for media and substrates ■ Defect inspection imaging and analysis ■ High-resolution electrical property measurement mode ■ Sidewall measurement in 3D structural analysis ■ Accurate AFM shape imaging with a low-noise Z detector *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX-Hivac"

Atomic Force Microscope (AFM) "Park NX-Hivac"

Vacuum environment scanning suitable for fault analysis applications.

The "Park NX-Hivac" is a high vacuum atomic force microscope (AFM) designed for failure analysis and materials that are susceptible to environmental influences. It enables precise failure analysis of highly doped semiconductors. Additionally, by utilizing our already recognized technology, it has achieved low noise measurements with high resolution, high reproducibility, and operability. 【High Vacuum Measurement for Failure Analysis】 - Advanced StepScan automatic mechanism and laser alignment mechanism for high-speed scanning - Multi-sample chuck - Park's unique easy chip exchange function - Large vacuum chamber (300mm×420mm×320mm) - Direct optical microscope that enables ultra-long distance observation - Enhanced sensitivity high vacuum SSRM mode *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX12-Bio"

Atomic Force Microscope (AFM) "Park NX12-Bio"

Powerful scanning probe microscope for life sciences

The "Park NX12-Bio" is an atomic force microscope (AFM) equipped with three types of high-performance nanoscale microscopes on a single innovative platform. It enables both innovative liquid imaging with scanning ion conductance microscopy (SICM) and the highly regarded atomic force microscopy (AFM) technology. 【Comprehensive Solution for Nanoscale Biological Research】 ■ Equipped with a fracture-type fully independent Z-axis scanner/XY scanner, featuring high-precision Park NX AFM with complete non-contact technology (TM) ■ Ultra-high-resolution optical imaging using inverted optical microscopy technology ■ Enhanced biological cell imaging through the integration of scanning ion conductance microscopy *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope "Park NX-HDM"

Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
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[New Release!] Atomic Force Microscope 'Park NX7'

[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

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Bilateral Microscope System "TOMOS-50"

Bilateral Microscope System "TOMOS-50"

Introducing the front and back misalignment / dimensional measurement microscope. Achieved high precision at a low cost.

The "TOMOS-50" is a compact type of measurement system that can simultaneously capture the front and back of electronic components such as crystal oscillators, MEMS, and semiconductors, and measure with an accuracy of ±0.2μm or less. The front and back optical axis correction can be precisely adjusted using a micro stage and software. Additionally, it is also available for sale as a dual-sided microscope module for device integration. Please contact us for more information. 【Features】 ■ Compact type ■ Approximately 3 million pixels ■ Simultaneous capture of both sides, dimensional measurement, and position deviation measurement ■ High-precision correction of the front and back optical axis using a micro stage and software ■ Measurement of position deviation between front and back with a repeatability of ±0.2μm or less (varies depending on conditions) *For more details, please refer to the PDF document or feel free to contact us.

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Bilateral Microscope System "TOMOS-60XY"

Bilateral Microscope System "TOMOS-60XY"

Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.

The "TOMOS-60XY" is a 6-inch electric XY stage dual-sided microscope system that can automatically measure multiple locations on a workpiece. It can automatically move to the specified measurement locations on the workpiece and measure the displacement of patterns and alignment marks on the front and back of quartz oscillators, MEMS, semiconductor wafers, and electronic components. Additionally, it is equipped with an alignment function for correcting the positional deviation between the XY stage and the workpiece, ensuring precise movement control and preventing measurement errors. 【Features】 ■ Automatically detects the edges of alignment marks such as circles, squares, and crosses, and measures the displacement between their center coordinates. ■ Controls XYZ stage conditions, measurement conditions, creates maps, and registers recipes to automatically measure multiple locations on the workpiece. *For more details, please download the PDF or feel free to contact us.

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  • TOMOS-60XY-5.PNG
  • Electron microscope
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Frobel Corporation Industrial Products Digest Catalog

Frobel Corporation Industrial Products Digest Catalog

Introducing autofocus units, near-infrared cameras, and microscope camera systems.

This catalog features dual-sided microscope systems, micro line width measurement systems, and microscope camera systems. We introduce the easy-to-use, low-cost micro line width measurement system "VP-5LW," the high-resolution 3CMOS camera system "FR-960M" with excellent color reproduction, and the bright and beautifully colored color camera system for stereo microscopes "FR-400Z." It serves as a useful reference when considering implementation. 【Featured Products (Partial)】 ■ Dual-sided microscope system 4-inch/6-inch "TOMOS-50/TOMOS-60" ■ 6-inch electric XY stage dual-sided microscope system "TOMOS-60XY" ■ High-speed autofocus unit "MimicII-AF/CL" ■ High-sensitivity near-infrared camera "FS-1700IRP" ■ Color camera system for microscopes "FR-400C" *For more details, please download the PDF or feel free to contact us.

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8-inch electric XY stage dual-sided microscope system

8-inch electric XY stage dual-sided microscope system

We measure the positional deviation of the front and back with a repeatability accuracy of ±0.3μm or less!

The "TOMOS-50/60/80/XY" is a dual-sided microscope displacement measurement system capable of simultaneous imaging of both sides, dimensional measurement, and displacement measurement. It features electric control and automatic measurement, making it suitable for measuring and observing displacement of dual-sided exposure patterns, semiconductor wafers, and 4-inch, 6-inch, and 8-inch wafers, as well as MEMS and quartz oscillators. The correction of the optical axis for both sides is performed with high precision using a micro-stage and software. Additionally, it can be sold as a dual-sided microscope module for integration into devices. 【Features】 ■ Simultaneous imaging, dimensional measurement, and displacement measurement of both sides ■ High-precision correction of the optical axis for both sides using a micro-stage and software ■ Measurement of displacement between both sides with a repeatability accuracy of ±0.3μm or less ■ Compatible with a dual-channel auto-focus unit for both sides (optional) ■ Development of an electric XY stage control system is underway ■ Available for sale as a dual-sided microscope module for device integration *For more details, please download the catalog or feel free to contact us.

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6-inch electric XY stage dual-side microscope system

6-inch electric XY stage dual-side microscope system

Equipped with an electric XY stage and autofocus function!

The "TOMOS-60XY" is a dual-sided microscope displacement measurement system capable of simultaneous imaging of both sides, dimension measurement, and displacement measurement. [Applications] ■Observation: Simultaneous observation of both sides of electronic paper electrophoresis, particles, fluids, filters, etc. ■Displacement measurement of both sides: Measurement of the displacement of alignment marks and through holes on both sides of quartz oscillators, MEMS, etc. ■Dimension measurement of both sides: Measurement of dimensions on both sides of quartz oscillators, semiconductor linewidth patterns, etc. *For more details, please download the catalog or feel free to contact us.

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  • microscope

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