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microscope Product List and Ranking from 178 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. スリーアールソリューション Fukuoka//Trading company/Wholesale
  3. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  4. 4 アイテス Shiga//Electronic Components and Semiconductors
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
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microscope Product ranking

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. White interference microscope equipped with laser 'VK-X4000 series'
  3. All-in-one fluorescence microscope 'BZ-X1000 Series'
  4. 4 Portable Microscope "Magic Loupe R" / 15x Magnification, Photo and Save Capability スリーアールソリューション
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

571～600 item / All 650 items

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Infrared microscope "TAZ10-IR"

Infrared microscope "TAZ10-IR"

Zoom ratio 12 (0.83x to 10x)! We offer three types of objective lenses.

The "TAZ10-IR" is an infrared microscope equipped with an infrared-compatible lens for the AZ10 zoom microscope. It is suitable for observing and aligning samples that cannot be seen with visible light, such as the interiors of samples covered with composite materials, the insides of silicon substrates, and wire bonding adhesive surfaces. 【Features】 ■ Available with objective lenses of 15x, 30x, and 50x ■ Choose between manual (TAZ10-IRT) and electric (TAZ10-IRE) types ■ Wavelength range: 650nm to 1200nm (infrared and some visible) = near-infrared microscope *For more details, please download the PDF or contact us.

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25 million pixel ultra-wide field microscope

25 million pixel ultra-wide field microscope

f = 200mm infinite distance design compatible with coaxial illumination! Super wide field microscope.

We handle the "25 million pixel ultra-wide field microscope" with an image circle of 33mm. It is possible to incorporate laser autofocus and an electric revolver. Additionally, it features an f=200mm infinity design and is compatible with coaxial illumination. 【Features】 ■ Dedicated objective lenses of 2.5X and 5X can be attached. When using 5X, the field of view (FOV) is 4.6mm x 4.6mm. ■ Camera Link I/F *For more details, please download the PDF or contact us.

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Industrial Microscope OLS5100 EVIDENT (OLYMPUS)

Industrial Microscope OLS5100 EVIDENT (OLYMPUS)

A sophisticated tool for quick measurement and analysis.

Evolving into a tool that provides total support from experiment preparation to report creation - From experiment preparation to analysis and report creation, all in one device - Industry-leading measurement performance accessible to anyone - High-precision measurements without the need for setup

  • Optical microscope
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Inverted Metal Microscope BX53M

Inverted Metal Microscope BX53M

With abundant support features, we achieve the appropriate settings.

With its rich support features, even beginners can easily set up the microscope correctly. Additionally, the newly developed guidance function allows users to easily return to the same observation conditions as before. With the BX53M, users can fully utilize the microscope's functions without needing specialized training, reducing variability among different operators. ◆ Just turn the dial: Simple switching of observation methods Complex operations required during microscope use are minimized to the extreme. The dial on the front of the illumination tube allows users to change observation methods, enabling quick switching between commonly used methods such as bright field, dark field, and differential interference, making various analyses easy to perform. Furthermore, even in simple polarized observations, rotating the analyzer expands the range of observations. ◆ Obtain appropriate images with guidance: Indexed diaphragm The diaphragm position, which has been difficult to set correctly in the past, can now be accurately specified just by matching it to the display. By properly setting the aperture diaphragm and field diaphragm, high-contrast images that fully utilize optical performance can be obtained.

  • Optical microscope
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Time-lapse fluorescence microscope 'LS 820/850' in incubator

Time-lapse fluorescence microscope 'LS 820/850' in incubator

Incubator-compatible; time-lapse three-color fluorescence microscope.

The "Lumascope 820/850" from Etaluma is a compact time-lapse fluorescence microscope designed for use in limited spaces such as incubators, safety cabinets, and environmental control workstations. With an LED light source, Semrock filters, advanced optical design, and a CMOS sensor, it achieves nearly diffraction-limited resolution. Additionally, by simply connecting to a dedicated computer via USB, it allows for easy saving of still images, time-lapse sequences, and videos, enabling low-cost, high-quality imaging in three-color fluorescence (blue, green, red). 【Features】 - Reduces costs and simplifies operation and maintenance through advanced LED optical design. - Achieves quick setup and ease of use with power supply and control via USB connection to a PC. - Provides excellent resolution even under general lighting conditions with an advanced optical system. - Enhances observation of unstained samples with a phase contrast unit. - Offers high image quality through compatibility with objectives from Evident, among other features. *For more details, please download the PDF or feel free to contact us.

  • Other microscopes and optical inspection equipment
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[Measurement Example] Evaluating the Thickness of Metal Thin Films with Heat [TM]

[Measurement Example] Evaluating the Thickness of Metal Thin Films with Heat [TM]

By measuring thermal properties, the thickness of the thin film can be evaluated!

By using the Bethel Corporation's thermal microscope TM3, the "thickness of thin films" can be evaluated.

  • Other physicochemical equipment
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Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 (Held on 10/15)

Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 (Held on 10/15)

Free participation! Report on the determination of absolute stereochemistry using MicroED.

We will hold a webinar titled "Fundamentals and Applications of MicroED Crystal Structure Analysis Part 2 - Determining Absolute Stereochemistry Using MicroED." This time, referred to as "Part 2," we will introduce the determination of "absolute stereochemistry" while fully considering the effects of multiple scattering of electrons. This method is an excellent technique that demonstrates remarkable power in determining absolute stereochemistry in molecules composed solely of light elements. As a case study, this webinar will report on the determination of absolute stereochemistry using MicroED for complex natural products and synthetic pharmaceutical raw materials. [Event Overview] ■ Date and Time: October 15, 2024 (Tuesday) 14:00 - 14:45 ■ Participation: Free ■ Venue: Webinar held via Microsoft Teams *For more details, please refer to the related links or feel free to contact us.

  • Structural analysis contract
  • Seminar
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Atomic Force Microscope (AFM) "Park NX10"

Atomic Force Microscope (AFM) "Park NX10"

Atomic force microscope providing reliable data with the highest level of nanoscale resolution.

The "Park NX10" is an atomic force microscope (AFM) that can be easily operated at all stages, from sample setup to imaging, measurement, and analysis. With this product, users can focus more on innovative research based on better data and more time. 【Features】 ■ Accurate XY scanning without bowing due to crosstalk removal ■ Accurate AFM topography using a low-noise Z detector ■ Top-class chip lifespan, resolution, and sample protection with true non-contact (TM) mode ■ Nano-order surface analysis of various materials such as semiconductors, polymers, battery materials, and carbon-based materials (see image gallery) *For more details, please refer to the PDF document or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX20"

Atomic Force Microscope (AFM) "Park NX20"

Fault analysis and nano-shape measurement tools for research and development in large samples.

The "Park NX20" is a large sample atomic force microscope (AFM) that artistically combines power, versatility, and ease of operation. This product is equipped with unique features to clarify the underlying causes of device failures and develop more creative solutions. Additionally, true non-contact (TM) mode scanning allows chips to be maintained sharper and longer, preventing unnecessary time and cost expenditures. [Solutions using large sample AFM in research and FA labs] ■ Surface roughness measurement for media and substrates ■ Defect inspection imaging and analysis ■ High-resolution electrical property measurement mode ■ Sidewall measurement in 3D structural analysis ■ Accurate AFM shape imaging with a low-noise Z detector *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX-Hivac"

Atomic Force Microscope (AFM) "Park NX-Hivac"

Vacuum environment scanning suitable for fault analysis applications.

The "Park NX-Hivac" is a high vacuum atomic force microscope (AFM) designed for failure analysis and materials that are susceptible to environmental influences. It enables precise failure analysis of highly doped semiconductors. Additionally, by utilizing our already recognized technology, it has achieved low noise measurements with high resolution, high reproducibility, and operability. 【High Vacuum Measurement for Failure Analysis】 - Advanced StepScan automatic mechanism and laser alignment mechanism for high-speed scanning - Multi-sample chuck - Park's unique easy chip exchange function - Large vacuum chamber (300mm×420mm×320mm) - Direct optical microscope that enables ultra-long distance observation - Enhanced sensitivity high vacuum SSRM mode *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX12-Bio"

Atomic Force Microscope (AFM) "Park NX12-Bio"

Powerful scanning probe microscope for life sciences

The "Park NX12-Bio" is an atomic force microscope (AFM) equipped with three types of high-performance nanoscale microscopes on a single innovative platform. It enables both innovative liquid imaging with scanning ion conductance microscopy (SICM) and the highly regarded atomic force microscopy (AFM) technology. 【Comprehensive Solution for Nanoscale Biological Research】 ■ Equipped with a fracture-type fully independent Z-axis scanner/XY scanner, featuring high-precision Park NX AFM with complete non-contact technology (TM) ■ Ultra-high-resolution optical imaging using inverted optical microscopy technology ■ Enhanced biological cell imaging through the integration of scanning ion conductance microscopy *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope "Park NX-HDM"

Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
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[New Release!] Atomic Force Microscope 'Park NX7'

[New Release!] Atomic Force Microscope 'Park NX7'

[Japanese Version Catalog Available] New products with low cost, high functionality, and short delivery times! Introducing the atomic force microscopes we handle!

The "Park NX7" is equipped with all the new technologies developed by Park Systems and is available at an affordable price. This product is designed down to the finest details, just like the higher-end models, and can facilitate research. Additionally, it offers flat orthogonal XY scanning without bowing. Please feel free to contact us if you have any inquiries. 【Features】 ■ Highly expandable AFM solution ■ Flat orthogonal XY scanning without bowing ■ Low noise Z detector ■ Improved chip lifespan, sample preservation, and repeatability through True Non Contact mode * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.

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Bilateral Microscope System "TOMOS-50"

Bilateral Microscope System "TOMOS-50"

Introducing the front and back misalignment / dimensional measurement microscope. Achieved high precision at a low cost.

The "TOMOS-50" is a compact type of measurement system that can simultaneously capture the front and back of electronic components such as crystal oscillators, MEMS, and semiconductors, and measure with an accuracy of ±0.2μm or less. The front and back optical axis correction can be precisely adjusted using a micro stage and software. Additionally, it is also available for sale as a dual-sided microscope module for device integration. Please contact us for more information. 【Features】 ■ Compact type ■ Approximately 3 million pixels ■ Simultaneous capture of both sides, dimensional measurement, and position deviation measurement ■ High-precision correction of the front and back optical axis using a micro stage and software ■ Measurement of position deviation between front and back with a repeatability of ±0.2μm or less (varies depending on conditions) *For more details, please refer to the PDF document or feel free to contact us.

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Bilateral Microscope System "TOMOS-60XY"

Bilateral Microscope System "TOMOS-60XY"

Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.

The "TOMOS-60XY" is a 6-inch electric XY stage dual-sided microscope system that can automatically measure multiple locations on a workpiece. It can automatically move to the specified measurement locations on the workpiece and measure the displacement of patterns and alignment marks on the front and back of quartz oscillators, MEMS, semiconductor wafers, and electronic components. Additionally, it is equipped with an alignment function for correcting the positional deviation between the XY stage and the workpiece, ensuring precise movement control and preventing measurement errors. 【Features】 ■ Automatically detects the edges of alignment marks such as circles, squares, and crosses, and measures the displacement between their center coordinates. ■ Controls XYZ stage conditions, measurement conditions, creates maps, and registers recipes to automatically measure multiple locations on the workpiece. *For more details, please download the PDF or feel free to contact us.

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  • Electron microscope
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8-inch electric XY stage dual-sided microscope system

8-inch electric XY stage dual-sided microscope system

We measure the positional deviation of the front and back with a repeatability accuracy of ±0.3μm or less!

The "TOMOS-50/60/80/XY" is a dual-sided microscope displacement measurement system capable of simultaneous imaging of both sides, dimensional measurement, and displacement measurement. It features electric control and automatic measurement, making it suitable for measuring and observing displacement of dual-sided exposure patterns, semiconductor wafers, and 4-inch, 6-inch, and 8-inch wafers, as well as MEMS and quartz oscillators. The correction of the optical axis for both sides is performed with high precision using a micro-stage and software. Additionally, it can be sold as a dual-sided microscope module for integration into devices. 【Features】 ■ Simultaneous imaging, dimensional measurement, and displacement measurement of both sides ■ High-precision correction of the optical axis for both sides using a micro-stage and software ■ Measurement of displacement between both sides with a repeatability accuracy of ±0.3μm or less ■ Compatible with a dual-channel auto-focus unit for both sides (optional) ■ Development of an electric XY stage control system is underway ■ Available for sale as a dual-sided microscope module for device integration *For more details, please download the catalog or feel free to contact us.

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6-inch electric XY stage dual-side microscope system

6-inch electric XY stage dual-side microscope system

Equipped with an electric XY stage and autofocus function!

The "TOMOS-60XY" is a dual-sided microscope displacement measurement system capable of simultaneous imaging of both sides, dimension measurement, and displacement measurement. [Applications] ■Observation: Simultaneous observation of both sides of electronic paper electrophoresis, particles, fluids, filters, etc. ■Displacement measurement of both sides: Measurement of the displacement of alignment marks and through holes on both sides of quartz oscillators, MEMS, etc. ■Dimension measurement of both sides: Measurement of dimensions on both sides of quartz oscillators, semiconductor linewidth patterns, etc. *For more details, please download the catalog or feel free to contact us.

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Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'

Dual-sided microscope system with wide-field ring lighting 'TOMOS-50R1'

Dual-sided wide-angle shooting is possible with a 1x shooting field of view! (Field of view 9mm x 7mm)

The "TOMOS-50R1" is a dual-sided microscope system equipped with wide-field ring lighting that allows for dual-sided wide-field imaging at a 1x magnification. It can simultaneously capture images of both sides of electronic components such as crystal oscillators, MEMS, and holes in printed circuit boards. Additionally, it can measure the misalignment of patterns and alignment marks on both sides with a repeatability accuracy of ±0.010mm. 【Features】 ■ High-precision image processing correction for optical axis misalignment of the microscope, lens magnification errors, and camera θ misalignment. ■ Dimension measurement is possible without the hassle of flipping the sample over. ■ Simultaneous imaging of both sides of crystal oscillators, MEMS, holes in printed circuit boards, and electronic components. *For more details, please download the PDF or feel free to contact us.

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Bilateral Microscope System "TOMOS Series"

Bilateral Microscope System "TOMOS Series"

Correcting the optical axis shift of the microscope's front and back, variations in the objective lens magnification, and the camera's θ shift with images!

We would like to introduce our dual-sided microscope system, the "TOMOS series." Our lineup includes the "TOMOS-50" with a 4-inch stage, the "TOMOS-60" with a 6-inch stage, and the "TOMOS-50R1" with wide-field ring illumination. It captures both sides of quartz oscillators, MEMS, and electronic components simultaneously. Dimension measurements can be performed without the hassle of flipping the sample over. 【Features of TOMOS-50/60】 ■ Simultaneous imaging of both sides of quartz oscillators, MEMS, semiconductor wafers, and electronic components ■ Measurement of alignment marks and pattern shifts on both sides with repeatable accuracy of ±0.3μm ■ High-precision image processing correction for optical axis misalignment, lens magnification errors, and camera θ shifts ■ Supports autofocus function and electric XY stage (optional) *For more details, please download the PDF or feel free to contact us.

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Scientific instrument microscope

Scientific instrument microscope

It is used in various fields such as education, agriculture, forestry, healthcare, and sanitation and epidemic prevention.

We handle a wide range of microscopes, including biological microscopes, industrial microscopes, digital microscopes, and fluorescence microscopes. Each microscope product is produced at a rate of over 15,000 units per month and is used in various fields such as education, agriculture, forestry, healthcare, and sanitation. All raw materials and products have obtained CE, CMD, CQC, and RoHS certifications. 【Product Lineup】 ■ Medical Microscopes ■ Biological Microscopes ■ Digital Microscopes ■ Children's Microscopes ■ Metal Microscopes, etc. *For more details, please download the PDF or feel free to contact us.

  • Optical microscope
  • Electron microscope
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Darkfield Biological Microscope [UT503-DK]

Darkfield Biological Microscope [UT503-DK]

It is a dark field biological microscope [UT503-DK].

★ It is a high-performance dark field microscope. ★ Equipped with a standard Plan achromatic objective lens that demonstrates high performance for both visual observation and photo/video recording. ★ A wide range of options for bright field, phase contrast, and polarized light observation.

  • Company：誠報堂
  • Price：100,000 yen-500,000 yen
  • Optical microscope
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Brightfield Biological Microscope [UT503]

Brightfield Biological Microscope [UT503]

This is a high-performance microscope recommended for research use. - General research and development - Educational use - For high-level amateurs.

- This is a biological microscope suitable for research and high-level amateur use. - It excels in both optical and mechanical performance. - As a system microscope, it offers a wide range of options such as phase contrast, dark field, and polarized light observation. ★ It comes standard with Plan achromat objective lenses that demonstrate high performance for both visual observation and photography/video recording. ★ There are abundant options for dark field, phase contrast, and polarized light observation, among others.

  • Company：誠報堂
  • Price：100,000 yen-500,000 yen
  • Optical microscope
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【SM300-T1】 7x to 45x zoom variable magnification three-eyed stereo microscope

【SM300-T1】 7x to 45x zoom variable magnification three-eyed stereo microscope

This is a three-eye type zoom stereo microscope equipped with a camera port and standard stand type with LED ring lighting.

This is the SM300 series of stereo microscopes. The main body of the microscope features a zoom objective lens (0.7x to 4.5x), and by using optional auxiliary objective lenses (0.5x, 2x), the magnification range can be further expanded. The eyepiece is equipped with a wide-field type as standard (WF10x/20mm), allowing for comfortable observation. The SM300 series is available in binocular (B type) and trinocular (T type) versions with a camera port. Additionally, the trinocular type offers a light path switching option (100/0, 0/100 switchable between eyepiece/camera port), making it easier to observe subjects with lower light levels and to capture photos and videos. Various stands are also available, allowing you to choose the type that best suits your needs.

  • Company：誠報堂
  • Price：10,000 yen-100,000 yen
  • Optical microscope
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【SM300-B5】 7x to 45x zoom variable binocular stereo microscope

【SM300-B5】 7x to 45x zoom variable binocular stereo microscope

It is a stand-type zoom stereo microscope with built-in LED lighting devices for both illumination and transmission.

This is the SM300 series stereo microscope. The magnification of the main body of the optical tube ranges from 0.7x to 4.5x, and by using optional objective auxiliary lenses (0.5x, 2x), the magnification range can be further expanded. The eyepiece is equipped with a wide field type as standard (WF10x/20mm), allowing for comfortable observation. This model's pillar stand (frame) is equipped with two types of illumination: top illumination (incident light) and bottom illumination (transmitted light), broadening the scope of observation.

  • Company：誠報堂
  • Price：10,000 yen-100,000 yen
  • Optical microscope
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【SM300-T2】 7x to 45x zoom variable magnification three-eyed stereo microscope

【SM300-T2】 7x to 45x zoom variable magnification three-eyed stereo microscope

It is a wide stand type zoom stereo microscope with LED ring lighting.

This is the T model of the SM300 series of stereo microscopes, equipped with a wide pillar stand and a camera port. With a width of 380mm, it is suitable for observing relatively large subjects. The objective lens of the main body of the microscope is a zoom type (0.7x to 4.5x), and by using optional auxiliary objective lenses (0.5x, 2x), the magnification range can be further expanded. The eyepiece is a wide-field type (WF10x/20mm) as standard, allowing for comfortable observation.

  • Company：誠報堂
  • Price：10,000 yen-100,000 yen
  • Optical microscope
  • microscope

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【SM300-B6G】 7x to 45x Zoom Stereo Microscope

【SM300-B6G】 7x to 45x Zoom Stereo Microscope

It is a stand-type zoom stereo microscope with built-in goose neck LED lighting device.

This is the SM300 series stereo microscope. It is equipped with goose-neck LED lighting. The objective lens of the main body is a zoom type (0.7x to 4.5x), and by using optional auxiliary objective lenses (0.5x, 2x), the magnification range can be further expanded. The eyepiece is a wide-field type (WF10x/20mm) as standard, allowing for comfortable observation. This model is equipped with two goose-neck LED lights, enabling diverse and flexible lighting options in terms of angle and distance, making it suitable for observation and video recording.

  • Company：誠報堂
  • Price：10,000 yen-100,000 yen
  • Optical microscope
  • microscope

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【SM300-B7】 7x to 45x zoom variable binocular stereo microscope

【SM300-B7】 7x to 45x zoom variable binocular stereo microscope

It is a single-arm boom stand type zoom stereo microscope with a wide observation range.

This is the boom stand type of the SM300 series stereo microscope. The magnification of the main body of the optical tube ranges from 0.7x to 4.5x, and using optional objective auxiliary lenses (0.5x, 2x) further expands the magnification range. It comes standard with wide-field eyepieces (WF10x/20mm), allowing for comfortable observation. The boom stand (type 7) enables stable observation with a wide range of motion.

  • Company：誠報堂
  • Price：100,000 yen-500,000 yen
  • Optical microscope
  • microscope

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【SM300-B8】 7x to 45x Zoom Variable Magnification Binocular Stereo Microscope

【SM300-B8】 7x to 45x Zoom Variable Magnification Binocular Stereo Microscope

It is a zoom stereo microscope with a rigid double-arm boom stand.

This is a binocular type of the SM300 series stereo microscope, featuring a double-arm boom stand. The magnification of the main body of the optical tube ranges from 0.7x to 4.5x, and by using optional objective auxiliary lenses (0.5x, 2x), the magnification range can be further expanded. The eyepiece is equipped with a wide field type as standard (WF10x/20mm), allowing for comfortable observation. The double-arm boom stand (Type 8) provides even more stable observation compared to the Type 7 boom stand.

  • Company：誠報堂
  • Price：100,000 yen-500,000 yen
  • Optical microscope
  • microscope

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