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microscope Product List and Ranking from 178 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. スリーアールソリューション Fukuoka//Trading company/Wholesale
  3. アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  4. 4 アイテス Shiga//Electronic Components and Semiconductors
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
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microscope Product ranking

Last Updated： Aggregation Period:Jan 14, 2026～Feb 10, 2026
This ranking is based on the number of page views on our site.

  1. White interference microscope equipped with laser microscope 'VK-X3000'
  2. White interference microscope equipped with laser 'VK-X4000 series'
  3. All-in-one fluorescence microscope 'BZ-X1000 Series'
  4. 4 Portable Microscope "Magic Loupe R" / 15x Magnification, Photo and Save Capability スリーアールソリューション
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

481～510 item / All 650 items

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Microspot exposure microscope

Microspot exposure microscope

Ultraviolet light inspection can be performed in a microscopic area.

The micro spot exposure microscope is a high-precision review inspection microscope for mask defects that can perform slit exposure on small areas of the screen. It places a mask coated with resist on a stage, automatically reproduces the defect positions from the defect inspection machine's data, determines the exposure range with an XY slit, and uses a timer to expose with a mercury spectrum in a spot irradiation microscope. For more details, please download and view the catalog.

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Length measuring microscope for module product inspection.

Length measuring microscope for module product inspection.

Panels up to 60" can be inspected for clear field transmission, reflection, and differential interference using an electric revolver and autofocus for focused image inspection.

This is a length measurement microscope that inspects module products up to 60 inches. With an extended optical tube, visual inspection and monitor inspection can be performed at hand. As it is a fixed-type microscope, visual inspection and monitor inspection can be conducted with the extended optical tube, and automatic measurement can be performed in conjunction with the stage movement. For more details, please download the catalog or contact us.

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Dual-Sided Position Confirmation Microscope DVM-400NEW

Dual-Sided Position Confirmation Microscope DVM-400NEW

A microscope that superimposes images of both sides of the specimen within the field of view and compares the amount of displacement, which can be measured using a measuring system.

This is a microscope that overlays images of both sides of the specimen within the field of view and compares the amount of displacement for observation, allowing measurement with a measuring system. The objective lenses come in five types, with magnifications ranging from 50x to 1000x, accommodating a wide variety of samples. It features NIR visible/infrared transmission type. There is also a camera position synthesis device available. For more details, please download the catalog or contact us.

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[Introduction to Development and Manufacturing Achievements] Medical Devices

[Introduction to Development and Manufacturing Achievements] Medical Devices

We have a track record of manufacturing and developing various devices, including moiré application 3D body measurement equipment!

We would like to introduce our achievements in the development and manufacturing of medical devices. We have developed and manufactured products such as surgical microscopes for otolaryngology, ophthalmic examination devices, and moiré-based 3D body measurement devices. Additionally, we also have experience with microscopes that incorporate TV cameras with LED lighting. [List of Achievements] ■ Surgical microscopes for otolaryngology ■ Ophthalmic examination devices ■ Moiré-based 3D body measurement devices ■ Microscopes with built-in TV cameras (with LED lighting) *For more details, please refer to the PDF materials or feel free to contact us.

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Unmatched high field of view and high resolution interference-type 3D laser scanning microscope.

Unmatched high field of view and high resolution interference-type 3D laser scanning microscope.

An interference-type 3D laser scanning microscope that achieves unparalleled high field of view and high resolution (field of view: 30x50 mm; resolution: 50 nm).

First Interferometric Measurement Using Laser Scanning Interference fringes appear with a reflection similar to that of glossy paper. It captures changes of 50 nm with interference fringes. ● Inverted Laser Scanning Interferometer (Model: LSMi-7000) By placing the sample on a glass surface, interference fringe measurement can be easily performed. Scanning range is 30 mm × 50 mm, and it can be observed in an enlarged view on the monitor. It can inspect fine scratches, polishing defects, and chipping on ceramics and other materials. Interference fringe analysis software is optional. ● Cylindrical Laser Scanning Interferometer (Model: LSMi-7500) Interference fringes can be observed over the entire surface of the cylinder, allowing for precise inspection of the cylinder. ● Upright Laser Scanning Interferometer (Model: LSMi-8000) Enables non-contact measurement of fine interference fringes. Interchangeable lenses include 5 mm, 10 mm, and 26 mm scanning lenses, with custom options available. Can also be used as a standard confocal laser scanning imager. Devices Developed from These Applications Ultra-wide field confocal type, high resolution 1 μm 3D laser scanning imager Can measure 3D shapes within a range of 5 × 50 mm. ● Capable of measuring shapes with inclinations up to 45 degrees. ● Can also detect defects such as scratches and deep holes. ● Shape measurement and image acquisition of cylindrical surfaces are also possible.

  • Laser microscope
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[Processing Example] Measurement of the processed surface using a white light interference microscope.

[Processing Example] Measurement of the processed surface using a white light interference microscope.

Wide measurement range exceeding mm units! Measurement examples of polycrystalline ceramics and SiC single crystals.

We would like to introduce a case study of surface measurement using the newly introduced white light interference microscope at our company. The white light interference microscope is a type of microscope that utilizes the phenomenon of light interference to measure and analyze "surface shape." It accommodates surface roughness and line roughness through 3D measurement, regardless of the material being measured. In the measurement of the wire slice surface and polishing surface of polycrystalline ceramics, the results were as follows: slice surface Sa 0.8446 μm, lapping surface Sa 0.2506 μm, and polishing surface Sa 0.00583 μm. Additionally, in the measurement of the polishing surfaces of SiC single crystal and SUS316L, the results were: SiC single crystal Sa 0.000458 μm and SUS316L Sa 0.000302 μm. 【Features of the White Light Interference Microscope】 ■ Non-contact & Surface Measurement - No restrictions on the material being measured - Accommodates surface roughness and line roughness through 3D measurement ■ Wide Measurement Range & High Resolution Measurement - Wide in-plane measurement range exceeding millimeter units - Height resolution of 0.01nm *For more details, please refer to the PDF document or feel free to contact us.

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  • 3D measuring device
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LYNX EVO

LYNX EVO

Error reduction! Thorough quality inspection of products with 360° angled observation.

The "LYNX EVO" is a product that enhances productivity and efficiency due to its wide working area and good peripheral vision, making fine manual work under magnification easier. With the optional 360° rotating viewer, it allows for 3D observation, facilitating defect detection that is difficult with direct vertical viewing. Additionally, we offer a low-cost model called "OPTA," which is suitable for replacing existing magnifiers and binocular stereo microscopes. 【Features】 <LYNX EVO> ■ Improved productivity and efficiency ■ Easier fine manual work under magnification ■ Allows for 3D observation ■ Simplifies defect detection that is difficult with direct vertical viewing ■ Simple design enables easy and clear observation even for operators unfamiliar with microscope observation *For more details, please download the PDF or feel free to contact us.

  • Optical microscope
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Auto Focus Microscope '3R-MSTVUSB20AF'

Auto Focus Microscope '3R-MSTVUSB20AF'

Full HD 2 million pixels, equipped with a 1/2 inch CSOS, microscope that connects to a monitor without the need for a PC!

The "3R-MSTVUSB20AF" is an autofocus microscope that displays high-definition images in just about 0.5 seconds. It allows for speedy observation without any operation, significantly reducing time. Additionally, it enables the capture and storage of still images and videos while maintaining high quality. The captured data is saved on a microSD card (compatible with up to 32G). The data can be utilized for email attachments or reporting purposes. 【Features】 ■ High-speed autofocus ■ Full HD imaging ■ Still image and video storage ■ Optical zoom 20x, digital zoom 6x ■ Powerful brightness with LED unit *For more details, please feel free to contact us.

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Portable Digital Microscope '3R-MSA600AF'

Portable Digital Microscope '3R-MSA600AF'

Maximum magnification of approximately 40 times! A touch panel integrated monitor that can also be used for shooting and measurement.

The "3R-MSA600AF" is a portable digital microscope equipped with a three-stage autofocus function that also allows for simple measurements. It is a microscope and monitor integrated into one unit and is wireless, making it usable even when you are out and about. Additionally, it can be used casually anywhere without being limited by location or subject, similar to using a camera. Please feel free to contact us if you have any inquiries. 【Features】 ■ One-touch automatic focus adjustment ■ Three-stage autofocus function ■ Magnification up to 40 times ■ Easy to operate, integrated monitor ■ Still image and video capture and storage *For more details, please feel free to contact us.

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Digital Microscope "3R-MSUSB Series"

Digital Microscope "3R-MSUSB Series"

You can correct and measure captured images with the dedicated software available for download!

The "3R-MSUSB Series" is a digital microscope that allows you to display images viewed through the microscope on your computer simply by connecting it via USB. Equipped with an LED light at the tip, it enables bright observation of the subject. You can capture still images and videos, and perform simple measurements using the included software. Additionally, it is possible to save images while displaying the measured values and entered text. 【Features】 ■ Easy measurement ■ Text input function ■ Measurement correction *For more details, please feel free to contact us.

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Scanning Electron Microscope (SEM) Observation

Scanning Electron Microscope (SEM) Observation

Observation of non-conductive samples without deposition is possible! Scanning electron microscopy is ideal for surface observation of fibers and similar materials.

A "Scanning Electron Microscope (SEM)" is a device that irradiates and scans a finely focused electron beam on a sample, detects secondary and backscattered electrons, and displays their intensity as an image on a monitor to obtain magnified images of the object. Although it is not suitable for high magnification observation due to reduced image quality, it can use low vacuum mode, allowing for non-coating observation of difficult-to-conduct samples. [Observation Items] ■ Surface observation at magnifications of 5 to 300,000 times ■ Elemental analysis (B to U) using an energy-dispersive X-ray spectrometer (EDS) as an accessory ■ Element identification in micro-regions (qualitative and semi-quantitative analysis) *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
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Transmission Electron Microscopy (TEM) Observation

Transmission Electron Microscopy (TEM) Observation

Electron microscope observation capable of identifying crystalline substances and analyzing crystal orientations! Applicable to all types of metallic materials.

The "Transmission Electron Microscope (TEM)" irradiates a sample with a high-voltage electron beam and obtains transmission electron images and electron diffraction patterns by magnifying the electrons that have passed through the sample using electromagnetic lenses. In transmission electron images, features such as grain boundaries, defects, strain, and the presence of precipitates can be observed, while electron diffraction patterns allow for the identification of crystalline materials and the analysis of crystal orientation. 【Features】 ■ Observation at magnifications from 1,000 to 1,000,000 times ■ Element identification in ultra-micro regions through EDS analysis (qualitative and semi-quantitative analysis of elements from C to U) ■ Identification of crystalline materials and analysis of crystal orientation *For more details, please refer to the catalog or feel free to contact us.

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Superior Corporation Business Introduction

Superior Corporation Business Introduction

We are striving for extreme business development in the fields of healthcare and information to meet the social needs of the 21st century!

Superior Co., Ltd. is a company that specializes in the manufacturing of special coils as a professional in precision winding, and also engages in the assembly of machinery, including the assembly of electron microscope units and ultra-precision assembly of semiconductor-related units. Additionally, we accept orders for integrated services from design to manufacturing of resin processing for cleaning tanks used in semiconductor manufacturing equipment and rationalization machinery and equipment. 【Business Activities】 ■ Special coil manufacturing ■ Machinery assembly ■ Resin processing related to industrial machinery ■ Precision parts processing *For more details, please refer to our catalog or feel free to contact us.

  • Inductor Coil
  • Electron microscope
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Zoom Stereo Microscope 'BS-2'

Zoom Stereo Microscope 'BS-2'

Microscope for observing cutting conditions

The "BS-2" is a zoom stereo microscope that can be used for the production of transparent micro-slices for FT/IR and for checking the trimming condition of samples. Since the microscope body is mounted on an X-Y table, fine adjustments to the field of view can be made while maintaining high magnification. Additionally, the microscope body can be retracted, so it does not interfere with the replacement of blades or samples. 【Usage Scenarios】 ■ Production of high-precision slices ■ Confirmation of knife edge quality ■ Alignment check between sample and knife edge ■ Quality check of slices ■ Collection of slices, etc. *For more details, please download the PDF or feel free to contact us.

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Technical Information Magazine 202001-01 in-situ STEM

Technical Information Magazine 202001-01 in-situ STEM

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, there has been a growing demand for high-sensitivity and low-power consumption devices, leading to increased attention on magnetic memory and magnetic sensors in the field of spintronics. These devices widely utilize the MTJ (magnetic tunnel junction) structure due to its ability to achieve high magnetoresistance effects. The MTJ structure consists of thin layered films on the order of a few nanometers, where the film thickness, roughness, and crystallinity at the atomic level significantly influence the properties. Additionally, since the magnetic characteristics change with annealing temperature, this paper presents a case study using in-situ TEM to analyze the changes in crystallinity and elemental distribution during heating at the nanometer level. **Table of Contents** 1. Introduction 2. Samples and Evaluation Methods 3-1. Changes in Crystallinity 3-2. Analysis of Crystal Orientation 3-3. Analysis of In-Plane Crystal Orientation 4. Conclusion 5. Acknowledgments 6. Closing Remarks

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Technical Information Magazine 201910-03 In-situ Heating Method

Technical Information Magazine 201910-03 In-situ Heating Method

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Regarding the LIB positive electrode active material LiCoO2, gas analysis using TPD-MS and two in-situ heating methods (in-situ heating TEM) were employed to investigate the relationship between the gases emitted from LiCoO2 particles during heating and the changes in morphology, organization, and structure. The results demonstrated that gas generation is closely related to structural changes. Changes similar to charge-discharge behavior were also observed, and a series of measurements with temperature as a parameter provided important insights for analyzing actual materials. Additionally, it was shown that microscopic structural changes (such as the formation of domain structures), which cannot be detected without high resolution (approximately 40 nm field of view), can be visualized and quantitatively analyzed using ASTAR* (with *ASTAR being a registered trademark of NanoMEGAS) at a field of view of over 1 μm. **Table of Contents** 1. Introduction 2. Experimental Methods 3. Observation of Gas Generation Behavior Using TPD-MS 4. Observation of Structural Changes by in-situ Heating TEM 4-1. Observation of Morphological and Organizational Changes in STEM Images 4-2. Observation of Crystal Structure Changes in HRSTEM Images 4-3. Observation of Morphological, Organizational, and Structural Changes Above 650°C 5. Conclusion

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Technical Information Magazine 201910-02 DDS Technology

Technical Information Magazine 201910-02 DDS Technology

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, research and development have been focused on drug delivery systems (DDS) aimed at reducing side effects of pharmaceuticals and improving their efficacy. Carriers used in DDS include biomaterials such as liposomes, polymer micelles, inorganic nanoparticles, and drug conjugates (e.g., ADCs). Among these, our company is concentrating on establishing analysis and evaluation techniques for liposomes, introducing case studies of liposome analysis primarily using high-difficulty techniques such as TEM (transmission electron microscopy) and AFM (atomic force microscopy). **Table of Contents** 1. Introduction 2. Fundamental technologies of DDS and characteristics of various carriers 3. Case studies of liposome analysis and evaluation 4. Conclusion

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Technical Information Magazine 201902-01 Polymers Using DPC-STEM

Technical Information Magazine 201902-01 Polymers Using DPC-STEM

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Differential Phase Contrast (DPC) - Scanning Transmission Electron Microscopy (STEM), one of the measurement techniques of STEM, enables the measurement of electric fields at microscopic regions. By applying this method to polymer alloys, we discovered that contrast of phase separation structures, which are difficult to observe with conventional electron microscopy, emerges. **Table of Contents** 1. Introduction 2. Visualization of Soft Materials through Elemental Analysis 3. Application of DPC-STEM Method 4. Conclusion

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Observation of the crystalline structure of resin and the morphology of polymer alloys using TEM.

Observation of the crystalline structure of resin and the morphology of polymer alloys using TEM.

It is possible to observe and evaluate the crystalline structure and dispersion state of the resin!

Our website introduces "Observation of Crystal Structure and Morphology of Polymer Alloys using Transmission Electron Microscopy (TEM)." To observe the crystal structure of polymers and the morphology of polymer alloys using TEM, it is necessary to prepare ultra-thin sections. Additionally, staining is required to create differences in electron beam transmission. We provide a table of main staining agents and resins that can be stained, as well as examples of observations, so please take a look. [Contents] ■ Main staining agents and resins that can be stained ■ Observation examples - Crystal structure of HDPE - Observation example of the dispersion structure of polymer alloys *For more details, please refer to the related links or feel free to contact us.

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TEM observation of CNF (cellulose nanofiber) in ink.

TEM observation of CNF (cellulose nanofiber) in ink.

Observing the CNF in the ink solid content of cellulose nanofiber ballpoint pens!

We would like to introduce our observation of cellulose nanofibers (CNF) using transmission electron microscopy (TEM). Utilizing the know-how we have developed in observing resin materials with TEM, we examined the CNF in the ink solids of commercially available cellulose nanofiber ballpoint pens. We observed CNF with a width of approximately 10 nm that appeared to be entangled with ink pigments, and it was found that the ink contains CNF with varying degrees of fibrillation. [Observation Results] - CNF with a width of approximately 10 nm that appeared to be entangled with ink pigments was observed. - Submicron-width CNF was also observed. - Several thin microfibrils, around a few nanometers in diameter, bundle together to form fibers approximately 100 nm thick. - The ink contains CNF with varying degrees of fibrillation. *For more details, please refer to the related links or feel free to contact us.

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Observation of cellulose nanofibers (CNF) in resin (polyethylene)

Observation of cellulose nanofibers (CNF) in resin (polyethylene)

Observation of the dispersion state of fine CNF and the lamellar crystals of resin! We also introduce the features of TEM and SEM observations.

Our website introduces "Morphological Observation of Cellulose Nanofiber (CNF) Composites." We have included photos of "TEM Observation Examples of HDPE/CNF" and "SEM Observation Examples of HDPE/CNF." In TEM observation, the dispersion state of fine CNF and the lamellar crystals of the surrounding resin can be observed, while SEM observation allows for the observation of the dispersion state of relatively larger CNF. [Published Photos] ■ TEM Observation Examples of HDPE/CNF ■ SEM Observation Examples of HDPE/CNF *For more details, please refer to the related links or feel free to contact us.

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Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations

Observation of Cellulose Nanofibers (CNF) - Examples of SEM and TEM Observations

Observing the structure of cellulose nanofibers (CNF) using scanning electron microscopy (SEM) and transmission electron microscopy (TEM)!

We would like to introduce the "Cellulose Nanofiber (CNF) Observation" conducted by our company. Utilizing the expertise we have developed in scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observation of resin materials, we observed commercially available cellulose nanofiber (CNF) samples. We were able to clearly view individual CNF microfibrils with thicknesses on the order of nanometers from the surface or cross-section. [Observation Details] ■ Scanning Electron Microscopy (SEM) Observation - More finely dispersed CNF ■ Transmission Electron Microscopy (TEM) Observation - Cross-sectional observation of finely dispersed CNF *For more details, please refer to the related links or feel free to contact us.

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Observation of surface roughness of resin and plastic materials using a laser microscope (LM).

Observation of surface roughness of resin and plastic materials using a laser microscope (LM).

It is possible to measure the surface roughness of molded products, sheets, and film surfaces, as well as surface texture shapes!

We conduct "surface roughness observation using a laser microscope (LM)" as morphological observation. The objective lenses are x5, x10, x20, x50, and x100, with an observation field of 100 to 1000 micrometers. The output types are color images, monochrome images, and three-dimensional (3D) images. We can perform measurement analysis of surface roughness of molded products, sheets, and films, as well as measurements of surface shapes of appearance anomalies, contaminants, and scratches. 【Device Overview】 ■ Objective lenses: x5, x10, x20, x50, x100 ■ Observation field: 100 to 1000 micrometers *Varies depending on the objective lens magnification ■ Output types: Color images, monochrome images, three-dimensional (3D) images *For more details, please refer to the related links or feel free to contact us.

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Analysis of food container packaging: Observation of the layer composition of plastic containers.

Analysis of food container packaging: Observation of the layer composition of plastic containers.

With the morphology observation techniques developed through SEM so far, it is possible to observe the layer composition of food container packaging materials!!

The container for solid roux has a multi-layer structure due to the need for food preservation. By observing the cross-section of such food containers with an electron microscope, the layer composition can be clarified. It was found that a commercially available solid roux container has a seven-layer multi-layer structure with a thickness of approximately 3μm to approximately 40μm, as determined by FE-SEM observation. Based on this, further material analysis (＊1) was conducted using FT-IR and Raman analysis, allowing us to understand the materials of each layer. Additionally, the preservation properties of the container can also be assessed through measurements of oxygen permeability and water vapor permeability (＊2). *For more details, please download the PDF or feel free to contact us.

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Observation of dispersed structures in plant-derived straw using a field emission scanning electron microscope.

Observation of dispersed structures in plant-derived straw using a field emission scanning electron microscope.

Observe the dispersion state of plastic composite materials from low magnification to high magnification, according to your purpose!

Our company conducts observations of the dispersed structures in plant-derived straw using a field emission scanning electron microscope (FE-SEM). We observe the dispersion of islands of plant fibers (cellulose) in a sea of natural plant-derived resin, with circular starch islands present at the interface. We examine the dispersion state of various plastic composite materials from low magnification (a few hundred times: relatively large aggregated structures) to high magnification (around 100,000 times: fine structures), depending on the purpose. [Features] ■ Observation of the dispersion state of various plastic composite materials from low to high magnification, according to the purpose. *For more details, please download the PDF or feel free to contact us.

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Dispersion structure of block polypropylene observed by transmission electron microscopy (TEM)

Dispersion structure of block polypropylene observed by transmission electron microscopy (TEM)

TEM observation of the dispersed structure of block PP! Elastomers and other resins can also be observed.

We conduct dispersion structure analysis of block polypropylene using transmission electron microscopy (TEM). The EPR components inside the rubber domain and the lamellar crystals of PE can be clearly observed, as well as the lamellar crystals in the PP matrix. We can also observe composites that include not only block PP alone but also elastomers, other resins, and filler components such as cellulose nanofibers (CNF), so please feel free to contact us. ■ EPR components and lamellar crystals of PE inside the rubber domain can be confirmed ■ Lamellar crystals in the PP matrix can be clearly observed ■ Composites with added filler components can also be observed *For more details, please download the PDF or feel free to contact us.

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Quantification (image analysis) of transmission electron microscope (TEM) images.

Quantification (image analysis) of transmission electron microscope (TEM) images.

Not only can image analysis be performed from TEM images, but it can also be done from SEM images! Various mechanical property evaluations can also be conducted.

Our company conducts quantification (image analysis) of transmission electron microscope (TEM) images. By analyzing high-resolution TEM and scanning electron microscope (SEM) images, it is possible to quantify the dispersion state of micro-dispersed rubber domains within the resin. Additionally, we can understand how the dispersion state of rubber domains affects the mechanical properties of the resin. 【Features】 ■ By applying binary processing to TEM images, we extract rubber domains and create a histogram of domain diameter (evaluation parameter) based on this, allowing for the evaluation of domain diameter distribution. ■ Other evaluation parameters that can be obtained include the lengths of the major and minor axes of the domains, the number of domains, occupancy area, and area ratio. *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis
  • Image analysis
  • microscope

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Notice of Participation in the "Food Forum Tsukuba Business Exchange Exhibition 2023"

Notice of Participation in the "Food Forum Tsukuba Business Exchange Exhibition 2023"

We will introduce our services at the corporate exchange exhibition!

We will be exhibiting at the Food Forum Tsukuba corporate exchange exhibition to be held on November 8, 2023 (Wednesday) at the Tsukuba International Conference Center. This exhibition is an opportunity for companies involved in the food industry to showcase their products and technologies. In addition to displaying equipment and products, we will also conduct demonstrations and distribute samples. At our booth, we will introduce the following services: - Electron microscopy observation of food - Analysis of amino acids and dipeptides We would be grateful if you could visit us when you are in the area. We look forward to seeing you all.

  • Contract Inspection
  • Contract measurement
  • Contract Analysis
  • microscope

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Laser microscope system 'VL3000DX-SVF18SP'

Laser microscope system 'VL3000DX-SVF18SP'

Using a confocal laser microscope! It allows observation without being affected by radiation and other influences from samples at high temperatures.

The "VL3000DX-SVF18SP" is an ultra-high temperature observation laser microscope system capable of clear microscopic observation in environments up to 1800°C. It allows for high-magnification, high-contrast observation images. Please utilize it for research on microstructural behavior and material development under high temperatures in steel, non-ferrous metals, ceramics, secondary batteries, etc. 【Features】 ■ High-resolution in situ observation ■ Capable of acquiring high-resolution images under ultra-high temperatures ■ Realization of diverse observation conditions ■ Rapid heating and rapid cooling up to 1800°C ■ Excellent operability and controllability *For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes and optical inspection equipment
  • microscope

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Digital Microscope "fino Series"

Digital Microscope "fino Series"

Digital specimen creation and real-time observation are possible! High-performance, low-cost digital microscope.

The "fino series" is a digital microscope that can be used for various bio-research, including pathology. It comes standard with a "Scan mode" for creating digital specimens and a "Live mode" for real-time observation of specimens. It features a low-center-of-gravity slide stage, enabling high-precision high-speed scanning, while also improving safety and durability. 【Features】 ■ Equipped with a high-speed viewer as standard ■ Optional immersion 100x lens available ■ Japanese menu included as standard ■ Four types available in the lineup *For more details, please download the PDF or feel free to contact us.

  • Other microscopes and optical inspection equipment
  • microscope

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