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microscope Product List and Ranking from 172 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jun 24, 2026～Jul 21, 2026
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jun 24, 2026～Jul 21, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. フローベル Kanagawa//Optical Instruments
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 レイマー Osaka//Optical Instruments
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
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microscope Product ranking

Last Updated： Aggregation Period:Jun 24, 2026～Jul 21, 2026
This ranking is based on the number of page views on our site.

  1. Exhibiting cutting-edge optical equipment such as dual-sided measurement microscopes for semiconductors and FA, as well as high-speed autofocus. フローベル
  2. All-in-one fluorescence microscope 'BZ-X1000 Series'
  3. White interference microscope equipped with laser 'VK-X4000 series'
  4. 4 White interference microscope equipped with laser microscope 'VK-X3000'
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

451～480 item / All 669 items

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[Analysis Case] (S)TEM Observation of Polymer Materials Using Electronic Staining

[Analysis Case] (S)TEM Observation of Polymer Materials Using Electronic Staining

We will introduce examples of observing polymer materials using SEM-STEM and (S)TEM!

Our organization offers (S)TEM observation of polymer materials using electron staining. Since polymer materials are composed of light elements, it is difficult to obtain clear contrast in (S)TEM observations. Staining can enhance the contrast for such materials. This document introduces examples of staining and observation using a method called electron staining with ruthenium tetroxide (RuO4), osmium tetroxide (OsO4), and phosphotungstic acid (H3[P(W3O10)4]·xH2O, abbreviated as PTA). [Measurement and Processing Methods] ■ [(S)TEM] (Scanning) Transmission Electron Microscopy ■ Others *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis
  • microscope

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[Analysis Case] Fine Structure of Hair Cross-Section (S)TEM Analysis

[Analysis Case] Fine Structure of Hair Cross-Section (S)TEM Analysis

We will introduce examples of observations of hair cell membrane complexes (CMC)!

Our organization offers (S)TEM analysis of the fine structure of hair cross-sections. The hair cell membrane complex (CMC) serves as a pathway for chemicals during processes such as bleaching and dyeing hair. In particular, the CMC between the cuticle layers has a three-layer structure, which we have visualized. We present a case where osmium tetroxide (OsO4) was used for electron staining targeting unsaturated fatty acids in lipids, followed by TEM observation and STEM-EDX analysis. [Measurement and Processing Methods] ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ [TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM) ■ Ultramicrotome processing ■ Others *For more details, please download the PDF or feel free to contact us.

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FT-IR imaging microscope "LUMOS II"

FT-IR imaging microscope "LUMOS II"

It is possible to conduct a chemical evaluation of non-uniform samples easily and accurately.

"LUMOS II" makes it possible to conduct micro-infrared spectroscopy and imaging analysis more easily, quickly, and comfortably. It demonstrates high performance in all measurement modes: transmission, reflection, and ATR (attenuated total reflectance). One of its features is the ease of access provided by the long working distance objective lens, along with an automated sample stage where all operations are electric. 【Features】 ■ Outstanding imaging performance with advanced FPA ■ High-quality spectral and image data ■ High-speed imaging and mapping capabilities: covering large areas in a short time ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF document or feel free to contact us.

  • Optical microscope
  • microscope

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FT-IR imaging microscope "LUMOS II"

FT-IR imaging microscope "LUMOS II"

Are you having trouble with micro-particle analysis? 'LUMOS II' will solve it!

Are you having trouble with micro-sample analysis? - Can't prepare liquid nitrogen, it's a hassle The 'LUMOS II' features an electronic cooling MCT detector that does not require liquid nitrogen. - I want a micro-IR that is easy to use even for beginners The 'LUMOS II' offers fully automated operation, making it accessible for beginners. Additionally... - Is there a micro-IR with better image quality? - I would like to try high-speed imaging functions, etc. The 'LUMOS II' makes micro-infrared spectroscopy and imaging analysis easier, faster, and more comfortable. With a long working distance objective lens for easy access, it also features an automated sample stage where all operations are motorized. **Features** - Achieves high-sensitivity measurements without liquid nitrogen - Outstanding imaging performance with advanced FPA - High-quality spectral and image data - High-speed imaging and mapping functions: covers large areas in a short time - FTIR imaging that supports transmission, reflection, and ATR measurement modes

  • Optical microscope
  • microscope

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【NEW!!】FT-IR Imaging Microscope 'LUMOS II'

【NEW!!】FT-IR Imaging Microscope 'LUMOS II'

【Equipped with high-speed imaging and high-speed mapping capabilities】FTIR imaging is now faster, more comfortable, and more accurate than ever!

"LUMOS II" is a high-speed imaging compatible FPA detector. With a guide function that can be used by anyone, from beginners to advanced users, regardless of their analytical skill level, it allows all users to utilize it quickly, comfortably, and accurately. Additionally, imaging can be performed in all measurement modes, enabling easy and accurate chemical evaluation of heterogeneous samples such as tablets, polymer materials, and the dispersion state of contaminants. 【Features】 ■ High-speed imaging and high-speed mapping function: covers wide areas in a short time ■ Excellent imaging performance with advanced FPA ■ High-quality spectral and image data ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF materials or feel free to contact us.

  • Optical microscope
  • microscope

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Technical Data: Microplastic Analysis Solution

Technical Data: Microplastic Analysis Solution

Providing a new analysis method based on high-speed imaging and machine learning!

Bruker Japan can provide spectroscopic analysis solutions specialized in microplastics due to many years of experience. Our FT-IR and Raman microscopes are used daily by leading microplastic scientists around the world. This document clearly explains: ▶ The effectiveness of micro-infrared and Raman spectroscopy ▶ Why Bruker products are suitable for microplastic analysis *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibiting at JASIS2023◆ Please check the basic information below for details about the exhibition.

  • Other environmental analysis equipment
  • microscope

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Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

Micro-infrared emission spectroscopic measurements utilizing spatial resolution are possible! Introducing solutions using infrared microscopy.

Analyzing the infrared emission spectrum of materials provides important insights in many research fields. In particular, measurements of emission spectra using FT-IR allow for simultaneous analysis across a wide range of wavenumbers, addressing both thermal radiation associated with the sample's heat and radiation resulting from quantum mechanisms. When the sample is large and emits strong infrared radiation, measuring the emission spectrum is relatively straightforward; however, in the case of small samples that are less than 1mm, detecting the emitted infrared light becomes challenging. This document introduces solutions using Bruker's unique infrared microscope to overcome these hurdles. [Contents] ■ Introduction ■ Measurement Examples ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • microscope

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Data DL available: AFM Case Studies in Scanning Probe Microscopy

Data DL available: AFM Case Studies in Scanning Probe Microscopy

We will introduce numerous analysis cases using AFM scanning probe microscopy, such as structural analysis, elastic modulus measurement, and conductivity measurement.

In this case study collection, we will introduce analysis examples using "AFM: Scanning Probe Microscopy." [Contents] ● Method and results of "Structural analysis and elastic modulus measurement of food (somen)" ● Features and analysis examples of "Conductive measurements of AFM in a vacuum" ● Features and analysis examples of "Conductivity evaluation of material surfaces using AFM" ● "AFM observation of polymer materials (smoothing by microtome)" We conduct various analyses using AFM, which is one of our strengths. We hope you will take a look. There are many other examples not included here. *For more details, please refer to our other PDF materials or feel free to contact us.

  • Other microscopes
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  • Surface treatment contract service
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Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

We will introduce various cases of micro-section machining and analysis, residual stress measurement, and more using ion milling, FE-SEM, EBSD, etc. The materials are available for download.

In this case study collection, we will introduce examples related to "cross-sectional observation and structural analysis." Starting with the analysis case of "Evaluation of aluminum sputter films using EBSD," we also include numerous examples such as the purpose, methods, samples, and results of "Cross-sectional processing of micro areas by ion milling," and the purpose, methods, and results of "Residual stress measurement of solder cross-sections." Additionally, we present orientation evaluations, cross-sectional observation results, and measurements. We encourage you to read through it. 【Contents】 ■ Evaluation of aluminum sputter films using EBSD ■ Cross-sectional processing of micro areas by ion milling ■ Residual stress measurement of solder cross-sections ■ Residual stress measurement of wire ■ Cooling (cryo) ion milling cross-sectional processing *For more details, please refer to the PDF document or feel free to contact us.

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  • Other polymer materials
  • Other metal materials
  • microscope

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[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

High-resolution observation of soft polymer materials is possible with a cryo-microtome and AFM.

AFM scanning probe microscopy is a device that detects various physical interactions occurring between a probe and the sample surface, allowing for the observation of surface morphology in small areas and the measurement of electrical and mechanical properties. These physical interactions include atomic force, frictional force, and electrostatic force. It can perform measurements in various environments, including atmospheric and vacuum conditions, and is capable of observing sample surfaces regardless of whether they are conductive or insulating. Additionally, by using a cryo-microtome, it is possible to produce ultra-thin sections of soft polymer materials such as resins under frozen conditions. We are observing polyisoprene rubber from various angles using this AFM and cryo-microtome. Please take a moment to read the PDF materials. This technology can be applied not only to rubber but also to resins, plastics, and various polymer materials. Furthermore, our company conducts various surface analyses, including XPS, AES, and GD-OES, in addition to this analytical device. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

  • Other polymer materials
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  • Rubber
  • microscope

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Freeze-Dry Microscope System FD-301 Series

Freeze-Dry Microscope System FD-301 Series

We will determine the maximum allowable product temperature (critical temperature) in the freeze-drying process of formulations and food products to improve the efficiency of the production process.

Freeze-drying technology, which has many advantages such as long-term preservation, is becoming increasingly important in the manufacturing of pharmaceuticals and food products. Freeze-drying requires expensive equipment and long processing times, so to improve the efficiency of the freeze-drying process, it is considered effective to raise the temperature of the frozen product to shorten the sublimation time. However, exceeding the critical temperature can lead to the collapse of the physical structure, resulting in incomplete drying and degradation of the product, such as a decrease in solubility. Therefore, it is necessary to determine the collapse temperature (Tc) and eutectic melting temperature (Teu) to establish the maximum allowable product temperature (critical temperature). The freeze-drying microscopy system is a device that can quickly determine the collapse temperature (Tc) and eutectic melting temperature (Teu) using small samples.

  • Analytical Equipment and Devices
  • Other microscopes
  • Other physicochemical equipment
  • microscope

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3D Measurement Laser Microscope 'LEXT OLS5500'

3D Measurement Laser Microscope 'LEXT OLS5500'

Bringing surface analysis to a new dimension. Analyzing various surfaces with trusted measurement technology.

The "LEXT OLS5500" is a 3D measurement laser microscope equipped with a white light interferometer. With high-precision measurement capabilities of laser scanning microscopy (LSM), white light interferometry (WLI), and focus variation microscopy (FVM), along with smart automation features and intuitive operability, it can be confidently used for various applications. Please feel free to contact us when you need assistance. 【Features】 ■ A seamless 3-in-1 solution that accommodates measurements from nm to mm with a single device ■ High optical performance due to in-house developed and designed optics ■ Visualization of invisible structures, from fine details to transparent objects ■ Guaranteed measurement accuracy under measurement conditions ■ Noise guarantee for height measurements using both LSM and WLI *For more details, please download the PDF or feel free to contact us.

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  • Laser microscope
  • Other microscopes and optical inspection equipment
  • microscope

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Material and Defect Analysis: Confocal Microscope

Material and Defect Analysis: Confocal Microscope

A measuring microscope with high resolution! It is used for surface roughness measurement and shape measurement/comparison.

At Mitsuba Environmental Solutions, we conduct "confocal microscope measurements" using a confocal microscope. The laser microscope "OPTELICS HYBRID" manufactured by Lasertec can obtain high-resolution images with a sharp focus across the entire field of view on samples with uneven surfaces. It enables non-destructive, non-contact three-dimensional shape measurement. High magnification and high-resolution observation with a 405nm laser beam allows for clear visualization of ultra-fine structures. 【Measurement Range】 ■ Width Measurement - Minimum measurement unit: 0.001μm, measurement reproducibility: 3σ < 10nm ■ Height Measurement - Scale resolution: 0.4nm, measurement reproducibility: σ < 10nm, measurement range: 7mm *For more details, please refer to the related links or feel free to contact us.

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Meridian Trade TouchScope

Meridian Trade TouchScope

The "Touch Scope" is a revolutionary biological microscope system that allows direct contact between the lens tip and the object being observed.

Due to a special lighting method, the conical lens surface at the tip itself emits light, allowing for the normally dark lens contact surface to be observed very brightly and clearly at high magnification.

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Observation of the cutting edge surface of single crystal diamond chips.

Observation of the cutting edge surface of single crystal diamond chips.

Scanning Electron Microscope (SEM) ■Industry: Automotive (Prototype) / Semiconductor / Robotics

The cutting edge surface of single crystal diamond chips was observed using a scanning electron microscope (SEM). The cutting edge surface of PCD (polycrystalline diamond) was also observed and compared. The differences in the fine surface roughness were clearly confirmed. How this difference affects the machining process is yet to be determined. *For more details, please refer to the PDF document or feel free to contact us.*

  • Other machine elements
  • Processing Contract
  • microscope

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High-precision ultrasonic microscope "Gen6"

High-precision ultrasonic microscope "Gen6"

Supports analysis that makes it difficult to separate interface waveforms of each layer! Also compatible with multilingual display.

The "Gen6" is a high-precision ultrasonic microscope that can detect even weak signal waveform changes within the gate with higher sensitivity and is capable of imaging. It can simultaneously scan multiple depths and can measure up to 100 gates. Furthermore, with the inclusion of the "SonoSimulator," it supports the analysis of stack dies and thin-film multilayer samples, where it is difficult to separate the interface waveforms of each layer. 【Features】 ■ High-speed sampling rate ■ Water recirculation system ■ Equipped with PolyGate function ■ Standard scan and reference included ■ Compatible with Windows 7 (64bit) Company Name: Japan Burns Co., Ltd. *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • Other inspection equipment and devices
  • microscope

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Measuring Microscope LTM-150D

Measuring Microscope LTM-150D

Leave everything from product purchase to calibration, repair, and retrofit to us.

It is a measuring microscope with a tiltable column. "Tilt angle" ±12°

  • Distance measuring device
  • microscope

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Universal Measuring Microscope

Universal Measuring Microscope

Leave everything from product purchase to calibration, repair, and retrofit to us.

It is a versatile measuring microscope with a tiltable column. {Column tilt angle} ±15°

  • Distance measuring device
  • microscope

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Microscope Product Catalog

Microscope Product Catalog

A lineup of easy-to-use microscopes with Japanese quality at low prices!

This catalog features microscopes from Biomedical Science Co., Ltd., which provides high-quality and high-precision research products based on cutting-edge scientific and technological information in the field of biotechnology, both domestically and internationally. It includes the educational and training biological microscope "MT4000 Series," which employs an infinity-corrected optical system, as well as the inverted culture microscope "TC5000 Series" suitable for various applications in research, clinical, and educational settings, and the stereomicroscope "RZ Series," among others. 【Featured Products】 ■ Educational and Training Biological Microscope "MT4000 Series" ■ Research Biological Microscope "MT5000 Series" ■ Inverted Culture Microscope for Research, Clinical, and Educational Use "TC5000 Series" ■ Stereomicroscope "RZ Series" ■ Stereomicroscope "EM Series," etc. *For more details, please download the PDF or contact us.

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Tohoku University Technology: High Frequency-Enhanced ESM: T19-796

Tohoku University Technology: High Frequency-Enhanced ESM: T19-796

Enabling to evaluate low-conductivity material

Electrochemical strain microscopy (ESM) is known as a technique for probing ion mobility, ion conductivity, etc. in a solid material at a nanoscale. The ESM method is a method for detecting a signal of a local volume change (electrochemical distortion) of a solid generated with the movement of ions by applying a voltage, and for imaging and outputting the detected signal. 　The ESM method provides an image showing the distribution of ion motion states, but the sharpness of the image depends on the ionic conductivity of the solid material. Therefore, in a solid material having a relatively low ionic conductivity, sufficient S/N ratio cannot be obtained, and it is difficult to evaluate the motion state of ions with high accuracy. 　The present invention has been made in view of the above circumstances, and by applying a high-frequency bias voltage, it is possible to dramatically enhance a response signal generated in accordance with a motion state of ions. According to the present invention, even in a material having a relatively low ionic conductivity, a distribution image can be obtained with sufficient sharpness.

  • others
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Quester Corporation, USA, long-distance microscope

Quester Corporation, USA, long-distance microscope

In 1983, we began the manufacturing and development of our own long-distance microscope. That same year, the long-distance microscope was awarded as the most valuable new innovative product of the year.

The Quester long-distance microscope was developed in response to strong demands from researchers and production sites for powerful imaging means for measurements, inspections, monitoring, and alignment using long-distance microscopes, such as "real-time observation and measurement of fine dynamic processes in experiments conducted in a vacuum chamber," "microscopic observation of samples in harmful environments," and "precision inspection online." The long-distance microscope optical system allows for the observation system to be moved outside of the often cluttered work area. Furthermore, the Quester long-distance microscope enables the acquisition of high-magnification and high-resolution images based on high-level requirements.

  • Optical microscope
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QUESTAR Long-Distance Microscope

QUESTAR Long-Distance Microscope

It is precisely because of the excellent optical system that wonderful images can be obtained.

The Quester long-distance microscope is the most perfect precision optical system in the world, developed by Quester Corporation. It sufficiently meets the extensive needs of precision measurement and research and development in high-tech fields, serving as a measurement tool that meets the advanced requirements of cutting-edge technology. For example, it allows for the observation of clear images when approaching the inspection sample (e.g., 15 cm) and measurements at the limit of resolution. It is an ideal device for use in fields such as core alignment and the visual industry. 【Features】 ○ Excellent resolution → Reaches the theoretical limit of resolution based on diffraction theory ○ Superior optical system → An intricate optical system with the highest quality and contrast For more details, please contact us or download the catalog.

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Lighted Small Microscope 100x 832

Lighted Small Microscope 100x 832

100x magnification microscope. It has a stand and a focus adjustment feature, so once you set the focus, you won't need to adjust it again for future use. Field of view: 1mm.

It is a small microscope with a light. The magnification is 100 times! It has various uses such as checking printed materials, inspecting fabrics, and examining cutting surfaces. It has a focus adjustment feature, so once you set the focus, you won't need to adjust it again for the next use. Field of view: approximately 1 mm.

  • Microscope
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60-100x Zoom Mini Microscope with LED Light 834

60-100x Zoom Mini Microscope with LED Light 834

A compact microscope with an LED light that allows for 60 to 100 times zoom! Its compact size makes it convenient to carry. It features an inverted image type.

Please look through the eyepiece and adjust the focus. It is recommended to start with the lowest magnification of 60x. Please attach the acrylic part to the surface you want to observe and adjust the focus while looking through the eyepiece. *The shape of the acrylic part may vary slightly. The 831 is an inverted image type. The object will appear inverted.

  • Microscope
  • microscope

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A fully equipped environment for quantitatively evaluating cutting【List of measuring instruments】.

A fully equipped environment for quantitatively evaluating cutting【List of measuring instruments】.

Solving problems at the cutting site! It is possible to measure the edge radius and surface roughness, as well as observe wear.

We would like to introduce our measurement equipment. We possess a "laser microscope" that can quantitatively measure edge radius and surface roughness, as well as a "scanning electron microscope (SEM)" that allows for the observation of wear. Additionally, we have a "microscope" that enables the observation of welding and adhesion, facilitating the selection of appropriate tools. 【List of Equipment】 ■ Laser Microscope ■ Scanning Electron Microscope (SEM) ■ Microscope *For more details, please refer to the PDF document or feel free to contact us.

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Digital 3D microscope inspection platform "sinaSCOPE"

Digital 3D microscope inspection platform "sinaSCOPE"

4K camera, digital 3D microscope inspection platform "sinaSCOPE" with 3D display, manufactured by SOLECTRIX.

The digital 3D microscope inspection platform 'sinaSCOPE' is a digital 3D microscope platform that enables naked-eye stereoscopic vision. It consists of a microscope equipped with two UHD high-resolution digital 4K cameras, a 3D display, and an image processing unit. It provides real-time 3D images without the need for 3D glasses or head-mounted displays. For users who already have existing microscopes, there is the sinaSCOPE digital upgrade kit, which allows for the installation of two 4K cameras onto the optical eyepiece mount of a stereo microscope, thereby expanding it into a digital microscope with a 3D monitor. Additionally, integration into customers' unique systems (OEM) is also supported. *For more details, please feel free to contact us.

  • 3D measuring device
  • Electron microscope
  • Electron microscope
  • microscope

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Portable wireless digital microscope TV model [Demo unit available for loan]

Portable wireless digital microscope TV model [Demo unit available for loan]

[Demo unit available for loan] The magnified images displayed by the microscope body can be wirelessly shown and saved on a computer or dedicated mobile monitor, supporting up to 600x optical magnification.

[Demo unit available for loan] The [3R-WM series] uses a 2.4GHz frequency band for wireless communication and has obtained technical standards conformity certification. It wirelessly transmits images displayed by the microscope body to a computer or dedicated mobile monitor. It supports optical magnification from 1x to 600x (magnification varies by model). This wireless digital microscope is comparable to a full-fledged microscope. You can choose a model that suits your needs, either a computer model for simple measurements or a mobile monitor model that can be used anywhere without being restricted by the environment, such as in fieldwork. Being wireless eliminates the hassle of cables, allowing for smooth operation. It is a valuable tool for quality control, enabling detailed observation of scratches, burrs, and foreign matter in factory settings. We offer it at a price suitable for utilizing remaining budget.

  • Microscope
  • microscope

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