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[Analysis Case] Morphological Observation and Component Analysis of Solid Polymer Fuel Cell Catalyst Materials

Evaluation of catalyst particles using SEM, STEM, and EDX.

The electrodes of fuel cells are supported by Pt particles or Pt alloy (such as PtRu) particles on carbon. Due to the fine structure of these catalyst particles, which are on the order of a few nanometers, SEM and TEM analyses are used for morphological observation and compositional analysis. In addition to evaluations in the initial state, degradation after current application has been reported, including modulation of alloy composition, Ru leaching, and an increase in catalyst particle size; high spatial resolution HAADF observation and EDX analysis are very effective for these evaluations. Furthermore, SEM observation allows for the confirmation of the shape of the carbon support and the state of the catalyst particles.

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[Analysis Case] Observation of Hair Surface Microstructure by AFM

Quantitative evaluation with reduced alteration is possible through analysis in the atmosphere.

This case study introduces an analysis of the condition of the cuticle on the hair surface using AFM. AFM is a method for three-dimensional measurement of nanoscale surface roughness. Since the analysis is conducted in the atmosphere, it does not cause degradation or gas release of organic materials, allowing for an evaluation of the sample's original shape. In this case study, we assessed the degree of cuticle opening, the distribution of adhered substances, and the roughness evaluation of different areas through images, as well as quantitatively evaluated the surface roughness through numerical processing. This method is effective for evaluating the condition of hair after shampooing and the application state after applying styling products.

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[Analysis Case] Evaluation of Crystal Defects in SiC Power Devices Using PL and TEM

High-resolution TEM observation of crystal defects detected by PL mapping.

In PL (photoluminescence) mapping, it is possible to identify the positions of crystal defects from the luminescent areas. Furthermore, by performing high-resolution STEM observation (HAADF-STEM images) at the same locations, we can capture stacking defects. In this case study, we investigated commercially available SiC power devices using PL mapping and STEM. After identifying the positions of stacking defects through PL mapping, we conducted μ-sampling at the defect edge and performed cross-sectional STEM observation.

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[Analysis Case] Evaluation of Diffusion Layer Shape of Image Sensors Using SCM

We provide consistent support from sample disassembly to measurement.

This document presents case studies evaluating the diffusion layer of image sensors in smartphones. Using a scanning capacitance microscope (SCM) capable of determining the p/n type of semiconductors, we assessed the distribution of the diffusion layer. By combining the results from cross-sectional and planar SCM, we obtained complementary and extensive information. SCM is one of the effective tools for evaluating the quality of image sensor diffusion layers and for failure analysis.

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AFM Data Collection

AFM: Atomic Force Microscopy Method

AFM is a method that scans the surface of a sample with a fine probe and measures nano-scale surface topography in three dimensions. It can measure a wide range of materials, not only for the evaluation of metals, semiconductors, and oxides, but also for soft materials such as hair and contact lenses. This document presents various AFM images of different materials.

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[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

In recent years, SiC has been attracting attention as a material for high-voltage devices. The trench MOSFET structure is necessary for the high integration of devices, and the application development for SiC devices is progressing. Since the channel region of the trench MOSFET structure is the trench sidewall, the flatness of the trench sidewall is related to the reliability of the device. This document introduces an example of quantitatively evaluating the roughness of the trench sidewall of SiC trench MOSFETs using AFM (Atomic Force Microscopy).

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[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation

The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.

By measuring the sample, it is possible to evaluate the crystal structure through the combination of results obtained and simulations. This document introduces a case study in which the crystal structure is discussed by comparing the results obtained from HAADF-STEM and EDX measurements on polycrystalline neodymium magnets with simulated images using the respective measurement conditions. The combination of measurement results and computational simulation results allows for a deeper understanding of the crystal structure.

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[Analysis Case] SiC by SMM and SNDM

You can evaluate the p/n polarity and carrier concentration distribution of the diffusion layer in SiC devices.

In recent years, SiC has attracted attention as a material for high-voltage devices. The trench MOSFET structure allows for high integration of the elements, and applications for SiC devices are also being advanced. On the other hand, there are challenges regarding the dopant activation rate of SiC devices, making performance evaluation important. In this instance, we will introduce a case where carrier polarity determination was conducted using SNDM (Scanning Nonlinear Dielectric Microscopy) and carrier concentration distribution was evaluated using SMM (Scanning Microwave Microscopy) for SiC trench MOSFETs.

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[Analysis Case] Structural Analysis of DRAM Chips using TEM and SEM

Reverse engineering of DRAM on the product's internal substrate.

We will conduct a comprehensive analysis of DRAM, a representative memory, from product level to device microstructure analysis through TEM observation. By performing appearance observation, layer analysis, and Slice & View, we will grasp the overall structure, control the FIB processing position at the nanoscale, and observe the microstructure of the memory section through TEM imaging after thin section formation.

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[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy

It is possible to obtain insights into the size and distribution of crystal grains in metallic polycrystals.

The Scanning Ion Microscope (SIM) is a method that irradiates a solid sample with an ion beam and detects the secondary electrons generated. Since secondary electrons produce contrast according to the crystal orientation of each grain, it is possible to easily obtain insights into the size and distribution of crystal grains in polycrystalline metals such as Cu and Al using SIM. This document presents an example of measurements where the surface of Cu was observed using SIM.

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[MFM] Magnetic Force Microscopy Method

MFM is a measurement technique that uses a probe coated with a magnetic film to measure the leakage magnetic field occurring near the sample surface and obtain magnetic information.

- Qualitative information on the magnetic properties of the sample can be obtained. - Imaging of attraction and repulsion due to leakage magnetic fields is possible. - A signal of magnetic force proportional to the magnitude of the gradient of the leakage magnetic field can be obtained, but quantitative evaluation is not possible. - AFM images can also be obtained simultaneously.

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[Analysis Case] Evaluation of Skin Permeability Using Three-Dimensional Cultured Human Skin

It is possible to conduct various evaluations of cultured human skin (morphological observation, distribution assessment of components, quantitative analysis).

■Morphological Observation The morphology of the tissue can be confirmed by staining frozen sections (e.g., HE staining, Nile blue staining). ■Fluorescence Microscopy Observation If the transmitted components have fluorescence, the fluorescent components can also be observed using a fluorescence microscope. ■Mass Microscopy Observation The distribution of components can be evaluated. Temporal changes can also be confirmed with sections taken at different times (TOF-SIMS). ■Quantitative Analysis Temporal changes in the amount of fluorescent components in the skin can also be confirmed (e.g., LC/MS/MS, fluorescence detectors, etc.).

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[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

Quantifying texture with mechanical property parameters.

Factors that determine texture include various elements such as hardness and adhesion. Generally, the texture of food is evaluated through stress assessment using tools like texture analyzers, but measuring in micro-regions or thin samples is challenging. AFM-MA can measure not only the shape of surface roughness but also the Young's modulus representing mechanical properties like hardness, adhesion parameters related to texture, and energy dissipation data in micro-regions. Therefore, it is effective for evaluating physical properties related to texture and similar characteristics in extremely small areas.

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[Analysis Case] Extraction of Active Material from Battery Cathode Material and Data Analysis

We determined the particle size of active substances from SEM images using deep learning and data analysis.

Deep learning enables the extraction of target objects from images. Additionally, by analyzing the regions corresponding to the obtained targets, information can be obtained in numerical form. In this instance, we used deep learning to extract active material particles and detect cracks in cross-sectional SEM images of battery cathode materials. Extraction is also possible for 3D data, such as Slice&View data. We extracted particles with and without cracks from the 3D data and calculated their respective particle sizes. Measurement methods: SEM, Slice&View, computational science, AI, data analysis Product fields: Solar cells, secondary batteries, fuel cells Analysis purposes: Structural evaluation, shape evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

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[Analysis Case] Surface Shape Analysis of GaN Substrates

Visualization of step-terrace structures by AFM.

Gallium nitride (GaN), a wide bandgap semiconductor, is used in a wide range of fields such as power devices and communication/optical devices. When fabricating devices, the shape and roughness of the wafer surface significantly impact device performance. During the growth of GaN wafers, a step-terrace structure is formed on the surface due to stress effects from lattice mismatch with the supporting substrate. This document introduces a case where the step-terrace structure of the GaN substrate surface was visualized using AFM, and the terrace width, step height, surface roughness, and off-angle were evaluated. Measurement method: AFM Product fields: Power devices, electronic components, lighting Analysis purpose: Shape evaluation, structural evaluation For more details, please download the document or contact us.

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[Analysis Case] Composition Analysis of Particles on a Wafer

Shape observation and simple quantitative analysis using SEM-EDX.

Control of particles in the semiconductor wafer manufacturing process is extremely important for ensuring wafer quality. In this case study, we estimated what the particles were on a Si wafer through SEM observation, EDX analysis, and simple quantification. The SEM equipment, which has high spatial resolution in the submicron range and can scan areas of several centimeters, allows for rapid inference of what the particles on the wafer are based on shape and composition information, enabling quick identification of the generation process. Analysis linked to coordinate data from defect inspection equipment is also possible.

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[Analysis Case] Composite Analysis of Specific Areas within Electronic Devices (C0572)

Non-destructive assessment of specific areas inside the device! Evaluation of detailed structure and composition information of specific areas through cross-sectional observation.

Our company offers technologies suitable for structural evaluation of electronic devices, and we propose analytical methods tailored to the observation field and objectives. In a case where we investigated specific areas of a device using X-ray CT and FIB-SEM, we first used X-ray CT to observe the internal structure of the entire sample and identify specific areas. Next, we used FIB-SEM to confirm the detailed structure of the specific structures identified on the vias. 【Measurement and Processing Methods】 ■[SEM] Scanning Electron Microscopy ■[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM) ■X-ray CT Method ■[FIB] Focused Ion Beam Processing *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] SEM Observation of Wide-Area Cross-Section Using Xe-PFIB

Observation of cross-sections with an accuracy of several tens of nanometers and a size of several hundred micrometers is possible!

We offer wide-area cross-sectional SEM observation (C0610) using Xe-PFIB. The metal bonding that electrically connects the electrodes of integrated circuits, electrodes, printed circuit boards, and semiconductor packages has a diameter of several tens of μm to several hundred μm. With Xe-PFIB (Xe-Plasma Focused Ion Beam), we can target processing positions on the order of several tens of nm and create cross-sections of several hundred μm square, allowing for a detailed understanding of the entire view at the center of the bonding. 【Measurement and Processing Methods】 ■ [SEM] Scanning Electron Microscopy ■ X-ray CT Method ■ [FIB] Focused Ion Beam Processing *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Evaluation of Mechanical Properties of Hair Cross-Sections Prepared by Microtome Method

It is possible to evaluate the elastic modulus of the internal structure of soft materials.

When evaluating the internal structure of materials, it is necessary to expose the internal structure while maintaining it through cross-sectional processing techniques such as cutting and polishing. This document introduces a case where the microtome method, which has a relatively small impact from processing damage, was used to create cross-sections of hair, followed by AFM observation of the internal structure and evaluation of elastic modulus. The microtome method is a cutting processing technique widely used in the field of soft materials, such as rubber materials and biological samples, and this approach has made it possible to evaluate the mechanical properties of the internal structure of these materials. [Measurement and Processing Methods] [AFM] Atomic Force Microscopy [AFM-MA・AFM-DMA] Mechanical Property Evaluation (Elastic Modulus Measurement, Dynamic Viscoelasticity Measurement) Ultra Microtome Processing *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] (S)TEM Observation of Polymer Materials Using Electronic Staining

We will introduce examples of observing polymer materials using SEM-STEM and (S)TEM!

Our organization offers (S)TEM observation of polymer materials using electron staining. Since polymer materials are composed of light elements, it is difficult to obtain clear contrast in (S)TEM observations. Staining can enhance the contrast for such materials. This document introduces examples of staining and observation using a method called electron staining with ruthenium tetroxide (RuO4), osmium tetroxide (OsO4), and phosphotungstic acid (H3[P(W3O10)4]·xH2O, abbreviated as PTA). [Measurement and Processing Methods] ■ [(S)TEM] (Scanning) Transmission Electron Microscopy ■ Others *For more details, please download the PDF or feel free to contact us.

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[Analysis Case] Fine Structure of Hair Cross-Section (S)TEM Analysis

We will introduce examples of observations of hair cell membrane complexes (CMC)!

Our organization offers (S)TEM analysis of the fine structure of hair cross-sections. The hair cell membrane complex (CMC) serves as a pathway for chemicals during processes such as bleaching and dyeing hair. In particular, the CMC between the cuticle layers has a three-layer structure, which we have visualized. We present a case where osmium tetroxide (OsO4) was used for electron staining targeting unsaturated fatty acids in lipids, followed by TEM observation and STEM-EDX analysis. [Measurement and Processing Methods] ■ [(S)TEM] Scanning Transmission Electron Microscopy ■ [TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM) ■ Ultramicrotome processing ■ Others *For more details, please download the PDF or feel free to contact us.

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FT-IR imaging microscope "LUMOS II"

It is possible to conduct a chemical evaluation of non-uniform samples easily and accurately.

"LUMOS II" makes it possible to conduct micro-infrared spectroscopy and imaging analysis more easily, quickly, and comfortably. It demonstrates high performance in all measurement modes: transmission, reflection, and ATR (attenuated total reflectance). One of its features is the ease of access provided by the long working distance objective lens, along with an automated sample stage where all operations are electric. 【Features】 ■ Outstanding imaging performance with advanced FPA ■ High-quality spectral and image data ■ High-speed imaging and mapping capabilities: covering large areas in a short time ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF document or feel free to contact us.

Company：ブルカージャパンオプティクス事業部
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Optical microscope
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FT-IR imaging microscope "LUMOS II"

Are you having trouble with micro-particle analysis? 'LUMOS II' will solve it!

Are you having trouble with micro-sample analysis? - Can't prepare liquid nitrogen, it's a hassle The 'LUMOS II' features an electronic cooling MCT detector that does not require liquid nitrogen. - I want a micro-IR that is easy to use even for beginners The 'LUMOS II' offers fully automated operation, making it accessible for beginners. Additionally... - Is there a micro-IR with better image quality? - I would like to try high-speed imaging functions, etc. The 'LUMOS II' makes micro-infrared spectroscopy and imaging analysis easier, faster, and more comfortable. With a long working distance objective lens for easy access, it also features an automated sample stage where all operations are motorized. **Features** - Achieves high-sensitivity measurements without liquid nitrogen - Outstanding imaging performance with advanced FPA - High-quality spectral and image data - High-speed imaging and mapping functions: covers large areas in a short time - FTIR imaging that supports transmission, reflection, and ATR measurement modes

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Optical microscope
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【NEW!!】FT-IR Imaging Microscope 'LUMOS II'

【Equipped with high-speed imaging and high-speed mapping capabilities】FTIR imaging is now faster, more comfortable, and more accurate than ever!

"LUMOS II" is a high-speed imaging compatible FPA detector. With a guide function that can be used by anyone, from beginners to advanced users, regardless of their analytical skill level, it allows all users to utilize it quickly, comfortably, and accurately. Additionally, imaging can be performed in all measurement modes, enabling easy and accurate chemical evaluation of heterogeneous samples such as tablets, polymer materials, and the dispersion state of contaminants. 【Features】 ■ High-speed imaging and high-speed mapping function: covers wide areas in a short time ■ Excellent imaging performance with advanced FPA ■ High-quality spectral and image data ■ FTIR imaging compatible with transmission, reflection, and ATR measurement modes ■ Achieves high-sensitivity measurements without liquid nitrogen *For more details, please refer to the PDF materials or feel free to contact us.

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Optical microscope
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Technical Data: Microplastic Analysis Solution

Providing a new analysis method based on high-speed imaging and machine learning!

Bruker Japan can provide spectroscopic analysis solutions specialized in microplastics due to many years of experience. Our FT-IR and Raman microscopes are used daily by leading microplastic scientists around the world. This document clearly explains: ▶ The effectiveness of micro-infrared and Raman spectroscopy ▶ Why Bruker products are suitable for microplastic analysis *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibiting at JASIS2023◆ Please check the basic information below for details about the exhibition.

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Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

Micro-infrared emission spectroscopic measurements utilizing spatial resolution are possible! Introducing solutions using infrared microscopy.

Analyzing the infrared emission spectrum of materials provides important insights in many research fields. In particular, measurements of emission spectra using FT-IR allow for simultaneous analysis across a wide range of wavenumbers, addressing both thermal radiation associated with the sample's heat and radiation resulting from quantum mechanisms. When the sample is large and emits strong infrared radiation, measuring the emission spectrum is relatively straightforward; however, in the case of small samples that are less than 1mm, detecting the emitted infrared light becomes challenging. This document introduces solutions using Bruker's unique infrared microscope to overcome these hurdles. [Contents] ■ Introduction ■ Measurement Examples ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.

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Data DL available: AFM Case Studies in Scanning Probe Microscopy

We will introduce numerous analysis cases using AFM scanning probe microscopy, such as structural analysis, elastic modulus measurement, and conductivity measurement.

In this case study collection, we will introduce analysis examples using "AFM: Scanning Probe Microscopy." [Contents] ● Method and results of "Structural analysis and elastic modulus measurement of food (somen)" ● Features and analysis examples of "Conductive measurements of AFM in a vacuum" ● Features and analysis examples of "Conductivity evaluation of material surfaces using AFM" ● "AFM observation of polymer materials (smoothing by microtome)" We conduct various analyses using AFM, which is one of our strengths. We hope you will take a look. There are many other examples not included here. *For more details, please refer to our other PDF materials or feel free to contact us.

Company：セイコーフューチャークリエーション
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Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

We will introduce various cases of micro-section machining and analysis, residual stress measurement, and more using ion milling, FE-SEM, EBSD, etc. The materials are available for download.

In this case study collection, we will introduce examples related to "cross-sectional observation and structural analysis." Starting with the analysis case of "Evaluation of aluminum sputter films using EBSD," we also include numerous examples such as the purpose, methods, samples, and results of "Cross-sectional processing of micro areas by ion milling," and the purpose, methods, and results of "Residual stress measurement of solder cross-sections." Additionally, we present orientation evaluations, cross-sectional observation results, and measurements. We encourage you to read through it. 【Contents】 ■ Evaluation of aluminum sputter films using EBSD ■ Cross-sectional processing of micro areas by ion milling ■ Residual stress measurement of solder cross-sections ■ Residual stress measurement of wire ■ Cooling (cryo) ion milling cross-sectional processing *For more details, please refer to the PDF document or feel free to contact us.

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[Data Download Available] Smoothing of Polymer Materials by Microtome and AFM Observation

High-resolution observation of soft polymer materials is possible with a cryo-microtome and AFM.

AFM scanning probe microscopy is a device that detects various physical interactions occurring between a probe and the sample surface, allowing for the observation of surface morphology in small areas and the measurement of electrical and mechanical properties. These physical interactions include atomic force, frictional force, and electrostatic force. It can perform measurements in various environments, including atmospheric and vacuum conditions, and is capable of observing sample surfaces regardless of whether they are conductive or insulating. Additionally, by using a cryo-microtome, it is possible to produce ultra-thin sections of soft polymer materials such as resins under frozen conditions. We are observing polyisoprene rubber from various angles using this AFM and cryo-microtome. Please take a moment to read the PDF materials. This technology can be applied not only to rubber but also to resins, plastics, and various polymer materials. Furthermore, our company conducts various surface analyses, including XPS, AES, and GD-OES, in addition to this analytical device. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

Company：セイコーフューチャークリエーション
Price：Other

Other polymer materials
Contract Analysis
Rubber
microscope

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