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microscope Product List and Ranking from 178 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

  1. null/null
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  5. 5 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
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microscope Product ranking

Last Updated： Aggregation Period:Mar 25, 2026～Apr 21, 2026
This ranking is based on the number of page views on our site.

  1. All-in-one fluorescence microscope 'BZ-X1000 Series'
  2. White interference microscope equipped with laser 'VK-X4000 series'
  3. White interference microscope equipped with laser microscope 'VK-X3000'
  4. 4 All-in-one fluorescence microscope 'BZ-X800'
  5. 5 All-in-one fluorescence microscope BZ-X series

microscope Product List

391～420 item / All 677 items

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Low Voltage Electron Microscope 'LVEM25'

Low Voltage Electron Microscope 'LVEM25'

Nanoparticle observation is used worldwide as a screening TEM.

The "LVEM25" is a low-voltage electron microscope that provides high-contrast images from samples prepared using conventional methods. Three powerful imaging modes are available in a compact single device. Switching between modes can be easily operated via software, allowing for rapid imaging of the same area of interest in TEM, STEM, and ED modes. 【Main Technical Features】 ■ Compact design ■ No special facilities required: can be installed in various locations ■ Permanent magnet lens: no cooling needed ■ Electrostatic field emission gun: high contrast ■ Control unit and software: complete imaging control, etc. *For more details, please download the PDF or feel free to contact us.

  • Electron microscope
  • microscope

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Tabletop Low Voltage Electron Microscope 'LVEM 5'

Tabletop Low Voltage Electron Microscope 'LVEM 5'

Nano-scale on the tabletop! Equipped with four imaging modes on a single benchtop.

The "LVEM 5" is a tabletop low-voltage electron microscope that seamlessly combines four different imaging functions into a single benchtop device, eliminating the need to move samples between microscopes. Furthermore, with just a click of a button, you can image the same area of interest in TEM, SEM, and STEM modes. 【Features】 ■ High-contrast nanoscale imaging ■ Unique benchtop design ■ Simple workflow *For more details, please download the PDF or feel free to contact us.

  • Electron microscope
  • microscope

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Introduction of Work Content: Panel Products Visual Inspection (Visual)

Introduction of Work Content: Panel Products Visual Inspection (Visual)

We will introduce the work content of visual inspection of panel products.

At Tadokoro Manufacturing, we handle part of our customers' production lines in Sagamihara City, Kanagawa Prefecture, and undertake various inspections, packaging, and assembly tasks. In particular, our appearance inspection department is equipped with four clean booths (Class 1000; one unit: 45 square meters) and uses microscopes (8 to 35 times), magnifying glasses (2 to 6 times), and visual inspection to identify any appearance defects. Please contact us if you are considering outsourcing in terms of labor, space, or cost. 【Features】 ○ Fixed cost reduction ○ Management cost reduction ○ Effective use of space For more details, please contact us or download the catalog.

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  • microscope

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Introduction of Work Content: Safety and Health Products - Appearance Inspection of Imported Goods (Dedicated Inspection Jigs)

Introduction of Work Content: Safety and Health Products - Appearance Inspection of Imported Goods (Dedicated Inspection Jigs)

We will introduce the work involved in the appearance inspection of imported safety and hygiene products using dedicated inspection jigs.

At Tadokoro Manufacturing, we handle part of our customers' manufacturing lines in Sagamihara City, Kanagawa Prefecture, and undertake various inspections, packaging, and assembly tasks. In particular, our appearance inspection department is equipped with four clean booths (Class 1000; one unit: 45 square meters) and uses microscopes (8-35x), magnifying glasses (2-6x), and visual inspection to identify any appearance defects. Please contact us if you are considering outsourcing in terms of labor, space, or cost. 【Features】 - Reduction of fixed costs - Reduction of management costs - Effective use of space For more details, please contact us or download the catalog.

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Safety and hygiene products, imported goods, inspection work, Japanese label affixing, within the warehouse.

Safety and hygiene products, imported goods, inspection work, Japanese label affixing, within the warehouse.

We will introduce the inspection work for safety and hygiene products and the task of attaching Japanese labels.

At Tadokoro Manufacturing, we handle part of our customers' manufacturing lines in Sagamihara City, Kanagawa Prefecture, and undertake various inspections, packaging, and assembly tasks. In particular, our appearance inspection department is fully equipped with four clean booths (Class 1000; one unit: 45 square meters) and uses microscopes (8-35x), magnifying glasses (2-6x), and visual inspection to identify appearance defects. Please contact us if you are considering outsourcing in terms of labor, space, and cost. 【Features】 ○ Reduction of fixed costs ○ Reduction of management costs ○ Effective use of space For more details, please contact us or download the catalog.

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Composite X-ray Excitation Photoelectron Microscope Review PEEM

Composite X-ray Excitation Photoelectron Microscope Review PEEM

Compound X-ray Excitation Photoelectron Microscope Review PEEM

For more details, please contact us.

  • Microscope
  • Electron microscope
  • microscope

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AFM/SPM for Polymers Cypher ES Polymer Edition

AFM/SPM for Polymers Cypher ES Polymer Edition

Standard-equipped with optimal measurement modes and options for polymer material research! Atomic force microscope for polymers based on ultra-high-performance environment-controlled AFM/SPM.

The Cypher ES Polymer Edition is based on the Cypher ES, which adds sophisticated environmental control to Asylum Research's ultra-high-performance AFM, and comes standard with measurement modes and options that are optimal for polymer materials research and polymer characterization (see "Basic Information" below). ● For other features and details, please refer to the catalog or contact us.

  • Other measurement, recording and measuring instruments
  • Microscope
  • microscope

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Benchtop Confocal Microscope "BC43"

Benchtop Confocal Microscope "BC43"

Space-saving and impressive performance. Ideal for live cell confocal imaging.

The "BC43" is a benchtop confocal microscope that can provide amazing images with just the push of a button. This plug-and-play confocal system is designed with cost, performance, and accessibility in mind, offering user-friendly high-quality 2D and 3D imaging capabilities that save valuable time for researchers. It also has many features and advantages, making it an ideal product for both those who are just starting their research and those who are already familiar with microscopy. 【Features】 ■ Benchtop multimodal imaging system ■ Easy confocal: sharp imaging without blur ■ Widefield imaging ■ Differential phase contrast and brightfield ■ Borealis uniform illumination *For more details, please refer to the PDF materials or feel free to contact us.

  • others
  • microscope

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Transmission electron microscope

Transmission electron microscope

The fine structure of the sample can be observed at the nanoscale using a transmission electron microscope (TEM)!

Our company is capable of producing high-precision thin film samples for TEM observation and achieving clear sub-nanometer order structural observations through advanced TEM observation techniques.

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Microscope "Major Scope" / Lens Camera "Digital Catch"

Microscope "Major Scope" / Lens Camera "Digital Catch"

A microscope with various combinations is possible! We also introduce a lens camera that can transmit wirelessly!

The "Major Scope" is an essential microscope for various industrial production, processing, and inspection processes. It is a highly valuable product as a peripheral device that optically supports positioning and setting of machine tools, measuring instruments, and various devices. Compact and easy to use, it can be utilized for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. 【Major Scope Features】 ■ The optical system provides a bright, wide field of view with a completely upright image microscope. ■ Designed with a long working distance and parfocality suitable for industrial use (objective lenses 2× to 10×). ■ By simply replacing the eyepiece micrometer, it can accommodate various applications such as measurement, inspection, centering, and positioning. ■ The objective lens has a gold frame mechanism that allows for easy fine magnification correction. Additionally, when attached to the Major Scope, the "Digital Catch" allows for measurement, inspection, and positioning while displaying the object and scale glass on a tablet device or similar screen. *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope
  • microscope

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Design engineers provide individual support for the "Product Utilization Proposal and Verification Agency Service."

Design engineers provide individual support for the "Product Utilization Proposal and Verification Agency Service."

From product selection to combination proposals and even on-site verification, everything is free!

At Mirac Optical Co., Ltd., our product utilization proposal and verification agency service is handled individually by our design engineers, not sales representatives, to address various concerns and inquiries from our customers. We will provide the best proposals to solve your challenges by leveraging the know-how we have accumulated. 【Recommended for】 ○ Those who are unsure which Mirac product to choose from a wide range… ○ Those who want suggestions for the best combination of products that match their working conditions and target workpieces. ○ Those who would like to send in a physical workpiece for testing with an appropriate equipment configuration. *For more details, please contact us.

  • Other services
  • microscope

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[Case Study] Examples of Microscope Use

[Case Study] Examples of Microscope Use

We will introduce examples of use in pin shape inspections and burr inspections of rubber products.

Microscopes are essential for various industrial production, processing, and inspection processes, and we would like to introduce some examples of their use. They are highly valuable products that can also serve as optical support peripheral devices for positioning and setting of machine tools, measuring instruments, and various equipment. Compact and easy to use, they can be utilized for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. [Usage Examples] - Pushpin shape inspection - Burr inspection of rubber products - Gate removal residue inspection - Crack inspection equipment - Pin tip angle inspection *For more details, please download the PDF or contact us.

  • Other microscopes
  • microscope

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Measuring Tool Microscope "Measurer Scope"

Measuring Tool Microscope "Measurer Scope"

A microscope that is essential for various industrial production, processing, and inspection processes! Comprehensive catalog available for free!

The major scope is an essential microscope for various industrial production, processing, and inspection processes. It is also a highly valuable product as a peripheral device that optically supports positioning and setting of machine tools, measuring instruments, and various devices. Compact and easy to use, it can be utilized for a wide range of applications, from visual inspection to monitor observation, image measurement, and digital camera photography. We offer a wide variety of models and accessories in detail, responding to diverse needs at low prices. 【Features】 - The optical system provides a bright and wide actual field of view with a completely upright image microscope. - Designed with a long working distance and parfocality suitable for industrial use (objective lenses 2× to 10×). - By simply replacing the eyepiece micrometer, it can accommodate various measurements, inspections, centering, and positioning. - The objective lens has a gold frame mechanism that allows for easy fine magnification correction. *For more details, please download the PDF or contact us.

  • Microscope
  • microscope

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[Video] DOVETAIL Stage

[Video] DOVETAIL Stage

Features of the Mirac Optical Company DOVETAIL Stage

I will explain the play, looseness, grinding, unevenness, and rattling of the dovetail stage. I will also explain the features of the dovetail stage made by Milacron Optical.

  • Other machine elements
  • microscope

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[Video] Monocular Microscope "Major Scope" Setup for Applications

[Video] Monocular Microscope "Major Scope" Setup for Applications

Here are some smart ways to use the monocular microscope "Majorscope"!

1. As a setting gauge for machine tools, it allows for tool compensation while simultaneously checking the cutting edge and alignment. 2. As a tool presetter for small automatic lathes, it enables the installation of cutting tools outside the machine using a tool holder (the part that secures the cutting tool) and a tool presetter (a device that allows for precise installation of the cutting tool while viewing through a microscope).

  • Optical microscope
  • microscope

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[Video] Long-Focus Microscope

[Video] Long-Focus Microscope

You can observe from a distance! Long-focus microscope.

1. Ideal for applications that require a long working distance optical system. 2. Can be installed in a remote location when mounted on machinery or equipment. 3. Flexible arm allows for versatile setup. 4. The optical system can also be purchased separately. 5. The optical system is available in two types: visual observation type and C-mount type.

  • Optical microscope
  • microscope

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

  • Electron microscope
  • microscope

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope
  • microscope

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[Improvement without product] MEMS microscope (dual-side pattern misalignment inspection device)

[Improvement without product] MEMS microscope (dual-side pattern misalignment inspection device)

Monitor with a microscope camera to inspect for pattern misalignment and discrepancies!

At Arrows Engineering, we handle MEMS microscopes manufactured by IT Tech. The "TMIR-2000" can monitor MEMS wafers from both sides using microscope cameras, allowing for pattern misalignment and misregistration inspections. With newly developed software, the optical axes of the two cameras are aligned and synthesized in real-time, directly capturing any vertical overlap misalignment. Additionally, automatic line width measurement allows for sub-micron measurement of mark misalignment. 【Basic Configuration (Excerpt)】 ■ MEMS Microscope Main Unit ■ Triple Eyepiece Tube ■ 10x Eyepiece ■ XY Stage ■ Two Color Cameras ■ Inspection PC/19-inch Monitor/MEMS Inspection Software, etc. *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
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Basic Analysis Methods for Things that are Similar Yet Different

Basic Analysis Methods for Things that are Similar Yet Different

Introducing the flow from optical microscope observation with a wide range of applications to SEM observation and EDX elemental analysis!

We will introduce the flow from basic and widely applicable optical microscope observation to SEM observation and EDX elemental analysis. Observation using an optical microscope is one of the fundamental observation techniques, allowing for quick examination of general shapes and other features. Its advantage lies in the ability to obtain color information, making it effective for observing abnormalities associated with corrosion and other changes. In this document, we also provide detailed explanations of "observation using SEM" and "elemental analysis using EDX" with the help of photos and graphs. We encourage you to read it. [Contents] ■ Observation using an optical microscope ■ Observation using SEM ■ Elemental analysis using EDX *For more details, please refer to the PDF document or feel free to contact us.

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[Information] Differentiating Between Optical Microscopes and SEM

[Information] Differentiating Between Optical Microscopes and SEM

Comparing optical microscopes and SEM with the same sample! I will explain the advantages and disadvantages.

Optical microscopes and SEM (scanning electron microscopes) are commonly used for sample observation, but each has its own characteristics, so it is important to choose the appropriate device according to the purpose. In this document, we compare optical microscopes and SEM using the same sample and introduce the generally mentioned advantages and disadvantages. Please take a moment to read it. 【Contents】 ■ Features of Optical Microscopes ・ Advantages / Disadvantages ・ Recommended for this type of observation ■ Features of SEM (Scanning Electron Microscope) ・ Advantages / Disadvantages ・ Recommended for this type of observation *For more details, please refer to the PDF document or feel free to contact us.

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[Analysis Case Study] Observation of Adhesion State Through Metal Plates Using Ultrasonic Microscopy

[Analysis Case Study] Observation of Adhesion State Through Metal Plates Using Ultrasonic Microscopy

If it is something that ultrasonic waves can penetrate, you can check internal information that cannot be confirmed from the appearance!

Here is a case study of observing the adhesive state through a metal plate using an ultrasonic microscope. The ultrasonic microscope can confirm internal information that cannot be seen from the exterior, as long as the ultrasonic waves can penetrate. After reliability testing, we observed the condition of the adhesive remaining on the metal plate from the metal side in a sample where the chip had come off. Please refer to the PDF document for details on the observations and results. [Case Overview] - Observation of the adhesive layer between the metal and the chip - Observation of the adhesion state between the metal and the adhesive *For more details, please download the PDF or feel free to contact us.

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Ultrasonic microscope observation of printed circuit boards.

Ultrasonic microscope observation of printed circuit boards.

Delamination inside the circuit board, which is not visible during visual inspection, can also be visualized!

At Aites Co., Ltd., we conduct ultrasonic microscope observation (transmission method) of printed circuit boards. In printed circuit boards, issues such as delamination (separation) can occur due to factors like storage environment, thermal and humidity stress, and defects in the manufacturing process, leading to the separation of internal layers of the board. The transmission method involves transmitting ultrasonic waves through the observation sample and converting the received ultrasonic waves into electrical signals for imaging. If there are voids such as delamination, the ultrasonic waves do not transmit, resulting in a black appearance in the image. 【Features】 - Effective for detecting delamination (separation) that is not visible through visual inspection due to internal defects in the board. - Ultrasonic waves are transmitted through the observation sample for imaging. - Areas with voids such as delamination appear black in the image. *For more details, please download the PDF or feel free to contact us.

  • Physicochemical testing
  • microscope

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Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)

High magnification observation (up to about 300,000 times) is possible.

SEM is a technique that allows for obtaining contrast based on the information from electrons emitted from a sample when an electron beam is directed at it, revealing the sample's surface roughness and compositional differences. - High magnification observation (up to about 500,000 times) is possible with simple operation. - Observation of secondary electron (SE) images, backscattered electron (BSE) images, and transmitted electron (TE) images is possible. - Observation can be conducted within an acceleration voltage range of 0.1 to 30 kV. - Samples up to 6 inches can be loaded into the device (depending on the equipment). - By combining options with SEM, various types of information can be obtained: - Elemental analysis using an EDX detector is possible. - Measurement of electron beam induced current (EBIC) allows for evaluation of the junction position and shape in semiconductors. - Crystal information can be obtained using electron backscatter diffraction (EBSD) method. - Three-dimensional structural information can be acquired through repeated FIB processing and SEM observation (Slice & View). - Cooling observation and atmosphere-controlled observation are available.

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Atomic Force Microscopy (AFM) method

Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

AFM is a method that scans the surface of a sample with a fine probe and measures nanoscale surface topography in three dimensions. - It can measure a wide range of samples, from insulators to soft organic materials, including metals, semiconductors, and oxides. - By using tapping mode with low contact pressure, it is possible to minimize sample damage.

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