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microscope Product List and Ranking from 177 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. スリーアールソリューション Fukuoka//Trading company/Wholesale
  2. null/null
  3. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  4. 4 アズサイエンス 松本本社 Nagano//Trading company/Wholesale
  5. 5 アイテス Shiga//Electronic Components and Semiconductors
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microscope Product ranking

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. Portable Microscope "Magic Loupe R" / 15x Magnification, Photo and Save Capability スリーアールソリューション
  2. White interference microscope equipped with laser 'VK-X4000 series'
  3. White interference microscope equipped with laser microscope 'VK-X3000'
  4. 4 All-in-one fluorescence microscope 'BZ-X1000 Series'
  5. 5 All-in-one fluorescence microscope 'BZ-X800'

microscope Product List

196～210 item / All 662 items

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Camera-equipped infrared microscope 'InGaAs'

Camera-equipped infrared microscope 'InGaAs'

Built-in LED ring dark field infrared illumination! Enables easy high-resolution infrared microscopy imaging.

The "InGaAs" is an infrared microscope equipped with a camera that features built-in LED ring dark field infrared illumination, allowing for easy high-resolution infrared imaging. When using a near-infrared camera as a microscope, it consists of an accessory set including a tube, objective lens, infrared LED illumination, and power supply. 【Features】 ■ Built-in LED ring dark field infrared illumination ■ Easy high-resolution infrared imaging ■ Magnification: x20 (also compatible with x10 and x50) ■ Focal length: 95mm ■ Working distance: 20mm *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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SPR Microscope

SPR Microscope

A fusion system of intermolecular interaction analysis and bright field imaging!

The "SPR Microscope" is an innovative system that simultaneously analyzes molecular interactions using surface plasmon resonance (SPR) and performs imaging in bright field. It is designed as a system to measure the binding activity and cellular dynamics of membrane proteins on cells in a label-free manner under in vitro conditions. As a result, it can simultaneously acquire the distribution of binding activity (SPR two-dimensional mapping images) and cellular structure (bright field images), allowing for the investigation of changes at the cellular level. 【Features】 ■ Fusion of molecular interaction analysis device and optical microscope ■ Mapping of label-free binding activity at the cellular level under in vitro conditions ■ Measurement of binding responses of bacteria, viruses, and nanoparticles at the nanometer level * This PDF document is the English version. * For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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Electrostatic Force Microscope (EFM)

Electrostatic Force Microscope (EFM)

It is a surface potential distribution measurement system of the scanning probe microscope type with a cantilever having a tip size of 5μm x 5μm.

It is possible to measure very fine surface potential distributions of about 10μm, which could not be measured with conventional surface potential meters, and it allows for scanning of very wide areas of about several millimeters. It can measure voltages of ±1000V with high precision of 0.5%.

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  • Electrical Instruments/Electrometers

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Examples of observing plastics and resin materials using TEM and SEM.

Examples of observing plastics and resin materials using TEM and SEM.

Introducing observations of CNF in PE and the higher-order structure of cell walls in PE foams, along with photos!

On our company website, we introduce examples of resin material observation using transmission electron microscopy (TEM) and scanning electron microscopy (SEM). In the TEM observation examples, we include observations of CNF in PE, the higher-order structure of cell walls in PE foams, and the lamellar structure near the surface of HDPE. Additionally, in the SEM observation examples, we present comparisons before and after weather resistance tests of ABS resin, as well as cross-sectional structural analysis of automotive bumper materials. Please take a look. [Content Included (Partial)] ■ TEM Observation Examples - Observation of CNF in PE - Higher-order structure of cell walls in PE foams - Observation of lamellar structure near the surface of HDPE - Morphology observation examples of HIPS/ABS systems - Morphology observation in PC/ABS system materials *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis

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Observation of PE/CNF (Cellulose Nanofiber) using TEM

Observation of PE/CNF (Cellulose Nanofiber) using TEM

We are introducing examples of observing the dispersion state of CNF (cellulose nanofiber) in PE.

On our company website, we introduce "Observation of CNF composite materials using Transmission Electron Microscopy (TEM)." By utilizing the techniques developed through the observation of polymer crystal structures and the morphology of polymer alloys, including the production of ultra-thin sections with staining, we have made it possible to observe CNF (cellulose nanofiber) incorporated into resins. We also include photographs of the dispersion state of CNF in PE and enlarged images. Please take a look. [Published Photos] ■Observation of CNF dispersion state in PE - PE/CNF dispersion state observation - PE/CNF enlarged photos *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis

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Morphological observation of foamed resin materials using TEM.

Morphological observation of foamed resin materials using TEM.

You can observe the crystal structure within the cell walls of the foam!

We conduct "observation of foams using Transmission Electron Microscopy (TEM)" as a form of morphological observation. By applying and enhancing the technology for producing ultra-thin sections, which we have developed through the observation of crystalline structures in polymers and the morphology of polymer alloys, it is possible to observe the crystalline structure within the cell walls of foams. Additionally, we have observation results for resins and composite materials other than PE, and by combining staining techniques, we can observe the dispersion state of the cell walls in polymer alloys. 【Features】 ■ Observation results available for resins and composite materials other than PE ■ The dispersion state of the cell walls in polymer alloys can be observed by combining staining techniques ■ Observation possible for soft material foams *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis

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Observation of the fine structure of styrene-based elastomers using transmission electron microscopy.

Observation of the fine structure of styrene-based elastomers using transmission electron microscopy.

If you are interested in TEM observation of the fine structure of block copolymers or graft copolymers, please feel free to consult with us.

Our company conducts fine structure observation of styrene-based elastomers using Transmission Electron Microscopy (TEM). We observe the fine structure (microphase separation structure) in styrene-based thermoplastic elastomers such as Styrene-Ethylene/Butylene-Styrene block copolymers (SEBS) using TEM. Additionally, the dispersion state of styrene-based elastomers within composite materials can also be observed using our electron staining technology in TEM. 【Features】 ■ The dispersion state of styrene-based elastomers within composite materials can be observed using electron staining technology in TEM. *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis

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Observation of fine dispersed rubber in styrene-based resin using transmission electron microscopy.

Observation of fine dispersed rubber in styrene-based resin using transmission electron microscopy.

Observation of the salami structure of micro-dispersed rubber domains (butadiene rubber)! The differences in structure are clearly distinguishable.

Our company conducts observations of micro-dispersed rubber in styrene-based resins (HIPS, ABS) using transmission electron microscopy (TEM). We observe the salami structure of micro-dispersed rubber domains (butadiene rubber) in high-impact polystyrene (HIPS) and acrylonitrile-butadiene-styrene (ABS) resins. The differences in the salami structures of both are clearly distinguishable. Please feel free to contact us if you have any inquiries. [Overview] ■ Observation of the salami structure of micro-dispersed rubber domains (butadiene rubber) ■ Clear distinction of the differences in salami structures *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis

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[Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins

[Analysis Case] Observation of the Dispersion State of Fillers in Automotive Resins

Quantitative evaluation of fillers blended into resin is possible! Here is an example of understanding the dispersion state per volume of filler.

In the fields of automobiles and aircraft, lightweight organic/inorganic composite materials with strength and rigidity are widely used. The size and dispersion state of inorganic fillers contained in organic/inorganic composite materials significantly affect mechanical properties, making it necessary to understand the distribution and orientation of inorganic fillers. This document presents a case study where fillers within a resin were evaluated in three dimensions using FIB-SEM. [Case Summary] ■ Analysis Sample - Automotive resin containing inorganic fillers ■ Analysis Results - It was found that the resin contains approximately 10Vol% of fillers. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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Introduction to the Equipment of the Technology Development Office

Introduction to the Equipment of the Technology Development Office

We own microscopes and electron microscopes! We provide consistently stable quality plating using various analytical devices.

In our Technology Development Department, we analyze and manage the plating solutions from three factories using various analytical devices. By understanding the consumption of chemicals due to plating operations and controlling the supply amounts, we strive to consistently provide stable quality plating. Additionally, in 2015, we introduced a scanning electron microscope to conduct surface analysis and evaluation of plating films. By observing at the micron level, we clarify issues that are not noticeable to the naked eye, and we research plating conditions that match the surface state to our customers' needs. 【Equipment Owned (Partial)】 ■ Microscope ■ Electron Microscope, manufactured by JEOL: "SM-6010PLUS/LA" ■ Polishing Machine, manufactured by Sankeikaku: Automatic Polishing Machine "HA-FSA-83" ■ Cutting Machine, manufactured by Sankeikaku: Cutting Machine Alt Cut "CK260-90" ■ Manufactured by Shimadzu: Spectrophotometer "UVmini-1240" ■ Manufactured by Matsuzawa: Digital Microhardness Tester "SMT-3" *For more details, please refer to the PDF document or feel free to contact us.

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  • Plating Equipment
  • Contract manufacturing

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Shinsei Science Co., Ltd. Business Introduction

Shinsei Science Co., Ltd. Business Introduction

Leave it to us for all your needs regarding physical and chemical instruments, research equipment, and nursing supplies!

Shinsei Science Co., Ltd. is a company that mainly develops businesses dealing with physical and chemical instruments, research equipment, and nursing care supplies. We offer a variety of physical and chemical instruments, research equipment, and welfare devices, including the electric cart "Palpal," which can be charged at home and can travel approximately 25 km on a single charge, as well as the "Resuscian With QCPR Full Body Skill Guide" and "Draft Chamber." 【Main Products】 ■ Physical and chemical instruments and agricultural measurement devices ■ Research equipment ■ Welfare devices ■ Medical simulators and AEDs *For more details, please refer to our catalog or feel free to contact us.

  • Other physicochemical equipment
  • Other measurement, recording and measuring instruments

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3D Inspection Microscope for Battery Manufacturing AniCAMHD

3D Inspection Microscope for Battery Manufacturing AniCAMHD

55% reduction in slurry waste, shorter switching times, reduction in inventory!

AniCAM HD with PIXELOC is a world-leading 3D volumetric measurement device for inspecting anilox rolls and gravure cylinders. Its unique flexibility allows it to be used in various manufacturing environments, such as the production of batteries and solar panels. Troika Systems' AniCAM is the ideal device for accurately measuring whether active materials, conductive additives, polymer binders, and solvents are applied to the substrate in the appropriate amounts and thicknesses during the manufacturing process.

  • Secondary Cells/Batteries
  • Other inspection equipment and devices

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Light Sheet Microscope "UltraMicroscope II"

Light Sheet Microscope "UltraMicroscope II"

Supports all transparency protocols! Flexibly adapts to the refractive index of any sample.

The "UltraMicroscope II" is an optical sheet microscope capable of visualizing biological processes related to physiological functions. With its large, open sample chamber, wide field of view, and long working distance of the objective lens, it can capture large samples such as embryos, mouse organs, biopsy samples, and 3D cell cultures from a bird's-eye perspective. 【Features】 ■ Visualization of biological systems ■ Sharp and bright images ■ Flexible sample selection ■ Smart and user-friendly features ■ Ability to grasp the entire biological system at the cellular level *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes and optical inspection equipment

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