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scope Product List and Ranking from 30 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Jul 23, 2025~Aug 19, 2025
This ranking is based on the number of page views on our site.

scope Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Jul 23, 2025~Aug 19, 2025
This ranking is based on the number of page views on our site.

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  5. 5 GOKO映像機器 Kanagawa//Optical Instruments 本社

scope Product ranking

Last Updated: Aggregation Period:Jul 23, 2025~Aug 19, 2025
This ranking is based on the number of page views on our site.

  1. Digital Microscope "VHX-X1 Series"
  2. Digital Microscope "VHX-D500/D510"
  3. Stroboscope "ST-MX"
  4. 3D Microscope [Realistic 3D playback without wearing goggles or glasses]
  5. 4 Narrow Diameter Industrial Fiber Scope / M186BE0.5-500AM

scope Product List

286~300 item / All 535 items

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Digital Oscilloscope "WaveAce1000/2000"

Demo units available for loan! It can improve troubleshooting and reduce debugging time.

By using an excellent oscilloscope, you can simplify your work and reduce the time for problem detection and debugging. The WaveAce improves troubleshooting and shortens debugging time by combining long memory, a color display, diverse measurement functions, advanced triggers, and outstanding connectivity. With a bandwidth ranging from 40MHz to 300MHz, a maximum sampling rate of 2GS/s, and waveform memory of up to 1M points/Ch (2M points interleaved), the WaveAce achieves high functionality that is unimaginable for a compact and low-cost oscilloscope. 【Features】 ○ Equipped with all the tools and functions necessary for debugging ○ Functional, simple, and efficient For more details, please contact us or download the catalog.

  • oscilloscope

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High-precision 12-bit oscilloscope HDO4000 series

Bandwidth: 200MHz to 1GHz! It is a high-precision 12-bit oscilloscope.

The HDO4000 series is an ideal oscilloscope that enables accurate measurements and quick debugging by combining Teledyne LeCroy's HD4096 high-resolution 12-bit technology, long memory, and powerful debugging tools. Despite its compact design, it features a large 12.1-inch touch screen display that provides high operability. Tools such as the WaveScan search function and History mode help identify and isolate issues for faster troubleshooting. The LabNotebook not only simplifies report creation but also allows you to recall the state during report generation, enabling revalidation of measurement results. 【Features】 ○ HD4096 Technology ○ Long Memory ○ 12.1-inch Touch Screen ○ Compact Design For more details, please contact us or download the catalog.

  • oscilloscope

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12-bit high-precision oscilloscope WaveRunner 6Zi

400MHz to 4GHz, vertical resolution 8 bits / 12 bits

LeCroy's 12-bit high-precision oscilloscope (WaveRunner 6Zi series) offers superior performance that surpasses other equivalent models, enabling you to complete tasks quickly and accurately with features such as long memory, a sampling rate of 40GS/s, low noise, and the world's highest resolution thanks to its 12-bit ADC. 【Features】 ○ 400MHz-4GHz bandwidth ○ 90-degree rotating tilt control For more details, please contact us or download the catalog.

  • oscilloscope

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High-performance film thickness gauge Leptoscope 2041

A high-performance thickness gauge that allows for easy and highly accurate measurement of non-magnetic metal film thickness and non-conductive film thickness on magnetic substrate materials.

◆Built-in data logger (up to 3850 points) ◆RS232 output ◆Calibration selection available for easy operation to high-precision measurement, even on unknown film thickness ◆Upper and lower limit alarm setting function ◆Calculation functions, number of measurement points, maximum, minimum, average, standard deviation ◆Offset function ◆Wide variety of probes Choose from a rich variety, from small microprobes to ZP probes for thick materials. ◆Measurement range: 0 to 12500μm (up to 20mm with NEW probe) ◆Measurement accuracy: Single pole probe, 1%±1μm for 100μm or less, 1.3%±1μm for over 100μm ◆Dimensions: W83×H151×D35mm, 300g Power: Two AA batteries, 26 hours of use ◆For inquiries, please contact us at the following: Tokyo Headquarters: TEL: 03-3221-7531 Osaka Branch: TEL: 06-6885-6201 Email: sales@matech.co.jp

  • Coating thickness gauge

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INVIZ Video Scope

A videoscope that enables efficient and economical tube inspection.

● Very efficient inspection of the inner surface of tubes with diameters from 5mm to 120mm and weld inspections! ● Wide range of applications from pharmaceuticals, chemicals, and food to plants. 【INVIZ Revolver 12.7】 Electric rotating model with the smallest diameter (continuous 360°), field of view direction: 90° side, 0° possible. 【INVIZ Inspector】 Equipped with a robust protective outer covering, detachable 90° mirror can be attached. 【INVIZ iNSPECTOR 10/8】 Revolutionary model for bends equipped with remote focus function. 【INVIZ H4】 Hybrid type combining a micro camera and fiber, ideal for narrow spaces and multiple bends (supports up to 7 bends).

  • Optical microscope
  • Microscope
  • Other image-related equipment

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Compact Lightweight LED Stroboscope [For Development and Maintenance Repair Sites]

This is a stroboscope born from the front lines of manufacturing, developed in the field of motor control.

Our "Compact Lightweight LED Stroboscope" is a stroboscope born from the forefront of manufacturing, developed in the field of motor control. It is a handheld type that uses high-brightness LEDs, making it compact and lightweight. Anyone can easily observe dynamic behavior. It is a very convenient device to have in development and maintenance repair sites. 【Features】 ■ Dial adjustable for easy measurement of rotation speed ■ One of the lightest in its class at 200g (including two AA batteries) ■ Performance is top-class in the industry, capable of handling up to 150,000 RPM ■ Auto-off power function for long battery life ■ Portable, low-cost, and designed to fit comfortably in the hand *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope
  • Lighting for image processing
  • Time-frequency measurements

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Standard Version of Flat Field Halation Observation Microscope (Medium Magnification)

Detection of scratches down to "4 microns" with a zoom magnification of 0.75 to 4.5 times.

This is a highly versatile microscope that allows for easy detection of defects through zooming in and magnified observation. It features a telecentric zoom lens with a magnification range of 0.75 to 4.5 times and high-brightness illumination that minimizes halation, achieving high-quality images. It excels in quality inspection as a microscope for planar observation, enabling the "seeing of the unseen."

  • Microscope

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24mm field of view R illumination halation microscope

The Halation Microscope provides lossless images due to the direct reflection of external illumination.

This is a curved surface observation microscope that can be observed at a zoom magnification of 0.2 to 1.6 times. It is equipped with a unique halation R lighting system that provides a field of view of 24×18 mm, making it a microscope for surface observation without shadows, allowing you to "see the unseen." It is a versatile microscope that can be applied to a wide range of observations, including scratches and dents on φ16 shafts, lens scratches, bubbles, cracks, and chips in metal pipes, which could not be observed with conventional methods.

  • Microscope

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Haleration Microscope "PS-100-S6Z45C"

It comes with a height reading dial, allowing for depth measurement as well, making it highly versatile.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image captured using the halation microscope "PS-100-S6Z45C" (medium magnification) for planar observation, showing the ITO of the LCD under halation lighting and incident lighting. The image under incident lighting does not show the ITO, while the image under halation lighting clearly reveals the ITO.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Halation Microscope "PS-100-S6Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left shows a comparative image of dirt on an IC chip captured using the "PS-100-S6Z90A" halation microscope for planar observation (high magnification) with halation lighting and reflected lighting. The image taken with reflected lighting does not capture the dirt, while the image taken with halation lighting clearly shows the dirt.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS..S7Z16R100-2"

With its unique lighting effect, it has become possible to observe curved and R surfaces.

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt that are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a reflection image with a small angle can be obtained, it is now possible to observe surface irregularities "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. This is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The image on the left is a comparison captured by the halation microscope "PS-100-S7Z16R100-2" for curved surface observation, showing scratches and mold on the lens surface using both halation and incident lighting. The incident lighting image captures only a small part of the scratches on the lens, while the halation lighting image clearly captures both the scratches and the mold.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope with a maximum field of view of 24×18mm, designed for R illumination curved surface observation, equipped with an illumination controller.

Haleration Microscope "PS-100-S7Z16R100-2M" Wide Field Curved Surface Version, Maximum Field of View 24×18mm for R Lighting Curved Surface Observation (13x to 53x on a 15" monitor, with 11-column lighting selection controller). This is a microscope for curved surface observation that can be observed at a zoom magnification of 0.2 to 1.6 times. The R lighting features a controller that allows for selective illumination of 11 columns, cutting out unnecessary lighting and focusing on "seeing the unseen" for surface observation. It secures a field of view of 24×18mm, enabling wider field observations of scratches, dents on shafts and metal pipes, cracks, and chips in mounted components, and the effective use of lighting further enhances the capabilities of this imaging sensor tool. For more details, please download the catalog.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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New product! Halation Microscope

"PS-100-S7Z45D" is an image with no loss due to specular reflection from external illumination.

The external illumination captures the specular reflection image. As a result, the color of the workpiece is lost, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The moving image shown below is a comparative image captured with the halation microscope "PS-100-S7Z45D" (medium magnification) for flat observation, using halation lighting and incident lighting on a metal painted surface. The image under incident lighting makes it difficult to capture scratches, while the image under halation lighting does not capture color but clearly reveals the scratches.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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