We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Atomic Force Microscope.
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Atomic Force Microscope Product List and Ranking from 5 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

Atomic Force Microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. パーク・システムズ・ジャパン Tokyo//Testing, Analysis and Measurement
  3. 生体分子計測研究所 Ibaraki//Testing, Analysis and Measurement
  4. 4 日本レーザー Tokyo//Electronic Components and Semiconductors
  5. 5 東陽テクニカ Kanagawa//Testing, Analysis and Measurement 慶應義塾大学理工学部中央試験所・ 東陽テクニカ産学連携室 ナノイメージングセンター
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Atomic Force Microscope Product ranking

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. Atomic Force Microscope (AFM)
  2. Multifunctional Compact Atomic Force Microscope CoreAFM
  3. High-speed atomic force microscope (high-speed AFM) 'MS-NEX' 生体分子計測研究所
  4. Compact Type Atomic Force Microscope NaioAFM
  5. 4 Atomic Force Microscope (AFM) "Park NX10" パーク・システムズ・ジャパン

Atomic Force Microscope Product List

16～18 item / All 18 items

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Atomic Force Microscope (AFM) "Park NX12-Bio"

Atomic Force Microscope (AFM) "Park NX12-Bio"

Powerful scanning probe microscope for life sciences

The "Park NX12-Bio" is an atomic force microscope (AFM) equipped with three types of high-performance nanoscale microscopes on a single innovative platform. It enables both innovative liquid imaging with scanning ion conductance microscopy (SICM) and the highly regarded atomic force microscopy (AFM) technology. 【Comprehensive Solution for Nanoscale Biological Research】 ■ Equipped with a fracture-type fully independent Z-axis scanner/XY scanner, featuring high-precision Park NX AFM with complete non-contact technology (TM) ■ Ultra-high-resolution optical imaging using inverted optical microscopy technology ■ Enhanced biological cell imaging through the integration of scanning ion conductance microscopy *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

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Atomic Force Microscope "Park NX-HDM"

Atomic Force Microscope "Park NX-HDM"

A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.

The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
  • Other microscopes

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