Atomic Force Microscope Product List and Ranking from 12 Manufacturers, Suppliers and Companies

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Atomic Force Microscope Manufacturer, Suppliers and Company Rankings

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

日本カンタム・デザイン Tokyo//Testing, Analysis and Measurement
パーク・システムズ・ジャパン Tokyo//Testing, Analysis and Measurement
一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
4 アローズエンジニアリング Chiba//Testing, Analysis and Measurement
5 オックスフォード・インストゥルメンツ Tokyo//Testing, Analysis and Measurement

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Atomic Force Microscope Product ranking

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Atomic Force Microscope (AFM) 日本カンタム・デザイン
Atomic Force Microscope "AFM with Stage" アローズエンジニアリング
[New Release!] Atomic Force Microscope 'Park NX7' パーク・システムズ・ジャパン
Compact AFM "NaioAFM" *Demo now available 日本カンタム・デザイン
4 [Analysis Case] Surface Shape Analysis of GaN Substrates 一般財団法人材料科学技術振興財団　MST

Atomic Force Microscope Product List

16～30 item / All 41 items

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AFM platform with optical microscope

Achieves high-speed scanning and high resolution imaging using atomic force microscopy. Compatible with measurements in air and liquid.

This is an AFM platform equipped with an optical microscope. It allows imaging with an atomic force microscope targeting areas observed with the optical microscope. It adopts a vertical optical path design, and the gas-liquid dual-use probe holder can be used simultaneously in both air and liquid. (Liquid measurement option required) *For more details, please contact us.*

Company：日本レーザー
Price：Other

probe

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AFM Atomic Force Microscope Nano Observer 2

Achieving measurement quality comparable to high-end products from established AFM manufacturers.

Combining flexibility, outstanding performance, and user-friendly operability, it achieves measurement quality comparable to high-end products from established AFM manufacturers. It is equipped with a wide range of functions for nanoscale imaging and characterization. It also enables electrical property measurements (KFM, C-AFM) and features a soft IC mode that can measure fragile samples.

Company：日本レーザー
Price：Other

Other microscopes

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Atomic Force Microscope (AFM)

Introduction of atomic force microscopes (AFM) capable of proposing customized solutions for various systems, from research use to production sites.

Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have a lineup of models including the "CoreAFM," which features an active vibration isolation mechanism and supports a variety of measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever replacement using dedicated tools. Customization options are available, ranging from small models for research environments to large stage models for production sites, as well as automated systems for quality control. 【Lineup (excerpt)】 ◎ Desktop Atomic Force Microscope "CoreAFM" 　■ Equipped with active vibration isolation and wind protection 　■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM" 　■ Integrates controller, XY stage, wind protection, and vibration isolation 　■ Equipped with a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we handle. Detailed information can be viewed via "PDF Download."

Company：日本カンタム・デザイン
Price：Other

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High-performance atomic force microscope DriveAFM

Equipped with the off-resonance measurement mode "WaveMode" using photothermal excitation! Achieves high stability and performance!

"DriveAFM" is a high-performance atomic force microscope that dramatically accelerates research in both material science and life science. It enables high-speed imaging with atomic resolution while covering a very wide scan range of 100μm. It boasts high stability even in liquid environments. With "WaveMode," off-resonance measurements can be performed at speeds over 20 times faster, and the time required for imaging a single field of view is less than one minute. 【Features】 ■ Wide-range and high-resolution scanning using the proprietary "Direct drive" piezo scanner ■ Off-resonance mode "WaveMode" utilizing photothermal excitation developed by Nanosurf ■ WaveMode is useful even for soft samples like polymers ■ Equipped with photothermal excitation for the cantilever called "Clean-Drive" ■ Clearly images the periodic double helix structure of DNA *For more details, please refer to the PDF document or feel free to contact us.

Company：日本カンタム・デザイン
Price：Other

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Compact Type Atomic Force Microscope NaioAFM

Introducing a low-cost "All-in-one" AFM device that is compact, durable, and easy to operate!

"NaioAFM" is a compact atomic force microscope suitable for users who want to measure surface shapes concisely and quickly in the fields of nanotechnology education at universities and vocational schools, as well as in research and development or quality control. With the product's unique "Flip-over" scan head and dedicated exchange tools, it allows for quick and simple cantilever replacement. Balancing functionality and operability, it is an "All-in-one" AFM device that can be used by anyone, anywhere, and is widely utilized around the world. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera for positioning and side-view observation ■ Additional measurement modes can be added according to needs ■ Simple cantilever replacement: no need to adjust the laser or detector ■ Ready for measurement immediately after installation: just connect the USB cable and launch the software *For more details, please refer to the PDF document or feel free to contact us.

Company：日本カンタム・デザイン
Price：Other

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Custom Atomic Force Microscope (AFM) System

We will design and build a customized AFM system tailored to your needs!

It is necessary to conduct AFM measurements, but does the sample require special handling due to its size, or does it require experiments that differ from conventional techniques and methods? We sincerely take your needs into consideration and will work together with you to find solutions. At Japan Quantum Design, we design and build systems tailored to your requirements through close collaboration with the device development team at Nanosurf, the manufacturer based in Switzerland. If you have any concerns or requests regarding surface measurements, please feel free to contact us!

Company：日本カンタム・デザイン
Price：Other

Other measurement, recording and measuring instruments

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200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

Company：オックスフォード・インストゥルメンツ
Price：10 million yen-50 million yen

Microscope

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AFM/SPM for Polymers Cypher ES Polymer Edition

Standard-equipped with optimal measurement modes and options for polymer material research! Atomic force microscope for polymers based on ultra-high-performance environment-controlled AFM/SPM.

The Cypher ES Polymer Edition is based on the Cypher ES, which adds sophisticated environmental control to Asylum Research's ultra-high-performance AFM, and comes standard with measurement modes and options that are optimal for polymer materials research and polymer characterization (see "Basic Information" below). ● For other features and details, please refer to the catalog or contact us.

Company：オックスフォード・インストゥルメンツ
Price：10 million yen-50 million yen

Other measurement, recording and measuring instruments
Microscope

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Atomic Force Microscope "Handy AFM"

A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

Company：アローズエンジニアリング
Price：Other

Electron microscope

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Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

Company：アローズエンジニアリング
Price：Other

Electron microscope

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Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

AFM is a method that scans the surface of a sample with a fine probe and measures nanoscale surface topography in three dimensions. - It can measure a wide range of samples, from insulators to soft organic materials, including metals, semiconductors, and oxides. - By using tapping mode with low contact pressure, it is possible to minimize sample damage.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement
Contract Inspection

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[Analysis Case] Observation of Hair Surface Microstructure by AFM

Quantitative evaluation with reduced alteration is possible through analysis in the atmosphere.

This case study introduces an analysis of the condition of the cuticle on the hair surface using AFM. AFM is a method for three-dimensional measurement of nanoscale surface roughness. Since the analysis is conducted in the atmosphere, it does not cause degradation or gas release of organic materials, allowing for an evaluation of the sample's original shape. In this case study, we assessed the degree of cuticle opening, the distribution of adhered substances, and the roughness evaluation of different areas through images, as well as quantitatively evaluated the surface roughness through numerical processing. This method is effective for evaluating the condition of hair after shampooing and the application state after applying styling products.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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AFM Data Collection

AFM: Atomic Force Microscopy Method

AFM is a method that scans the surface of a sample with a fine probe and measures nano-scale surface topography in three dimensions. It can measure a wide range of materials, not only for the evaluation of metals, semiconductors, and oxides, but also for soft materials such as hair and contact lenses. This document presents various AFM images of different materials.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Wafer

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[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

In recent years, SiC has been attracting attention as a material for high-voltage devices. The trench MOSFET structure is necessary for the high integration of devices, and the application development for SiC devices is progressing. Since the channel region of the trench MOSFET structure is the trench sidewall, the flatness of the trench sidewall is related to the reliability of the device. This document introduces an example of quantitatively evaluating the roughness of the trench sidewall of SiC trench MOSFETs using AFM (Atomic Force Microscopy).

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Other semiconductors

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[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

Quantifying texture with mechanical property parameters.

Factors that determine texture include various elements such as hardness and adhesion. Generally, the texture of food is evaluated through stress assessment using tools like texture analyzers, but measuring in micro-regions or thin samples is challenging. AFM-MA can measure not only the shape of surface roughness but also the Young's modulus representing mechanical properties like hardness, adhesion parameters related to texture, and energy dissipation data in micro-regions. Therefore, it is effective for evaluating physical properties related to texture and similar characteristics in extremely small areas.