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Defect Inspection Equipment Product List and Ranking from 42 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Defect Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 三橋製作所 Kyoto//Industrial Machinery
  2. アヤハエンジニアリング 本社 Shiga//Testing, Analysis and Measurement
  3. バイスリープロジェクツ Miyagi//software
  4. テクネ商事 Kanagawa//Machine elements and parts
  5. 5 クボタ計装 Osaka//Testing, Analysis and Measurement
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Defect Inspection Equipment Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Surface Defect Inspection Unit "SSMM-1R" バイスリープロジェクツ
  2. US CW Company☆ Maintenance tools for piping and heat exchange tubes. テクネ商事
  3. Marking Device Series アヤハエンジニアリング 本社
  4. LPC Infrared Edge Sensor "PSM-700" 三橋製作所
  5. 4 [LPC] Ultrasonic Edge Sensor 'PSM-400' 三橋製作所

Defect Inspection Equipment Product List

46～60 item / All 65 items

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LPC Infrared Edge Sensor "PSM-700"

LPC Infrared Edge Sensor "PSM-700"

Uses infrared light source! Suitable for detecting undulations in non-woven fabric as well as transparent and opaque films.

The "PSM-700" is an infrared transmission web edge sensor. It is used for web wander control in combination with G-series controllers and drivers, and is suitable for edge detection of opaque webs and non-woven fabrics. In addition to the standard model "PSM-700," we also offer models such as "PSM-700S" with a switch panel, "PSM-700-DB" with a dust blow feature, and "PSM-700S-DB" with both a switch panel and dust blow feature. 【Features】 ■ The "DB" type with a dust blow unit is effective in dusty environments. ■ The "700S" with a switch panel allows for mode switching and teaching operations directly on the sensor body. ■ Models with a switch panel can also be configured into a simple system (only the driver and sensor) that does not use a PEM type controller. *For more details, please refer to the related links or feel free to contact us.

  • 08_PSM-700.2.PNG
  • Sensors

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Wafer surface defect inspection device with review function

Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, allowing for the detection of minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, enabling discrimination by defect type such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds/12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality is available

  • Semiconductor inspection/test equipment

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Microscopic wafer surface defect inspection device

Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway

  • Semiconductor inspection/test equipment

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Wafer Surface Particle Scanner YPI-MN

Wafer Surface Particle Scanner YPI-MN

A compact and space-saving tabletop particle inspection device ideal for device development and wafer cleaning checks!

It is a non-pattern wafer and substrate surface particle inspection device. It is a manual transport tabletop inspection device that does not take up much space. It is easy to install in labs or next to equipment. It can measure not only silicon but also glass materials.

  • Other inspection equipment and devices

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Wafer Chip Monitor Inspection Machine Model WBM-2000E

Wafer Chip Monitor Inspection Machine Model WBM-2000E

High-quality monitor inspection at optimal magnification is possible with the Takara Leica APO zoom optical system!

This is a visual inspection system for wafer chips that allows operators to reliably identify defective chips while viewing high-quality optical images. It can accurately classify defect locations/categories and image files. The system features an expanding stage that moves in steps, enabling color monitor inspections at optimal magnification suited to chip sizes. For more details, please download and view the catalog.

  • Other microscopes
  • Other inspection equipment and devices

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Chip element defect inspection machine

Chip element defect inspection machine

It is a high-precision XYZ auto stage.

Automatically inspects chip element defects on wafers. The system controls a microscope color camera and auto stage to automatically identify defects at the chip element level. For more details, please download and view the catalog.

  • Other microscopes
  • Other inspection equipment and devices

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Development Case [Image Inspection Device] *Detectable with a simple method!

Development Case [Image Inspection Device] *Detectable with a simple method!

Detectable by simple methods through cylindrical internal image inspection! Automatically inspect internal defects of LCD glass!

Taiyo Acris is engaged in the development of automatic machines that can accurately respond to customer requests. To achieve this, we consistently handle everything in-house, from mechanical design, electrical design, and software design to parts procurement, assembly, and on-site adjustments. We conduct reviews at each development step to ensure a smooth startup for our customers. 【Device Overview】 ○ A device that automatically inspects internal defects in LCD glass 【Features】 ○ Capable of inspecting defects as small as 0.05mm ○ Inspects for bubbles, foreign objects, scratches, craters, etc. ○ Inspection cycle of 20 seconds per sheet (for 730x920mm glass) For more details, please contact us or download the catalog.

  • Other inspection equipment and devices

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Cylindrical inner surface defect inspection device

Cylindrical inner surface defect inspection device

Non-contact inspection of casting processed products for surface defects such as pits and scratches is possible.

This is a device for inspecting grinding processing surface defects and scratches on cast metal products, which automatically conducts non-contact inspections of the entire inner surface of the cylinder and can record the location of defects. It helps improve productivity and quality without damaging the workpiece itself.

  • Recorders

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Visualization of surface defects and internal flaws using a special optical system.

Visualization of surface defects and internal flaws using a special optical system.

Solving 'If only we could do this!' Introducing an appearance inspection and internal defect inspection system using special optical systems.

For example, if you want to inspect products with textured patterns like fiber sheets (geometric patterns) for scratches or foreign substances, even if you take pictures of the defective areas with a general visible light camera, the defects can be buried within the complex texture patterns, making it difficult to extract just the defects. Additionally, defects such as bubbles that occur inside the product cannot be seen with a visible light camera because they are internal. In such cases, by using a camera with a special imaging method, it is possible to visualize defects buried within patterns that were previously not visible and defects inside the product.

  • Image Processing Equipment
  • Visual Inspection Equipment
  • Defect Inspection Equipment

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NS flange plug (steel)

NS flange plug (steel)

Introducing the NS flange plug with excellent sealing properties due to the use of O-rings!

We would like to introduce our "NS Flange Plug (Steel)." The material is structural carbon steel and structural alloy steel, with a hardness of HRC32 to 42. The use of O-rings ensures excellent sealing performance. Additionally, the pressure resistance has been confirmed through a dynamic pressure test at 350 kgf/cm². 【Specifications】 ■ Material: Structural carbon steel and structural alloy steel ■ Hardness: HRC32 to 42 ■ Surface treatment: Black oxide coating ■ Thread: JIS B0202 standard parallel pipe thread, Class A ■ Female thread: Sealed using the O-ring method according to JIS B2351 *For more details, please refer to the PDF document or feel free to contact us.

  • nut
  • bolt

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Semiconductor MEMS process services / substrate materials

Semiconductor MEMS process services / substrate materials

No need for equipment, specialized technicians, or operators! Outsourcing support for process services.

At Nippon Functional Materials Co., Ltd., we serve as a suitable bridge between a global alliance of process companies and substrate material companies, primarily in Europe and the United States. We provide process services such as "epitaxial growth," "oxidation," "deposition & sputtering," "wafer polishing," "laser processing," and "other processes," as well as wafer substrates including "FZ wafers," "CZ wafers," "SOI wafers," "SOS wafers," and "other wafers." 【Features】 ○ No equipment required ○ No specialized technicians required ○ No operators required ⇒ Outsourcing of process services For more details, please contact us or download the catalog.

  • Other metal materials
  • Wafer
  • Other semiconductors

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Edge Defect Inspection Device "RXW Series"

Edge Defect Inspection Device "RXW Series"

Unique laser application technology and sensor/image processing technology! Equipment dedicated to silicon wafers.

The "RXW Series" is a dedicated edge defect inspection device for silicon wafers that utilizes unique laser application technology along with sensor and image processing technology. It meets the diverse inspection, dimensional measurement, and automatic sorting requirements for edge proximity areas demanded in both wafer manufacturing and device manufacturing processes. We offer models such as the "RXW-1200D" and "RXW-1200F" that are compatible with device manufacturing processes. 【Features】 <RXW-1200D> ■ Full circumference image acquisition and ADC functionality using a laser sensor ■ Dark field switching function that enables high-sensitivity inspection ■ Border measurement function after EBR ■ Inspection and measurement after edge trimming, bonding, and sintering in CIS/TSV processes ■ ADR function with a high-magnification AF color camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices

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Laser Scanning Surface Shape Inspection Machine "CSM & CSYS Series"

Laser Scanning Surface Shape Inspection Machine "CSM & CSYS Series"

A surface shape inspection machine capable of measuring minute height changes over a wide range! Extremely resistant to vibrations, eliminating the need for vibration isolation tables and devices!

The "CSM & CSYS series" is a laser scanning surface shape inspection machine capable of fast measurements with high sensitivity over a wide measurement range. Utilizing patented technology for "laser surface shape inspection," it inspects "surface shape," "roughness," "waviness," "particles," and "defects" of semiconductor wafers (Si, SiC, GaN, etc.), MEMS, hard disks, functional films for FPDs, and sputtered thin films with high sensitivity, quickly, and over a wide range, displaying "digital data" and "3D image data." 【Features】 ■ Non-contact laser scanning for surface shape measurement data display ■ High detection sensitivity allows for fast measurements over a wide range, with digital image display ■ High reliability due to simple optical detection principles and structure ■ Extremely resistant to vibration, eliminating the need for vibration isolation tables or devices ■ Capable of 100% non-destructive inspection in inline processes, with automation support *For more details, please request documentation or view the PDF data available for download.

  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices

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On-off edge sensor

On-off edge sensor

Operate the actuator to control the web position! Available in two types: feeler type and photoelectric transmission type.

The "TK On-Off Edge Sensor" is a product that controls the web position by repeatedly turning an actuator on and off. A dead zone is established within a certain range, and when the web edge is within that dead zone, the sensor signal is off; when it exceeds that range, the sensor signal turns on. We offer a simple touch sensor with a feeler rubber, the "FB-8E," and a photoelectric transmission sensor with a built-in amplifier, the "PS-30." 【Features】 ■ Controls web position ■ Available in two types: feeler rubber type and photoelectric transmission type *For more details, please refer to the PDF document or feel free to contact us.

  • Sensors
  • Actuator

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Laser Cross-Section Shape Measurement System "PML"

Laser Cross-Section Shape Measurement System "PML"

Very lightweight and convenient to carry! High operability, compatible with all gauges.

"PML" is a laser cross-sectional measurement system that allows for the export of measurement results in PDF format. Measurements are completed in a short time. Evaluation after measurement is finished in a few seconds, and a preview display compares the current profile of the rail with the reference profile. It can be mounted on a correction vehicle and used, and even when installed on a vehicle, data acquisition and evaluation can be performed as easily as with a handheld device. 【Features】 ■ Laser cross-sectional measurement ■ Compliant with EN13231-2:2020 ■ High-performance tablet ■ Compatible with various track gauges ■ Measurement of correction amount ■ High operability *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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