Defect Inspection Equipment Product List and Ranking from 47 Manufacturers, Suppliers and Companies

Press part defect inspection device

It has flexible characteristics and can adapt to various types of pressed parts!

We would like to introduce the "Press Parts Defect Inspection Device," which combines advanced vision technology and artificial intelligence algorithms for processing and analysis, enabling efficient, accurate, and comprehensive inspections. Thanks to the positioning and posture of the camera used for image capture, along with the autofocus control algorithm, it is possible to conduct appearance inspections of press parts with varying sizes, different surface conditions, and numerous types of defects. The high-speed imaging technology processes 30 images per second, allowing for online inspection of the presence or absence of cracks over 1mm at a conveyor speed of 600mm/s. 【Features】 ■ Strong compatibility and convenience, high stability ■ System self-diagnosis function ■ Accuracy that triggers image capture ■ Remote data monitoring *For more details, please refer to the PDF document or feel free to contact us.

Company：名善
Price：Other

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Internal Defects in Materials Inspection Device 3D V-ROX

Rapid and easy identification of internal defects using active thermography inspection method.

This is a device that adds heat to the measurement target and confirms changes in thermal conductivity using an infrared camera. By integrating the heat source and the camera, it has become compact and lightweight, making it suitable for field services and installation on robots. It can determine defects in CFRP and honeycomb internal structures without using X-ray inspection.

Company：TOMITA CO.,LTD.
Price：Other

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Particle scanner for component cleanliness inspection "Micro Quick"

Simple scanning system! Membrane analysis and report generation possible in 2.5 minutes.

"Micro Quick" is a particle scanner for inspecting the cleanliness of components that can measure particle area, width, length, and number for particles larger than 25μm. When a membrane filter that has collected contaminants from automotive and precision machinery parts is set in the scanner, particle analysis is completed in just 2.5 minutes, and the results report particle diameter, number, and classification based on ISO16232 and VDA19. For small, precision components, it is crucial to analyze the size, number, shape, and classification of particles. This product allows for an easy start to foreign matter inspection of components standardized by ISO16232 and VDA19. 【Features】 ■ Particle counting method (size and number) according to international standard ISO16232 (automotive: inspection of component cleanliness) ■ Automatic report generation for easy results reporting ■ Automatic scanning and analysis ensure consistent results regardless of who operates it ■ Micro Quick operation is also documented in VDA19 (German automotive industry standard) ■ Adopted by many automotive companies and component manufacturers producing fluid circuits *For more details, please refer to the PDF materials or feel free to contact us.

Company：インテクノス・ジャパン
Price：Other

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Label marker (compatible with low, medium, and high-speed lines)

■It features a low price and compact design that breaks common sense. ■Easy to install, lightweight type. ■Sensor adjustment can be easily performed.

Company：AYAHA ENGINEERING CO.,LTD. Head office
Price：Other

Commercial printers
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Offline inspection device "MICRO ACE series"

Customizable! A lineup of offline inspection devices capable of high-resolution testing.

The "MICRO ACE Series" is an offline inspection device handled by Ayaha Engineering. The "OMI-UL," which can achieve a resolution of 0.7μ to ultra-high resolution inspection, can be linked with 3D measuring instruments and allows for the measurement of defect depth with the push of a button from the inspection map. Additionally, we offer a compact type "OMI-SP" and a simplified inspection model "OMI-FE" that can perform inspections at 10 to 100μ. 【Features】 <OMI-UL> ■ Capable of ultra-high resolution inspection from 0.7μ ■ Wide depth of field allows for full shape imaging of defects without variation due to focus ■ A rich combination of optical systems and defect type discrimination through image processing ■ Defect analysis possible with 3D measurement using a laser microscope (optional) ■ Active in research and development scenes for advanced materials such as displays, electronic materials, and batteries *For more details, please contact us.

Company：AYAHA ENGINEERING CO.,LTD. Head office
Price：Other

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Murabiyuwaa

It is possible to automatically detect and visualize even the smallest changes at the nanoscale without missing them!

The "Murabiyuwa Series" changes the common sense of inspection. It is a new sensation scope that allows you to confirm "invisible and hard-to-see" defects in a "clear and vivid" manner. It enables visual inspection and evaluation of nano-sized fine polishing marks, orange peel, scratches remaining on the surfaces of glass, crystal, sapphire, and fine grain patterns and crystal defects inside, leading to improved management of surface roughness, setting of polishing conditions, and significantly enhancing yield after deposition.

Company：三明
Price：Other

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Surface Defect Inspection Unit "SSMM-1R"

Realization of inspection for small scratches, unevenness, and foreign substances on products with high gloss mirror-like reflection (such as painted or plated surfaces).

This inspection unit utilizes a unique image processing system that has also obtained a utility model, enabling the inspection of small scratches, unevenness, and foreign objects on products with strong glossy mirror-like reflections (such as painted or plated surfaces), which were difficult to inspect using conventional methods. By taking advantage of the fact that the brightness changes that occur when the slit pattern is shifted at a constant cycle differ depending on the presence and shape of defects in the workpiece being inspected, defects are emphasized. The types of defects that arise vary depending on the surface condition and processing of the target workpiece, but the SSMM-1R can capture images suitable for the intended defects by allowing arbitrary settings for the direction and shape of the slit.

Company：バイスリープロジェクツ
Price：Other

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Comprehensive Catalog [Taymer Corporation]

We are featuring flat ribbon cable inspection devices and tape defect verification devices!

This catalog is a comprehensive catalog featuring products from Taymer, handled by Toho International Co., Ltd. It includes devices such as the "Surface Defect Detection Device," which contributes to zero defective product leakage, the "Printing Verification Device," which can automatically verify and manage the quality of printing on high-speed production lines, and the "High-Speed Kobb Inspection and Outer Diameter Measurement Device," which can accommodate up to 3,000 m/min. [Contents (excerpt)] ■ Surface Defect Detection Device (SI3100/SI4100) ■ Medical Surface Defect Detection Device (SI3100-MED) ■ Printing Verification Device (PV1400) ■ Cable Surface Color Identification Device (CV2000) ■ Flat Ribbon Cable Inspection Device (RI2400) *For more details, please refer to the PDF document or feel free to contact us.

Company：東邦インターナショナル本社
Price：Other

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Glass edge defect inspection device *Inspection of the front, back, and sides is possible with one camera.

Easily installable on existing lines! A glass edge defect inspection device that uses a special prism to inspect the surface, back, and sides of glass with a single camera.

This is a system for detecting edge cracks, grinding width, corner cuts, oriflat cuts, and chipping defects on glass substrates before cleaning. We offer a low-cost glass edge defect inspection machine. 【Features】 ■ Can be easily installed in existing lines with minimal space. ■ Capable of inspection at a speed of 800mm/sec. ■ Creates and saves inspection result LOG data and defect images in real-time. ■ LOG data can also be saved as CSV format files. *For more details, please download the catalog or contact us directly.

Company：ラポールシステム
Price：Other

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US CW Company☆ Maintenance tools for piping and heat exchange tubes.

☆Maintenance technology from CW Corporation, USA☆ High-pressure test flange local pressure resistance jig! No welding required, and high-pressure specification heat exchange tubes can be closed with a single touch!

Curtiss-Wright Corporation in the United States offers maintenance technologies with special features called "Pop-A-Plug" and "High Lift Flange Plug." 【Pop-A-Plug】 The Pop-A-Plug allows anyone to easily seal heat exchanger tubes in high-pressure equipment without the need for welding. - No welding required: Since welding is not necessary, there is no need for fire permits or inspections related to welding. - High-pressure compatible: It can withstand a maximum pressure of 48MPa and is used in various plant equipment. - No qualified personnel or skilled techniques required: With engineered plugs and specialized tools, anyone can achieve the same quality of crimp sealing. - Reduced labor: Significantly shortens work time and equipment recovery time. 【High Lift Flange Plug】 This is a tool for local pressure testing of flange welds, capable of testing up to high pressure. - Capable of testing up to high pressure: Flange #150 is 3.1MPa, #300 is 7.7MPa, and #600 is 15.5MPa. - Compatible with various flange shapes: WN, SO, SW. There are already numerous achievements, particularly in the maintenance sites of domestic petrochemical plants. *For more details, please feel free to contact us.

Company：テクネ商事
Price：Other

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High-speed defect inspection device for non-woven fabric

Hidden defects are clearly visible! Non-woven fabric defect inspection device capable of detecting even light colors such as yellow.

The Media Research Institute's "High-Speed Defect Inspection Device for Non-Woven Fabrics" is the ideal defect inspection device for those struggling with issues such as fluff, shots, and wind cotton. Thanks to the multi-channel optical system's technology for capturing multiple images of defects, the integration of multiple optical systems emphasizes the contrast between defects and the base material. With a high-speed camera, it can also accommodate high-speed lines, and its technology allows for the detection of light colors such as yellow while maintaining high-speed performance for color detection. 【Features】 ■ Emphasizes the contrast between defects and the base material through the integration of multiple optical systems ■ Accommodates high-speed lines with a high-speed camera ■ Detects light colors such as yellow ■ Effective for colored non-woven fabrics such as black ■ Clearly reveals defects hidden in the base material *For more details, please refer to the PDF document or feel free to contact us.

Company：メディア研究所
Price：Other

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ANALYZER3 f

Detect defects that cannot be captured by camera inspection.

New model "ANALYZER3f" (Model F) ----- High-precision imaging with newly developed laser light source ----- Achieves miniaturization of fiber-coupled laser light sources and stable output. The design of the laser head stage has also been revamped. This enables high-resolution imaging without focus shift, allowing for high-definition results. ----- Technology that supports mass production sites ----- Laser scanning technology detects fine defects quickly and accurately, meeting the demands of tact time. It overcomes issues related to light reflection and resolution that are challenging for camera inspections.

Company：ANALYZER
Price：1 million yen-5 million yen

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Wafer transfer device "TMUJ-05"

Supports 6-inch wafer size! Easy operation allows for wafer transfer!

The TMUJ-05 is a wafer transfer device that allows for the simple operation of transferring wafers from one cassette to another. Since it lifts and transfers the wafers, it can handle thin wafers without causing any damage during the transfer. Additionally, height adjustment is possible by loosening two screws. 【Features】 - Compatible with bottomless types - Easy to operate - Gentle on wafers - Transfers with front and back inversion - Bidirectional transfer of cassettes is possible *For more details, please refer to the catalog or feel free to contact us.

Company：サンワハイテック
Price：Other

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Film defect inspection device

Inspection of 300mm wafers can be performed in less than one second for the entire field of view in a single shot.

【Device Overview】 It is capable of inspecting 300mm wafers in less than one second for the entire field of view in a single shot. Due to the short inspection time, it is also adopted in fully automated inspection lines. It starts with a small field optical system and can be applied to internal void inspections by using infrared as an optional light source. In recent years, wafers have been getting thinner, but this is a high-precision wafer crack inspection device that quickly inspects the entire field of view for issues such as the unevenness of BG processing, polishing marks, and chip cracks caused by stress. 【Device Features】 In addition to automatic inspection, a standalone type is also available, allowing for manual inspection. It can set any slice level, enabling inspections tailored to specific needs. Depending on the application, it also has a function for removing so-marks, automatically extracting defect components excluding polishing marks. 【Device Applications】 ● Patterned wafer crack inspection ● Bare wafer crack inspection ● Wafer edge damage inspection ● Evaluation of BG polishing marks ● Evaluation of slurry ● Residual stress in glass substrates ● Evaluation of stress relief ● Tension inspection of BG tape ● Inspection of distortion and scratches on compound wafers

Company：ブルーオーシャンテクノロジー
Price：Other

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Surface defect detection device (for monofilament, stainless steel wire, and ultra-fine wire)

Minimum outer diameter Φ10μm and capable of detecting minimum defects from 2μm! An automatic measurement system for continuous monitoring of surface defects and small diameter irregularities in ultra-fine wires such as monofilaments.

The new product from Sensoptic, the "Surface Defect Detection Device," can detect a minimum outer diameter of Φ10μm and a minimum defect size of 2μm. It contributes to quality improvement and reduces manufacturing costs for multiple products. You can rely on us for the inspection of surface defects in monofilaments, stainless steel wires, tungsten wires, magnet wires, catheters, and ultra-fine wires! 【Benefits of Use】 - Leads to quality improvement - Reduces manufacturing costs for multiple products - Detects a minimum outer diameter of Φ10μm and a minimum defect size of 2μm 【Detection Examples】 - Wire 1.59mm with a 40μm scratch - Monofilament Φ80μm with a 15.4μm bump, etc. *For more details, please contact us or refer to the catalog.

Company：ユニテック・ジャパン
Price：Other

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Cylindrical inner surface defect inspection device

Hole inspection [Automating nest hole, defects, and visual inspection!] Proposed by Nidec Tosok, a manufacturer of automotive parts and precision measuring instruments.

Automatically inspect the grinding surfaces of cast processed products for voids and scratches non-contactly, allowing for quantitative measurement of the size of the voids.

Company：日本電産トーソク
Price：Other

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LPC Infrared Edge Sensor "PSM-75W Series"

The light source uses infrared, making it suitable for detecting the meandering of non-woven fabric, as well as transparent and opaque films!

The "PSM-75W series" is a sensor for detecting web edges. It performs web skew correction in combination with a dedicated controller and drive unit. It uses infrared light as the light source, making it suitable for detecting skew in both transparent and opaque films, as well as non-woven fabrics. You can choose from two types of shapes: "W" and "WX," and the "PSM-75WX series" is also available in the lineup. 【Features】 ■ Choose from two types of shapes: "W" and "WX" ■ The "DB" type with a dust blower unit is effective in dusty environments ■ The type with a switch panel allows for mode switching and teaching operations directly on the sensor body, making it convenient ■ It is also possible to create a simple system that does not use the PEM type controller with the switch panel version *For more details, please refer to the PDF materials or feel free to contact us.

Company：三橋製作所
Price：Other

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[LPC] Ultrasonic Edge Sensor 'PSM-400'

Not affected by color, pattern, or transparency! Detecting the edge position of the web by changes in ultrasonic transmission.

The "PSM-400" is an ultrasonic transmission-type web edge sensor. It is used in combination with G-series controllers and drive units for web wander control, and is suitable for edge detection of transparent materials as it is not affected by the web's transparency, color, or pattern. Additionally, the "PSM-400S" with a switch panel allows for mode switching and teaching operations directly on the sensor body, making it convenient. 【Features】 ■ It can accurately detect the edge position of the web without being affected by color, pattern, or transparency, by measuring changes in ultrasonic transmission. ■ The version with a switch panel can also be configured as a simple system (only the drive unit and sensor) without using a PEM-type controller. *For more details, please refer to the related links or feel free to contact us.

Company：三橋製作所
Price：Other

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LPC Infrared Edge Sensor "PSM-700"

Uses infrared light source! Suitable for detecting undulations in non-woven fabric as well as transparent and opaque films.

The "PSM-700" is an infrared transmission web edge sensor. It is used for web wander control in combination with G-series controllers and drivers, and is suitable for edge detection of opaque webs and non-woven fabrics. In addition to the standard model "PSM-700," we also offer models such as "PSM-700S" with a switch panel, "PSM-700-DB" with a dust blow feature, and "PSM-700S-DB" with both a switch panel and dust blow feature. 【Features】 ■ The "DB" type with a dust blow unit is effective in dusty environments. ■ The "700S" with a switch panel allows for mode switching and teaching operations directly on the sensor body. ■ Models with a switch panel can also be configured into a simple system (only the driver and sensor) that does not use a PEM type controller. *For more details, please refer to the related links or feel free to contact us.

Company：三橋製作所
Price：Other

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Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, allowing for the detection of minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, enabling discrimination by defect type such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds/12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality is available

Company：クボタ計装
Price：Other

Semiconductor inspection/test equipment
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Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway

Company：クボタ計装
Price：Other

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Wafer Surface Particle Scanner YPI-MN

A compact and space-saving tabletop particle inspection device ideal for device development and wafer cleaning checks!

It is a non-pattern wafer and substrate surface particle inspection device. It is a manual transport tabletop inspection device that does not take up much space. It is easy to install in labs or next to equipment. It can measure not only silicon but also glass materials.

Company：山梨技術工房
Price：10 million yen-50 million yen

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Wafer Chip Monitor Inspection Machine Model WBM-2000E

High-quality monitor inspection at optimal magnification is possible with the Takara Leica APO zoom optical system!

This is a visual inspection system for wafer chips that allows operators to reliably identify defective chips while viewing high-quality optical images. It can accurately classify defect locations/categories and image files. The system features an expanding stage that moves in steps, enabling color monitor inspections at optimal magnification suited to chip sizes. For more details, please download and view the catalog.

Company：アイティ・テック
Price：Other

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Chip element defect inspection machine

It is a high-precision XYZ auto stage.

Automatically inspects chip element defects on wafers. The system controls a microscope color camera and auto stage to automatically identify defects at the chip element level. For more details, please download and view the catalog.

Company：アイティ・テック
Price：Other

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Development Case [Image Inspection Device] *Detectable with a simple method!

Detectable by simple methods through cylindrical internal image inspection! Automatically inspect internal defects of LCD glass!

Taiyo Acris is engaged in the development of automatic machines that can accurately respond to customer requests. To achieve this, we consistently handle everything in-house, from mechanical design, electrical design, and software design to parts procurement, assembly, and on-site adjustments. We conduct reviews at each development step to ensure a smooth startup for our customers. 【Device Overview】 ○ A device that automatically inspects internal defects in LCD glass 【Features】 ○ Capable of inspecting defects as small as 0.05mm ○ Inspects for bubbles, foreign objects, scratches, craters, etc. ○ Inspection cycle of 20 seconds per sheet (for 730x920mm glass) For more details, please contact us or download the catalog.

Company：タイヨーアクリス
Price：Other

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Cylindrical inner surface defect inspection device

Non-contact inspection of casting processed products for surface defects such as pits and scratches is possible.

This is a device for inspecting grinding processing surface defects and scratches on cast metal products, which automatically conducts non-contact inspections of the entire inner surface of the cylinder and can record the location of defects. It helps improve productivity and quality without damaging the workpiece itself.

Company：モリタ
Price：Other

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Visualization of surface defects and internal flaws using a special optical system.

Solving 'If only we could do this!' Introducing an appearance inspection and internal defect inspection system using special optical systems.

For example, if you want to inspect products with textured patterns like fiber sheets (geometric patterns) for scratches or foreign substances, even if you take pictures of the defective areas with a general visible light camera, the defects can be buried within the complex texture patterns, making it difficult to extract just the defects. Additionally, defects such as bubbles that occur inside the product cannot be seen with a visible light camera because they are internal. In such cases, by using a camera with a special imaging method, it is possible to visualize defects buried within patterns that were previously not visible and defects inside the product.

Company：八光オートメーション
Price：Other

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NS flange plug (steel)

Introducing the NS flange plug with excellent sealing properties due to the use of O-rings!

We would like to introduce our "NS Flange Plug (Steel)." The material is structural carbon steel and structural alloy steel, with a hardness of HRC32 to 42. The use of O-rings ensures excellent sealing performance. Additionally, the pressure resistance has been confirmed through a dynamic pressure test at 350 kgf/cm². 【Specifications】 ■ Material: Structural carbon steel and structural alloy steel ■ Hardness: HRC32 to 42 ■ Surface treatment: Black oxide coating ■ Thread: JIS B0202 standard parallel pipe thread, Class A ■ Female thread: Sealed using the O-ring method according to JIS B2351 *For more details, please refer to the PDF document or feel free to contact us.

Company：日産ネジ本社営業部
Price：Other

nut
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Semiconductor MEMS process services / substrate materials

No need for equipment, specialized technicians, or operators! Outsourcing support for process services.

At Nippon Functional Materials Co., Ltd., we serve as a suitable bridge between a global alliance of process companies and substrate material companies, primarily in Europe and the United States. We provide process services such as "epitaxial growth," "oxidation," "deposition & sputtering," "wafer polishing," "laser processing," and "other processes," as well as wafer substrates including "FZ wafers," "CZ wafers," "SOI wafers," "SOS wafers," and "other wafers." 【Features】 ○ No equipment required ○ No specialized technicians required ○ No operators required ⇒ Outsourcing of process services For more details, please contact us or download the catalog.

Company：日本機能材料
Price：Other

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Defect Inspection Equipment Product List and Ranking from 47 Manufacturers, Suppliers and Companies | IPROS GMS

Defect Inspection Equipment Manufacturer, Suppliers and Company Rankings

Defect Inspection Equipment Product ranking