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Defect Inspection Equipment Product List and Ranking from 42 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Aug 19, 2026～Sep 15, 2026
This ranking is based on the number of page views on our site.

Defect Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 19, 2026～Sep 15, 2026
This ranking is based on the number of page views on our site.

  1. 三橋製作所 Kyoto//Industrial Machinery
  2. テクネ商事 Kanagawa//Machine elements and parts
  3. AYAHA ENGINEERING CO.,LTD. Head office Shiga//Testing, Analysis and Measurement
  4. 4 TOMITA CO.,LTD. Tokyo//Service Industry
  5. 5 クボタ計装 Osaka//Testing, Analysis and Measurement
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Defect Inspection Equipment Product ranking

Last Updated： Aggregation Period:Aug 19, 2026～Sep 15, 2026
This ranking is based on the number of page views on our site.

  1. US CW Company☆ Maintenance tools for piping and heat exchange tubes. テクネ商事
  2. [LPC] Ultrasonic Edge Sensor 'PSM-400' 三橋製作所
  3. Internal Defects in Materials Inspection Device 3D V-ROX TOMITA CO.,LTD.
  4. 4 On-off edge sensor 東洋機械
  5. 5 Inline inspection device "CONTACT ACE series" AYAHA ENGINEERING CO.,LTD. Head office

Defect Inspection Equipment Product List

31～60 item / All 61 items

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Murabiyuwaa

Murabiyuwaa

It is possible to automatically detect and visualize even the smallest changes at the nanoscale without missing them!

The "Murabiyuwa Series" changes the common sense of inspection. It is a new sensation scope that allows you to confirm "invisible and hard-to-see" defects in a "clear and vivid" manner. It enables visual inspection and evaluation of nano-sized fine polishing marks, orange peel, scratches remaining on the surfaces of glass, crystal, sapphire, and fine grain patterns and crystal defects inside, leading to improved management of surface roughness, setting of polishing conditions, and significantly enhancing yield after deposition.

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  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Surface Defect Inspection Unit "SSMM-1R"

Surface Defect Inspection Unit "SSMM-1R"

Realization of inspection for small scratches, unevenness, and foreign substances on products with high gloss mirror-like reflection (such as painted or plated surfaces).

This inspection unit utilizes a unique image processing system that has also obtained a utility model, enabling the inspection of small scratches, unevenness, and foreign objects on products with strong glossy mirror-like reflections (such as painted or plated surfaces), which were difficult to inspect using conventional methods. By taking advantage of the fact that the brightness changes that occur when the slit pattern is shifted at a constant cycle differ depending on the presence and shape of defects in the workpiece being inspected, defects are emphasized. The types of defects that arise vary depending on the surface condition and processing of the target workpiece, but the SSMM-1R can capture images suitable for the intended defects by allowing arbitrary settings for the direction and shape of the slit.

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  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Comprehensive Catalog [Taymer Corporation]

Comprehensive Catalog [Taymer Corporation]

We are featuring flat ribbon cable inspection devices and tape defect verification devices!

This catalog is a comprehensive catalog featuring products from Taymer, handled by Toho International Co., Ltd. It includes devices such as the "Surface Defect Detection Device," which contributes to zero defective product leakage, the "Printing Verification Device," which can automatically verify and manage the quality of printing on high-speed production lines, and the "High-Speed Kobb Inspection and Outer Diameter Measurement Device," which can accommodate up to 3,000 m/min. [Contents (excerpt)] ■ Surface Defect Detection Device (SI3100/SI4100) ■ Medical Surface Defect Detection Device (SI3100-MED) ■ Printing Verification Device (PV1400) ■ Cable Surface Color Identification Device (CV2000) ■ Flat Ribbon Cable Inspection Device (RI2400) *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Visual Inspection Equipment
  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Glass edge defect inspection device *Inspection of the front, back, and sides is possible with one camera.

Glass edge defect inspection device *Inspection of the front, back, and sides is possible with one camera.

Easily installable on existing lines! A glass edge defect inspection device that uses a special prism to inspect the surface, back, and sides of glass with a single camera.

This is a system for detecting edge cracks, grinding width, corner cuts, oriflat cuts, and chipping defects on glass substrates before cleaning. We offer a low-cost glass edge defect inspection machine. 【Features】 ■ Can be easily installed in existing lines with minimal space. ■ Capable of inspection at a speed of 800mm/sec. ■ Creates and saves inspection result LOG data and defect images in real-time. ■ LOG data can also be saved as CSV format files. *For more details, please download the catalog or contact us directly.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

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US CW Company☆ Maintenance tools for piping and heat exchange tubes.

US CW Company☆ Maintenance tools for piping and heat exchange tubes.

☆Maintenance technology from CW Corporation, USA☆ High-pressure test flange local pressure resistance jig! No welding required, and high-pressure specification heat exchange tubes can be closed with a single touch!

Curtiss-Wright Corporation in the United States offers maintenance technologies with special features called "Pop-A-Plug" and "High Lift Flange Plug." 【Pop-A-Plug】 The Pop-A-Plug allows anyone to easily seal heat exchanger tubes in high-pressure equipment without the need for welding. - No welding required: Since welding is not necessary, there is no need for fire permits or inspections related to welding. - High-pressure compatible: It can withstand a maximum pressure of 48MPa and is used in various plant equipment. - No qualified personnel or skilled techniques required: With engineered plugs and specialized tools, anyone can achieve the same quality of crimp sealing. - Reduced labor: Significantly shortens work time and equipment recovery time. 【High Lift Flange Plug】 This is a tool for local pressure testing of flange welds, capable of testing up to high pressure. - Capable of testing up to high pressure: Flange #150 is 3.1MPa, #300 is 7.7MPa, and #600 is 15.5MPa. - Compatible with various flange shapes: WN, SO, SW. There are already numerous achievements, particularly in the maintenance sites of domestic petrochemical plants. *For more details, please feel free to contact us.

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  • Power tools
  • Defect Inspection Equipment

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High-speed defect inspection device for non-woven fabric

High-speed defect inspection device for non-woven fabric

Hidden defects are clearly visible! Non-woven fabric defect inspection device capable of detecting even light colors such as yellow.

The Media Research Institute's "High-Speed Defect Inspection Device for Non-Woven Fabrics" is the ideal defect inspection device for those struggling with issues such as fluff, shots, and wind cotton. Thanks to the multi-channel optical system's technology for capturing multiple images of defects, the integration of multiple optical systems emphasizes the contrast between defects and the base material. With a high-speed camera, it can also accommodate high-speed lines, and its technology allows for the detection of light colors such as yellow while maintaining high-speed performance for color detection. 【Features】 ■ Emphasizes the contrast between defects and the base material through the integration of multiple optical systems ■ Accommodates high-speed lines with a high-speed camera ■ Detects light colors such as yellow ■ Effective for colored non-woven fabrics such as black ■ Clearly reveals defects hidden in the base material *For more details, please refer to the PDF document or feel free to contact us.

  • Defect Inspection Equipment
  • Other inspection equipment and devices
  • Defect Inspection Equipment

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ANALYZER3 f

ANALYZER3 f

Detect defects that cannot be captured by camera inspection.

New model "ANALYZER3f" (Model F) ----- High-precision imaging with newly developed laser light source ----- Achieves miniaturization of fiber-coupled laser light sources and stable output. The design of the laser head stage has also been revamped. This enables high-resolution imaging without focus shift, allowing for high-definition results. ----- Technology that supports mass production sites ----- Laser scanning technology detects fine defects quickly and accurately, meeting the demands of tact time. It overcomes issues related to light reflection and resolution that are challenging for camera inspections.

  • Company：ANALYZER
  • Price：1 million yen-5 million yen
  • Visual Inspection Equipment
  • Defect Inspection Equipment

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Wafer transfer device "TMUJ-05"

Wafer transfer device "TMUJ-05"

Supports 6-inch wafer size! Easy operation allows for wafer transfer!

The TMUJ-05 is a wafer transfer device that allows for the simple operation of transferring wafers from one cassette to another. Since it lifts and transfers the wafers, it can handle thin wafers without causing any damage during the transfer. Additionally, height adjustment is possible by loosening two screws. 【Features】 - Compatible with bottomless types - Easy to operate - Gentle on wafers - Transfers with front and back inversion - Bidirectional transfer of cassettes is possible *For more details, please refer to the catalog or feel free to contact us.

  • Other factory equipment
  • Defect Inspection Equipment

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Surface defect detection device (for monofilament, stainless steel wire, and ultra-fine wire)

Surface defect detection device (for monofilament, stainless steel wire, and ultra-fine wire)

Minimum outer diameter Φ10μm and capable of detecting minimum defects from 2μm! An automatic measurement system for continuous monitoring of surface defects and small diameter irregularities in ultra-fine wires such as monofilaments.

The new product from Sensoptic, the "Surface Defect Detection Device," can detect a minimum outer diameter of Φ10μm and a minimum defect size of 2μm. It contributes to quality improvement and reduces manufacturing costs for multiple products. You can rely on us for the inspection of surface defects in monofilaments, stainless steel wires, tungsten wires, magnet wires, catheters, and ultra-fine wires! 【Benefits of Use】 - Leads to quality improvement - Reduces manufacturing costs for multiple products - Detects a minimum outer diameter of Φ10μm and a minimum defect size of 2μm 【Detection Examples】 - Wire 1.59mm with a 40μm scratch - Monofilament Φ80μm with a 15.4μm bump, etc. *For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Resistors
  • Defect Inspection Equipment
  • Defect Inspection Equipment

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Cylindrical inner surface defect inspection device

Cylindrical inner surface defect inspection device

Hole inspection [Automating nest hole, defects, and visual inspection!] Proposed by Nidec Tosok, a manufacturer of automotive parts and precision measuring instruments.

Automatically inspect the grinding surfaces of cast processed products for voids and scratches non-contactly, allowing for quantitative measurement of the size of the voids.

  • Defect Inspection Equipment
  • Defect Inspection Equipment

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LPC Infrared Edge Sensor "PSM-75W Series"

LPC Infrared Edge Sensor "PSM-75W Series"

The light source uses infrared, making it suitable for detecting the meandering of non-woven fabric, as well as transparent and opaque films!

The "PSM-75W series" is a sensor for detecting web edges. It performs web skew correction in combination with a dedicated controller and drive unit. It uses infrared light as the light source, making it suitable for detecting skew in both transparent and opaque films, as well as non-woven fabrics. You can choose from two types of shapes: "W" and "WX," and the "PSM-75WX series" is also available in the lineup. 【Features】 ■ Choose from two types of shapes: "W" and "WX" ■ The "DB" type with a dust blower unit is effective in dusty environments ■ The type with a switch panel allows for mode switching and teaching operations directly on the sensor body, making it convenient ■ It is also possible to create a simple system that does not use the PEM type controller with the switch panel version *For more details, please refer to the PDF materials or feel free to contact us.

  • Sensors
  • Defect Inspection Equipment

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[LPC] Ultrasonic Edge Sensor 'PSM-400'

[LPC] Ultrasonic Edge Sensor 'PSM-400'

Not affected by color, pattern, or transparency! Detecting the edge position of the web by changes in ultrasonic transmission.

The "PSM-400" is an ultrasonic transmission-type web edge sensor. It is used in combination with G-series controllers and drive units for web wander control, and is suitable for edge detection of transparent materials as it is not affected by the web's transparency, color, or pattern. Additionally, the "PSM-400S" with a switch panel allows for mode switching and teaching operations directly on the sensor body, making it convenient. 【Features】 ■ It can accurately detect the edge position of the web without being affected by color, pattern, or transparency, by measuring changes in ultrasonic transmission. ■ The version with a switch panel can also be configured as a simple system (only the drive unit and sensor) without using a PEM-type controller. *For more details, please refer to the related links or feel free to contact us.

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  • Sensors
  • Defect Inspection Equipment

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LPC Infrared Edge Sensor "PSM-700"

LPC Infrared Edge Sensor "PSM-700"

Uses infrared light source! Suitable for detecting undulations in non-woven fabric as well as transparent and opaque films.

The "PSM-700" is an infrared transmission web edge sensor. It is used for web wander control in combination with G-series controllers and drivers, and is suitable for edge detection of opaque webs and non-woven fabrics. In addition to the standard model "PSM-700," we also offer models such as "PSM-700S" with a switch panel, "PSM-700-DB" with a dust blow feature, and "PSM-700S-DB" with both a switch panel and dust blow feature. 【Features】 ■ The "DB" type with a dust blow unit is effective in dusty environments. ■ The "700S" with a switch panel allows for mode switching and teaching operations directly on the sensor body. ■ Models with a switch panel can also be configured into a simple system (only the driver and sensor) that does not use a PEM type controller. *For more details, please refer to the related links or feel free to contact us.

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  • Sensors
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Wafer surface defect inspection device with review function

Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, allowing for the detection of minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, enabling discrimination by defect type such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds/12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality is available

  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

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Microscopic wafer surface defect inspection device

Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway

  • Semiconductor inspection/test equipment
  • Defect Inspection Equipment

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Wafer Surface Particle Scanner YPI-MN

Wafer Surface Particle Scanner YPI-MN

A compact and space-saving tabletop particle inspection device ideal for device development and wafer cleaning checks!

It is a non-pattern wafer and substrate surface particle inspection device. It is a manual transport tabletop inspection device that does not take up much space. It is easy to install in labs or next to equipment. It can measure not only silicon but also glass materials.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Wafer Chip Monitor Inspection Machine Model WBM-2000E

Wafer Chip Monitor Inspection Machine Model WBM-2000E

High-quality monitor inspection at optimal magnification is possible with the Takara Leica APO zoom optical system!

This is a visual inspection system for wafer chips that allows operators to reliably identify defective chips while viewing high-quality optical images. It can accurately classify defect locations/categories and image files. The system features an expanding stage that moves in steps, enabling color monitor inspections at optimal magnification suited to chip sizes. For more details, please download and view the catalog.

  • Other microscopes
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Chip element defect inspection machine

Chip element defect inspection machine

It is a high-precision XYZ auto stage.

Automatically inspects chip element defects on wafers. The system controls a microscope color camera and auto stage to automatically identify defects at the chip element level. For more details, please download and view the catalog.

  • Other microscopes
  • Other inspection equipment and devices
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Cylindrical inner surface defect inspection device

Cylindrical inner surface defect inspection device

Non-contact inspection of casting processed products for surface defects such as pits and scratches is possible.

This is a device for inspecting grinding processing surface defects and scratches on cast metal products, which automatically conducts non-contact inspections of the entire inner surface of the cylinder and can record the location of defects. It helps improve productivity and quality without damaging the workpiece itself.

  • Recorders
  • Defect Inspection Equipment

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Visualization of surface defects and internal flaws using a special optical system.

Visualization of surface defects and internal flaws using a special optical system.

Solving 'If only we could do this!' Introducing an appearance inspection and internal defect inspection system using special optical systems.

For example, if you want to inspect products with textured patterns like fiber sheets (geometric patterns) for scratches or foreign substances, even if you take pictures of the defective areas with a general visible light camera, the defects can be buried within the complex texture patterns, making it difficult to extract just the defects. Additionally, defects such as bubbles that occur inside the product cannot be seen with a visible light camera because they are internal. In such cases, by using a camera with a special imaging method, it is possible to visualize defects buried within patterns that were previously not visible and defects inside the product.

  • Image Processing Equipment
  • Visual Inspection Equipment
  • Defect Inspection Equipment
  • Defect Inspection Equipment

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NS flange plug (steel)

NS flange plug (steel)

Introducing the NS flange plug with excellent sealing properties due to the use of O-rings!

We would like to introduce our "NS Flange Plug (Steel)." The material is structural carbon steel and structural alloy steel, with a hardness of HRC32 to 42. The use of O-rings ensures excellent sealing performance. Additionally, the pressure resistance has been confirmed through a dynamic pressure test at 350 kgf/cm². 【Specifications】 ■ Material: Structural carbon steel and structural alloy steel ■ Hardness: HRC32 to 42 ■ Surface treatment: Black oxide coating ■ Thread: JIS B0202 standard parallel pipe thread, Class A ■ Female thread: Sealed using the O-ring method according to JIS B2351 *For more details, please refer to the PDF document or feel free to contact us.

  • nut
  • bolt
  • Defect Inspection Equipment

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Semiconductor MEMS process services / substrate materials

Semiconductor MEMS process services / substrate materials

No need for equipment, specialized technicians, or operators! Outsourcing support for process services.

At Nippon Functional Materials Co., Ltd., we serve as a suitable bridge between a global alliance of process companies and substrate material companies, primarily in Europe and the United States. We provide process services such as "epitaxial growth," "oxidation," "deposition & sputtering," "wafer polishing," "laser processing," and "other processes," as well as wafer substrates including "FZ wafers," "CZ wafers," "SOI wafers," "SOS wafers," and "other wafers." 【Features】 ○ No equipment required ○ No specialized technicians required ○ No operators required ⇒ Outsourcing of process services For more details, please contact us or download the catalog.

  • Other metal materials
  • Wafer
  • Other semiconductors
  • Defect Inspection Equipment

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Edge Defect Inspection Device "RXW Series"

Edge Defect Inspection Device "RXW Series"

Unique laser application technology and sensor/image processing technology! Equipment dedicated to silicon wafers.

The "RXW Series" is a dedicated edge defect inspection device for silicon wafers that utilizes unique laser application technology along with sensor and image processing technology. It meets the diverse inspection, dimensional measurement, and automatic sorting requirements for edge proximity areas demanded in both wafer manufacturing and device manufacturing processes. We offer models such as the "RXW-1200D" and "RXW-1200F" that are compatible with device manufacturing processes. 【Features】 <RXW-1200D> ■ Full circumference image acquisition and ADC functionality using a laser sensor ■ Dark field switching function that enables high-sensitivity inspection ■ Border measurement function after EBR ■ Inspection and measurement after edge trimming, bonding, and sintering in CIS/TSV processes ■ ADR function with a high-magnification AF color camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Laser Scanning Surface Shape Inspection Machine "CSM & CSYS Series"

Laser Scanning Surface Shape Inspection Machine "CSM & CSYS Series"

A surface shape inspection machine capable of measuring minute height changes over a wide range! Extremely resistant to vibrations, eliminating the need for vibration isolation tables and devices!

The "CSM & CSYS series" is a laser scanning surface shape inspection machine capable of fast measurements with high sensitivity over a wide measurement range. Utilizing patented technology for "laser surface shape inspection," it inspects "surface shape," "roughness," "waviness," "particles," and "defects" of semiconductor wafers (Si, SiC, GaN, etc.), MEMS, hard disks, functional films for FPDs, and sputtered thin films with high sensitivity, quickly, and over a wide range, displaying "digital data" and "3D image data." 【Features】 ■ Non-contact laser scanning for surface shape measurement data display ■ High detection sensitivity allows for fast measurements over a wide range, with digital image display ■ High reliability due to simple optical detection principles and structure ■ Extremely resistant to vibration, eliminating the need for vibration isolation tables or devices ■ Capable of 100% non-destructive inspection in inline processes, with automation support *For more details, please request documentation or view the PDF data available for download.

  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices
  • Defect Inspection Equipment

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On-off edge sensor

On-off edge sensor

Operate the actuator to control the web position! Available in two types: feeler type and photoelectric transmission type.

The "TK On-Off Edge Sensor" is a product that controls the web position by repeatedly turning an actuator on and off. A dead zone is established within a certain range, and when the web edge is within that dead zone, the sensor signal is off; when it exceeds that range, the sensor signal turns on. We offer a simple touch sensor with a feeler rubber, the "FB-8E," and a photoelectric transmission sensor with a built-in amplifier, the "PS-30." 【Features】 ■ Controls web position ■ Available in two types: feeler rubber type and photoelectric transmission type *For more details, please refer to the PDF document or feel free to contact us.

  • Sensors
  • Actuator
  • Defect Inspection Equipment

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Laser Cross-Section Shape Measurement System "PML"

Laser Cross-Section Shape Measurement System "PML"

Very lightweight and convenient to carry! High operability, compatible with all gauges.

"PML" is a laser cross-sectional measurement system that allows for the export of measurement results in PDF format. Measurements are completed in a short time. Evaluation after measurement is finished in a few seconds, and a preview display compares the current profile of the rail with the reference profile. It can be mounted on a correction vehicle and used, and even when installed on a vehicle, data acquisition and evaluation can be performed as easily as with a handheld device. 【Features】 ■ Laser cross-sectional measurement ■ Compliant with EN13231-2:2020 ■ High-performance tablet ■ Compatible with various track gauges ■ Measurement of correction amount ■ High operability *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Defect Inspection Equipment

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Sealer Application Detection System

Sealer Application Detection System

Automatic adjustment of parameter data can be completed with one touch.

The "Sealer Application Detection System" is an online sealer inspection system that combines CV vision algorithm technology based on AI algorithms. When inspecting various types and colors of workpieces on a single production line, data settings for different processes can be completed with just three parameter adjustments (detection area (length), upper limit of adhesive width, lower limit of adhesive width). This significantly reduces labor and time costs. 【Features】 ■ Map setting ■ Parameter setting in 3 steps ■ Quick adjustment of parameters for multiple plus one position ■ Simulation test verification ■ Summary of result data ■ Visualization management of detection data *For more details, please download the PDF or feel free to contact us.

  • Visual Inspection Equipment
  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Defect Detection for Semiconductors using Cheetah EVO

Defect Detection for Semiconductors using Cheetah EVO

Support for program operation, automation of semiconductor inspection, and stabilization of quality.

In the semiconductor industry, detecting minute defects in the manufacturing process is essential to ensure product quality and reliability. Especially as devices become smaller and more densely packed, tiny defects that are difficult to detect through visual inspection can significantly impact product performance. The Cheetah EVO provides high-precision X-ray inspection technology to address these challenges. 【 Application Scenarios 】 ● Internal defect inspection of semiconductor chips ● Defect analysis of packaging ● Inspection of bonding failures in mounted substrates 【 Benefits of Implementation 】 ● Improved yield through early detection of defects ● Labor reduction through automation of the inspection process ● Stable supply of high-quality products

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  • X-ray inspection equipment
  • Defect Inspection Equipment

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[Image Processing Related] OEM Product Digital Defect Inspection Device

[Image Processing Related] OEM Product Digital Defect Inspection Device

We uphold a commitment to "quality first" and confidently and responsibly deliver our products.

All planning proposals, order-taking, contract manufacturing, and the development and production of OEM products are fundamentally based on wisdom, passion, and originality. The work of Nichio Electric Co., Ltd. encompasses a wide range of activities, including the design, manufacturing, and sales of various devices, software development, and system design. We have obtained international certifications ISO 9001:2015 and ISO 14001:2015, establishing a globally recognized management system. We operate an effective Integrated Management System (IMS) and implement step-by-step check management based on policy documents (design policy documents, manufacturing policy documents, countermeasure policy documents, etc.) from order to delivery, focusing on improving and stabilizing quality, as well as designing and manufacturing environmentally considerate products as a company-wide theme. With foresight to predict market trends, we propose plans for hardware or software and respond to various requests for product development by leveraging our advanced technological capabilities. This unwavering spirit is supported by the energy and originality of our staff's ideas.

  • Analytical Equipment and Devices
  • Defect Inspection Equipment

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