We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Elemental analysis.
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Elemental analysis Product List and Ranking from 8 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Elemental analysis Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. アイテス Shiga//Electronic Components and Semiconductors
  2. エス・ブイ・シー東京 Kanagawa//Testing, Analysis and Measurement
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  5. 5 JAPAN TESTING LABORATORIES Gifu//Testing, Analysis and Measurement
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Elemental analysis Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX. アイテス
  2. [Analysis Case] Evaluation of Impurity Concentration in Gallium Oxide Ga2O3 Films Using SIMS 一般財団法人材料科学技術振興財団　MST
  3. Analysis of platinum group elements using the iCAP PRO series ICP-OES. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  4. [Test] Elemental Analysis of Grease <ICP> エス・ブイ・シー東京
  5. 4 [Test] Fe, Ni, V, Na, K, Al, Si in heavy oil エス・ブイ・シー東京

Elemental analysis Product List

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Case Studies of Analysis by Micro-ESCA

Case Studies of Analysis by Micro-ESCA

We are publishing the analysis results of the 400LPI copper mesh (mesh spacing: 63.5μm)!

This case study presents the results of analyzing a 400 LPI copper mesh (mesh spacing: 63.5 μm) using micro ESCA (Quantum-2000). By specifying the analysis area from the secondary electron image, an analysis of the copper surface in that region was conducted, resulting in a distribution of copper corresponding to the secondary electron image. Furthermore, using this data, measurements such as mesh spacing can be obtained using the length measurement function. [Publication Overview] ■ Analysis using micro ESCA *For more details, please refer to the catalog or feel free to contact us.

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Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

Investigation of the joint condition and joining methods of crimp terminals, as well as the types of materials! Introduction to cross-sectional observation and elemental analysis using SEM/EDX.

I would like to introduce the topic of "Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX." We conducted cross-section preparation of the joint area of the copper crimp terminal fixture for resistance measurement, applied chemical etching to the prepared cross-section, and observed the metal structure before and after etching. As a result, we infer that the detected elements are P (phosphorus), Ag (silver), and Cu (copper), indicating that it is a silver-containing phosphorus copper solder material. *For more details, please refer to the PDF document or feel free to contact us.*

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[Analysis Case] Evaluation of Impurity Concentration in Gallium Oxide Ga2O3 Films Using SIMS

[Analysis Case] Evaluation of Impurity Concentration in Gallium Oxide Ga2O3 Films Using SIMS

It is possible to quantitatively evaluate impurity elements.

Gallium oxide (Ga2O3) has a higher band gap and superior physical properties compared to SiC and GaN, making it a material of interest for power devices that can be expected to be high-efficiency and low-cost. Controlling the impurity concentration, which affects the characteristics, is crucial in wafer development. This document presents a case study of impurity concentration analysis in Ga2O3 films. It is found that B and C are below the background level, while Si is present. MST offers a range of Ga2O3 standard samples and can quantify over 30 types of impurities.

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Analysis of trace metal elements in the environment

Analysis of trace metal elements in the environment

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

Metal elements suspended in environments such as clean rooms and production lines can adhere to or contaminate products, potentially leading to a deterioration in product performance. With ICP-MS, exposure tests can be conducted on clean Si wafers, allowing for the measurement of the amount of metal elements adhered to the surface at ppt levels. Additionally, we also offer the loan of Si wafers that have been pre-cleaned.

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Solid Analysis New Service Launch (GDMS)

Solid Analysis New Service Launch (GDMS)

We respond to your request to measure many elements with high sensitivity! Simultaneous analysis of over 70 elements, from major components to trace elements, is possible.

We have launched a new service using Glow Discharge Mass Spectrometry (GDMS) starting from May 15 (Monday). - Simultaneous analysis of over 70 elements, from major components to trace components at the ppb level, is possible. - Detection of C, N, and O at the ppm level, which was previously difficult. - Depth direction analysis is possible from nm to several tens of µm.

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[Analysis Case] Composition and Impurity Analysis of Thin Films, Bulk, and Powder Materials

[Analysis Case] Composition and Impurity Analysis of Thin Films, Bulk, and Powder Materials

Quantitative analysis of main components and metallic impurity elements in IGZO using CP-MS.

IGZO thin films, which are transparent oxide semiconductors, are being researched and developed as TFT materials for displays. IGZO is a material whose properties change based on the composition of the thin film and the amount of impurities within it, making it important to obtain information about the composition and impurities. This time, we will introduce a case where the main components and the amounts of metallic impurity elements in IGZO powder, the raw material for the thin film, were evaluated with high precision using ICP-MS. Analysis is possible not only for powders but also for bulk and thin films.

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Analysis of platinum group elements using the iCAP PRO series ICP-OES.

Analysis of platinum group elements using the iCAP PRO series ICP-OES.

Measuring trace PGE in base metal matrices! iCAP PRO XP ICP-OES

Platinum group elements are a group of metals located around the center of the periodic table and are referred to as PGE. In electronic materials, PGE alloys with diverse compositions are used as substrates for low voltage and low power, thermocouples, furnace construction materials, and electrodes. Additionally, in the chemical and petrochemical industries, the excellent catalytic properties of PGE are utilized in the manufacturing processes of various organic synthesis chemicals. In the automotive industry, PGE is used as a redox agent in catalytic converters to reduce harmful substances emitted from engines, and it is added to ceramic substrates along with metals that control side reactions. The iCAP PRO XP ICP-OES can measure trace amounts of PGE in base metal matrices.

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Analysis of trace metal elements in liquid crystals

Analysis of trace metal elements in liquid crystals

Depending on the panel size, it is possible to analyze using different ICP-AES/MS devices!

We will introduce a case where ICP measurement was conducted using panels before and after reliability testing, along with quantification. The liquid crystal molecules in an LCD are oriented within the panel, and the display is controlled by changes in the orientation state of the liquid crystal due to voltage. When ionic substances, such as metal elements, are present inside the panel, the liquid crystal does not operate correctly, leading to display defects. Ionic substances are known to increase due to contamination during manufacturing or long-term use, making it important to quantify and understand them as part of panel quality. Metal ions can be quantitatively analyzed using ICP analysis, and depending on the differences in pretreatment methods and detection sensitivity, ICP-AES and ICP-MS are used selectively. [Analysis Content] ■ Comparison of metal element content using ICP-AES analysis ■ Comparison of metal element content using ICP-MS analysis *For more details, please refer to the PDF document or feel free to contact us.

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Inorganic element analysis

Inorganic element analysis

From major components to trace elements! We specialize in dissolving and analyzing various substances.

We would like to introduce TTC's "Inorganic Element Analysis." Using our extensive know-how, we can analyze various materials and products through ICP-MS and ICP-OES, from major components to trace elements. We will propose suitable analytical methods tailored to your needs. For past analysis cases and applications, please visit our website. 【Features】 ■ Analysis by dissolving various substances ■ Support for major components to trace elements ■ Extensive know-how ■ Capable of analyzing various materials and products using ICP-MS and ICP-OES ■ Proposing suitable analytical methods according to customer requests *For more details, please refer to the PDF materials or feel free to contact us.

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[Test] Elemental Analysis of Grease <ICP>

[Test] Elemental Analysis of Grease <ICP>

Measure the additive concentration in the new grease and the wear metal content in the used grease!

We would like to introduce our "Elemental Analysis of Grease (ICP)" test. This test measures the concentration of additives in new grease and the wear metals in used grease. After combusting or acid-digesting the organic matter in the grease, it is converted into an aqueous solution, and elements are detected using an ICP emission spectrometer. Please feel free to contact us if you would like to request this service. 【Test Details】 ■ Item Number: K510 ■ Required Amount: 5g ■ Standard Number: - ■ Main Target Oil Types: Machine oil, grease, and other sludge/solvents, etc. *For more details, please refer to the related links or feel free to contact us.

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[Test] Fe, Ni, V, Na, K, Al, Si in heavy oil

[Test] Fe, Ni, V, Na, K, Al, Si in heavy oil

After burning and ashing the sample, perform alkaline fusion treatment to obtain a solution! Measure the light intensity for quantitative analysis.

We would like to introduce our test for "Fe, Ni, V, Na, K, Al, Si in heavy oil." This test measures the levels of Fe, Ni, V, Na, K, Al, and Si contained in the fuel. After combusting and ashing the sample, it is treated with alkaline fusion to create an aqueous solution. The intensity of light emitted when the plasma in the ICP optical emission spectrometer returns from an excited state to the ground state is measured for quantitative analysis. 【Test Details】 ■Item Number: K548 ■Required Amount: 100g ■Standard Number: JPI-5S-62 ■Main Target Oil Types: Diesel (including mixed diesel), Heavy Oil *For more details, please refer to the related links or feel free to contact us.

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[Test] CHN Analysis (Elemental Analyzer)

[Test] CHN Analysis (Elemental Analyzer)

After reducing nitrogen oxides to nitrogen, we will detect each product and determine the elemental concentrations!

We would like to introduce the "CHN Analysis (Elemental Analysis)" test conducted by our company. In this test, the carbon, hydrogen, and nitrogen components in the sample are converted into carbon dioxide, water, and nitrogen oxides in a high-temperature combustion tube. After reducing the nitrogen oxides to nitrogen, we detect each product and determine the elemental concentrations. Please feel free to contact us when you need our services. 【Test Details】 ■ Item Number: K562 ■ Required Amount: 20ml ■ Standard Number: JPI-5S-65-11 ■ Main Target Oil Types: Engine oil, automotive gear oil, industrial gear oil, machine oil, gasoline, kerosene (including jet fuel), light oil (including mixed light oil), heavy oil *For more details, please refer to the PDF document or feel free to contact us.

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Food Foreign Substance Analysis <Inorganic Samples>

Food Foreign Substance Analysis <Inorganic Samples>

For metal pieces, rust, plated products, etc.! It is possible to understand the shape and composition of foreign substances.

We would like to introduce our "Food Foreign Substance Analysis - Inorganic Samples." The testing involves visual observation plus SEM-EDX (component identification). The identification of components using EDX allows for the acquisition of mapping images of the measured elements, enabling the understanding of the shape and composition of the foreign substances. Additionally, we can create reports tailored to specific scenes, such as internal company documents. 【Types of Samples】 ■ Metal fragments ■ Minerals ■ Rust ■ Ash ■ Plated products, etc. *For more details, please refer to the PDF document or feel free to contact us.

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Elemental Analysis Service by EDX | JTL

Elemental Analysis Service by EDX | JTL

Qualitative and quantitative analysis of elements (B to U) contained on the sample surface will be conducted.

The elemental analysis service using Energy Dispersive X-ray Spectroscopy (EDX) measures the energy of characteristic X-rays excited by directing an electron beam from the EDX device onto the sample, allowing for elemental analysis of the sample surface from the obtained spectrum. It is possible to analyze where on the sample surface certain elements are present (qualitative) and in what quantities (quantitative).

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Elemental analysis services by WDX | JTL

Elemental analysis services by WDX | JTL

We conduct analysis of trace elements and light elements suitable for material analysis and foreign substance analysis.

We provide contract analysis services for trace elements and light elements using wavelength dispersive X-ray analysis (WDX), which is an analytical method of EPMA, FE-EPMA, and XRF. The WDX equipment has superior wavelength resolution compared to energy dispersive X-ray analysis (EDX), allowing for high detection sensitivity of trace elements and light elements. Therefore, it can be used for trace element analysis such as distinguishing metal materials, analyzing the diffusion state of trace elements, and analyzing foreign substances.

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  • X-ray fluorescence analyzer

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