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Testing service Product List and Ranking from 99 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

Testing service Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

  1. イノバテスト・ジャパン 本社 Tokyo//Testing, Analysis and Measurement
  2. JAPAN TESTING LABORATORIES Gifu//Testing, Analysis and Measurement
  3. イナリサーチ Tokyo//Service Industry
  4. 4 スガ試験機 Tokyo//Testing, Analysis and Measurement
  5. 5 日本ビジネスロジスティクス（JBL） 藤沢北事業所 Kanagawa//Testing, Analysis and Measurement
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Testing service Product ranking

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.

  1. Environmental Testing (Steam Testing) Contract Service ケイヒン
  2. JIS C 60068-2-38 Temperature and Humidity Combination (Cycle) Test 日本ビジネスロジスティクス（JBL） 藤沢北事業所
  3. JIS C 60068-2-30 Temperature and Humidity Cycle Test 日本ビジネスロジスティクス（JBL） 藤沢北事業所
  4. 4 Hardness Testing Machine: Ultra Nanoindentation Tester (UNHT3)
  5. 4 Contract Testing Services for Automobiles

Testing service Product List

136～150 item / All 268 items

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ESD Test (CDM) Device "Orion3"

ESD Test (CDM) Device "Orion3"

Easily create test patterns! Testing equipment equipped with humidity control function.

The "Orion3" is a test system that can simulate electrostatic discharge phenomena caused by device charging. It is equipped with humidity control functionality and can conduct ESD (CDM) tests compliant with various standards by exchanging the test head. It allows for easy creation of test patterns for any device, minimizing cycle time. 【Features】 ■ Test equipment with humidity control functionality ■ Conducts tests compliant with various standards by exchanging the test head ■ Easily creates test patterns for any device ■ Minimizes cycle time ■ The new feature CDM2 enables a new type of CDM testing that significantly improves the repeatability issues associated with the conventional air discharge method *For more details, please refer to the PDF materials or feel free to contact us.

  • EMC/Static electricity measuring equipment

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JIS C 60068-2-38 Temperature and Humidity Combination (Cycle) Test

JIS C 60068-2-38 Temperature and Humidity Combination (Cycle) Test

Our company conducts environmental testing, including temperature and humidity combination (cycle) tests, as well as temperature and humidity tests based on customer-specified conditions.

1. Overview of JIS C 60068-2-38 Test: - JIS C 60068-2-38 specifies a temperature and humidity combination (cycle) test method that primarily accelerates the degradation of electrical and electronic components under high temperature and high humidity as well as low temperature conditions. The aim is to induce defects in the test samples through respiration rather than moisture absorption. - This test differs from other temperature and humidity cycle tests by intensifying the rigor of the test as follows: ◇ A high number of temperature fluctuations within the specified time ◇ A wide range of temperature changes ◇ A rapid rate of temperature change ◇ Inclusion of temperature cycles below 0 degrees ▼ For more details, please download the PDF document (recommended). ▼ For urgent inquiries, please contact us using the 'Contact Us' section below.

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  • Environmental Test Equipment

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Compact ESD Tester "HCE-5000"

Compact ESD Tester "HCE-5000"

Achieving a low-cost, space-saving ESD tester!!

In recent years, with the miniaturization of devices, there has been a demand for improved ESD tolerance. Therefore, Hanwa Electronic Industry Co., Ltd. has developed a portable electrostatic discharge (ESD) testing device that is easy to operate. This device also has a leakage measurement function, allowing for ESD failure assessment to be conducted solely with this device. 【Features】 ○ Easy operation with a touch panel ○ Compatible with various standard waveforms ○ Leakage measurement function ○ HBM Fast/Slow unit (optional) For more details, please contact us or download the catalog.

  • Testing Equipment and Devices

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CDM Tester "HED-C5000R"

CDM Tester "HED-C5000R"

We support domestic and international standard tests for the replacement of discharge circuit units.

The compact ESD tester "HCE-5000" is a highly reliable device that complies with standards in Japan and overseas (JEITA/ESDA/JEDEC standards). It supports domestic and international standard testing through unit replacement of the discharge circuit. It is capable of measuring the capacitance of each terminal of the device. Measurement data can be saved as text files. 【Features】 ○ Temperature and humidity control using nitrogen ○ Compatible with various device shapes ○ Equipped with an automatic waveform acquisition system ○ Measurement movable range (80mm × 200mm) ○ Applied voltage range: 0 to +/-4000V (+/-5V step) For more details, please contact us or download the catalog.

  • Testing Equipment and Devices

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Helium pressurization and recovery testing device

Helium pressurization and recovery testing device

This device also has the function of pressurizing helium, conducting a leak test on the test specimen, and recovering the helium into a storage tank. It can maintain high-purity helium through vacuum pumping.

This device can pressurize helium and perform airtight testing on test specimens. After the airtight test, it also has the function of recovering helium into a storage tank. Additionally, since it uses a vacuum pump for evacuation, the recovered helium can be reused while maintaining its purity. The air-driven pump used in the device is compact and allows for easy maintenance of the high-pressure components.

  • Other inspection equipment and devices
  • Pneumatic Equipment
  • Testing Equipment and Devices

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Overseas Manufactured Parts and Products Evaluation Service

Overseas Manufactured Parts and Products Evaluation Service

Some overseas manufactured parts and products may have quality issues. We provide quality evaluation services for reliability testing and assessment for these.

Some overseas manufactured parts and products may initially operate without issues, but can cause malfunctions and lead to failures and breakdowns in a short period of time. Before adopting or using overseas products, please consider AIT's parts and product quality evaluation services. ■ Examples of overseas parts evaluation - Reliability evaluation during the parts procurement and selection stage - Comparative evaluation between parts and product manufacturers - Reliability evaluation when replacing current parts with alternative parts (cost reduction) ■ Examples of applicable parts - Active components (transistors, diodes, thyristors, etc.) - Passive components (capacitors, resistors, etc.) - LCDs - Circuit boards - Power supplies - Etc.

  • Contract Inspection
  • Testing Equipment and Devices
  • Other inspection equipment and devices

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ESD (CDM) Testing Outsourcing Service

ESD (CDM) Testing Outsourcing Service

Reliable application with the contact confirmation function of the applied pin! Compatible with direct charging method and electric field induction method.

The "ESD (CDM) Testing Contract Service" evaluates the resistance to damage caused by ESD (Electrostatic Discharge) according to device charging models, which are important for the reliability of semiconductor products and electronic components that include them. It supports both the Direct Charge Method (Direct CDM) and the Field Induced Method (Field Induced CDM). Additionally, it is possible to determine damage through diode characteristic evaluation methods and other characteristic assessments (using separate equipment). 【Features】 ■ Compatible with various standard conditions such as JEDEC, JEITA (EIAJ also acceptable), and AEC through unit exchange ■ Supports both the Direct Charge Method (Direct CDM) and the Field Induced Method (Field Induced CDM) ■ Also compatible with the Direct Charge Method and Field Induced Method of AEC-Q100-011 ■ Damage determination is also possible through diode characteristic evaluation methods and other characteristic assessments ■ Ensures reliable application through contact confirmation function of applied pins *For more details, please refer to the PDF document or feel free to contact us.

  • Contract measurement

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ESD (HBM・MM) Testing Contract Service

ESD (HBM・MM) Testing Contract Service

From DUT board production to testing! We propose and conduct tests according to your requests and objectives.

The "ESD (HBM・MM) Testing Service" evaluates the resistance to damage caused by ESD using the Human Body Model and Machine Model, which are important for the reliability of semiconductor products and electronic components that include them. We accommodate products such as IC modules, semiconductor products, and subsystems with up to 512 pins. We conduct tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. Additionally, if there are issues with resistance, we assist in problem-solving, including failure analysis and root cause investigation. 【Features】 ■ Supports products such as IC modules, semiconductor products, and subsystems with up to 512 pins ■ Partial support for products with more than 512 pins (consultation required) ■ Conducts tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC ■ Proposes and conducts tests tailored to customer requests and objectives ■ Assists in problem-solving, including failure analysis and root cause investigation, if there are issues with resistance *For more details, please refer to the PDF document or feel free to contact us.

  • Contract measurement

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Thermal shock test

Thermal shock test

Not only the joints of electronic components, but also the evaluation of fixed parts such as screws!

At AITES Co., Ltd., we conduct "Thermal Shock Testing." By repeatedly exposing samples to high and low temperatures, not only does stress occur due to thermal effects, but also due to the expansion and contraction of various parts. Repeated stress also adds to the overall stress. This test is conducted not only for the joints of electronic components but also for evaluating fixed points such as screws. 【Main Specifications of the Thermal Shock Testing Equipment】 ■ Internal dimensions: W650×H460×D370mm, Temperature range: -65 to 0/+60 to 200℃ ■ Internal dimensions: W650×H460×D670mm, Temperature range: -65 to 0/+60 to 200℃ ■ Internal dimensions: W970×H460×D670mm, Temperature range: -65 to 0/+60 to 200℃ *For more details, please refer to the PDF document or feel free to contact us.

  • Testing Equipment and Devices

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Weather resistance test

Weather resistance test

Weather Resistance Test

By changing the conditions of ultraviolet irradiation from carbon arc discharge, as well as the temperature, humidity, and water spray inside the chamber, it is possible to conduct accelerated testing of degradation that occurs due to outdoor use of products, parts, and materials, which takes a long time in nature.

  • Contract measurement

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Rental of the portable ultrasonic hardness tester Sono Dur3.

Rental of the portable ultrasonic hardness tester Sono Dur3.

From small parts like screws and bolts to narrow surfaces of large gears! We offer a wide range of support.

Simply place it on the measurement area, and the results are displayed prominently on the monitor, making it easy to operate. It adopts the UCI method, allowing for the setting of test force and conversion to multiple hardness scales. *For more details, please refer to the catalog available for download below under "PDF Download." You can also request a quote through "Contact Us." Feel free to reach out.

  • Testing Equipment and Devices

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Multi-Channel Communication Reliability Evaluation Device "RTm-100 Series"

Multi-Channel Communication Reliability Evaluation Device "RTm-100 Series"

Measure the conduction resistance of circuit patterns, solder joints, etc., quickly and accurately!

The "RTm-100 Series" is a multi-channel conductive communication reliability evaluation device manufactured by J-RAS Corporation. It measures contact resistance in circuit patterns, solder joints, and more with high speed and precision. With a scan processing time of 50 milliseconds per channel, it can keep up with high-speed cycle testing even for multi-channel measurements. It employs semiconductor relays for the four-terminal network switching in linked channel scans, significantly improving long-term reliability compared to mechanical relay systems. Additionally, the compact housing can be expanded to accommodate up to 240 channels, allowing for flexible installation and easy mobility. It can also connect thermocouples for temperature data display and recording (optional). 【Features】 ■ High precision and high-speed measurement ■ High-speed scanning at 50 msec/channel: follows high-speed heat shock chambers ■ High precision & low noise: reliable data output ■ Four-terminal measurement cables: twisted pair / color-coded by channel ■ High reliability: does not use mechanical relays *For more details, please refer to the PDF document or feel free to contact us.

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High Voltage Insulation Reliability Evaluation Device "HVUα Series"

High Voltage Insulation Reliability Evaluation Device "HVUα Series"

High-speed detection circuits with a few tens of nsec installed in all channels! Tester capable of low-noise measurement.

The "HVUα Series" is a high-voltage insulation reliability evaluation device manufactured by J-RAS Corporation. It is equipped with high-speed detection circuits capable of operating in the tens of nanoseconds across all channels, enabling more advanced reliability testing. It can detect partial discharge with a high-speed event measurement function of less than 100 nanoseconds. Each channel has its own power supply and individual control, allowing for different applied voltage settings across all channels. There are no mechanical relay scans, so there are no failures or troubles during continuous testing. Active guarding with triaxial cables enables low-noise measurements. 【Features】 ■ Detects partial discharge with a high-speed event measurement function of less than 100 nanoseconds ■ Each channel has its own power supply and individual feedback for stable voltage application to each sample ■ Individual short-circuit detection circuits for each channel can respond to instantaneous sample short circuits ■ Dedicated software allows for graph display and data recording ■ The system can be configured in units of five channels according to demand *For more details, please refer to the PDF document or feel free to contact us.

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JIS K 7374 Imaging Tester 'ICM-2'

JIS K 7374 Imaging Tester 'ICM-2'

This one device measures both transmission and reflection, quickly assessing imaging properties. Long-lasting VI-LED light source.

The "ICM-2" is an imaging measurement device that measures the clarity of images reflected on the surfaces of objects, such as painted surfaces, and the sharpness of images that can be viewed through transparent films and plastics. It supports three conditions for transmission and reflection measurements (45°, 60°) with a single unit. The position and angle of the sample stage and the light receiver can be switched easily and accurately. Additionally, it can be operated and display measurement results using dedicated software for computers (compatible with Windows 11). 【Features】 ■ Significantly reduces measurement time (PAT.) ■ Compatible with both transmission and reflection ■ Long-lasting VI-LED light source ■ Operable from a computer *For more details, please download the PDF or feel free to contact us.

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  • Other electronic measuring instruments

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