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Atomic Force Microscope(顕微鏡) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
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Atomic Force Microscope Product List

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Investigate the structures and dynamics of biomolecules that are difficult to measure experimentally through simulation.

Investigate the structures and dynamics of biomolecules that are difficult to measure experimentally through simulation.

Keywords: Molecular simulation, biomolecules, integrated modeling, free energy calculation.

Many life phenomena, including various diseases, are caused by biomolecules such as proteins, and observing molecular structures and dynamics in the microscopic realm is crucial for understanding these phenomena and for fundamental treatments of diseases. Molecular dynamics simulation is a technique that allows for the "direct" observation of microscopic behavior by reconstructing biomolecular models with atomic resolution in a computer and moving the molecules according to physical laws. Coupled with the computational power of computers, this technique has developed to the point where it is referred to as a computational microscope and is actively used as a method to complement experiments. However, there are two challenges to contributing to drug discovery and materials development: "too much computation time" and "limitations in model accuracy." To address the first challenge, we are working on introducing efficient algorithms to predict loop structures of next-generation antibodies in a shorter time. For the second challenge, we are developing methods that integrate experimental data and simulations using statistical mathematics and machine learning to achieve more accurate observations.

  • others

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Atomic Force Microscope (AFM) "Park NX20"

Atomic Force Microscope (AFM) "Park NX20"

Fault analysis and nano-shape measurement tools for research and development in large samples.

The "Park NX20" is a large sample atomic force microscope (AFM) that artistically combines power, versatility, and ease of operation. This product is equipped with unique features to clarify the underlying causes of device failures and develop more creative solutions. Additionally, true non-contact (TM) mode scanning allows chips to be maintained sharper and longer, preventing unnecessary time and cost expenditures. [Solutions using large sample AFM in research and FA labs] ■ Surface roughness measurement for media and substrates ■ Defect inspection imaging and analysis ■ High-resolution electrical property measurement mode ■ Sidewall measurement in 3D structural analysis ■ Accurate AFM shape imaging with a low-noise Z detector *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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Atomic Force Microscope (AFM) "Park NX-3DM"

Atomic Force Microscope (AFM) "Park NX-3DM"

Fully automated industrial AFM with NX technology implemented.

The "Park NX-3DM" is a fully automated AFM (Atomic Force Microscope) system designed for overhang profiling, high-resolution sidewall imaging, and critical angle measurement. With its patented separated XY and Z scanning system equipped with an inclined Z scanner, it overcomes the challenges of conventional and flare chip methods in accurate sidewall analysis. 【Essential Tool for Wafer Fabrication】 ■ Fully automated industrial AFM using advanced and precise Park NX technology ■ Tilt head design for undercut and overhang structures ■ Accurate sidewall roughness measurement without the need for sample pretreatment ■ High-quality images can be obtained without damaging the device or sample due to the fully non-contact mode (TM) *For more details, please download the PDF or feel free to contact us.

  • Other microscopes

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[Analysis Case] Evaluation of Mechanical Properties of Hair Cross-Sections Prepared by Microtome Method

[Analysis Case] Evaluation of Mechanical Properties of Hair Cross-Sections Prepared by Microtome Method

It is possible to evaluate the elastic modulus of the internal structure of soft materials.

When evaluating the internal structure of materials, it is necessary to expose the internal structure while maintaining it through cross-sectional processing techniques such as cutting and polishing. This document introduces a case where the microtome method, which has a relatively small impact from processing damage, was used to create cross-sections of hair, followed by AFM observation of the internal structure and evaluation of elastic modulus. The microtome method is a cutting processing technique widely used in the field of soft materials, such as rubber materials and biological samples, and this approach has made it possible to evaluate the mechanical properties of the internal structure of these materials. [Measurement and Processing Methods] [AFM] Atomic Force Microscopy [AFM-MA・AFM-DMA] Mechanical Property Evaluation (Elastic Modulus Measurement, Dynamic Viscoelasticity Measurement) Ultra Microtome Processing *For more details, please download the PDF or feel free to contact us.

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  • Contract measurement
  • Contract Analysis

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AFM Data Collection

AFM Data Collection

AFM: Atomic Force Microscopy Method

AFM is a method that scans the surface of a sample with a fine probe and measures nano-scale surface topography in three dimensions. It can measure a wide range of materials, not only for the evaluation of metals, semiconductors, and oxides, but also for soft materials such as hair and contact lenses. This document presents various AFM images of different materials.

  • Contract Analysis
  • Wafer

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AFM Atomic Force Microscope Nano Observer 2

AFM Atomic Force Microscope Nano Observer 2

Achieving measurement quality comparable to high-end products from established AFM manufacturers.

Combining flexibility, outstanding performance, and user-friendly operability, it achieves measurement quality comparable to high-end products from established AFM manufacturers. It is equipped with a wide range of functions for nanoscale imaging and characterization. It also enables electrical property measurements (KFM, C-AFM) and features a soft IC mode that can measure fragile samples.

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200mm Large Sample Compatible AFM/SPM Jupiter XR

200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

  • Microscope

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[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

In recent years, SiC has been attracting attention as a material for high-voltage devices. The trench MOSFET structure is necessary for the high integration of devices, and the application development for SiC devices is progressing. Since the channel region of the trench MOSFET structure is the trench sidewall, the flatness of the trench sidewall is related to the reliability of the device. This document introduces an example of quantitatively evaluating the roughness of the trench sidewall of SiC trench MOSFETs using AFM (Atomic Force Microscopy).

  • Contract Analysis
  • Other semiconductors

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Custom Atomic Force Microscope (AFM) System

Custom Atomic Force Microscope (AFM) System

We will design and build a customized AFM system tailored to your needs!

It is necessary to conduct AFM measurements, but does the sample require special handling due to its size, or does it require experiments that differ from conventional techniques and methods? We sincerely take your needs into consideration and will work together with you to find solutions. At Japan Quantum Design, we design and build systems tailored to your requirements through close collaboration with the device development team at Nanosurf, the manufacturer based in Switzerland. If you have any concerns or requests regarding surface measurements, please feel free to contact us!

  • Other measurement, recording and measuring instruments

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[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

Visualization of structural changes in samples in the atmosphere and in aqueous solutions.

Polymers are known to exhibit diverse functions by altering their composition and structure, and they are utilized in various products. In the evaluation of polymers, assessment in real environments is crucial. This time, we will introduce a case where the shape of polymers on a substrate was visualized in the atmosphere and in aqueous solution using an environmental control atomic force microscope (AFM). Additionally, by combining data analysis, we quantified the dispersion of polymer particles.

  • Contract Analysis

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[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

Visualization of nanoscale roughness on the skin surface using AFM.

In recent years, the development of alternative methods to animal testing for the efficacy and safety testing of pharmaceuticals and cosmetics has been progressing, with particular attention being paid to testing methods using three-dimensional cultured skin. In this case study, a percutaneous absorption test of a cosmetic (lotion) was conducted using three-dimensional cultured human skin, which was measured using AFM (Atomic Force Microscopy). This allows for a visual evaluation of the microstructure of the skin surface, and it is also possible to quantitatively assess the roughness of any specific area. By measuring under atmospheric conditions, it is possible to observe the samples while minimizing alterations that would occur under vacuum conditions.

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  • Contract Analysis

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[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

Introduction to the evaluation of in-plane distribution of viscoelasticity and frequency dependence!

Our organization offers dynamic viscoelastic evaluation of PDMS using AFM. Dynamic Mechanical Analysis (DMA) is an effective method for investigating viscoelastic behavior, which is an important factor in the research and development of polymer materials. Additionally, by combining it with the AFM mechanism, it becomes possible to measure in-plane distribution and evaluate localized areas. This document presents a case study using AFM-DMA to map the viscoelastic modulus of PDMS (polydimethylsiloxane) and conduct frequency-dependent spectroscopy evaluation. [Measurement Method / Processing Method] ■ [AFM] Atomic Force Microscopy *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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Atomic Force Microscopy (AFM) method

Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

AFM is a method that scans the surface of a sample with a fine probe and measures nanoscale surface topography in three dimensions. - It can measure a wide range of samples, from insulators to soft organic materials, including metals, semiconductors, and oxides. - By using tapping mode with low contact pressure, it is possible to minimize sample damage.

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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AFM/SPM for Polymers Cypher ES Polymer Edition

AFM/SPM for Polymers Cypher ES Polymer Edition

Standard-equipped with optimal measurement modes and options for polymer material research! Atomic force microscope for polymers based on ultra-high-performance environment-controlled AFM/SPM.

The Cypher ES Polymer Edition is based on the Cypher ES, which adds sophisticated environmental control to Asylum Research's ultra-high-performance AFM, and comes standard with measurement modes and options that are optimal for polymer materials research and polymer characterization (see "Basic Information" below). ● For other features and details, please refer to the catalog or contact us.

  • Other measurement, recording and measuring instruments
  • Microscope

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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  • Electron microscope

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