We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Sheet resistance tester.
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Sheet resistance tester Product List and Ranking from 6 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Sheet resistance tester Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. ナプソン Tokyo//Electronic Components and Semiconductors
  2. エヌピイエス Tokyo//Electronic Components and Semiconductors
  3. 日本セミラボ 新横浜本社 Kanagawa//Electronic Components and Semiconductors
  4. 4 リッチモアインターナショナル 本社 Tokyo//Industrial Electrical Equipment
  5. 5 雄山 東京支店 Tokyo//others
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Sheet resistance tester Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Sheet resistance meter エヌピイエス
  2. Non-contact sheet resistance measurement device "LEI-1510 Series" 日本セミラボ 新横浜本社
  3. Resistance rate / Sheet resistance measuring instrument [WS-3000] ナプソン
  4. 4 Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F] ナプソン
  5. 4 Resistance rate / Sheet resistance measuring instrument [CRESBOX] ナプソン

Sheet resistance tester Product List

16～20 item / All 20 items

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Junction Photo Voltage(JPV)

Junction Photo Voltage(JPV)

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

The JPV method (Junction Photo Voltage method) allows for fast and reproducible mapping measurements. 【Features】 - Non-contact, non-destructive measurement - No adjustment of probes required - No special sample preparation needed for measurement - Measurement possible even with oxide films or coatings on the surface - High spatial resolution distribution measurement (mapping) can be performed quickly - Highly reproducible measurements are possible - Can be integrated with Semilab's benchtop platforms WT-2000, WT-2500, WT-3000, or inline wafer testing equipment.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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Non-contact sheet resistance measurement device 'DELCOM'

Non-contact sheet resistance measurement device 'DELCOM'

Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!

"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.

  • Insulation Tester

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EddyCus(R) TF portable

EddyCus(R) TF portable

Data management on PC via Bluetooth! A user-friendly and efficient testing solution.

The "EddyCus(R) TF portable" is a portable contact-type sheet resistance meter that accurately measures the sheet resistance of conductive films at a single point. It features user-friendly software that allows for real-time measurements. Measurement results from multiple devices are managed and visualized using a data sensor. Additionally, wireless data transfer via Bluetooth is possible. 【Features】 ■ Portable ■ Non-destructive contact measurement ■ Real-time & user-friendly ■ Data recording function ■ Accurate & reliable *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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EddyCus(R) TF inline series

EddyCus(R) TF inline series

A suitable solution for measuring the thickness of metal layers, light transmittance, density, and electrical anisotropy.

The "EddyCus(R) TF inline series" is a non-contact inline sheet resistance measurement solution capable of measuring the sheet resistance of thin films and the thickness of metal film layers. It offers advanced variability and flexibility, suitable for both vacuum and atmospheric environments. Equipped with an easy-to-use GUI, comprehensive software, SQL database, statistics, and export functions. 【Features】 ■ Non-contact & real-time measurement ■ Accurate measurements ■ Advanced variability and flexibility ■ Compatible with both vacuum and atmospheric environments ■ Supports single lane and multiple lanes *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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EddyCus(R)TF lab 2020 series

EddyCus(R)TF lab 2020 series

Manual mapping measurements of sheet resistance are possible using user-friendly software.

The "EddyCus(R)TF lab 2020 series" is a non-contact sheet resistance measurement device. It accurately measures the sheet resistance of conductive films at a single point. Additionally, it can measure the thickness of metal film layers and monitor the thickness of thin films and substrates. Upon request, we evaluate the characteristics of multi-layer systems. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Accurate single-point measurement of sheet resistance of conductive films (Ohm/sq) ■ Thickness measurement of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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