プレシテック・ジャパン List of Products and Services

"CHRocodile C" is an inexpensive optical single-point sensor. It maintains high speed and high precision comparable to other models, and can be used as a thickness sensor capable of measuring distances with nm resolution, simultaneously measuring up to 4 surfaces and 3 layers of thickness. Additionally, it is compact and palm-sized with the probe integrated into the main body, achieving space-saving during embedding, and is also recommended for inline use. This sensor is compatible with all surface types, including rough, mirror, and colored materials, and has a wide measurement range. It can also be used for measuring the thickness of graphite coatings. 【Features】 ■ Wide thickness measurement range, compatible with various materials A rich lineup of probes covers thickness from a few micrometers to thick films (up to 10mm). ■ High resolution (sub-micron, with a minimum of 8nm) ■ Contributes to reducing development costs and shortening development lead times, with a software development kit (DLL, etc.) available for device integration. ■ Extensive track record across multiple industries Semiconductor industry, consumer electronics, glass manufacturing, medical field *For more details, please refer to the materials. Feel free to contact us with any inquiries.

Presitech is a specialist in laser material processing and optical measurement technology. We are not just a supplier of systems and components, but a professional partner in ensuring a smooth processing process for our customers. We offer consultations from the foundational stage and accurately consult with our customers on their needs and objectives. This allows us to provide appropriate solutions for our customers' applications. 【Business Activities】 ■ Laser Material Processing ■ Optical Measurement Technology *For more details, please refer to the PDF document or feel free to contact us.

"CHRocodile C" is a chromatic aberration confocal sensor that measures displacement or thickness due to chromatic aberration using white light. It has a compact size of under 440g. It is compatible with all surfaces, including "rough," "mirror," and "colored materials." The probe head is available in sizes from 200μm to 10mm. 【Features】 ■ Compact ■ Surface-independent ■ Accurate and stable measurements even at inclinations of up to ±45° ■ Shape-independent ■ Probe heads available from 200μm to 10mm *For more details, please refer to the PDF document or feel free to contact us.

This document provides information about wafer thickness measurement sensors. We introduce the "CHRocodile 2 Series," which is suitable for replacement with contact gauges, as well as the design of optical measurement heads for in-process semiconductor applications. Please take a moment to read it. 【Contents】 ■ CHRocodile 2 Series ■ Design of optical measurement heads for in-process semiconductor applications ■ Advantage: Use of chromatic aberration confocal principle ■ Advantage: Use of spectral interference principle ■ Si thickness measurement data during wafer in-process *For more details, please refer to the PDF document or feel free to contact us.

This document provides information about non-contact thickness and shape measurement sensors. It introduces topics such as "The Principle of the CHROMATIC VISION CAMERA," "Measurement Examples," and "Features and Advantages of CHRocodile." Please take a moment to read it. 【Contents (Excerpt)】 ■ White Light Sensor ■ CHRocodile C ■ Interference Sensor ■ CHROMATIC VISION CAMERA ■ FLYING SPOT SCANNER *For more details, please refer to the PDF document or feel free to contact us.

This document introduces the CHRocodile series. It includes information on "the measurement principle of CHRocodile," as well as "interference sensors" and "CHROMATIC VISION CAMERA." Please take a moment to read it. 【Contents (excerpt)】 ■ About the measurement principle of CHRocodile ■ Principle 1: Confocal position measurement mode (surface shape and roughness measurement) ■ CLS appearance ■ Probe for CLS ■ CLS controller *For more details, please refer to the PDF document or feel free to contact us.

This document introduces the performance of various sensors for component inspection handled by PreciTech Japan Co., Ltd. It includes the measurement principles, compatible sensors, and ease of use for each sensor, such as the "Chromatic Aberration Confocal Single Point Sensor" and "Optical Point Sensor." Our company provides intelligent and reliable solutions for laser material processing and optical measurement technology. [Overview] ■ Measurement with the Chromatic Aberration Confocal Single Point Sensor ■ Shape and thickness measurement inspection with the Chromatic Aberration Line Sensor ■ Quality control of welding ■ Area scan measurement of thickness, flatness, and shape in specified areas *For more details, please refer to the PDF document or feel free to contact us.

To meet the need for speeding up production processes, data from ultra-fast inline measurements is essential. Such technology requires non-contact, high precision, as well as robustness, high reliability, and high-resolution 3D imaging. Our "Chromatic Aberration Confocal Sensor" can meet these requirements. Equipped with high-performance optical lenses, our chromatic aberration confocal sensor focuses not at a single point but at multiple distances along the optical axis, allowing it to focus across all wavelengths of visible light. This multifunctional optical sensor opens up new dimensions in measurement technology. In addition, we also offer products such as the "CLS-C Line Sensor," "C Point Sensor," and "Chromatic Aberration Point Sensor." 【Features】 ■ Capable of measuring various materials: transparent/opaque, diffuse/reflective surfaces, absorbing surfaces, etc. ■ Prevention of shadowing effects through coaxial measurement ■ Wide tolerance and high NA allow for measurements at up to 45° on reflective surfaces and over 80° on diffuse surfaces ■ Ultra-fast multi-point line sensor enables parallel measurement of multiple points *For more details, please refer to the PDF document or feel free to contact us.

In grinding operations, it is necessary to adjust the thickness of the wafer during processing. If using a non-contact, non-destructive optical measurement method, the thickness of the wafer can be monitored during processing without applying stress to the workpiece or damaging it, making it a suitable solution. Our "CHRocodile 2 DPS Chromatic Aberration Confocal Sensor" is equipped with two independent measurement channels. The sensor processes two chromatic aberration probes and synchronizes measurements and outputs in real-time, providing the final height and thickness of the wafer. 【Features】 ■ Development of chromatic aberration probes for harsh environments based on over 10 years of know-how in CMP and grinding interference measurement. ■ Non-contact measurement of wafer thickness in harsh environments. ■ Data acquisition rate of 10 kHz per probe. *For more details, please refer to the PDF document or feel free to contact us.

This document contains application examples and proposals for products related to the manufacturing process of consumer electronics. It introduces sub-micron precision displacement, shape, and thickness measurements using optical point sensors, as well as measurements of flatness, thickness, shape, and the arrangement of vertical and horizontal layers and components using FSS. We encourage you to read it. 【Contents (excerpt)】 ■ Applications and Products (designed for inline inspection) - Displacement and thickness measurements using optical single-point sensors and probes - Scanning the desired area for thickness, flatness, and shape - Shape and thickness inspection using color aberration line sensors - Scratch and defect dimension inspection using color aberration line scan cameras - Quality control of welding *For more details, please refer to the PDF document or feel free to contact us.

The "CHRocodile 2 series" is a non-contact sensor capable of in-process measurement of wafer thickness with sub-micron resolution. It is also used for quality control through sampling. In addition to the semiconductor industry, it is adopted in consumer electronics, glass manufacturing, and the medical field, making it suitable for measuring the thickness of transparent materials, coating thickness, and simultaneous measurement of multiple layers (up to 16 layers). 【Features】 - Wide range of thickness measurement, compatible with various materials A rich lineup of probes covers thickness from thin films (a few micrometers) to thick films (780 micrometers). Two principle methods can be selected according to the material. - High resolution (sub-micron, minimum 1nm) High-resolution measurements based on "chromatic aberration confocal method" and "spectral interference method." - Contributes to reducing development costs and shortening development lead times, with a software development kit (DLL, etc.) available for equipment integration. - Extensive track record across multiple industries Semiconductor industry, consumer electronics, glass manufacturing, medical field. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

The "CHROCODILE CLS2" and "CHROCODILE CLS2 PRO" can achieve non-contact high-speed three-dimensional shape measurement at a maximum of 48 million points per second (standard is 16.8 million points per second). The resolution is also extremely high, with a maximum of Y1um and Z0.025um, allowing for very precise measurements. Compared to previous generations, there has been a significant reduction in measurement time, and improvements have been made for high NA and increased light volume suitable for wafer edges, wire bonding, and micro bump measurements. There are numerous applications including shape, surface roughness, step height (thickness), flatness, and TTV. It is suitable not only as a tabletop device but also for use as a sensor for in-situ, monitoring, and inline equipment integration. 【Features】 - Three-dimensional shape measurement over a wide area Maximum line width of 20mm - Wide tolerance angle Can accommodate ±53° on reflective surfaces, suitable for edges and steep slopes - Contributes to reduced development costs and shortened development lead times, with a compact unit and a software development kit for equipment integration (such as DLLs) also available - Rich track record across multiple industries Semiconductor industry, consumer electronics, glass manufacturing, medical field *For more details, please refer to the documentation.

This document describes the evaluation results of surface roughness measurements using our optical single-point sensor. It introduces the standard roughness specimens used, measurement results, conclusions, and surface roughness samples with calibration certificates. It also includes features and specifications of the "CHROMATIC LINE SENSOR (CLS)," which is equipped with interchangeable probes suitable for various applications and has an integrated setup. [Contents (excerpt)] ■ Overview ■ Standard roughness specimens used ■ Measurement results and conclusions ■ Surface roughness samples with calibration certificates - measurements at the German headquarters ■ Reference: Line sensor CHROCODILE CLS *For more details, please refer to the PDF document or feel free to contact us.

Our optical distance sensor/thickness sensor 'CHRocodile C / CHRocodile Mini' from PreciTech Japan is a compact non-contact sensor with a wide measurement range. It is robust against slopes and offers high resolution in the distance direction starting from 20nm, all at an affordable price of approximately 1 million yen (excluding tax). 【Examples of Use Cases】 ● Complete inspection through height and distance measurement of manufactured products within equipment ● Quality improvement through thickness management of glass, film, and graphite coatings ⇒ Adopted by manufacturers of production equipment, inspection equipment, and integrators. 【Features】 ・Combines high resolution with a price point that lowers the purchasing barrier ・Non-contact measurement of film and coating thickness ・Strong against slopes with an angle tolerance of up to ±45 degrees ・Distance direction resolution starting from 20nm ・Flexible software creation possible with the provided software development kit ・Can be embedded in equipment ・Compatible with rough and mirror surfaces, independent of surface or shape *For product details, please refer to the materials available for download in PDF format. Feel free to contact us for inquiries.

1. Area sensor for internal defect inspection in welding - Field sensor Capable of simultaneous measurement of 110,000 points with image output. Replaces electron microscopes that require X-ray, CT scans, and work cuts. 2. Non-contact thickness measurement sensor for opaque materials - Enovasense Capable of measuring the thickness of resins, coatings, and metal coatings. Measurement range is 10nm to 1mm, with a measurement speed of 1 second or more, and measurement variation is approximately 0.5% to 3%. 3. Line camera for burr inspection after battery foil cutting - CVC A line camera with a maximum of 100kHz, capable of inline burr detection. 4. Insulation layer thickness measurement sensor - FSS Measures the thickness profile of battery insulation layers inline with a resolution of a few nm. 5. Dual point sensor for electrode thickness measurement - DPS Enables high-precision thickness measurement with a distance sensor of a few nm resolution. ■ Others 6. Line sensor for 3D shape measurement of battery can welds - CLS 7. - LWM

This is an application document for vial measurement using a chromatic aberration confocal sensor. It features high speed and high precision, enabling the automation of thickness and shape inspection with PreciTech's optical sensors. There is a lineup of single-point, dual-point, and line sensors available. It offers Z resolution from a few nanometers and high-speed measurement up to 70 kHz. *For more details, please refer to the document. Feel free to contact us with any inquiries.*

This is a single-point sensor using a chromatic aberration confocal method from Pretech, characterized by high precision and high-speed measurement. It has a proven track record in reducing measurement time for thickness and shape, as well as in full inspection. Due to the chromatic aberration confocal method, it is also possible to use probes with a large angular tolerance. There is also a budget sensor lineup available, starting from approximately 800,000 yen. *For more details, please refer to the materials. Feel free to contact us as well.*