プレシテック・ジャパン List of Products and Services

The "CHRocodile CLS" enables high-speed 3D shape measurement at 1 million points per second. It also offers very high precision with a maximum resolution of XY 1µm and Z 0.02µm. We provide up to six types of measurement heads based on range, resolution, and accuracy, and it can be applied inline as well. 【Features】 　■ Non-contact 3D shape measurement over a wide area 　　　Maximum line width of 8.3mm 　■ Wide acceptance angle 　　　Can accommodate reflective surfaces at ±45°, edges, and steep slopes 　■ Contributes to reduced development costs and shortened development lead times, 　　　with a compact unit and a software development kit (DLL, etc.) for equipment integration available 　■ Extensive track record across multiple industries 　　　Semiconductor industry, consumer electronics, glass manufacturing, medical field *For more details, please refer to the materials. Feel free to contact us with any inquiries.

Presitech is a specialist in laser material processing and optical measurement technology. We are not just a supplier of systems and components, but a professional partner in ensuring a smooth processing process for our customers. We offer consultations from the foundational stage and accurately consult with our customers on their needs and objectives. This allows us to provide appropriate solutions for our customers' applications. 【Business Activities】 ■ Laser Material Processing ■ Optical Measurement Technology *For more details, please refer to the PDF document or feel free to contact us.

The "CHRocodile MPS2L" is a new color aberration confocal sensor (MPS) that can measure 24 points simultaneously. The wavelength difference corresponds to a constant thickness. It can handle multiple points with a single probe head. There is no damage, deformation, or impact on the shape of the sample. 【Features】 ■ Optical and non-contact ■ No consumables required ■ No damage, deformation, or impact on the shape of the sample ■ Capable of measuring inclined workpieces ■ Compatible with hot end processes *For more details, please refer to the PDF document or feel free to contact us.

This document introduces the performance of various sensors for component inspection handled by PreciTech Japan Co., Ltd. It includes the measurement principles, compatible sensors, and ease of use for each sensor, such as the "Chromatic Aberration Confocal Single Point Sensor" and "Optical Point Sensor." Our company provides intelligent and reliable solutions for laser material processing and optical measurement technology. [Overview] ■ Measurement with the Chromatic Aberration Confocal Single Point Sensor ■ Shape and thickness measurement inspection with the Chromatic Aberration Line Sensor ■ Quality control of welding ■ Area scan measurement of thickness, flatness, and shape in specified areas *For more details, please refer to the PDF document or feel free to contact us.

In dedicated equipment for measuring the optical properties of glass products, non-contact measurement techniques are used to prevent damage to the surface and bulk materials. By using our "CHRomatic Vision Camera (CVC)" for quality inspection, you can instantly obtain information related to glass measurement and visualize various defects in bulk materials during the production process. Due to its deep depth of field, there is no need to refocus the camera, making it a powerful and superior tool for glass inspection compared to conventional microscope systems. 【Features】 ■ Saves valuable time during quality inspection as refocusing is unnecessary ■ Integrated coaxial illumination and interchangeable optical probes allow for clear, high-contrast images at any height ■ Suitable as a tool for appearance inspection of metal parts and defect detection on wafers and OLED masks ■ Incredible speed of up to 200,000,000 pixels/second ■ Equipped with a 44° light reception angle Camera Link/Ethernet interface to ensure reliable image recording ■ Camera can be used in harsh industrial environments *For more details, please refer to the PDF document or feel free to contact us.

When producing container glass bottles, it is necessary to inspect the thickness of each individual bottle despite the high production speed. Currently, it is difficult to measure important parts of containers or to measure black glass and non-spherical containers with existing point probe sensors. Our "CHRocodile MPS 2L sensor" spreads along a line with measurement points up to 12.5 mm in length. With high flexibility and efficiency, it can process each channel individually, allowing configurations such as using one line probe and up to 12 additional point probes. 【Features】 ■ Data collection rate per line probe is 4.5 kHz ■ 108,000 measurements per second with CHRocodile MPS 2L ■ Inline inspection is possible even for fast-moving samples ■ Increasing the sampling rate by reducing the number of channels used ■ CHRocodile MPS 2L allows measurement of up to 24 independent channels and selection of measurement points along the probe line *For more details, please refer to the PDF document or feel free to contact us.

Our company handles non-contact type measuring instruments based on the principles of chromatic aberration confocal and interference. These instruments can be applied to film thickness measurement, shape measurement, roughness measurement, displacement measurement, and appearance inspection, allowing for in-process measurement during manufacturing, high-speed inline inspection, and offline measurement. We offer various interfaces to accommodate embedded applications. Measurements can be performed with high resolution (minimum XY resolution of 1μm and minimum Z resolution of 0.02μm), contributing to improved product quality and reductions in manufacturing process time and costs. 【Features】 ■ Wide range of sensor lineup Sensors can be selected according to inspection requirements and materials from various sensor probes. ■ Sensors according to measurement range Available in single-point sensors, line sensor types, and area scan types. ■ Applications Can be utilized for inspection of PCB flex, wire loop inspection, wafer bump inspection, and more. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

Our company handles non-contact measurement devices based on the principles of chromatic aberration confocal and interference. These devices can be applied to film thickness measurement, shape measurement, roughness measurement, displacement measurement, and appearance inspection, enabling in-process measurement during manufacturing, high-speed inline inspection, and offline measurement. We offer various interfaces to accommodate embedded applications. Measurements can be performed with high resolution (minimum XY resolution of 1μm and minimum Z resolution of 0.02μm), contributing to improved product quality and reduced time and costs in manufacturing processes. For single-point sensors, we also offer two types of products aimed at lower price points (CHRcodile C, CHRocodile Mini). 【Features】 ■ Wide range of sensor lineup Sensors can be selected according to inspection requirements and materials from various sensor probes. ■ Sensors according to measurement range We provide single-point sensors, line sensor types, and area scan types. ■ Applications Can be utilized for inspection of PCB flex, wire loop inspection, wafer bump inspection, and more. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

The "CHROCODILE CLS2" and "CHROCODILE CLS2 PRO" can achieve non-contact high-speed three-dimensional shape measurement at a maximum of 48 million points per second (standard is 16.8 million points per second). The resolution is also extremely high, with a maximum of Y1um and Z0.025um, allowing for very precise measurements. Compared to previous generations, there has been a significant reduction in measurement time, and improvements have been made for high NA and increased light volume suitable for wafer edges, wire bonding, and micro bump measurements. There are numerous applications including shape, surface roughness, step height (thickness), flatness, and TTV. It is suitable not only as a tabletop device but also for use as a sensor for in-situ, monitoring, and inline equipment integration. 【Features】 - Three-dimensional shape measurement over a wide area Maximum line width of 20mm - Wide tolerance angle Can accommodate ±53° on reflective surfaces, suitable for edges and steep slopes - Contributes to reduced development costs and shortened development lead times, with a compact unit and a software development kit for equipment integration (such as DLLs) also available - Rich track record across multiple industries Semiconductor industry, consumer electronics, glass manufacturing, medical field *For more details, please refer to the documentation.

1. Area sensor for internal defect inspection in welding - Field sensor Capable of simultaneous measurement of 110,000 points with image output. Replaces electron microscopes that require X-ray, CT scans, and work cuts. 2. Non-contact thickness measurement sensor for opaque materials - Enovasense Capable of measuring the thickness of resins, coatings, and metal coatings. Measurement range is 10nm to 1mm, with a measurement speed of 1 second or more, and measurement variation is approximately 0.5% to 3%. 3. Line camera for burr inspection after battery foil cutting - CVC A line camera with a maximum of 100kHz, capable of inline burr detection. 4. Insulation layer thickness measurement sensor - FSS Measures the thickness profile of battery insulation layers inline with a resolution of a few nm. 5. Dual point sensor for electrode thickness measurement - DPS Enables high-precision thickness measurement with a distance sensor of a few nm resolution. ■ Others 6. Line sensor for 3D shape measurement of battery can welds - CLS 7. - LWM