一般財団法人材料科学技術振興財団　MST List of Products and Services

The STEM device equipped with a Cs collector (spherical aberration correction function) enables ultra-high-resolution observation (resolution of 0.10 nm). The HAADF*-STEM image, which is sensitive to atomic weight, is an effective tool for directly understanding multi-component crystal structures. In this study, we evaluated micro-particles in oxide semiconductors, which can be applied to the atomic arrangement at heterogeneous material interfaces and compound interfaces, as well as grain boundary segregation assessments. *High-Angle Annular Dark-Field: Contrast is obtained that is proportional to atomic weight (Z).

Silicon dioxide (SiO2) is widely used in semiconductors as an insulating film, in FPD substrate materials, optical materials, and from medical devices to jewelry; however, conducting structural analysis on glass, which is amorphous, is very challenging. Focusing on the cyclic bonding of SiO2 in glass, Raman measurements were conducted. (Figure 1) In single crystal quartz, the spectrum in the glass state is significantly different, and phonon bands due to long-range order are observed. (Figures 2, 3)

TDS is a method that heats samples in high vacuum (1E-7 Pa) and detects the gases that are released. By heating the sample at a constant rate in high vacuum, it is possible to confirm the temperature dependence of even trace amounts of desorption (at the monolayer level). Additionally, for some components, it is also possible to calculate the number of molecules of the desorbed gas. We will introduce examples of TDS applied to representative materials.

GPC (Gel Permeation Chromatography) is one of the separation modes of HPLC and is a method for evaluating the molecular weight of polymer compounds. It can determine several average molecular weights (Mn), weight average molecular weight (Mw), and polydispersity (Mw/Mn) in a single analysis, and it is also possible to compare the distribution profiles. It is also referred to as SEC (Size Exclusion Chromatography).

To improve the reliability of organic EL, which is expected to expand in demand in the future, detailed structural analysis, state analysis, and identification of degradation causes will become increasingly important. We will introduce examples of evaluating layer structures and materials using TOF-SIMS and LC/MS. With TOF-SIMS, we were able to evaluate the layer structure and the component information of each layer. We conducted analyses of the components revealed by TOF-SIMS using LC/MS and a fluorescence detector, allowing us to assess the emission wavelength and understand the structure of the components. Thus, the combination of TOF-SIMS and LC/MS enables detailed evaluations.

Polymers are known to exhibit diverse functions by altering their composition and structure, and they are utilized in various products. In the evaluation of polymers, assessment in real environments is crucial. This time, we will introduce a case where the shape of polymers on a substrate was visualized in the atmosphere and in aqueous solution using an environmental control atomic force microscope (AFM). Additionally, by combining data analysis, we quantified the dispersion of polymer particles.

The SIMS analysis profile of the interface between different materials changes with a certain width in the depth direction. This is due to the characteristics of SIMS analysis, which are influenced by ion beam mixing and the roughness of the sputtered surface. The detected impurities represent averaged information up to the mixed depth, detecting ions from regions with a width in the depth direction. Therefore, the interface position is generally defined as the location where the ion intensity of the main constituent elements reaches 50%.

In clean rooms where the manufacturing of semiconductors and liquid crystals takes place, it is important to monitor not only particles but also molecular-level chemical contamination (molecular contamination). Floating molecular contaminants include acidic and basic gases, cohesive organic substances, dopants, and metals, and the analysis methods vary depending on the components. Here, we will introduce details about cohesive organic substances and the representative collection methods, "adsorbent collection" and "wafer exposure collection."

Graphene, a monolayer form of graphite, is expected to be applied in a wide range of fields such as batteries, transparent electrodes, and sensors due to its excellent properties, including toughness, high electrical conductivity, and high thermal stability. It is also said that the types and amounts of functional groups present on the surface vary depending on the manufacturing method, and clarifying its structure is an important point for improving performance. This case study introduces a comparison of the functional groups of two types of graphene using thermal decomposition GC/MS method.

The penetration rate of smartphones is increasing year by year, and along with that, the protective films applied to their surfaces are diversifying in functionality. In this instance, we will introduce a case where two types of films (A and B) with fingerprint prevention and anti-reflection features were quantitatively evaluated in terms of roughness, simulating the sensation of touch through AFM analysis.

Applications of carbon materials, such as graphene in electron emission devices and hydrogen storage in carbon nanotubes, are increasing in vacuum environments. Therefore, evaluating the outgassing from carbon materials in vacuum is an important point for the future applications of these materials. This case study introduces an example of outgassing analysis from graphene using TDS (Thermal Desorption Spectroscopy), which can evaluate outgassing from samples in a vacuum.

TDS (Thermal Desorption Gas Analysis) is a method that allows for the confirmation of desorbed components and desorption temperatures while heating a sample in a vacuum (1E-7 Pa). Furthermore, by combining the results of TDS with GC/MS (Gas Chromatography-Mass Spectrometry), which can identify organic substances, it is possible to evaluate the desorption temperatures of specific desorbed components in a vacuum. Below, we present an example of a combined analysis of TDS and GC/MS conducted on graphene.

Understanding the degradation mechanism of liquid crystal display panels is an essential theme for extending the lifespan of the panels. Among the degradation symptoms, a decrease in brightness can be attributed to various factors, including liquid crystals, alignment films, sealing materials, and TFTs. A comprehensive analysis will be conducted, incorporating surface, structure, composition, and computational science. By capturing the slight differences between good and defective products and conducting a comprehensive evaluation, we can elucidate the degradation mechanism of liquid crystal displays.

Carbon nanotubes are lightweight nanomaterials with high strength and flexibility, and their excellent properties are expected to lead to applications in various fields. On the other hand, changes in physical properties associated with shape changes are also known, and evaluations of deformation and strain in response to external forces are required. This document introduces a case study of bending deformation simulations of single-walled carbon nanotubes using molecular dynamics calculations. By conducting simulations, it is possible to observe shape changes at the atomic level, which are difficult to evaluate from actual measurements, and to calculate strain energy.

To investigate the causes of defects such as poor adhesion, it is important to gain insights into the surfaces of wafers and devices. In this instance, hydrophobic areas were observed on a silicon wafer, prompting wide-area imaging using TOF-SIMS. As a result, components estimated to be silicone oil, CF-based grease, and paraffin oil were identified from the hydrophobic areas. TOF-SIMS typically has a measurement field of view up to 500μm square, but by moving the stage during measurement, it is possible to evaluate wide-area distributions. Measurement method: TOF-SIMS Product fields: Devices, Displays, Electronic Components, Manufacturing Equipment Analysis objectives: Qualitative, Imaging, Composition Distribution Evaluation For more details, please download the materials or contact us.

To determine impurity concentrations using SIMS analysis, it is necessary to use a standard sample with the same composition as the analysis sample. By preparing various Al compositions of AlGaN standard samples for AlGaN used in ultraviolet LEDs and power devices, MST can achieve more accurate quantification of impurities. We will introduce a case where, after disassembling a commercially available deep ultraviolet LED, SIMS analysis was conducted to determine the concentration of the dopant Mg and the distribution of the main component Al composition. Measurement method: SIMS Product fields: Lighting, power devices, optical devices Analysis purposes: Trace concentration evaluation, impurity evaluation, distribution evaluation, product investigation For more details, please download the materials or contact us.

Quantum chemical calculations can provide molecular insights (such as molecular structure, charge distribution, molecular orbitals, and mechanisms of chemical reactions) that serve as guidelines for the development and design of materials, as well as simulate various response spectra like UV-Vis and NMR with high accuracy. The results obtained can help overcome various challenges faced in research and development in fields such as functional materials and drug discovery. This document introduces the analysis targets, the physical property information obtained, and case studies that can be understood from quantum chemical calculations.

The response speed, driving voltage, and reliability characteristics of liquid crystal panels are attributed to the molecular structure of the liquid crystals. Therefore, analyzing the details of the molecular structure is essential for controlling the display characteristics of liquid crystal panels. Here, we introduce a case where the liquid components in commercially available panels were extracted and structurally estimated using GC/TOFMS. Approximately 10 components, including liquid crystal materials that exhibit negative dielectric anisotropy, were estimated from precise mass information. Measurement method: GC/MS Product fields: Displays, televisions, projectors Analysis objectives: Market research, molecular structure evaluation, degradation investigation For more details, please download the materials or contact us.

We provide suitable analysis menus for essential components of EVs, including onboard batteries and devices.

Pigment Red 254 (p-Cl DPP) is a type of DPP (diketopyrrolopyrrole) pigment that exhibits a vivid red color. DPP pigments are used as red pigments with excellent weather resistance, and due to their ease of mass production and low cost, they are also expected to be utilized as organic EL materials. This document presents a case study of UV-Vis spectrum simulation based on quantum chemical calculations targeting Pigment Red 254 in solution. By referring to the simulation results, the spectral shape of the measured data can be interpreted. Measurement method: Computational science and data analysis, UV-Vis Product fields: Lighting, displays, cosmetics, daily necessities Analysis purpose: Evaluation of chemical bonding states For more details, please download the document or contact us.

- Phosphorescence has a longer lifespan compared to fluorescence, and it often becomes thermally deactivated due to quenching by oxygen or the motion and collisions of solvents, making it difficult to measure at room temperature in most cases. Therefore, phosphorescence measurements are generally conducted at low temperatures. The fluorescence spectrometer owned by MST can cool samples to liquid nitrogen temperatures, allowing for phosphorescence measurements. - To perform phosphorescence measurements, it is necessary to measure the emission lifetime of phosphorescence and appropriately set the opening and closing time of the shutter integrated into the device based on the results. By establishing suitable measurement conditions, it is possible to distinguish and observe phosphorescence from fluorescence. This document explains the measurement of phosphorescence emission lifetime and phosphorescence measurements.

NMR is typically performed using the resonance signals of deuterium (2H or D) nuclei in deuterated solvents for reasons such as ensuring the stability of the magnetic field. However, by using the resonance signals of proton (1H) nuclei, measurements can also be conducted with light solvents (i.e., regular solvents) (No-D measurement method). The effective measurements for the No-D method are as follows: - Measurements to evaluate interactions with light solvents (e.g., degradation studies in light solvents) - Measurements of samples that cannot use deuterated solvents (e.g., samples in the biochemical field such as proteins) - Measurements of samples containing volatile components - Measurements of samples for which no dissolvable deuterated solvents are available.

This document presents a case study of Rietveld analysis applied to the powder X-ray diffraction data of Li(Ni, Mn, Co)O2, which is used as a positive electrode active material in lithium-ion secondary batteries. By seeking a crystal structure model that reproduces the measured powder X-ray diffraction data through simulation, it is possible to precisely calculate crystal structure parameters such as lattice constants, site occupancy rates, and the proportion of cation mixing, which can then be used to discuss the material properties.

Carbon nanotubes (CNTs) are lightweight and possess excellent mechanical properties (high strength and high elasticity), making them suitable for various applications and environments. In particular, the deformation behavior of CNTs is related to flexibility and energy absorption characteristics, which are important in sensor and nano-device design. This document presents a case study that simulates the bending and recovery deformation of single-walled CNTs using molecular dynamics calculations. The simulation allows for the observation of structural changes at the atomic level due to environmental changes (pressure and temperature), enabling the analysis of deformation behavior based on the changes in strain energy associated with these structural changes.