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  2. Testing, Analysis and Measurement
  3. 一般財団法人材料科学技術振興財団 MST
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一般財団法人材料科学技術振興財団 MST

EstablishmentAugust 1, 1984
addressTokyo/Setagaya-ku/Kitaomi 1-18-6
phone03-3749-2525
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last updated:Apr 10, 2026
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一般財団法人材料科学技術振興財団 MST Product Lineup

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Mass spectrometry Mass spectrometry
 【分析事例】高分子材料 【分析事例】高分子材料
【測定法】計算科学・AI・データ解析 【測定法】計算科学・AI・データ解析
Photoelectron spectroscopy Photoelectron spectroscopy
[Measurement Method] Electron Microscopy Observation and Analysis [Measurement Method] Electron Microscopy Observation and Analysis
Vibrational spectroscopy Vibrational spectroscopy
Measurement Method: X-ray Diffraction Related Measurement Method: X-ray Diffraction Related
[Measurement Method] Related to SPM [Measurement Method] Related to SPM
Measurement Method: Failure Analysis Measurement Method: Failure Analysis
[Measurement Method] Other Measurement Methods [Measurement Method] Other Measurement Methods
Processing methods and treatment methods Processing methods and treatment methods
Other services and support information Other services and support information
[Analysis Case] LSI・Memory [Analysis Case] LSI・Memory
[Analysis Case] Optical Devices [Analysis Case] Optical Devices
[Analysis Case] Solar Cells [Analysis Case] Solar Cells
[Analysis Case] Fuel Cell [Analysis Case] Fuel Cell
[Analysis Case] Display [Analysis Case] Display
[Analysis Case] Oxide Semiconductors [Analysis Case] Oxide Semiconductors
[Analysis Case] Power Device [Analysis Case] Power Device
[Analysis Case] Electronic Components [Analysis Case] Electronic Components
[Analysis Case] Secondary Battery [Analysis Case] Secondary Battery
[Analysis Case] Lighting [Analysis Case] Lighting
[Analysis Case] Manufacturing Equipment and Components [Analysis Case] Manufacturing Equipment and Components
[Analysis Case] Biotechnology [Analysis Case] Biotechnology
[Analysis Case] Cosmetics [Analysis Case] Cosmetics
[Analysis Case] Food [Analysis Case] Food
[Analysis Case] Pharmaceuticals [Analysis Case] Pharmaceuticals
[Analysis Case] Medical Devices [Analysis Case] Medical Devices
Analysis Case: Daily Necessities Analysis Case: Daily Necessities
[Analysis Case] Environment [Analysis Case] Environment
[Analysis Case] Others [Analysis Case] Others
Materials from the exhibition where MST exhibited. Materials from the exhibition where MST exhibited.
Measurement

Measurement Method: X-ray Diffraction Related

◆XRD (X-ray Diffraction) ◆XRR (X-ray Reflectivity) ◆SAXS (Small-Angle X-ray Scattering)

X-ray Reflectivity Method

XRR:X-ray Reflectivity

XRR measures the reflection intensity of X-rays incident on the sample surface at a very shallow angle. By comparing the reflection X-ray intensity profile obtained from this measurement with simulation results and optimizing the simulation parameters, this method determines the film thickness and density of the sample. - Evaluation of film thickness is possible (approximately 2 to 300 nm) - Evaluation of density is possible - Evaluation of surface roughness is possible (Rms ≤ 5 nm) - Non-destructive analysis is possible - Average information over a wide area of approximately 10×20 mm can be obtained

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X-ray diffraction method

XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.

- Identification of crystalline substances is possible - Evaluation of crystal size (from a few nm to 100 nm) is possible - Evaluation of crystallinity is possible - Evaluation of orientation is possible - Evaluation of strain and stress is possible - Non-destructive analysis is possible Features of the equipment - Heating analysis is possible from room temperature to 1100°C - Micro-area measurement with a beam diameter of up to 100 μm is possible - Atmosphere control is possible with N2, He, Ar, and vacuum

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[SAXS] Small-Angle X-ray Scattering Method

- Capable of evaluating periodic structures and orientation at the nanoscale.

SAXS is an analytical method that measures the X-rays scattered by a substance when X-rays are irradiated onto it, specifically in the low-angle region where 2θ < 10°. It is used to evaluate the structure of materials. Typically, it can assess structures ranging from a few nanometers to several tens of nanometers in size. - Enables evaluation of periodic structures and orientation at the nanoscale - Allows assessment of the distribution of voids in fine particles and materials - Capable of evaluating biological materials such as proteins - Allows for evaluation of samples under heating

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Rietveld analysis refers to

Detailed information such as atomic arrangements within the crystal can be obtained from the analysis of measurement data like XRD.

Rietveld analysis is a method for analyzing measurement data from XRD (X-ray diffraction) and neutron diffraction. In addition to identifying lattice constants and space groups using existing methods, it is possible to obtain more detailed crystallographic information, such as atomic arrangements within the unit cell, if there is a crystal structure model (candidate) for the sample.

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[Analysis Case] Evaluation of Antibacterial Coating by XPS

Various surface treatments can be verified.

Antimicrobial coatings and coated everyday items aimed at infection prevention, mold prevention, and odor control have become widely popular. Among them, silver ions (Ag) are known to exhibit antibacterial and sterilizing effects against bacteria and viruses, while being almost harmless to the human body, making them widely used as inorganic antimicrobial agents. We will introduce a case study that focused on the presence of Ag as an antimicrobial component on the sample surface and evaluated the presence and durability of the antimicrobial coating film.

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Hard X-ray Photoelectron Spectroscopy

HAXPES is an analytical method that uses hard X-rays as the excitation light for XPS (X-ray photoelectron spectroscopy).

It is also referred to as HX-PES or HXPES. Due to high-energy X-ray excitation, it allows for bulk state evaluation up to approximately 50 nm deep, which is several to about 10 times deeper than conventional XPS, as well as damage-free evaluation of bonding states at interfaces. This device is a laboratory instrument equipped with a GaKα source (9.25 keV), which enables a reduction in the time lag from sample preparation to measurement. - Bulk-sensitive state evaluation (approximately up to 50 nm) - Non-destructive evaluation of buried interface bonding states - Evaluation using deep inner shell orbitals (avoiding overlapping Auger peaks in XPS, analysis using the non-split 1s orbital) It also includes options for measurements combined with sputtering using GCIB (Gas Cluster Ion Beam), angle-resolved measurements, Al source (1.49 keV), neutralization guns, and measurements under non-exposure to the atmosphere. - Damage-free sputter cleaning using GCIB (depth profiling is generally not possible) - Depth-direction comparison of bonding states using Al source and angle-resolved measurements - Evaluation under non-exposure to the atmosphere

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Contract analysis service for in situ measurement using X-ray CT.

It is possible to observe three-dimensional structures under heating/cooling and stress/compression load conditions.

Tensile Test It is possible to perform X-ray CT measurements while applying stress in the direction of pulling the sample. Compression Test It is possible to perform X-ray CT measurements while applying pressure in the direction of compressing the sample. Temperature Control It is possible to perform X-ray CT measurements while adjusting the temperature of the stage.

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[Analysis Case] Measurement of Partial Density of States of GaN

Information about valence bands and gap states can be obtained by element.

Soft X-ray emission spectroscopy (SXES) using synchrotron radiation is widely used as a method to evaluate the electronic states of materials, as it allows for the direct acquisition of the partial density of states (pDOS) near the Fermi level for each element constituting the material. Furthermore, the characteristics of this method include: 1. Information from the bulk can be obtained. 2. It can be evaluated without being affected by charging effects, even for insulators. 3. The detection limit is low (<1 atomic%). These features make it particularly effective for evaluating materials containing light elements (such as B, C, N, O). In this document, we will introduce the SXES spectrum of a GaN substrate as a measurement example.

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[Analysis Case] CFRP (Carbon Fiber Reinforced Plastic) Internal Fiber Orientation Analysis

Case study of CFRP analysis using X-ray CT.

CFRP (Carbon Fiber Reinforced Plastic) is a resin material that uses carbon fibers as a reinforcing material, characterized by its lightweight and high strength and rigidity. The internal fiber structure of CFRP was observed using X-ray CT. As a result, we were able to observe clusters of carbon fibers with a diameter of approximately 7 μm, and we also conducted an analysis of the fiber orientation.

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[Analysis Case] Structural Refinement of Powdered Crystalline Materials Using Rietveld Analysis Method

It is possible to refine the crystal structure from powder X-ray diffraction data.

This document presents a case study of Rietveld analysis applied to the powder X-ray diffraction data of Li(Ni, Mn, Co)O2, which is used as a positive electrode active material in lithium-ion secondary batteries. By seeking a crystal structure model that reproduces the measured powder X-ray diffraction data through simulation, it is possible to precisely calculate crystal structure parameters such as lattice constants, site occupancy rates, and the proportion of cation mixing, which can then be used to discuss the material properties.

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[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

The degree of imidization due to differences in heating conditions can be evaluated using XPS.

Polyimide has very high heat resistance and excellent electrical insulation and mechanical properties, making it an essential material not only for electronic components but also for a wide range of fields such as precision machinery, automobiles, and aerospace. In its reliability evaluation, research on imide bonds is important. This document presents an example of XPS measurements conducted on polyimide before and after heating. Changes in the amount of oxygen and the chemical shifts of carbon, nitrogen, and oxygen confirmed that imidization progressed after heating. Additionally, by performing waveform analysis, it is also possible to determine the proportion of polyimide present.

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[Analysis Case] Evaluation of Glass Fiber Reinforced Plastic using X-ray CT and GC/MS

Evaluation of GFRP is possible according to the purpose.

Glass Fiber Reinforced Plastics (GFRP) are inexpensive, lightweight, and high-strength materials. Understanding their components, distribution, and internal structure is an important aspect of product design. This document presents case studies evaluating the components and structure of GF-reinforced PEEK (Poly Ether Ether Ketone) as GFRP material, as well as the degradation components of the resin after UV exposure.

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[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

Evaluation of the distribution of organic components and active substances on the surface, qualitative analysis.

The segregation of components and the formation of films on the surface of the positive electrode of lithium-ion secondary batteries are factors that influence the electric capacity. We will introduce a case study on Li(NiCoMn)O2 (NCM), which is used as a positive electrode, where micro-region mapping was conducted using AES, and qualitative analysis of organic components (binder) and active material surface films was performed using XPS and TOF-SIMS. These methods allow for analysis with a series of treatments conducted under an Ar atmosphere, which helps to suppress the alteration of the sample.

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[Analysis Case] Rietveld Analysis of Secondary Battery Cathode Materials

Quantitative analysis of positive electrode active materials, precise evaluation of crystal structure.

In lithium-ion secondary batteries, Li(NiCoMn)O2 (NCM) used as the positive electrode can achieve higher capacity by increasing the Ni ratio, and it also excels in high-temperature storage, making it suitable for mass production for automotive applications. On the other hand, cation mixing, where Ni ions occupy Li sites, is considered one of the factors contributing to the degradation of secondary batteries. This presentation will introduce a case where the metal content of the positive electrode active material was evaluated using ICP-MS, the crystal structure was assessed using XRD, and the results were used to perform Rietveld analysis to evaluate the proportion of cation mixing.

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[Analysis Case] Analysis of All-Solid-State Batteries

Comprehensive analytical evaluation combining structure, composition, and electrical properties.

Next-generation all-solid-state batteries, which are lithium-ion batteries, are expected to have high safety, high energy density, high output, and a wide operating temperature range. In recent years, research and development aimed at practical application has been actively conducted, but there are various development challenges. At MST, we propose evaluation content suitable for solving development challenges based on comprehensive analysis and evaluation of structure, composition, and electrical properties. This document introduces specific examples of development challenges for all-solid-state batteries, their evaluation content, and representative evaluation methods for each component.

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[Analysis Case] Structural Analysis of Non-Woven Fabric Masks

Comparison of structures before and after mask use using X-ray CT.

The frequency of mask usage has increased to prevent infections caused by viruses, but there is a lack of structural data that serves as a basis for their usage methods and resistance. This document presents the results of an analysis of non-woven masks before and after use using X-ray CT. The analysis revealed that the thickness of the entire mask increased after use, and it was found that sparse areas in the fibers developed within the layers of the non-woven fabric. It is expected that after use, masks may become more susceptible to the infiltration of dust and that the capture of dust fibers may become less effective.

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[Analysis Case] Wide-area Quantitative Mapping using XPS

It is possible to evaluate the composition distribution in an area of up to 70×70mm.

This is an example of wide-area quantitative mapping using XPS. We evaluated organic residue on silicon wafers using the following procedure. To graph the amount (atomic concentration) rather than peak intensity, it is less affected by sample roughness and allows for data acquisition over a wide area. It is suitable for investigating organic and inorganic contamination, discoloration, surface treatments, etc., as it enables an overview assessment of the compositional distribution on the sample surface.

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[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.

The inner walls of metal pipes, such as SUS, used in various fields can discolor and corrode due to reactions with incoming gases and liquids, leading to a decline in equipment functionality. Understanding the locations prone to discoloration and corrosion, as well as their causes, is an important issue in equipment maintenance. At MST, we provide a comprehensive evaluation from sample cutting to analysis. This document presents a case study of XPS analysis conducted on the inner walls of SUS pipes used in vacuum equipment, highlighting both normal and discolored areas.

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[Analysis Case] Evaluation of Sn Surface State by XPS

It is possible to calculate the ratio by valence (divalent, tetravalent).

Tin (Sn), such as in solder, is used in many electronic components. In the XPS analysis of the Sn surface, by using the 4d orbitals in addition to the quantitative and state analysis typically performed with the 3d orbitals, it is possible to separate the oxidation states (divalent Sn2+ (SnO) and tetravalent Sn4+ (SnO2)) and calculate their ratios. Furthermore, by examining the valence band, it is possible to sensitively detect even a very small amount of the low oxidation state (divalent Sn2+ (SnO)). This document presents examples of evaluating Sn on the surface of solder using various orbitals.

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[Analysis Case] Structural Evaluation of Secondary Battery Separators

Evaluation of the shape and composition of organic/inorganic multilayer structures.

The separator in lithium-ion secondary batteries not only serves the role of isolating the positive and negative electrodes to prevent internal short circuits, but in automotive batteries, it is also required to have heat resistance to prevent a decrease in strength or melting even in high-temperature environments. This report introduces a case study on separators used in overseas automotive batteries, where heat resistance and thermal decomposition behavior were investigated using TG-DTA, and structural and compositional evaluations were conducted using SEM-EDX, FT-IR, XPS, TOF-SIMS, and XRD. It was found that the separator used in the battery consists of a porous polyethylene and a layered structure of polygonal AlO(OH) aimed at heat resistance.

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[Analysis Case] Comprehensive Evaluation of Positive Electrode Active Materials in Secondary Batteries

Proposing an evaluation that combines structure, composition, and electricity to solve development issues.

This article introduces a case study evaluating the surface morphology, cross-sectional structure, components, composition, crystal structure, and resistance value distribution of Li(NiCoMn)O2 (NCM), which is used as a positive electrode in lithium-ion secondary batteries. Based on a comprehensive evaluation of structure, composition, and electrical properties, MST proposes assessments suitable for solving development challenges aimed at improving characteristics and enhancing reliability.

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[Analysis Case] Non-destructive Analysis of All-Solid-State Batteries Using X-ray CT

X-ray CT allows us to observe structural changes before and after charging and discharging.

In the research and development of all-solid-state batteries, it is important to evaluate the quality of the battery and to understand the degradation phenomena that occur during operation. By using X-ray CT, it is possible to confirm the presence of cracks at the electrode ends and structural changes associated with charging and discharging without destroying the battery. This document presents a case study of observing a single-layer laminated cell of an all-solid-state battery using X-ray CT. First, the entire 20 mm square electrode was observed, and then focused enlarged observations were conducted on areas suspected of defects. Furthermore, the battery was charged, and X-ray CT images before and after charging were compared.

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[Analysis Case] Evaluation of CNF Fiber Orientation Using Nano-CT

Three-dimensional observation of fibers on the nanometer order inside the sample is possible.

Cellulose nanofiber (CNF) is a fiber material that has been refined to the nanoscale from plant fibers primarily composed of cellulose. Due to its lightweight, high strength, and low environmental impact, it is utilized in product development across various fields. The properties of CNF can change significantly depending on its orientation, making the evaluation of orientation important. This document presents a case study where nano-CT was used to observe CNF with a short diameter of over 100 nm, which could not be captured by conventional micro-CT. Based on the data obtained from nano-CT measurements, structural analysis of CNF and evaluation of its orientation are possible.

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Notice of Website Renewal

To a more user-friendly and easier-to-read homepage.

We have completely renewed our homepage. In this renewal, we have revamped the design and structure to make it more user-friendly and comfortable for everyone, while enhancing the information provided. ◆ Key Points of the Renewal - Improved accessibility to information We have reviewed the common navigation across all pages and improved the menu structure to make it easier to understand. The structure allows for intuitive access to the necessary information. - Comfortable viewing in all environments In addition to PCs, we have made the site compatible with various viewing environments, including smartphones and tablets. You can enjoy a comfortable experience regardless of location or device. - Enhanced visual design for better visibility We have reviewed the overall color scheme and layout of the site, refreshing it to a more understandable and sophisticated design. ▼ You can view it here https://www.mst.or.jp/ We would be grateful if you could take a look. We will continue to strive for further enhancement of our content, and we appreciate your continued support.

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Custom analysis tailored to support research and development environments.

We will provide high-value-added analysis services by integrating AI with cutting-edge analytical technologies.

■ A consistent system that accompanies you until resolution and diverse analytical approaches We provide consistent support from hearing about the issues to reporting, collaboratively leading to optimal solutions through dialogue. With over 100 types of analytical methods and AI analysis, we cover challenges across all domains, responding to the trust that "MST is reliable" with flexible responses and proven results. ■ Abundant technical skills and experience We cater to a wide range of needs, from advanced analysis in existing fields like semiconductors to custom analysis in new areas. We have achievements in unique technologies such as the first domestic commercialization of FIB-TEM and SSDP-SIMS. ■ Fairness and reliability Since 1984, during the era when semiconductors took the world by storm, we have walked alongside the forefront of manufacturing. We maintain a fair and neutral stance, building solid trust through quality management based on ISO 9001. ■ Optimal problem-solving through AI analysis We propose solutions tailored to objectives and challenges through equipment analysis, AI analysis, and simulation. By maximizing the use of customer-owned data and designing and constructing custom AI models, we aim to generate results that meet specific needs. For inquiries regarding analysis and consultation, please feel free to contact us.

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