Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
CTT3280F is ideal for testing discrete power semiconductors such as MOSFETs and diodes. By using 16 sites simultaneously, it is possible to increase throughput. The supported voltage is up to 1000V/10A. Test programs can be developed in C language, making it easy to create programs.
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basic information
● Up to 13 modules can be mounted in the test head ● 16 sites prepared for parameter testing at 1000V/10A ● Capable of testing 16 devices simultaneously ● C/C++ is used as the development language
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Applications/Examples of results
It can be used for power semiconductors such as MOSFETs, diodes, and triodes. The voltage range is up to 1000V/10A. It is ideal for power semiconductors in the 650V/700V range and products with lower voltage ranges.
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Company information
A semiconductor inspection equipment manufacturer established in Hangzhou, China in April 2008. We develop and design wafer probers, testers, and handlers, supplying them to major semiconductor manufacturers. In 2017, we were listed on the Shenzhen Stock Exchange in China, established a Taiwan office, and in July 2018, we set up a Japan office. In 2019, we acquired Semiconductor Technologies & Instruments Ptd Ltd, an appearance inspection equipment manufacturer in Singapore, and in September 2020, we absorbed the semiconductor division of Sato Product Co., Ltd., providing better inspection equipment to the market for inspection equipment manufacturers.
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