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  6. Prestige etching processed products, semiconductor appearance inspection equipment catalog

Prestige etching processed products, semiconductor appearance inspection equipment catalog

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Prestige II

last updated:Jan 28, 2025

CCTECH Japan CCTECH Japan(株)-  日本法人
CCTECH Japan CCTECH Japan(株)-  日本法人
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Inspection of semiconductor defects, unevenness, and stains is handled by a single machine using the same inspection process.

In semiconductor manufacturing processes such as film deposition, resist coating, lithography, etching, and CMP, it is desirable to perform uniform manufacturing processes on each die on the wafer. However, in reality, variations such as foreign matter contamination, pattern defects, and film thickness lead to inconsistencies on the wafer. By incorporating automated inspection equipment into each of these processes, fine adjustments to the semiconductor process operations can be made. Furthermore, not only for semiconductor wafers but also for metal etching products, defects and distortions are inspected visually. However, as the quantity of these processed products increases, the likelihood of oversight in visual inspections and the labor costs can become significantly inflated. To reduce these oversights and labor costs, we introduce Prestige into the inspection processes of semiconductor and metal etching products, enabling cost reductions from oversight in the inspection process. 【Features】 ● High-resolution specification of 7μm and high-throughput specification of 38μm pixel resolution, accommodating a wide range of inspections ● RGB three-color LED lighting for optimized illumination according to patterns ● Adjustable camera angles for inspecting bright field to dark field images ● Simultaneous processing of defect inspection and uniformity inspection ● Compatible with 6/8/12-inch wafers ● Optional features for backside wafer inspection

    Semiconductor inspection/test equipmentOther semiconductor manufacturing equipmentVisual Inspection Equipment
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Prestige etching processed products, semiconductor appearance inspection equipment catalog

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Automation of the inspection process by using inspection equipment instead of visual inspection for defects and debris in the front-end processes of semiconductors. ● Semiconductor manufacturers, front-end exposure and etching processes ● Semiconductor manufacturers, final inspection process in the front-end It can also be used for defects in metal etching products, not just semiconductors. ● Defect inspection process for VCM (Voice Coil Motor) springs used in mobile phone camera components ● Lead frames of semiconductor packages etc.

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    High-performance wafer macro appearance defect inspection device

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Prestige etching processed products, semiconductor appearance inspection equipment catalog.

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Exhibited at SEMICON Japan 2021 Hybrid.

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Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

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CCTECH

CCTECH Japan CCTECH Japan(株)-  日本法人

Industrial Electrical Equipment

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A semiconductor inspection equipment manufacturer established in Hangzhou, China in April 2008. We develop and design wafer probers, testers, and handlers, supplying them to major semiconductor manufacturers. In 2017, we were listed on the Shenzhen Stock Exchange in China, established a Taiwan office, and in July 2018, we set up a Japan office. In 2019, we acquired Semiconductor Technologies & Instruments Ptd Ltd, an appearance inspection equipment manufacturer in Singapore, and in September 2020, we absorbed the semiconductor division of Sato Product Co., Ltd., providing better inspection equipment to the market for inspection equipment manufacturers.

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