Prestige etching processed products, semiconductor appearance inspection equipment catalog
Prestige II
Inspection of semiconductor defects, unevenness, and stains is handled by a single machine using the same inspection process.
In semiconductor manufacturing processes such as film deposition, resist coating, lithography, etching, and CMP, it is desirable to perform uniform manufacturing processes on each die on the wafer. However, in reality, variations such as foreign matter contamination, pattern defects, and film thickness lead to inconsistencies on the wafer. By incorporating automated inspection equipment into each of these processes, fine adjustments to the semiconductor process operations can be made. Furthermore, not only for semiconductor wafers but also for metal etching products, defects and distortions are inspected visually. However, as the quantity of these processed products increases, the likelihood of oversight in visual inspections and the labor costs can become significantly inflated. To reduce these oversights and labor costs, we introduce Prestige into the inspection processes of semiconductor and metal etching products, enabling cost reductions from oversight in the inspection process. 【Features】 ● High-resolution specification of 7μm and high-throughput specification of 38μm pixel resolution, accommodating a wide range of inspections ● RGB three-color LED lighting for optimized illumination according to patterns ● Adjustable camera angles for inspecting bright field to dark field images ● Simultaneous processing of defect inspection and uniformity inspection ● Compatible with 6/8/12-inch wafers ● Optional features for backside wafer inspection
Inquire About This Product
basic information
For more details, please download the PDF or contact us.
Price range
Delivery Time
Applications/Examples of results
Automation of the inspection process by using inspection equipment instead of visual inspection for defects and debris in the front-end processes of semiconductors. ● Semiconductor manufacturers, front-end exposure and etching processes ● Semiconductor manufacturers, final inspection process in the front-end It can also be used for defects in metal etching products, not just semiconductors. ● Defect inspection process for VCM (Voice Coil Motor) springs used in mobile phone camera components ● Lead frames of semiconductor packages etc.
Detailed information
-
High-performance wafer macro appearance defect inspection device
catalog(1)
Download All CatalogsNews about this product(1)
Company information
A semiconductor inspection equipment manufacturer established in Hangzhou, China in April 2008. We develop and design wafer probers, testers, and handlers, supplying them to major semiconductor manufacturers. In 2017, we were listed on the Shenzhen Stock Exchange in China, established a Taiwan office, and in July 2018, we set up a Japan office. In 2019, we acquired Semiconductor Technologies & Instruments Ptd Ltd, an appearance inspection equipment manufacturer in Singapore, and in September 2020, we absorbed the semiconductor division of Sato Product Co., Ltd., providing better inspection equipment to the market for inspection equipment manufacturers.