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  6. [Technical Data Presentation] High-speed and High-precision Camera Inspection Technology using 3D Charts

[Technical Data Presentation] High-speed and High-precision Camera Inspection Technology using 3D Charts

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High-speed and high-precision camera inspection technology using 3D charts

last updated:Jan 28, 2025

CCTECH Japan CCTECH Japan(株)-  日本法人
CCTECH Japan CCTECH Japan(株)-  日本法人
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A new technology for active alignment of camera modules significantly improves the throughput of module manufacturing using 3D charts.

Currently, active alignment, which positions the image sensor and lens, uses a 2D chart and employs a method of taking several images to achieve focus. The fundamental principle involves using a 3D chart to align both the front and depth focus simultaneously for lens positioning. This time, we will introduce the 3D chart related to the fundamental principle of active alignment. In this technical handbook, we will cover the following topics: ★ Optical axis of high-performance cameras ★ Methods for optical axis adjustment ★ 3D chart technology ★ Experiments to verify the principles

    Other semiconductorsSemiconductor inspection/test equipmentOther semiconductor manufacturing equipment
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[Technical Data Presentation] High-speed and High-precision Camera Inspection Technology using 3D Charts

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  • Related Link - https://cctech.co.jp/technologyhighlight/

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basic information

The document explains the advantages of using a 3D chart instead of a 2D chart due to the reasons for the misalignment of the camera's optical axis, as well as how the experiment to verify the principles of the 3D chart was conducted. Please download the document to see what a 3D chart looks like.

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It is used in active alignment for adjusting the position of the image sensor and lens to improve the throughput of the manufacturing process of conventional 2D charts.

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High-speed and high-precision camera inspection technology using 3D charts.

High-speed and high-precision camera inspection technology using 3D charts.

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Exhibited at SEMICON Japan 2021 Hybrid.

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Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

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CCTECH

CCTECH Japan CCTECH Japan(株)-  日本法人

Industrial Electrical Equipment

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A semiconductor inspection equipment manufacturer established in Hangzhou, China in April 2008. We develop and design wafer probers, testers, and handlers, supplying them to major semiconductor manufacturers. In 2017, we were listed on the Shenzhen Stock Exchange in China, established a Taiwan office, and in July 2018, we set up a Japan office. In 2019, we acquired Semiconductor Technologies & Instruments Ptd Ltd, an appearance inspection equipment manufacturer in Singapore, and in September 2020, we absorbed the semiconductor division of Sato Product Co., Ltd., providing better inspection equipment to the market for inspection equipment manufacturers.

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