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49

High-precision "ZENSEI Concentricity Measuring Instrument" with diverse customization options.
全晴(ZENSEI)
Simultaneous measurement of outer shape, inner diameter, and end face runout at three points! With a lineup of 24 types, precise measurement of concentricity suitable for the target workpiece is possible.
49

High-precision substrate materials essential for the fabrication of SPM and AFM samples.
NanoAndMoreジャパン 本社
For AFM/SPM sample substrates! Atomically flat mica and HOPG.