Automatic insertion of all probe pins. Exchange of any specified pins is also possible.
Easily achieve communication tests for 1553 signals! DBT300 Network Tester
The coil test can be measured using the GOOD/BAD method, and the continuity test can be measured using the LED lighting method!
SPD EEPROM programmer capable of reading, saving, and writing SPD from DIMM/SODIMM on a Windows PC.
Supports up to 4096 channels, a multi-site open short tester that achieves the fastest test time in the industry.
CE, RoHS certified device! Bond tester equipped with proprietary technology (patented).
High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.
It is the ideal product for general aviation, such as airlines and business jets. Customization according to customer specifications is also possible.
The versatile bond tester DAGE4000 has been completely redesigned, becoming more multifunctional and achieving higher precision, thus being reborn!
Easy expansion of the tester itself! Strong support for mass production of high-density multi-pin devices.
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
Ideal for collecting fallen or adhered foreign objects.
Designed for system verification and evaluation of software algorithms!
Designed for the removal ratio of common mode signals in EEG and system noise testing!
Improved cost performance through simultaneous measurement of multiple chips! Measurement of 2KV/20A is possible.
Middle-range model: A handler that thoroughly pursues excellent stability and significant reduction in working time.
Eliminating keypad operations, we have adopted an intuitive touchscreen method!
High-speed seek with in-house developed VCM.
Compatible with flat cables! Equipped with automatic mechanisms, manual mechanisms, and desktop mechanisms, etc.
It can handle various bonding strength tests in the assembly process of various semiconductor components and electronic parts, as well as in the mounting process on substrates, all with one machine!
Leakage Current Circuit Breaker 【LCB 15mA 100V 15A PSC AAM A】
Compatible with SFP112/QSFP112! Can be mounted in the compact FTB-1 HPDC chassis.
Starting the 800GbE point-to-point test, also supporting breakout tests with 2x400GbE and 8x100GbE!
Using two inspection cameras for semiconductor wafer inspection equipment, the tact time has been reduced by half. 3D bump inspection is also possible.
To achieve low cost and high precision, we are switching from Japanese manufacturers' testers to overseas manufacturers' testers.
A device that transports parts to semiconductor inspection equipment. It is a gravity-based transport device. It is capable of performing transport and appearance inspection simultaneously.
Supports PAM4/NRZ signals and covers the 1.6TBASE/CEI-224G standard!
We are a problem-solving company that realizes "visualization" of energy conservation and measurement!
Probe card maintenance sheet that can be used 5 to 10 times in the same area, reducing replacement frequency with a self-repairing coating.
Manual measurement laser bond tester specifically for thick aluminum wire bonds! It can be used for all bond inspections.
Room temperature and high temperature test handler suitable for TO220 type.
It is a product suitable for both old-style replacements and new test stations!
This is a product for simplified testing of circuit card assemblies!
We are a device manufacturer that handles heat dissipation and noise reduction products for electronic equipment, as well as high-frequency circuits.
High performance! You can easily create test programs without needing special experience or knowledge.
Evaluate the drive IC with images! LCD panel simulator
Minimize aggressiveness towards the rim! There are plenty of clamp options available, compatible with various rims and vehicles.
Accelerate the deterioration diagnosis of lead-acid batteries. Measure reliably even under UPS operating conditions.
Supports large current and high voltage measurements, as well as high-speed and parallel measurements! Flexible and diverse system configurations are possible.
High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.
Changing the common sense of testing. AMB5600, an innovative platform that supports diverse ICs.
A mid-range IC test handler that pursues excellent stability and reduced working time.
Streamlining IC testing for small home appliances while ensuring high quality.
A handler that thoroughly pursues excellent stability and reduced working hours.
A mid-range handler that supports the efficiency of IC testing in AI development.
IC multi-function inspection support! Equipped with an LCR meter developed in-house.
Micro-capacity inspection with high resolution! Capable of inspecting various products such as thin-film RF filters and accelerometers.
Expansion of measurement conditions and built-in 64 LCR meters enable faster and more accurate inspections!
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
We will evaluate the performance degradation of the molybdenum SPD cassette.
You can perform in-circuit testing and JTAG boundary testing seamlessly.
Removable test lead! Equipped with a tote band meter that can withstand a 1m drop.
Easy panel operation allows for the implementation of standard tests! A tester for conducting leakage current tests.
A modular measurement platform for testing optical passive components 24 hours a day, 365 days a year!
A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.
It can be used for a wide range of applications, from analog semiconductors such as power supply-related ICs, operational amplifiers, and motor drivers to analog-digital mixed ICs.
The CTA8280 is an IC tester specialized for analog products. It is characterized by high accuracy in voltage and current measurements.
Introduction to Theoretical Analysis of Wire Probe Wear
High-performance wafer-level test system compatible with wafers from 8 inches to 12 inches!
Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!
The standard measurement target is the thick aluminum wire bond in the post-process of power semiconductor manufacturing.
Standard feature for correcting to optimal measurement positions! It can be used for efficient sampling inspections and full bond inspections of medium lots.
Non-contact, non-destructive, and instantaneous measurement is possible! You can specify the optimal measurement position.
We will introduce products that can be used for efficient sampling inspections and full bond inspections of medium lots.
We will introduce products that can be used for efficient sampling inspections and full bond inspections of medium lots.
We will protect our customers' investments in legacy radios and support functional verification!
We aim to support our customers in mastering all aspects of their maintenance strategy!
We will maintain the assets on the vehicle and along the tracks in good repair condition!
This is the latest version of the tester that has been introduced around the world for many years!
A cost-effective device with powerful capabilities in a compact size!
Component-level diagnostics and high-performance functional testing in a single system!
This is a product for detecting and identifying faults in circuit cards that is expandable and affordably priced!
It completely detects, isolates, and repairs wiring faults even in extremely harsh environments!
This is a test device that combines a wide range of digital tests and analog LMR tests!
SPEA DOT800T Electrical Characteristic Testing System for Power Devices
An electrical characteristic testing system that maximizes the performance of power devices for EV control.
We can provide a wide range of proposals tailored to your needs.
Low-cost inspection equipment! Suitable for replacing aging inspection facilities.
Attach it to your open press machine and repurpose it as a vacuum press machine at low cost.
We can propose a system from the contact probe fixture to the signal generator and backlight.
Lay network cables with this one device! Simple operation: connect the cables and press the TEST button.