Automatic insertion of all probe pins. Exchange of any specified pins is also possible.
Designed for the removal ratio of common mode signals in EEG and system noise testing!
Eliminating keypad operations, we have adopted an intuitive touchscreen method!
It can be used for a wide range of applications, from analog semiconductors such as power supply-related ICs, operational amplifiers, and motor drivers to analog-digital mixed ICs.
Ideal for collecting fallen or adhered foreign objects.
Supports large current and high voltage measurements, as well as high-speed and parallel measurements! Flexible and diverse system configurations are possible.
Compatible with SFP112/QSFP112! Can be mounted in the compact FTB-1 HPDC chassis.
SPD EEPROM programmer capable of reading, saving, and writing SPD from DIMM/SODIMM on a Windows PC.
Multi-standard compatible "RFID Comprehensive Testing Machine" using proprietary "LabVIEW" measurement technology.
A handler that thoroughly pursues excellent stability and reduced working hours.
Compatible with flat cables! Equipped with automatic mechanisms, manual mechanisms, and desktop mechanisms, etc.
The versatile bond tester DAGE4000 has been completely redesigned, becoming more multifunctional and achieving higher precision, thus being reborn!
It can handle various bonding strength tests in the assembly process of various semiconductor components and electronic parts, as well as in the mounting process on substrates, all with one machine!
Standard feature for correcting to optimal measurement positions! It can be used for efficient sampling inspections and full bond inspections of medium lots.
Power semiconductor tester for low-voltage discrete devices at Si level. Increases throughput by testing 16 sites simultaneously.
Full support for testing transmission standards of 800G/400G/200G/100G!
Leakage Current Circuit Breaker 【LCB 15mA 100V 15A PSC AAM A】
Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!
Introducing the product features of Peritec's RFID tester (catalog available for download).
[Development Case] GUI Development for PDA Communication Control
CE, RoHS certified device! Bond tester equipped with proprietary technology (patented).
Minimize aggressiveness towards the rim! There are plenty of clamp options available, compatible with various rims and vehicles.
A tester suitable for the development of finger clip oximeters and patient monitors!
Supports up to 4096 channels, a multi-site open short tester that achieves the fastest test time in the industry.
A mid-range IC test handler that pursues excellent stability and reduced working time.
Streamlining IC testing for small home appliances while ensuring high quality.
A mid-range model that pursues excellent stability and reduced working hours.
IC regulator tester designed for 12V specification IC regulators!
High-speed seek with in-house developed VCM.
The standard measurement target is the thick aluminum wire bond in the post-process of power semiconductor manufacturing.
Non-contact, non-destructive, and instantaneous measurement is possible! You can specify the optimal measurement position.
We will introduce products that can be used for efficient sampling inspections and full bond inspections of medium lots.
Using two inspection cameras for semiconductor wafer inspection equipment, the tact time has been reduced by half. 3D bump inspection is also possible.
A device that transports parts to semiconductor inspection equipment. It is a gravity-based transport device. It is capable of performing transport and appearance inspection simultaneously.
A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.
Starting the 800GbE point-to-point test, also supporting breakout tests with 2x400GbE and 8x100GbE!
A modular measurement platform for testing optical passive components 24 hours a day, 365 days a year!
Low-cost inspection equipment! Suitable for replacing aging inspection facilities.
High performance! You can easily create test programs without needing special experience or knowledge.
Attach it to your open press machine and repurpose it as a vacuum press machine at low cost.
We can propose a system from the contact probe fixture to the signal generator and backlight.
High-capacity work compatible model! Differential pressure air leak tester equipped with noise-canceling function.
[Development Case] Relay Board Inspection Machine
Supports operation linked with external devices! Inspections are conducted according to the specified conditions.
Accelerate the deterioration diagnosis of lead-acid batteries. Measure reliably even under UPS operating conditions.
We have combined accuracy, convenience, and test automation into one!
An electrocardiogram simulator designed for performance testing!
Intensive shock tests at 15-second intervals due to enhanced resistance improve productivity!
Improved cost performance through simultaneous measurement of multiple chips! Measurement of 2KV/20A is possible.
If you do not perform a proof test, it can also be used as a regular winding machine!
High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.
A mid-range handler that thoroughly pursues excellent stability and reduced working hours.
A mid-range handler that supports the efficiency of IC testing in AI development.
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
IC multi-function inspection support! Equipped with an LCR meter developed in-house.
You can perform in-circuit testing and JTAG boundary testing seamlessly.
The CTA8280 is an IC tester specialized for analog products. It is characterized by high accuracy in voltage and current measurements.
Removable test lead! Equipped with a tote band meter that can withstand a 1m drop.
A smart test system optimized for mass production screening of silicon photonics.
We can provide a wide range of proposals tailored to your needs.
DCRF mixed probe (power and high-frequency mixed probe)
Lay network cables with this one device! Simple operation: connect the cables and press the TEST button.
Tabletop type ECU (Power Control Unit) tester
Compatible with various auto probers! LED chip tester ECOIC-LED
Evaluate the drive IC with images! LCD panel simulator
Evaluation of two-dimensional magnetic characteristics with arbitrary waveforms and automatic tracking control - Steel plate magnetic characteristic tester
Suitable for the development of reflective PPG products! Outputs analog signals of R and IR.
Easily achieve communication tests for 1553 signals! DBT300 Network Tester
High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.
Middle Range Model: A handler that thoroughly pursues excellent stability and significant reduction in work time.
The layout and operability of the NS series remain unchanged, achieving stable low-temperature measurements.
High-speed, high-precision IC test handler that supports the reliability of automotive components.
A handler that thoroughly pursues excellent stability and reduced working hours.
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
Started operations as a major supplier of high-precision pressure calibration equipment to government agencies around the world.
It is the ideal product for general aviation, such as airlines and business jets. Customization according to customer specifications is also possible.
High-precision pressure calibration equipment that supports the safe operation of aircraft.
Micro-capacity inspection with high resolution! Capable of inspecting various products such as thin-film RF filters and accelerometers.
Easy expansion of the tester itself! Strong support for mass production of high-density multi-pin devices.
We will evaluate the performance degradation of the molybdenum SPD cassette.
Manual measurement laser bond tester specifically for thick aluminum wire bonds! It can be used for all bond inspections.
We will introduce products that can be used for efficient sampling inspections and full bond inspections of medium lots.
To achieve low cost and high precision, we are switching from Japanese manufacturers' testers to overseas manufacturers' testers.
Customize the optical integrated circuit you want to measure! Introducing our testing solutions.
Introduction to Theoretical Analysis of Wire Probe Wear