Correcting the optical axis shift of the microscope's front and back, variations in the objective lens magnification, and the camera's θ shift with images!
Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.
Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.
This is a grinding machine suitable for sample grinding, tissue observation, and cross-sectional inspection, among other applications. Its versatility is enhanced when combined with the FORCIMAT head.
Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.
The LVEM 5 is an unprecedented "tabletop type" "low-cost" "transmission electron microscope (TEM)." SEM/STEM can be added as an option.
Structural analysis of liposomes and skin lamellar structures! Sections can be prepared from 30nm to 5μm.
An absolute encoder that, like a resolver, is designed for harsh environments and can achieve 22-bit high resolution and high precision. It is unaffected by condensation, oil, dust, or dirt.
NA0.19, WD30mm! The optical magnification is 10x zoom with autofocus for focus adjustment.
Faithfully simulate TEM/STEM images! Capable of handling protein samples and viruses as well.
Ideal cardboard case for transporting sales demo units such as electron microscopes.
We contribute to visualization! We can illuminate according to the subject!
【Free demo units available】Anyty series digital microscope dedicated stand. The flexible arm allows for easy height adjustment.
High-performance vibration isolation table to improve measurement accuracy.
We will fully automate the detection of foreign substances and impurities, size measurement, and elemental analysis.
Composition observation and three-dimensional observation are possible! Insulating samples can be observed directly without any pretreatment.
It is a new generation SEM that is compact and capable of unmanned operation.
A long-selling model for over 45 years, a desktop type that allows easy production of electrode films, compact DC sputter.
In about two weeks, we will deliver a report via email! By visualizing with an electron microscope, it is possible to confirm the morphology and size.
This is a compact evaporation source compatible with UHV. It is characterized by excellent thin film control with a deposition rate at the monolayer level.
The nano-resolution piezo positioning stage is used in various fields around the world, so you can use it with confidence.
A 3-megapixel USB-connected digital microscope that allows observation with bright and clear image quality at a fixed magnification!
Save time for 2D and 3D analysis! A digital microscope with overwhelming resolution and expressive power.
Applied CERVO for Cryo-EM analysis, supporting the application analysis of advanced technology that achieved atomic-level resolution.
It is possible to prepare a holey sample for transmission electron microscopy inspection from samples with a diameter of 3mm or 2.3mm in just a few minutes!
Exceptional usability: A digital version with USB connection of the "Standard Type EV-1" is available.
Achieve everything from macro to distant views with a single device! A digital microscope that powerfully supports a wide range of visual inspections with overwhelming clarity. Ideal for remote observation as well.
4K camera, digital 3D microscope inspection platform "sinaSCOPE" with 3D display, manufactured by SOLECTRIX.
High precision sample analysis is supported by a high-precision, ultra-thin grid.
【Demo Now Available】 Equipped with a high-speed autofocus function that eliminates the hassle of focusing. You can observe and save on PC, smartphone, and tablet!
High-performance vibration isolation table that improves the precision of microfabrication.
Vibration isolation table with excellent vibration isolation characteristics tailored to the load capacity.
High-performance vibration isolation table that improves the precision of microfabrication.
High-performance vibration isolation table that improves the precision of micro-machining machines.
High-performance vibration isolation table to improve the accuracy of exposure processes.
High-performance vibration isolation table to improve experimental accuracy.
High-performance vibration isolation table that improves the precision of microfabrication.
Size suitable for installation inside an electron microscope. Enables in-situ observation under stress loading.
It is possible to observe cross-sections while observing FIB processing in real time.
We have published cross-sectional observations in clear vision mode and normal/standard mode!
Diverse sample environments such as gas filling and UHV! Hard and soft collaboration with the synchrotron beamline is possible.
It fully automates everything from the detection of interposed objects to size measurement, elemental analysis, and report creation.
We will fully automate the detection of metal powder particles in metal additive manufacturing, from size measurement and elemental analysis to report generation.
We will fully automate the detection of metal powder particles, from size measurement to elemental analysis, in metal additive manufacturing methods.
Compound X-ray Excitation Photoelectron Microscope Review PEEM
Complex shape analysis completed in just 2 simple steps in a matter of seconds! Easy, speedy, and low-cost! Moreover, it's accurate.
Analysis such as cell counting, which takes hours, is completed in "about 3 seconds"! And at a low cost!
Inspection in one shot for 300mm wafers in 1 second.
High resolution that cannot be achieved with conventional zoom microscopes.
A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.
The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.
Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!
Please leave the milling of MC nylon to us. When milling sheets, it is important to be cautious of warping.
It is used in various fields such as education, agriculture, forestry, healthcare, and sanitation and epidemic prevention.
Seamless from optical imaging to SEM observation! Elemental analysis while observing simultaneously!
Adjust the focus with the dial! You can observe the subject you want to check on the monitor without looking through the viewfinder.
Equipped with XY electric stage and autofocus function! Customization for software and more is also supported.
Equipped with an electric XY stage and autofocus function!
Complete FIB processing, observation, and analysis with just one machine!
We have adopted our new concept colors, Pure White and JEOL Silver, resulting in a more refined form design.
A field emission transmission electron microscope developed with the concept of energy conservation and CO2 reduction.
It is expected that information that has not been obtained until now can be acquired, and improvements can be made to the measurements that are causing difficulties.
The observation work of SEM has become more efficient and easier to perform.
It can be utilized in various fields such as medicine, biology, metals, semiconductors, and ceramics.
Recommended by Azusa Science
This is a new bio-resin for embedding samples. It is made from "paper" components and can be disposed of as combustible waste. There is no dust dispersion or distinctive odor.
Can be stored in JIS standard racks! Units can be freely combined according to your purpose!
Manual operation type! Each dimension of the interface of various silicone devices can be measured with clear images.
Surprising price starting from 15,750 yen - Contracted imaging with an electron microscope.
We will conduct surface morphology observation at high magnification using SEM/FE-SEM.
It is possible to perform electron beam lithography without compromising the functionality of your SEM.
Electron microscope-related electron microscope sample holder storage device
Electron microscope related: UHV electron microscope static electric deflection type electron gun.
Train door opening and closing solenoid; electron microscope lens.
Achieving high-speed 3D/4D imaging measurements of nano-level dynamics!
Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.
Improve measurement efficiency and data quality with Spike-Guard! Compatible with other manufacturers' AFMs as well.
One-stop service for detailed support!
It is possible to prepare sections ranging from 30nm to 5μm! This document introduces several case studies of material analysis!
It is widely used in various fields, including basic research, the development of new products, and their evaluation.