No darkroom needed, a highly versatile all-in-one microscope designed for ease of use.
For AFM/SPM sample substrates! Atomically flat mica and HOPG.
Equipped with a highly sensitive CMOS color camera and a high-resolution CMOS monochrome camera! High-performance all-in-one fluorescence microscope.
Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.
A low-magnification wide-field microscope that can simultaneously observe both sides of electronic components and printed circuit boards. Ideal for scratch inspection and measuring misalignment of alignment marks!










































































































































