List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
181～195 item / All 726 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
It is a UV irradiation device that can utilize DUV light up to 248nm and allows for wavelength selection and switching.
- Semiconductor inspection/test equipment
Achieving high magnification, high resolution, and high density resolution! Compact X-ray TV inspection device.
- Semiconductor inspection/test equipment
Equipped with SOFTEX original X-ray generator! An X-ray inspection device that can be installed anywhere.
- Semiconductor inspection/test equipment
Image recomposition time is approximately 10 seconds! A 3D CT unit that can be integrated into standard X-ray equipment.
- Semiconductor inspection/test equipment
Practical application of ultrasonic ultrasonic technology mounted on a spin sheet device!
- Semiconductor inspection/test equipment
It is also possible to impart water-repellent properties to the tapered surface on the outer circumference to improve ESI efficiency!
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?
- Semiconductor inspection/test equipment
ServAir Cloud V4.3 has released the "BI Option."
We are pleased to announce the release of the after-sales service core business package, ServAir Cloud V4.3. In V4.3, we will offer a new BI (Business Intelligence) option. You will be able to analyze various data from ServAir and create graphs using the BI tool QuickSight provided by AWS Japan (Amazon Web Services Japan LLC). ServAir's data will be available in a format that can be easily utilized on QuickSight, allowing you to perform data analysis, forecasting, create various graphs, and manage KPIs on your own. This enables you to manage, analyze, and share data tailored to your business goals. V4.3 is scheduled to go on sale on December 15, 2023, and to start shipping on January 26, 2024. Please feel free to contact us for an introduction to the product, including the new features of V4.3.
We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.
- Analytical Equipment and Devices
- Other machine elements
- Semiconductor inspection/test equipment
We will exhibit at the 2024 Japan Proteomics Society Annual Meeting and the 20th Joint Meeting of the Japanese Clinical Proteogenomics Society.
Our company will be exhibiting at the Joint Conference of the 2024 Annual Meeting of the Japanese Proteomics Society and the 20th Annual Meeting of the Japanese Clinical Proteogenomics Society, which will be held at Link Station Hall Aomori from June 26 to 28, 2024. At our booth, we will showcase a complete set of interfaces that enable high-sensitivity measurements using capillary electrophoresis-mass spectrometry (CE-MS). We invite anyone using CE-MS, as well as those who own an MS and are interested in utilizing capillary electrophoresis, to visit our booth.
CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.
- Semiconductor inspection/test equipment