List of Semiconductor inspection/test equipment products

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

• Cooling system

It is a device that measures the thickness of silicon wafers and sorts them according to their thickness.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device used to measure the thickness of metal or resin carriers used in the silicon wafer lapping process and the double-sided polishing process.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of compound semiconductor wafers in sizes φ2”, φ4” or φ6”.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of various types of wafers below φ4"

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement of Si, SiC, and other wafers with a diameter of φ100mm to φ150mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Thickness measurement device for silicon wafers with a diameter of φ200mm and φ300mm.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that removes silicon wafers from a dedicated cassette and measures the thickness at the set points.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device for measuring the thickness of SiC wafers adhered to a glass plate and the thickness of the adhesive, as well as measuring the thickness of individual SiC wafers.

• Other semiconductor manufacturing equipment
• Semiconductor inspection/test equipment

The very popular TME series

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Large-diameter silicon wafer measuring instrument

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

This is a device that extracts silicon wafers from a dedicated cassette using edge handling and measures the thickness of a set pattern.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Measurement of Si wafer thickness, front and back surface P/N determination.

• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

We provide advanced specialized technology as an integrated R&D foundry.

• Semiconductor inspection/test equipment
• Analytical Equipment and Devices
• Other contract services