List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

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  • Other conveying machines

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Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.

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  • Other safety and hygiene products

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Maximum size up to 1,200mm × 3,600mm can be produced. Can be made in either glass or resin.

  • Semiconductor inspection/test equipment
  • Other physicochemical equipment
  • others

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Cam and gear software

  • Other machine tools
  • gear
  • Semiconductor inspection/test equipment

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By conducting a complete visual inspection of the chips before implementation, we can reduce losses in subsequent processes and improve yield! Ideal for acceptance inspection and screening in module a...

  • Semiconductor inspection/test equipment

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It is also possible to impart water-repellent properties to the tapered surface on the outer circumference to improve ESI efficiency!

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

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We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

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We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

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We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

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We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

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We create tapered capillaries with a consistent inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

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Would you like to achieve efficiency in repair and maintenance inspection operations and improve customer satisfaction with the core business package "ServAir" for after-sales service?

  • Semiconductor inspection/test equipment

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ServAir Cloud V4.3 has released the "BI Option."

We are pleased to announce the release of the after-sales service core business package, ServAir Cloud V4.3. In V4.3, we will offer a new BI (Business Intelligence) option. You will be able to analyze various data from ServAir and create graphs using the BI tool QuickSight provided by AWS Japan (Amazon Web Services Japan LLC). ServAir's data will be available in a format that can be easily utilized on QuickSight, allowing you to perform data analysis, forecasting, create various graphs, and manage KPIs on your own. This enables you to manage, analyze, and share data tailored to your business goals. V4.3 is scheduled to go on sale on December 15, 2023, and to start shipping on January 26, 2024. Please feel free to contact us for an introduction to the product, including the new features of V4.3.

We create tapered capillaries with a constant inner diameter using our unique manufacturing technology.

  • Analytical Equipment and Devices
  • Other machine elements
  • Semiconductor inspection/test equipment

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We will exhibit at the 2024 Japan Proteomics Society Annual Meeting and the 20th Joint Meeting of the Japanese Clinical Proteogenomics Society.

Our company will be exhibiting at the Joint Conference of the 2024 Annual Meeting of the Japanese Proteomics Society and the 20th Annual Meeting of the Japanese Clinical Proteogenomics Society, which will be held at Link Station Hall Aomori from June 26 to 28, 2024. At our booth, we will showcase a complete set of interfaces that enable high-sensitivity measurements using capillary electrophoresis-mass spectrometry (CE-MS). We invite anyone using CE-MS, as well as those who own an MS and are interested in utilizing capillary electrophoresis, to visit our booth.

CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.

  • Semiconductor inspection/test equipment

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Sheet substrate electrical testing system! (Continuity testing, insulation testing, four-terminal testing, micro-short detection) FPC, flexible substrates, PCB, PKG

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  • Other inspection equipment and devices
  • Circuit Board Inspection Equipment
  • Semiconductor inspection/test equipment

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【TTL】Board Power-On Test Device 'TY-CHECKER DS401' Semi-Automatic Type, a power-on testing machine for printed circuit boards, capable of high-frequency testing in a semi-automatic manner (continuity testing, insulation testing, four-terminal testing, micro-short detection).

The "TY-CHECKER DS401" is a powered inspection system that adds X-direction movement (horizontal movement) to the conventional Y-direction step-and-repeat transport. Since the device is semi-automatic, the entire front of the machine is almost open, making it easy to handle the workpieces. It is designed to be useful in product development and manufacturing environments. Transitioning to mass production can also be done smoothly by adopting the AT type. *We also assist with the supply of jigs! It supports both a unique dedicated plate holding method that does not apply tension and a tension holding method, allowing selection according to the product. By swapping the measurement unit, high-frequency characteristic testing can be performed either on sheets or individual pieces, leveraging the advantages of jig fixation to achieve stable automatic/semi-automatic high-frequency testing. 【Features】 ■ Maximum substrate size: 305mm x 510mm ■ Step-and-repeat transport in the XY direction ■ Contributes to downsizing of jig head (reducing jig costs) ■ Continuity, insulation, 4-terminal testing, micro-short detection ■ High-frequency characteristic testing compatible with 'VNA, LCR, TDR' *For more details, please refer to the PDF document or feel free to contact us.

Fusing the "design capabilities" of machinery, electronics, and software! We respond to needs in a one-stop manner.

  • Semiconductor inspection/test equipment

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Zirconia (ZrO2) has high bending strength and compressive strength at room temperature, and its fracture toughness is extremely high.

  • Fine Ceramics
  • Mounter
  • Semiconductor inspection/test equipment

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OYM-401 is a manual prober compatible with optical microscopes. It is equipped with multiple positioners, allowing for easy probing.

  • Semiconductor inspection/test equipment

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It is a device that automatically supplies semiconductor wafers to the inspection machine. It employs a vibration isolation mechanism to prevent vibrations during inspection.

  • Semiconductor inspection/test equipment

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IC socket

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • socket

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Anisotropic conductive sheet

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • others

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W-CSP inspection probe card

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

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Consolidating decades of technology developed with contact probes for semiconductor testing!

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

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We will introduce product information by genre for various precision tools and fixtures used in semiconductor manufacturing, as well as individual product specifications.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

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STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.

  • Semiconductor inspection/test equipment
  • Contract Analysis
  • Other semiconductors

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We provide a one-stop service from semiconductor test development to the launch of semiconductor testing and semiconductor testing outsourcing.

  • Semiconductor inspection/test equipment

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We have a proven track record in static electricity measures and charge prevention, from atmospheric environments to vacuum environments.

  • Other semiconductors
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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Inline cleaning of particles on the stage - wafer-type stage cleaner

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Other cleaning tools

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Ideal for testing resin and plastic raw materials! Our uniquely developed inspection mechanism detects foreign substances and discoloration in pellets and powders! *Detection of 9μm is possible.

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment

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Function tester combining Pickering switches and LabVIEW.

  • Testing Equipment and Devices
  • Semiconductor inspection/test equipment
  • Contract Inspection

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High-precision alignment (within 1μm of the target) is now possible in all directions of X-Y-Z-θx-θy-θz.

  • Sputtering Equipment
  • Semiconductor inspection/test equipment
  • Photomask

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It is possible to propose a customized FFU that fits the size of the enclosure.

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  • Other clean room equipment and facilities
  • Semiconductor inspection/test equipment
  • Oxidation/Diffusion Device

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For semiconductor inspection processes! Leave high-precision micro-hole processing with short delivery times to us!

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  • Semiconductor inspection/test equipment

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It is a device that measures the dynamic characteristics of semiconductors according to specified test conditions.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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Multiple different measurement item conditions can be set, allowing for continuous testing.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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Anode bonding support device

  • Semiconductor inspection/test equipment
  • Bonding Equipment

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A technical partner for our customers that supports "performance improvement" and "stable operation" of the manufacturing line.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Other clean room equipment and facilities

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The nano-resolution piezo positioning stage is used in various fields around the world, so you can use it with confidence.

  • Optical microscope
  • Electron microscope
  • Semiconductor inspection/test equipment

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Introducing examples of stainless steel machining. We accommodate various parts processing across industries, not limited to machining, including turning, sheet metal work, and welding.

  • Processing Contract
  • Other machine elements
  • Semiconductor inspection/test equipment

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To customers considering wide-width equipment for roll-to-roll production lines.

  • Bag making machine/slitter
  • Injection Molding Machine
  • Semiconductor inspection/test equipment

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Air Stage LBT Series

  • Other machine elements
  • Semiconductor inspection/test equipment
  • Linear motor

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Applicable to evaluation tests, capable of handling temperatures down to -40°C without a chiller!

  • Semiconductor inspection/test equipment
  • Temperature and Humidity Control

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Applicable to all test environments from evaluation tests to mass production tests!

  • Semiconductor inspection/test equipment
  • Temperature and Humidity Control

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Applicable to all test environments from evaluation tests to mass production tests!

  • Semiconductor inspection/test equipment
  • Temperature and Humidity Control

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Tester for AC characteristic testing in semiconductor backend processes! Capable of conducting avalanche tolerance tests on products.

  • Semiconductor inspection/test equipment

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Satisfying customer needs with a lid that can control heat in various structures.

  • Testing Equipment and Devices
  • Semiconductor inspection/test equipment

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